JP2018001296A - 研磨装置、研磨方法、及び研磨制御プログラム - Google Patents
研磨装置、研磨方法、及び研磨制御プログラム Download PDFInfo
- Publication number
- JP2018001296A JP2018001296A JP2016127611A JP2016127611A JP2018001296A JP 2018001296 A JP2018001296 A JP 2018001296A JP 2016127611 A JP2016127611 A JP 2016127611A JP 2016127611 A JP2016127611 A JP 2016127611A JP 2018001296 A JP2018001296 A JP 2018001296A
- Authority
- JP
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- Prior art keywords
- polishing
- film thickness
- measurement
- time
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005498 polishing Methods 0.000 title claims abstract description 191
- 238000000034 method Methods 0.000 title claims description 24
- 238000005259 measurement Methods 0.000 claims abstract description 105
- 238000012545 processing Methods 0.000 claims abstract description 95
- 239000004065 semiconductor Substances 0.000 abstract description 38
- 239000010408 film Substances 0.000 description 182
- 238000001514 detection method Methods 0.000 description 18
- 239000002184 metal Substances 0.000 description 18
- 229910052751 metal Inorganic materials 0.000 description 18
- 238000010586 diagram Methods 0.000 description 10
- 238000004891 communication Methods 0.000 description 9
- 230000010355 oscillation Effects 0.000 description 7
- 238000003860 storage Methods 0.000 description 5
- 230000007423 decrease Effects 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 230000003321 amplification Effects 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000001579 optical reflectometry Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/10—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving electrical means
- B24B49/105—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving electrical means using eddy currents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/013—Devices or means for detecting lapping completion
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/02—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/08—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving liquid or pneumatic means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/16—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the load
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016127611A JP2018001296A (ja) | 2016-06-28 | 2016-06-28 | 研磨装置、研磨方法、及び研磨制御プログラム |
TW106117866A TW201800183A (zh) | 2016-06-28 | 2017-05-31 | 研磨裝置、研磨方法、及研磨控制程式 |
KR1020170077095A KR20180002024A (ko) | 2016-06-28 | 2017-06-19 | 연마 장치, 연마 방법 및 연마 제어 프로그램 |
US15/633,464 US20170368661A1 (en) | 2016-06-28 | 2017-06-26 | Polishing apparatus, polishing method and polishing control program |
CN201710498753.3A CN107538338A (zh) | 2016-06-28 | 2017-06-27 | 研磨装置、研磨方法、及研磨控制程序 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016127611A JP2018001296A (ja) | 2016-06-28 | 2016-06-28 | 研磨装置、研磨方法、及び研磨制御プログラム |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018001296A true JP2018001296A (ja) | 2018-01-11 |
JP2018001296A5 JP2018001296A5 (enrdf_load_stackoverflow) | 2019-08-15 |
Family
ID=60675235
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016127611A Pending JP2018001296A (ja) | 2016-06-28 | 2016-06-28 | 研磨装置、研磨方法、及び研磨制御プログラム |
Country Status (5)
Country | Link |
---|---|
US (1) | US20170368661A1 (enrdf_load_stackoverflow) |
JP (1) | JP2018001296A (enrdf_load_stackoverflow) |
KR (1) | KR20180002024A (enrdf_load_stackoverflow) |
CN (1) | CN107538338A (enrdf_load_stackoverflow) |
TW (1) | TW201800183A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11534886B2 (en) | 2019-12-10 | 2022-12-27 | Kioxia Corporation | Polishing device, polishing head, polishing method, and method of manufacturing semiconductor device |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107363730A (zh) * | 2017-09-11 | 2017-11-21 | 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) | 涡流检测装置及系统 |
