JP2017511782A - ナノ粒子から作られた薄膜中のカーボンを低減するためのh2s反応性アニーリング - Google Patents
ナノ粒子から作られた薄膜中のカーボンを低減するためのh2s反応性アニーリング Download PDFInfo
- Publication number
- JP2017511782A JP2017511782A JP2016549235A JP2016549235A JP2017511782A JP 2017511782 A JP2017511782 A JP 2017511782A JP 2016549235 A JP2016549235 A JP 2016549235A JP 2016549235 A JP2016549235 A JP 2016549235A JP 2017511782 A JP2017511782 A JP 2017511782A
- Authority
- JP
- Japan
- Prior art keywords
- annealing
- cigs
- film
- temperature
- nanoparticles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000002105 nanoparticle Substances 0.000 title claims abstract description 79
- 238000000137 annealing Methods 0.000 title claims abstract description 73
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 title abstract description 9
- 229910052799 carbon Inorganic materials 0.000 title abstract description 9
- 239000010409 thin film Substances 0.000 title description 7
- 238000000034 method Methods 0.000 claims abstract description 66
- 239000012298 atmosphere Substances 0.000 claims abstract description 31
- 229910052717 sulfur Inorganic materials 0.000 claims abstract description 27
- 239000013078 crystal Substances 0.000 claims abstract description 23
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims abstract description 21
- 239000011593 sulfur Substances 0.000 claims abstract description 21
- 239000000758 substrate Substances 0.000 claims abstract description 19
- 239000002245 particle Substances 0.000 claims abstract description 6
- 239000011669 selenium Substances 0.000 claims description 38
- 229910052711 selenium Inorganic materials 0.000 claims description 14
- 239000002243 precursor Substances 0.000 claims description 13
- 229910052733 gallium Inorganic materials 0.000 claims description 12
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims description 11
- 239000010949 copper Substances 0.000 claims description 11
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 10
- 229910052738 indium Inorganic materials 0.000 claims description 10
- 238000000151 deposition Methods 0.000 claims description 9
- 238000004519 manufacturing process Methods 0.000 claims description 9
- 239000007789 gas Substances 0.000 claims description 8
- 229910052802 copper Inorganic materials 0.000 claims description 7
- 239000011521 glass Substances 0.000 claims description 7
- 230000008569 process Effects 0.000 claims description 7
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 6
- 239000012528 membrane Substances 0.000 claims description 6
- HVMJUDPAXRRVQO-UHFFFAOYSA-N copper indium Chemical compound [Cu].[In] HVMJUDPAXRRVQO-UHFFFAOYSA-N 0.000 claims description 5
- 229920000642 polymer Polymers 0.000 claims description 5
- 239000000725 suspension Substances 0.000 claims description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 4
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 claims description 4
- 150000003346 selenoethers Chemical class 0.000 claims description 4
- 230000003068 static effect Effects 0.000 claims description 4
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 3
- 230000008859 change Effects 0.000 claims description 3
- 230000008021 deposition Effects 0.000 claims description 3
- 229910052750 molybdenum Inorganic materials 0.000 claims description 3
- 239000011733 molybdenum Substances 0.000 claims description 3
- RWSOTUBLDIXVET-UHFFFAOYSA-N Dihydrogen sulfide Chemical compound S RWSOTUBLDIXVET-UHFFFAOYSA-N 0.000 claims description 2
- 229910000037 hydrogen sulfide Inorganic materials 0.000 claims description 2
- 230000008018 melting Effects 0.000 claims description 2
- 238000002844 melting Methods 0.000 claims description 2
- 229910000058 selane Inorganic materials 0.000 claims description 2
