JP2018022813A - プローバ - Google Patents
プローバ Download PDFInfo
- Publication number
- JP2018022813A JP2018022813A JP2016154213A JP2016154213A JP2018022813A JP 2018022813 A JP2018022813 A JP 2018022813A JP 2016154213 A JP2016154213 A JP 2016154213A JP 2016154213 A JP2016154213 A JP 2016154213A JP 2018022813 A JP2018022813 A JP 2018022813A
- Authority
- JP
- Japan
- Prior art keywords
- test head
- pogo frame
- probe card
- unit
- pogo
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016154213A JP2018022813A (ja) | 2016-08-05 | 2016-08-05 | プローバ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016154213A JP2018022813A (ja) | 2016-08-05 | 2016-08-05 | プローバ |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020024517A Division JP2020074496A (ja) | 2020-02-17 | 2020-02-17 | プローバ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2018022813A true JP2018022813A (ja) | 2018-02-08 |
| JP2018022813A5 JP2018022813A5 (enExample) | 2019-06-20 |
Family
ID=61164587
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016154213A Pending JP2018022813A (ja) | 2016-08-05 | 2016-08-05 | プローバ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2018022813A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2021082695A (ja) * | 2019-11-19 | 2021-05-27 | 株式会社東京精密 | プローバの組立方法及びティーチング治具 |
| KR20210111681A (ko) * | 2020-03-03 | 2021-09-13 | 도쿄엘렉트론가부시키가이샤 | 검사 장치 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009200271A (ja) * | 2008-02-22 | 2009-09-03 | Tokyo Electron Ltd | プローブ装置、プロービング方法及び記憶媒体 |
| JP2010157550A (ja) * | 2008-12-26 | 2010-07-15 | Toshiba Corp | ウエハテストシステム |
| JP2015088555A (ja) * | 2013-10-29 | 2015-05-07 | 東京エレクトロン株式会社 | ウエハ検査装置の整備用台車及びウエハ検査装置の整備方法 |
| JP2015130422A (ja) * | 2014-01-08 | 2015-07-16 | 東京エレクトロン株式会社 | 基板検査装置及びプローブカード搬送方法 |
-
2016
- 2016-08-05 JP JP2016154213A patent/JP2018022813A/ja active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009200271A (ja) * | 2008-02-22 | 2009-09-03 | Tokyo Electron Ltd | プローブ装置、プロービング方法及び記憶媒体 |
| JP2010157550A (ja) * | 2008-12-26 | 2010-07-15 | Toshiba Corp | ウエハテストシステム |
| JP2015088555A (ja) * | 2013-10-29 | 2015-05-07 | 東京エレクトロン株式会社 | ウエハ検査装置の整備用台車及びウエハ検査装置の整備方法 |
| JP2015130422A (ja) * | 2014-01-08 | 2015-07-16 | 東京エレクトロン株式会社 | 基板検査装置及びプローブカード搬送方法 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2021082695A (ja) * | 2019-11-19 | 2021-05-27 | 株式会社東京精密 | プローバの組立方法及びティーチング治具 |
| KR20210111681A (ko) * | 2020-03-03 | 2021-09-13 | 도쿄엘렉트론가부시키가이샤 | 검사 장치 |
| US11486924B2 (en) | 2020-03-03 | 2022-11-01 | Tokyo Electron Limited | Inspection apparatus |
| KR102535047B1 (ko) * | 2020-03-03 | 2023-05-26 | 도쿄엘렉트론가부시키가이샤 | 검사 장치 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6447553B2 (ja) | プローバ | |
| JP7324992B2 (ja) | プローバ | |
| JP6071097B1 (ja) | プローバ | |
| JP6425027B2 (ja) | プローバ及びウエハチャック温度測定方法 | |
| JP2024038105A (ja) | プローバ | |
| JP2018022813A (ja) | プローバ | |
| JP6519780B2 (ja) | プローブカード型温度センサ | |
| JP7218495B2 (ja) | プローバ | |
| JP6575663B2 (ja) | プローブカード型温度センサ及びウエハチャック温度測定方法 | |
| JP6982774B2 (ja) | プローバ | |
| JP2022028823A (ja) | プローバ |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20190514 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20190514 |
|
| A871 | Explanation of circumstances concerning accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A871 Effective date: 20190514 |
|
| A975 | Report on accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A971005 Effective date: 20190905 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20190906 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20190910 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20191107 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20191119 |
|
| C60 | Trial request (containing other claim documents, opposition documents) |
Free format text: JAPANESE INTERMEDIATE CODE: C60 Effective date: 20200217 |
|
| C22 | Notice of designation (change) of administrative judge |
Free format text: JAPANESE INTERMEDIATE CODE: C22 Effective date: 20200731 |
|
| C22 | Notice of designation (change) of administrative judge |
Free format text: JAPANESE INTERMEDIATE CODE: C22 Effective date: 20200818 |
|
| C23 | Notice of termination of proceedings |
Free format text: JAPANESE INTERMEDIATE CODE: C23 Effective date: 20201112 |
|
| C03 | Trial/appeal decision taken |
Free format text: JAPANESE INTERMEDIATE CODE: C03 Effective date: 20201215 |
|
| C30A | Notification sent |
Free format text: JAPANESE INTERMEDIATE CODE: C3012 Effective date: 20201215 |