JP2019009270A - 基板固定装置 - Google Patents
基板固定装置 Download PDFInfo
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- JP2019009270A JP2019009270A JP2017123360A JP2017123360A JP2019009270A JP 2019009270 A JP2019009270 A JP 2019009270A JP 2017123360 A JP2017123360 A JP 2017123360A JP 2017123360 A JP2017123360 A JP 2017123360A JP 2019009270 A JP2019009270 A JP 2019009270A
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- layer
- base plate
- electrostatic chuck
- adhesive layer
- thermal conductivity
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
- H01L21/6833—Details of electrostatic chucks
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67109—Apparatus for thermal treatment mainly by convection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68757—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a coating or a hardness or a material
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02N—ELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
- H02N13/00—Clutches or holding devices using electrostatic attraction, e.g. using Johnson-Rahbek effect
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Drying Of Semiconductors (AREA)
Abstract
【解決手段】本基板固定装置は、吸着対象物を吸着保持する静電チャックと、前記静電チャックを搭載するベースプレートと、を備えた基板固定装置であって、ベースプレートと、前記ベースプレート上に設けられた接着層と、前記接着層上に設けられた静電チャックと、を有し、前記接着層は、前記ベースプレート側に設けられた第1層と、前記静電チャック側に設けられた第2層と、含み、前記第1層は、前記ベースプレート、前記接着層、及び前記静電チャックが積層される積層方向の熱伝導率が、前記積層方向に垂直な平面方向の熱伝導率よりも高く、前記第2層は、前記平面方向の熱伝導率が前記積層方向の熱伝導率よりも高い。
【選択図】図1
Description
[基板固定装置の構造]
図1は、第1の実施の形態に係る基板固定装置を簡略化して例示する断面図である。
図2及び図3は、第1の実施の形態に係る基板固定装置の製造工程を例示する図である。
10 ベースプレート
10a ベースプレートの上面
15 水路
15a 冷却水導入部
15b 冷却水排出部
20 接着層
21 第1層
22 第2層
40 静電チャック
41 基体
42 静電電極
43 発熱体
211、221 樹脂
212、222 伝熱材料
221a、221b 絶縁樹脂フィルム
Claims (5)
- 吸着対象物を吸着保持する静電チャックと、前記静電チャックを搭載するベースプレートと、を備えた基板固定装置であって、
ベースプレートと、
前記ベースプレート上に設けられた接着層と、
前記接着層上に設けられた静電チャックと、を有し、
前記接着層は、前記ベースプレート側に設けられた第1層と、前記静電チャック側に設けられた第2層と、含み、
前記第1層は、前記ベースプレート、前記接着層、及び前記静電チャックが積層される積層方向の熱伝導率が、前記積層方向に垂直な平面方向の熱伝導率よりも高く、
前記第2層は、前記平面方向の熱伝導率が前記積層方向の熱伝導率よりも高いことを特徴とする基板固定装置。 - 前記第2層は、前記第1層よりも薄いことを特徴とする請求項1に記載の基板固定装置。
- 前記第1層は、第1の樹脂と、長手方向が前記積層方向を向くように前記第1の樹脂中に配置されたカーボンナノチューブと、を有することを特徴とする請求項1又は2に記載の基板固定装置。
- 前記第2層は、第2の樹脂と、主面が前記平面方向と平行になるように、前記第2の樹脂中に配置された炭素シートと、を有することを特徴とする請求項1乃至3の何れか一項に記載の基板固定装置。
- 前記炭素シートは、グラファイトシート又はグラフェンシートであることを特徴とする請求項4に記載の基板固定装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017123360A JP6905399B2 (ja) | 2017-06-23 | 2017-06-23 | 基板固定装置 |
US15/956,852 US11145531B2 (en) | 2017-06-23 | 2018-04-19 | Substrate fixing device |
KR1020180051037A KR102450072B1 (ko) | 2017-06-23 | 2018-05-03 | 기판 고정 장치 |
TW107117539A TWI840328B (zh) | 2017-06-23 | 2018-05-23 | 基板固定裝置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017123360A JP6905399B2 (ja) | 2017-06-23 | 2017-06-23 | 基板固定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2019009270A true JP2019009270A (ja) | 2019-01-17 |
JP6905399B2 JP6905399B2 (ja) | 2021-07-21 |
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JP2017123360A Active JP6905399B2 (ja) | 2017-06-23 | 2017-06-23 | 基板固定装置 |
Country Status (4)
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US (1) | US11145531B2 (ja) |
JP (1) | JP6905399B2 (ja) |
KR (1) | KR102450072B1 (ja) |
TW (1) | TWI840328B (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021111688A (ja) * | 2020-01-10 | 2021-08-02 | 日本特殊陶業株式会社 | 保持装置 |