- 239000006096 absorbing agent Substances 0.000 abstract description 14
- 238000010438 heat treatment Methods 0.000 abstract description 5
- 239000000155 melt Substances 0.000 abstract description 4
- 239000010408 film Substances 0.000 description 64
- 239000000463 material Substances 0.000 description 17
- 239000000203 mixture Substances 0.000 description 16
- 239000004065 semiconductor Substances 0.000 description 7
- 238000009472 formulation Methods 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 229910052739 hydrogen Inorganic materials 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 239000003446 ligand Substances 0.000 description 3
- 239000003960 organic solvent Substances 0.000 description 3
- 238000001878 scanning electron micrograph Methods 0.000 description 3
- 238000005245 sintering Methods 0.000 description 3
- 239000002904 solvent Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 239000011230 binding agent Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 239000000806 elastomer Substances 0.000 description 2
- 229920001971 elastomer Polymers 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 239000012467 final product Substances 0.000 description 2
- -1 for example Chemical class 0.000 description 2
- HJOVHMDZYOCNQW-UHFFFAOYSA-N isophorone Chemical compound CC1=CC(=O)CC(C)(C)C1 HJOVHMDZYOCNQW-UHFFFAOYSA-N 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 238000003786 synthesis reaction Methods 0.000 description 2
- 238000010345 tape casting Methods 0.000 description 2
- ZMBHCYHQLYEYDV-UHFFFAOYSA-N trioctylphosphine oxide Chemical compound CCCCCCCCP(=O)(CCCCCCCC)CCCCCCCC ZMBHCYHQLYEYDV-UHFFFAOYSA-N 0.000 description 2
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 1
- BWGNESOTFCXPMA-UHFFFAOYSA-N Dihydrogen disulfide Chemical compound SS BWGNESOTFCXPMA-UHFFFAOYSA-N 0.000 description 1
- 229910016001 MoSe Inorganic materials 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 150000007824 aliphatic compounds Chemical class 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 150000001491 aromatic compounds Chemical class 0.000 description 1
- 238000000498 ball milling Methods 0.000 description 1
- 239000013590 bulk material Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- ZZEMEJKDTZOXOI-UHFFFAOYSA-N digallium;selenium(2-) Chemical compound [Ga+3].[Ga+3].[Se-2].[Se-2].[Se-2] ZZEMEJKDTZOXOI-UHFFFAOYSA-N 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000001548 drop coating Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000002803 fossil fuel Substances 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000006911 nucleation Effects 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 239000003755 preservative agent Substances 0.000 description 1
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 1
- 238000010791 quenching Methods 0.000 description 1
- 230000000171 quenching effect Effects 0.000 description 1
- 239000011541 reaction mixture Substances 0.000 description 1
- SPVXKVOXSXTJOY-UHFFFAOYSA-N selane Chemical compound [SeH2] SPVXKVOXSXTJOY-UHFFFAOYSA-N 0.000 description 1
- IRPLSAGFWHCJIQ-UHFFFAOYSA-N selanylidenecopper Chemical compound [Se]=[Cu] IRPLSAGFWHCJIQ-UHFFFAOYSA-N 0.000 description 1
- 150000003958 selenols Chemical class 0.000 description 1
- 238000004729 solvothermal method Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 125000004434 sulfur atom Chemical group 0.000 description 1
- 239000004034 viscosity adjusting agent Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/032—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
- H01L31/0322—Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312 comprising only AIBIIICVI chalcopyrite compounds, e.g. Cu In Se2, Cu Ga Se2, Cu In Ga Se2
