WO2014191834A3 - Spectometer - Google Patents
Spectometer Download PDFInfo
- Publication number
- WO2014191834A3 WO2014191834A3 PCT/IB2014/001434 IB2014001434W WO2014191834A3 WO 2014191834 A3 WO2014191834 A3 WO 2014191834A3 IB 2014001434 W IB2014001434 W IB 2014001434W WO 2014191834 A3 WO2014191834 A3 WO 2014191834A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- focusing lens
- actuator assembly
- incident beam
- excitation source
- movable mirror
- Prior art date
Links
- 230000005284 excitation Effects 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/10—Scanning systems
- G02B26/101—Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J2003/4424—Fluorescence correction for Raman spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
- G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/02—Mechanical
- G01N2201/022—Casings
- G01N2201/0221—Portable; cableless; compact; hand-held
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Optics & Photonics (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Mechanical Optical Scanning Systems (AREA)
- Microscoopes, Condenser (AREA)
Abstract
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
BR112015029663-7A BR112015029663B1 (en) | 2013-05-31 | 2014-07-31 | spectrometer and method for moving a focused incident beam |
EP14804678.2A EP3004819A4 (en) | 2013-05-31 | 2014-07-31 | Spectrometer |
JP2016516259A JP6590793B2 (en) | 2013-05-31 | 2014-07-31 | Spectrometer and method for moving a focused incident beam of a spectrometer across the surface of a spectroscopic sample |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/907,812 US9791313B2 (en) | 2010-12-01 | 2013-05-31 | Spectrometer |
US13/907,812 | 2013-05-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2014191834A2 WO2014191834A2 (en) | 2014-12-04 |
WO2014191834A3 true WO2014191834A3 (en) | 2015-12-17 |
Family
ID=51989473
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/IB2014/001434 WO2014191834A2 (en) | 2013-05-31 | 2014-07-31 | Spectometer |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP3004819A4 (en) |
JP (1) | JP6590793B2 (en) |
BR (1) | BR112015029663B1 (en) |
WO (1) | WO2014191834A2 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9791313B2 (en) * | 2010-12-01 | 2017-10-17 | MKS Technology | Spectrometer |
DE102016010236A1 (en) * | 2016-08-23 | 2018-03-01 | Blickfeld GmbH | LIDAR SYSTEM WITH MOBILE FIBER |
DE102016010448B4 (en) * | 2016-08-30 | 2024-01-11 | Blickfeld GmbH | Fiber-based laser scanner |
JP7044498B2 (en) * | 2017-08-25 | 2022-03-30 | 日本信号株式会社 | Actuator |
WO2019231512A1 (en) * | 2018-05-30 | 2019-12-05 | Pendar Technologies, Llc | Methods and devices for standoff differential raman spectroscopy with increased eye safety and decreased risk of explosion |
EP3803293A4 (en) | 2018-05-30 | 2022-06-15 | Pendar Technologies, LLC | Methods and devices for standoff differential raman spectroscopy with increased eye safety and decreased risk of explosion |
CN109490279A (en) * | 2018-09-10 | 2019-03-19 | 桂林电子科技大学 | The rotary SPR sensorgram chip of D-shaped microtrabeculae mirror |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4265545A (en) * | 1979-07-27 | 1981-05-05 | Intec Corporation | Multiple source laser scanning inspection system |
US5825493A (en) * | 1996-06-28 | 1998-10-20 | Raytheon Company | Compact high resolution interferometer with short stroke reactionless drive |
US6501551B1 (en) * | 1991-04-29 | 2002-12-31 | Massachusetts Institute Of Technology | Fiber optic imaging endoscope interferometer with at least one faraday rotator |
US20060285109A1 (en) * | 2005-06-20 | 2006-12-21 | Odhner Jefferson E | Compact spectrometer |
US20090249521A1 (en) * | 2007-05-15 | 2009-10-01 | Dazzi A Dazzi | High frequency deflection measurement of IR absorption |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03180813A (en) * | 1989-12-08 | 1991-08-06 | Matsushita Electric Ind Co Ltd | Optical scanner |
DE69530072T2 (en) * | 1994-12-08 | 2004-03-04 | Molecular Dynamics, Sunnyvale | FLUORESCENT IMAGING SYSTEM USING A LENS WITH MACRO SCANNING |
US5646411A (en) * | 1996-02-01 | 1997-07-08 | Molecular Dynamics, Inc. | Fluorescence imaging system compatible with macro and micro scanning objectives |
DE19707225A1 (en) * | 1997-02-24 | 1998-08-27 | Bodenseewerk Perkin Elmer Co | Light scanner |
US6201628B1 (en) * | 1997-11-19 | 2001-03-13 | University Of Washington | High throughput optical scanner |
JP2000081587A (en) * | 1998-06-24 | 2000-03-21 | Fuji Photo Film Co Ltd | Main scanner |
JP2002372456A (en) * | 2001-06-13 | 2002-12-26 | Shimadzu Corp | Ir spectrophotometer |
DE102004006836A1 (en) * | 2003-04-15 | 2004-11-18 | E.On Ruhrgas Ag | Device and method for optically scanning media, objects or surfaces |
US10684172B2 (en) * | 2010-08-30 | 2020-06-16 | Keith Carron | Spectroscopic assays and tagging |
JP2013195264A (en) * | 2012-03-21 | 2013-09-30 | Nikon Corp | Spectroscope and microspectroscopic system |
-
2014
- 2014-07-31 WO PCT/IB2014/001434 patent/WO2014191834A2/en active Application Filing
- 2014-07-31 BR BR112015029663-7A patent/BR112015029663B1/en active IP Right Grant
- 2014-07-31 JP JP2016516259A patent/JP6590793B2/en active Active
- 2014-07-31 EP EP14804678.2A patent/EP3004819A4/en not_active Withdrawn
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4265545A (en) * | 1979-07-27 | 1981-05-05 | Intec Corporation | Multiple source laser scanning inspection system |
US6501551B1 (en) * | 1991-04-29 | 2002-12-31 | Massachusetts Institute Of Technology | Fiber optic imaging endoscope interferometer with at least one faraday rotator |
US5825493A (en) * | 1996-06-28 | 1998-10-20 | Raytheon Company | Compact high resolution interferometer with short stroke reactionless drive |
US20060285109A1 (en) * | 2005-06-20 | 2006-12-21 | Odhner Jefferson E | Compact spectrometer |
US20090249521A1 (en) * | 2007-05-15 | 2009-10-01 | Dazzi A Dazzi | High frequency deflection measurement of IR absorption |
Non-Patent Citations (1)
Title |
---|
See also references of EP3004819A4 * |
Also Published As
Publication number | Publication date |
---|---|
EP3004819A4 (en) | 2017-05-24 |
BR112015029663A2 (en) | 2017-07-25 |
JP2016530486A (en) | 2016-09-29 |
WO2014191834A2 (en) | 2014-12-04 |
BR112015029663B1 (en) | 2021-02-23 |
JP6590793B2 (en) | 2019-10-16 |
EP3004819A2 (en) | 2016-04-13 |
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