JP7551591B2 (ja) | 2021-10-18 | 2024-09-17 | 日本特殊陶業株式会社 | 保持装置、および複合部材 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20220181126A1 (en) * | 2019-03-14 | 2022-06-09 | Lam Research Corporation | Lamellar ceramic structure |
TWI788769B (zh) * | 2021-01-27 | 2023-01-01 | 大陸商河南烯力新材料科技有限公司 | 導熱結構與電子裝置 |
EP4057068A1 (en) * | 2021-03-09 | 2022-09-14 | ASML Netherlands B.V. | Apparatus comprising an electrostatic clamp and method |
US20220301914A1 (en) * | 2021-03-22 | 2022-09-22 | Tokyo Electron Limited | Electrostatic chuck for a plasma processing apparatus |
CN114269081B (zh) * | 2022-03-03 | 2022-05-10 | 四川英创力电子科技股份有限公司 | 一种多层电路板制作方法及多层电路板 |
TWI820971B (zh) * | 2022-10-17 | 2023-11-01 | 中國砂輪企業股份有限公司 | 可吸附不同晶圓尺寸之吸盤 |
Citations (3)
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WO2010061740A1 (ja) * | 2008-11-25 | 2010-06-03 | 京セラ株式会社 | ウエハ加熱装置、静電チャックおよびウエハ加熱装置の製造方法 |
WO2015198942A1 (ja) * | 2014-06-23 | 2015-12-30 | 日本特殊陶業株式会社 | 静電チャック |
KR20170025964A (ko) * | 2015-08-31 | 2017-03-08 | 세메스 주식회사 | 정전 척 및 이를 포함하는 기판 처리 장치 |
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JP5423632B2 (ja) * | 2010-01-29 | 2014-02-19 | 住友大阪セメント株式会社 | 静電チャック装置 |
JP5740939B2 (ja) * | 2010-11-29 | 2015-07-01 | 住友電気工業株式会社 | 半導体装置の製造方法 |
EP2752083A1 (en) * | 2011-08-30 | 2014-07-09 | Watlow Electric Manufacturing Company | System and method for controlling a thermal array |
JP5838065B2 (ja) * | 2011-09-29 | 2015-12-24 | 新光電気工業株式会社 | 熱伝導部材及び熱伝導部材を用いた接合構造 |
JP5522220B2 (ja) * | 2012-09-12 | 2014-06-18 | 住友大阪セメント株式会社 | 静電チャック装置 |
JP6349228B2 (ja) * | 2014-10-22 | 2018-06-27 | 新光電気工業株式会社 | 静電チャック及びその静電チャックに使用されるベース部材 |
WO2016153582A1 (en) * | 2015-03-20 | 2016-09-29 | Applied Materials, Inc. | Ceramic electrostatic chuck bonded with high temperature polymer bond to metal base |
WO2017051748A1 (ja) * | 2015-09-25 | 2017-03-30 | 住友大阪セメント株式会社 | 静電チャック装置 |
US9759997B2 (en) * | 2015-12-17 | 2017-09-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Pellicle assembly and method for advanced lithography |
-
2017
- 2017-06-23 JP JP2017123360A patent/JP6905399B2/ja active Active
-
2018
- 2018-04-19 US US15/956,852 patent/US11145531B2/en active Active
- 2018-05-03 KR KR1020180051037A patent/KR102450072B1/ko active IP Right Grant
- 2018-05-23 TW TW107117539A patent/TWI840328B/zh active
Patent Citations (3)
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WO2010061740A1 (ja) * | 2008-11-25 | 2010-06-03 | 京セラ株式会社 | ウエハ加熱装置、静電チャックおよびウエハ加熱装置の製造方法 |
WO2015198942A1 (ja) * | 2014-06-23 | 2015-12-30 | 日本特殊陶業株式会社 | 静電チャック |
KR20170025964A (ko) * | 2015-08-31 | 2017-03-08 | 세메스 주식회사 | 정전 척 및 이를 포함하는 기판 처리 장치 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021111688A (ja) * | 2020-01-10 | 2021-08-02 | 日本特殊陶業株式会社 | 保持装置 |
JP7441046B2 (ja) | 2020-01-10 | 2024-02-29 | 日本特殊陶業株式会社 | 保持装置 |
JP7551591B2 (ja) | 2021-10-18 | 2024-09-17 | 日本特殊陶業株式会社 | 保持装置、および複合部材 |
Also Published As
Publication number | Publication date |
---|---|
US11145531B2 (en) | 2021-10-12 |
KR20190000783A (ko) | 2019-01-03 |
US20180374735A1 (en) | 2018-12-27 |
KR102450072B1 (ko) | 2022-10-05 |
JP6905399B2 (ja) | 2021-07-21 |
TWI840328B (zh) | 2024-05-01 |
TW201906056A (zh) | 2019-02-01 |
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