JP2018036337A5 - - Google Patents

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Publication number
JP2018036337A5
JP2018036337A5 JP2016167334A JP2016167334A JP2018036337A5 JP 2018036337 A5 JP2018036337 A5 JP 2018036337A5 JP 2016167334 A JP2016167334 A JP 2016167334A JP 2016167334 A JP2016167334 A JP 2016167334A JP 2018036337 A5 JP2018036337 A5 JP 2018036337A5
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JP
Japan
Prior art keywords
objective lens
illumination light
optical path
objective
specimen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2016167334A
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English (en)
Japanese (ja)
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JP6980370B2 (ja
JP2018036337A (ja
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Priority to JP2016167334A priority Critical patent/JP6980370B2/ja
Priority claimed from JP2016167334A external-priority patent/JP6980370B2/ja
Priority to US15/683,980 priority patent/US10281699B2/en
Publication of JP2018036337A publication Critical patent/JP2018036337A/ja
Publication of JP2018036337A5 publication Critical patent/JP2018036337A5/ja
Application granted granted Critical
Publication of JP6980370B2 publication Critical patent/JP6980370B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2016167334A 2016-08-29 2016-08-29 顕微鏡システム Active JP6980370B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2016167334A JP6980370B2 (ja) 2016-08-29 2016-08-29 顕微鏡システム
US15/683,980 US10281699B2 (en) 2016-08-29 2017-08-23 Microscope system configured to irradiate focused light onto an area of a specimen outside of an optical axis of an objective lens

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016167334A JP6980370B2 (ja) 2016-08-29 2016-08-29 顕微鏡システム

Publications (3)

Publication Number Publication Date
JP2018036337A JP2018036337A (ja) 2018-03-08
JP2018036337A5 true JP2018036337A5 (enExample) 2019-11-07
JP6980370B2 JP6980370B2 (ja) 2021-12-15

Family

ID=61242347

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016167334A Active JP6980370B2 (ja) 2016-08-29 2016-08-29 顕微鏡システム

Country Status (2)

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US (1) US10281699B2 (enExample)
JP (1) JP6980370B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110653488A (zh) * 2019-10-16 2020-01-07 东南大学 一种跨尺度高分辨三维激光直写加工方法
CN120239815A (zh) * 2023-06-13 2025-07-01 深圳华大生命科学研究院 生物芯片的扫描成像系统

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3623613A1 (de) * 1986-07-12 1988-01-21 Zeiss Carl Fa Koaxiales beleuchtungssystem fuer operationsmikroskope
JP3584301B2 (ja) * 1996-03-12 2004-11-04 株式会社ニコン 顕微鏡用架台
JP3917731B2 (ja) 1996-11-21 2007-05-23 オリンパス株式会社 レーザ走査顕微鏡
US20030002148A1 (en) 1998-10-24 2003-01-02 Johann Engelhardt Arrangement for optically scanning an object
JP2003524194A (ja) 1998-10-24 2003-08-12 ライカ ミクロジュステムス ハイデルベルク ゲーエムベーハー 対象物を光学的に走査するための装置
US7170676B2 (en) * 2003-03-13 2007-01-30 Olympus Corporation Illumination switching apparatus and method
GB0608258D0 (en) * 2006-04-26 2006-06-07 Perkinelmer Singapore Pte Ltd Spectroscopy using attenuated total internal reflectance (ATR)
US8040597B2 (en) * 2006-05-16 2011-10-18 Olympus Corporation Illuminating device
JP2008225095A (ja) * 2007-03-13 2008-09-25 Olympus Corp 光走査型観察装置
JP2009058776A (ja) * 2007-08-31 2009-03-19 Olympus Corp フォーカシング光学系を有する光学系およびこれを用いたレーザ顕微鏡装置
DE102009028149B4 (de) * 2009-07-31 2011-12-08 Leica Instruments (Singapore) Pte. Ltd. Beleuchtungseinrichtung für ein Mikroskop
JP2011118069A (ja) * 2009-12-02 2011-06-16 Nikon Corp 顕微鏡用照明装置および顕微鏡
DE102012211943A1 (de) * 2012-07-09 2014-06-12 Carl Zeiss Microscopy Gmbh Mikroskop
US9036146B2 (en) * 2013-01-21 2015-05-19 Sciaps, Inc. Micro purge of plasma region
US20140333998A1 (en) * 2013-03-12 2014-11-13 Board Of Trustees, Southern Illinois University Micro-lens for high resolution microscopy
US10718931B2 (en) * 2014-12-23 2020-07-21 Apple Inc. Confocal inspection system having averaged illumination and averaged collection paths
JP6634263B2 (ja) 2015-10-16 2020-01-22 オリンパス株式会社 顕微鏡

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