JP2018056157A - 成膜装置及び成膜方法 - Google Patents
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
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Abstract
【解決手段】本発明の成膜装置100は、基板に成膜処理を行う反応容器2と、反応容器からの排気ガスを外部に排出する排気装置46と、反応容器と排気装置との間を接続する配管に設けられ、反応容器の圧力を、弁体の位置により制御するバルブ42と、弁体を動作させる弁体駆動機構96と、弁体の閉位置を記憶する閉位置記憶部72と、弁体駆動機構により動作する弁体の位置を制御する開度制御部76と、弁体駆動機構の負荷を検出し、負荷が所定の基準値を超える時、閉位置を変更する閉位置変更部78と、を有するバルブ制御機構70と、を備える。
【選択図】図1
Description
本実施形態の成膜装置は、基板に成膜処理を行う反応容器と、反応容器からの排気ガスを外部に排出する排気装置と、反応容器と排気装置との間を接続する配管に設けられ、反応容器の圧力を、弁体の位置により制御するバルブと、弁体を動作させる弁体駆動機構と、弁体の閉位置を記憶する閉位置記憶部と、弁体駆動機構により動作する弁体の位置を制御する開度制御部と、弁体駆動機構の負荷を検出し、負荷が所定の基準値を超える時、閉位置を変更する閉位置変更部と、を有するバルブ制御機構と、を備える。
本実施形態の成膜装置は、バルブ50がニードルバルブである点で第1の実施形態の成膜装置と異なっている。ここで第1の実施形態と重複する記載は省略する。
本実施形態の成膜装置は、バルブ制御機構70が、停止時間検出部88と、制御パターン記憶部92と、をさらに備えることで、第1又は第2の実施形態の成膜装置と異なっている。ここで、第1又は第2の実施形態と重複する記載は省略する。
46 排気装置
50 バルブ
52 弁箱
54 弁体
60 制御機構
70 バルブ制御機構
72 閉位置記憶部
74 閉位置変更部
76 開度制御部
78 閉位置判断部
80 閉位置基準値記憶部
82 閉位置閾値判断部
84 閉位置閾値記憶部
88 停止時間検出部
92 制御パターン記憶部
96 弁体駆動機構
98 開度測定機構
100 成膜装置
200 成膜装置
Claims (5)
- 基板に成膜処理を行う反応容器と、
前記反応容器からの排気ガスを外部に排出する排気装置と、
前記反応容器と前記排気装置との間を接続する配管に設けられ、前記反応容器の圧力を、弁体の位置により制御するバルブと、
前記弁体を動作させる弁体駆動機構と、
前記弁体の閉位置を記憶する閉位置記憶部と、前記弁体駆動機構により動作する前記弁体の位置を制御する開度制御部と、前記弁体駆動機構の負荷を検出し、前記負荷が所定の基準値を超える時、前記閉位置を変更する閉位置変更部と、を有するバルブ制御機構と、
を備える成膜装置。 - 前記バルブ制御機構は、前記反応容器の圧力制御範囲の最小値から算出された前記閉位置の閾値に基づきメンテナンス要否を判断する閉位置閾値判断部をさらに有する請求項1記載の成膜装置。
- 前記バルブ制御機構は、前記弁体の動作が所定時間停止したことを検出すると、所定の時間間隔で前記弁体を動作させる、請求項1又は請求項2記載の成膜装置。
- 前記バルブ制御機構は、前記弁体を、前記反応容器の圧力制御が行われない間に、所定の時間間隔で動作させる、請求項1ないし請求項3いずれか一項記載の成膜装置。
- 基板が搬入された反応容器に所定の流量でプロセスガスを導入し、
前記反応容器の下流に設けられるバルブの弁体の位置により前記反応容器を所定の圧力に制御して前記基板上に成膜処理を行う成膜方法であって、
前記弁体の閉位置を記憶し、
前記弁体を動作させる弁体駆動部の負荷を検出し、
前記負荷が所定の基準値を超える時、前記閉位置を変更する、
成膜方法。
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JP2016186687A JP6744181B2 (ja) | 2016-09-26 | 2016-09-26 | 成膜装置及び成膜方法 |
US15/711,281 US10287707B2 (en) | 2016-09-26 | 2017-09-21 | Film growth apparatus, film growth method and maintenance method of film growth apparatus |
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JPWO2021060140A1 (ja) * | 2019-09-25 | 2021-04-01 | ||
WO2021060140A1 (ja) * | 2019-09-25 | 2021-04-01 | 株式会社Kokusai Electric | 基板処理装置および半導体装置の製造方法並びにプログラム |
JP7192141B2 (ja) | 2019-09-25 | 2022-12-19 | 株式会社Kokusai Electric | 基板処理装置および半導体装置の製造方法並びにプログラム |
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