JP2019007987A - 表面プラズモン共鳴蛍光分析方法 - Google Patents
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
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- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
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Abstract
Description
(測定装置の構成)
まず、本発明の実施の形態1に係る表面プラズモン共鳴蛍光分析装置(以下「SPFS装置」ともいう)について説明する。
1/2tan−1(b/a)<θ≦45 …(1)
上記式(1)において、aは、共役光学系(受光光学系)の光軸および励起光反射フィルター122の交点Aと、共役光学系(受光光学系)の光軸およびプリズム20の成膜面22の交点Bとの距離である。bは、交点Bからの、共役光学系(受光光学系)の光軸に直交する方向における分析チップ10の端部までの最短距離である(図2参照)。
実施の形態2に係るSPFS装置200は、実施の形態1に係るSPFS装置100と同様に、チップホルダー、励起光学系ユニット110、受光光学系ユニット220および制御部130を有する。実施の形態2に係るSPFS装置200は、受光光学系ユニット220の構成のみが実施の形態1に係るSPFS装置100と異なる。そこで、本実施の形態では、受光光学系ユニット220についてのみ説明する。
20 プリズム
21 入射面
22 成膜面
23 出射面
30 金属膜
40 流路蓋
41 流路
100,200 表面プラズモン共鳴蛍光分析装置
110 励起光学系ユニット
111 光源ユニット
112 角度調整部
120,220 受光光学系ユニット
121 第1レンズ
122 励起光反射フィルター
123 第2レンズ
124 第1光センサー
125 第2光センサー
130 制御部
131 光源制御部
132 第1光センサー制御部
133 第2光センサー制御部
134 制御処理部
226 第3レンズ
Claims (1)
- 被検出物質を標識する蛍光物質が、表面プラズモン共鳴に基づく局在場光により励起されて発した蛍光を検出して、前記被検出物質の存在またはその量を検出する表面プラズモン共鳴蛍光分析方法であって、
プリズムの一面上に配置された金属膜に対する入射角を変化させながら、前記プリズムを介して前記金属膜に励起光を照射するとともに、前記金属膜上から出射され、かつ励起光反射フィルターで反射されたプラズモン散乱光の強度を検出して、前記プラズモン散乱光の強度が最大となるときの入射角である増強角を決定する工程と、
蛍光物質で標識された被検出物質を前記金属膜上に配置する工程と、
前記金属膜に対する入射角が前記増強角となるように、前記プリズムを介して前記金属膜に励起光を照射するとともに、前記被検出物質を標識する前記蛍光物質から放出され、かつ前記励起光反射フィルターを透過した蛍光の強度を検出する工程と、
を含み、
前記増強角を決定する工程における励起光の光量は、前記蛍光の強度を検出する工程における励起光の光量よりも大きい、
表面プラズモン共鳴蛍光分析方法。
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WO2016147937A1 (ja) * | 2015-03-17 | 2016-09-22 | コニカミノルタ株式会社 | 検出装置 |
JP6515617B2 (ja) * | 2015-03-20 | 2019-05-22 | コニカミノルタ株式会社 | 測定方法および測定装置 |
WO2016152707A1 (ja) * | 2015-03-20 | 2016-09-29 | コニカミノルタ株式会社 | 測定方法、測定装置および測定チップ |
US20180313756A1 (en) * | 2015-11-13 | 2018-11-01 | Konica Minolta, Inc. | Method for surface plasmon resonance fluorescence analysis and device for surface plasmon resonance fluorescence analysis |
JP7043051B2 (ja) * | 2017-09-01 | 2022-03-29 | 学校法人関西学院 | 表面プラズモン励起増強蛍光検出装置および検出方法 |
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JPH10170430A (ja) | 1996-12-10 | 1998-06-26 | Toto Ltd | 表面プラズモン測定方法及び装置 |
DE19715483A1 (de) | 1997-04-14 | 1998-10-15 | Boehringer Mannheim Gmbh | Methode zur gleichzeitigen Bestimmung von biomolekularen Wechselwirkungen mittels Plasmonenresonanz undFluoreszenzdetektion |
GB9928849D0 (en) * | 1999-12-07 | 2000-02-02 | Secr Defence Brit | Surface plasmon resonance |
US20040181344A1 (en) * | 2002-01-29 | 2004-09-16 | Massachusetts Institute Of Technology | Systems and methods for providing diagnostic services |
WO2004040717A2 (en) * | 2002-10-28 | 2004-05-13 | University Of Washington | Wavelength tunable surface plasmon resonance sensor |
EP1930715A1 (en) * | 2006-12-04 | 2008-06-11 | Electronics And Telecommunications Research Institute | Surface plasmon resonance sensor capable of performing absolute calibration |
JP5344828B2 (ja) * | 2008-02-28 | 2013-11-20 | 富士フイルム株式会社 | センシング装置 |
JP5094484B2 (ja) * | 2008-03-11 | 2012-12-12 | 富士フイルム株式会社 | 蛍光検出方法および蛍光検出装置 |
JP4993308B2 (ja) * | 2008-03-31 | 2012-08-08 | 富士フイルム株式会社 | 蛍光検出方法および蛍光検出装置 |
JP5180703B2 (ja) * | 2008-06-27 | 2013-04-10 | 富士フイルム株式会社 | 検出方法、検出用試料セルおよび検出用キット |
US9464988B2 (en) | 2010-06-04 | 2016-10-11 | Konica Minolta, Inc. | Surface plasmon resonance fluorescence measurement device and surface plasmon resonance fluorescence measurement method |
JP5861640B2 (ja) | 2010-09-30 | 2016-02-16 | コニカミノルタ株式会社 | 表面プラズモン共鳴蛍光分析装置及び表面プラズモン共鳴蛍光分析方法 |
JP5541098B2 (ja) | 2010-11-05 | 2014-07-09 | コニカミノルタ株式会社 | 表面プラズモン共鳴蛍光分析装置及び表面プラズモン共鳴蛍光分析方法 |
US9068945B2 (en) | 2011-06-17 | 2015-06-30 | Konica Minolta, Inc. | Surface plasmon-field enhanced fluorescence spectroscopic measurement method and surface plasmon-field enhanced fluorescence spectroscopic measurement device |
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