KR102708233B1 (ko) * | 2019-02-15 | 2024-09-23 | 주식회사 케이씨텍 | 기판 연마 시스템 |
AU2020253350A1 (en) | 2019-03-29 | 2021-10-28 | Saint-Gobain Abrasives, Inc. | Performance grinding solutions |
MX2021012071A (es) | 2019-04-03 | 2021-12-10 | Saint Gobain Abrasives Inc | Articulo abrasivo, sistema abrasivo y metodo para usarlos y formarlos. |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013252613A (ja) * | 2013-09-26 | 2013-12-19 | Nikon Corp | 終点検出装置および研磨装置 |
JP2014003063A (ja) * | 2012-06-15 | 2014-01-09 | Ebara Corp | 研磨方法 |
JP2015076449A (ja) * | 2013-10-07 | 2015-04-20 | 株式会社荏原製作所 | 研磨方法 |
JP2015519740A (ja) * | 2012-04-26 | 2015-07-09 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 研磨のインシトゥ監視時にデータをフィルタリングするための線形予測 |
JP2015156503A (ja) * | 2010-03-02 | 2015-08-27 | 株式会社荏原製作所 | 研磨監視方法、研磨監視装置、および研磨装置 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3932836B2 (ja) * | 2001-07-27 | 2007-06-20 | 株式会社日立製作所 | 薄膜の膜厚計測方法及びその装置並びにそれを用いたデバイスの製造方法 |
JP4542324B2 (ja) * | 2002-10-17 | 2010-09-15 | 株式会社荏原製作所 | 研磨状態監視装置及びポリッシング装置 |
JP5365091B2 (ja) * | 2008-08-18 | 2013-12-11 | 富士通株式会社 | メッキ厚算出プログラム、メッキ厚算出装置およびメッキ厚算出方法 |
AT10301U3 (de) * | 2008-09-01 | 2009-09-15 | Avl List Gmbh | Verfahren und regelanordnung zur regelung einer regelstrecke mit sich wiederholendem arbeitszyklus |
JP5980476B2 (ja) * | 2010-12-27 | 2016-08-31 | 株式会社荏原製作所 | ポリッシング装置およびポリッシング方法 |
CN103205665B (zh) * | 2012-01-13 | 2015-05-06 | 鞍钢股份有限公司 | 一种连续热镀锌线锌层厚度自动控制方法 |
US20140224425A1 (en) * | 2013-02-13 | 2014-08-14 | Kabushiki Kaisha Toshiba | Film thickness monitoring method, film thickness monitoring device, and semiconductor manufacturing apparatus |
KR102326730B1 (ko) * | 2014-03-12 | 2021-11-17 | 가부시키가이샤 에바라 세이사꾸쇼 | 막 두께 측정값의 보정 방법, 막 두께 보정기 및 와전류 센서 |
JP6423600B2 (ja) * | 2014-03-12 | 2018-11-14 | 株式会社荏原製作所 | 膜厚測定装置、及び、研磨装置 |
US20160074988A1 (en) * | 2014-09-11 | 2016-03-17 | Ebara Corporation | Processing module, processing apparatus, and processing method |
JP6399873B2 (ja) * | 2014-09-17 | 2018-10-03 | 株式会社荏原製作所 | 膜厚信号処理装置、研磨装置、膜厚信号処理方法、及び、研磨方法 |
CN104570729A (zh) * | 2014-11-24 | 2015-04-29 | 东北林业大学 | 一种改进型的Smith预估控制器 |
CN104741388B (zh) * | 2015-04-15 | 2016-10-19 | 东北大学 | 一种热连轧精轧厚度控制方法 |
CN105316613B (zh) * | 2015-10-13 | 2017-11-21 | 浙江中控研究院有限公司 | 一种基于变时滞偏差校正技术的锌层厚度控制方法和系统 |
-
2016
- 2016-06-28 JP JP2016127611A patent/JP2018001296A/ja active Pending
-
2017
- 2017-05-31 TW TW106117866A patent/TW201800183A/zh unknown
- 2017-06-19 KR KR1020170077095A patent/KR20180002024A/ko not_active Ceased
- 2017-06-26 US US15/633,464 patent/US20170368661A1/en not_active Abandoned
- 2017-06-27 CN CN201710498753.3A patent/CN107538338A/zh active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015156503A (ja) * | 2010-03-02 | 2015-08-27 | 株式会社荏原製作所 | 研磨監視方法、研磨監視装置、および研磨装置 |
JP2015519740A (ja) * | 2012-04-26 | 2015-07-09 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 研磨のインシトゥ監視時にデータをフィルタリングするための線形予測 |
JP2014003063A (ja) * | 2012-06-15 | 2014-01-09 | Ebara Corp | 研磨方法 |
JP2013252613A (ja) * | 2013-09-26 | 2013-12-19 | Nikon Corp | 終点検出装置および研磨装置 |
JP2015076449A (ja) * | 2013-10-07 | 2015-04-20 | 株式会社荏原製作所 | 研磨方法 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11534886B2 (en) | 2019-12-10 | 2022-12-27 | Kioxia Corporation | Polishing device, polishing head, polishing method, and method of manufacturing semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
TW201800183A (zh) | 2018-01-01 |
US20170368661A1 (en) | 2017-12-28 |
KR20180002024A (ko) | 2018-01-05 |
CN107538338A (zh) | 2018-01-05 |
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