JP2018022813A5 - - Google Patents
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- Publication number
- JP2018022813A5 JP2018022813A5 JP2016154213A JP2016154213A JP2018022813A5 JP 2018022813 A5 JP2018022813 A5 JP 2018022813A5 JP 2016154213 A JP2016154213 A JP 2016154213A JP 2016154213 A JP2016154213 A JP 2016154213A JP 2018022813 A5 JP2018022813 A5 JP 2018022813A5
- Authority
- JP
- Japan
- Prior art keywords
- conveyance
- target device
- maintenance
- maintenance target
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012423 maintenance Methods 0.000 claims 5
- 238000005259 measurement Methods 0.000 claims 2
- 238000007689 inspection Methods 0.000 claims 1
- 239000000523 sample Substances 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016154213A JP2018022813A (ja) | 2016-08-05 | 2016-08-05 | プローバ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016154213A JP2018022813A (ja) | 2016-08-05 | 2016-08-05 | プローバ |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020024517A Division JP2020074496A (ja) | 2020-02-17 | 2020-02-17 | プローバ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2018022813A JP2018022813A (ja) | 2018-02-08 |
| JP2018022813A5 true JP2018022813A5 (enExample) | 2019-06-20 |
Family
ID=61164587
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016154213A Pending JP2018022813A (ja) | 2016-08-05 | 2016-08-05 | プローバ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2018022813A (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7361258B2 (ja) * | 2019-11-19 | 2023-10-16 | 株式会社東京精密 | プローバの組立方法及びティーチング治具 |
| JP7390934B2 (ja) * | 2020-03-03 | 2023-12-04 | 東京エレクトロン株式会社 | 検査装置 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5088167B2 (ja) * | 2008-02-22 | 2012-12-05 | 東京エレクトロン株式会社 | プローブ装置、プロービング方法及び記憶媒体 |
| JP2010157550A (ja) * | 2008-12-26 | 2010-07-15 | Toshiba Corp | ウエハテストシステム |
| JP6267928B2 (ja) * | 2013-10-29 | 2018-01-24 | 東京エレクトロン株式会社 | ウエハ検査装置の整備用台車及びウエハ検査装置の整備方法 |
| JP6271257B2 (ja) * | 2014-01-08 | 2018-01-31 | 東京エレクトロン株式会社 | 基板検査装置及びプローブカード搬送方法 |
-
2016
- 2016-08-05 JP JP2016154213A patent/JP2018022813A/ja active Pending
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