JP2018500556A5 - - Google Patents

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Publication number
JP2018500556A5
JP2018500556A5 JP2017530021A JP2017530021A JP2018500556A5 JP 2018500556 A5 JP2018500556 A5 JP 2018500556A5 JP 2017530021 A JP2017530021 A JP 2017530021A JP 2017530021 A JP2017530021 A JP 2017530021A JP 2018500556 A5 JP2018500556 A5 JP 2018500556A5
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JP
Japan
Prior art keywords
electrode
center
detector
electrodes
ionizing radiation
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JP2017530021A
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English (en)
Japanese (ja)
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JP2018500556A (ja
JP6505228B2 (ja
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Priority claimed from PCT/EP2015/079330 external-priority patent/WO2016096622A1/en
Publication of JP2018500556A publication Critical patent/JP2018500556A/ja
Publication of JP2018500556A5 publication Critical patent/JP2018500556A5/ja
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Publication of JP6505228B2 publication Critical patent/JP6505228B2/ja
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JP2017530021A 2014-12-17 2015-12-11 電離放射線を検出する検出器、撮像装置、非一時的コンピュータ可読媒体、及び方法 Active JP6505228B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP14198540.8 2014-12-17
EP14198540 2014-12-17
PCT/EP2015/079330 WO2016096622A1 (en) 2014-12-17 2015-12-11 Detector and method for detecting ionizing radiation

Publications (3)

Publication Number Publication Date
JP2018500556A JP2018500556A (ja) 2018-01-11
JP2018500556A5 true JP2018500556A5 (enExample) 2018-09-27
JP6505228B2 JP6505228B2 (ja) 2019-04-24

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JP2017530021A Active JP6505228B2 (ja) 2014-12-17 2015-12-11 電離放射線を検出する検出器、撮像装置、非一時的コンピュータ可読媒体、及び方法

Country Status (6)

Country Link
US (1) US10054692B2 (enExample)
EP (1) EP3234649A1 (enExample)
JP (1) JP6505228B2 (enExample)
CN (1) CN107110987B (enExample)
RU (1) RU2705717C2 (enExample)
WO (1) WO2016096622A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106249270B (zh) 2016-08-31 2023-04-25 同方威视技术股份有限公司 半导体探测器
EP3498171A1 (en) 2017-12-15 2019-06-19 Koninklijke Philips N.V. Single shot x-ray phase-contrast and dark field imaging
EP3508887A1 (en) * 2018-01-09 2019-07-10 Koninklijke Philips N.V. Charge sharing calibration method and system
US10254163B1 (en) * 2018-03-15 2019-04-09 Kromek Group, PLC Interaction characteristics from a plurality of pixels
US10247834B1 (en) * 2018-08-15 2019-04-02 General Electric Company Anodes for improved detection of non-collected adjacent signal
EP3709059A1 (en) 2019-03-14 2020-09-16 Koninklijke Philips N.V. Charge sharing compensation with sampled discriminators
CN113794449B (zh) * 2021-09-16 2024-02-02 西北工业大学 一种静态功耗自动配置的低功耗前端读出电路及设计方法
CN114236627B (zh) * 2021-12-18 2024-11-22 中国人民解放军96901部队23分队 一种辐射源位置探测方法和装置

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3274704B2 (ja) * 1992-06-02 2002-04-15 オリンパス光学工業株式会社 固体撮像素子
DE19616545B4 (de) * 1996-04-25 2006-05-11 Siemens Ag Schneller Strahlungsdetektor
DE10240062A1 (de) * 2002-08-30 2004-03-11 Philips Intellectual Property & Standards Gmbh Detektoranordnung
CN1328598C (zh) * 2005-01-26 2007-07-25 上海大学 共面栅阳极碲锌镉探测器的制备方法
JP2009133823A (ja) * 2007-10-31 2009-06-18 Fujifilm Corp 放射線画像検出器および放射線位相画像撮影装置
KR101371604B1 (ko) * 2007-11-26 2014-03-06 삼성디스플레이 주식회사 액정 표시 장치
CN101569530B (zh) * 2008-04-30 2013-03-27 Ge医疗系统环球技术有限公司 X-射线检测器和x-射线ct设备
EP2294455B1 (en) * 2008-06-26 2015-07-22 Philips Intellectual Property & Standards GmbH High dynamic range x-ray detector with improved signal to noise ratio
US8405038B2 (en) * 2009-12-30 2013-03-26 General Electric Company Systems and methods for providing a shared charge in pixelated image detectors
US8466420B2 (en) * 2010-06-04 2013-06-18 General Electric Company Charge loss correction
CN103261914B (zh) * 2010-12-07 2016-03-23 皇家飞利浦电子股份有限公司 直接转换x射线探测器
BR112014004344A2 (pt) * 2011-08-30 2017-05-30 Koninklijke Philips Nv matriz detectora e método de detecção de maiores taxas de fluxo de fóton
CN103917897B (zh) * 2011-11-09 2016-08-17 皇家飞利浦有限公司 具有电荷排斥段间隙的辐射敏感探测器设备
WO2013088352A2 (en) * 2011-12-13 2013-06-20 Koninklijke Philips Electronics N.V. Radiation detector
EP2929373B1 (en) 2012-12-04 2019-04-03 Koninklijke Philips N.V. Photon counting x-ray detector
CN103280393A (zh) * 2013-05-30 2013-09-04 中国科学院西安光学精密机械研究所 交叉位敏阳极及应用其实现光子计数积分成像测量的方法

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