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02568—Chalcogenide semiconducting materials not being oxides, e.g. ternary compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02587—Structure
- H01L21/0259—Microstructure
- H01L21/02601—Nanoparticles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/02623—Liquid deposition
- H01L21/02628—Liquid deposition using solutions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02167—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
- H01L31/1864—Annealing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Electromagnetism (AREA)
- Inorganic Chemistry (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Development (AREA)
- Sustainable Energy (AREA)
- Photovoltaic Devices (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Surface Treatment Of Glass (AREA)
Abstract
Description
この出願は、2014年1月31日に出願された米国仮特許出願第61/934495号の利益を主張する。
本発明は、概して、薄膜光起電力デバイスに関する。より具体的には、銅インジウムガリウムジセレニド/ジスルフィド(CIGS)をベースとする薄膜光起電力デバイスに関する。
本発明は、光起電力デバイスのCIGS吸収体層の作製を、CIGSナノ粒子前駆体の膜を堆積し(depositing)、アニーリングすることによって行なうシステム及び方法を提供する。開示される方法の利点は、膜からのカーボン成分の除去が向上し、より良好なデバイス性能が得られることである。開示される方法は、堆積されたCIGSナノ粒子膜を、反応性H2S雰囲気、及び/又は、H2SとH2Seの混合物を含む雰囲気中でアニーリングすることを含む。
この明細書で用いられる「CIGS」という用語は、周期表11族、13族及び16族の元素を含む材料のことを言う。一般的に、CIGS材料は、式Cu(In、Ga)(S,Se)2を有する。但し、化学量論は異なることがある。また、「CIGS」とは、例えば、Gaを含まない場合、CuInS2のような材料のことを言うものとする。この明細書で用いられる「CIGSナノ粒子インキ」という用語は、CIGS材料を成分として有するナノ粒子を含むインキのことを言う。
Claims (20)
- 銅インジウムガリウムスルフィド(セレニド)[CIGS]ナノ粒子を含有する膜を製造する方法であって、
CIGS前駆体の溶液又は懸濁液を基板上に堆積して膜を形成し、
前記膜を反応性イオウ含有雰囲気の中でアニーリングすることを含む、方法。 - 反応性イオウ含有雰囲気は、硫化水素ガス(H2S)を含む、請求項1に記載の方法。
- 反応性イオウ含有雰囲気は、セレニウムをさらに含む、請求項1に記載の方法。
- セレニウムは、セレン化水素ガス(H2Se)の形態である、請求項3に記載の方法。
- CIGS前駆体は、銅、インジウム及び/又はガリウム、並びにイオウ及び/又はセレニウムを含む、請求項1に記載の方法。
- 基板は、ガラスを含む、請求項1に記載の方法。
- ガラスは、モリブデンがコートされたガラスである、請求項6に記載の方法。
- アニーリングは、約200℃よりも高い温度で行われる、請求項1に記載の方法。
- アニーリング温度は、アニーリング工程中に変動する、請求項1に記載の方法。
- アニーリング温度は、第1の温度から、選択された変化率で、第2の温度へ変化される、請求項9に記載の方法。
- アニーリング温度を第2の温度で選択された時間保持し、次に、アニーリング温度を第3の温度に変化させることをさらに含む、請求項10に記載の方法。
- イオウ含有雰囲気は静的である、請求項1に記載の方法。
- イオウ含有雰囲気は動的である、請求項1に記載の方法。
- アニーリングの時間と温度は、粒子の溶融を生じさせてCIGS結晶を形成するのに十分なものである、請求項1に記載の方法。
- 反応性イオウ含有雰囲気中でアニーリングした後、セレニウム含有雰囲気の中で膜をアニーリングすることをさらに含む、請求項1に記載の方法。
- アニーリングは、チューブ炉の中で行なわれる、請求項1に記載の方法。
- 基板はポリマーであり、アニーリング温度は約500℃より低い温度である、請求項1に記載の方法。
- 基板はポリマーであり、アニーリング温度は約460℃より低い温度である、請求項17に記載の方法。
- 追加の堆積ステップ及びアニーリングステップにより、複数層の膜を形成することをさらに含む、請求項1に記載の方法。
- 複数層膜におけるインジウムとガリウムの比率は、膜内部の深さの関数として変動する、請求項19に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201461934495P | 2014-01-31 | 2014-01-31 | |
US61/934,495 | 2014-01-31 | ||
PCT/GB2015/050227 WO2015114356A1 (en) | 2014-01-31 | 2015-01-30 | H2s reactive anneal to reduce carbon in nanoparticle-derived thin films |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018143123A Division JP6619484B2 (ja) | 2014-01-31 | 2018-07-31 | ナノ粒子から作られた薄膜中のカーボンを低減するためのh2s反応性アニーリング |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2017511782A true JP2017511782A (ja) | 2017-04-27 |
Family
ID=52450516
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016549235A Pending JP2017511782A (ja) | 2014-01-31 | 2015-01-30 | ナノ粒子から作られた薄膜中のカーボンを低減するためのh2s反応性アニーリング |
JP2018143123A Expired - Fee Related JP6619484B2 (ja) | 2014-01-31 | 2018-07-31 | ナノ粒子から作られた薄膜中のカーボンを低減するためのh2s反応性アニーリング |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018143123A Expired - Fee Related JP6619484B2 (ja) | 2014-01-31 | 2018-07-31 | ナノ粒子から作られた薄膜中のカーボンを低減するためのh2s反応性アニーリング |
Country Status (7)
Country | Link |
---|---|
US (1) | US9887304B2 (ja) |
EP (1) | EP3100306A1 (ja) |
JP (2) | JP2017511782A (ja) |
KR (1) | KR101822147B1 (ja) |
CN (1) | CN105940500A (ja) |
TW (1) | TWI560891B (ja) |
WO (1) | WO2015114356A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101939114B1 (ko) * | 2016-09-27 | 2019-01-17 | 재단법인대구경북과학기술원 | 셀렌화 및 황화 열처리를 통한 셀렌 및 황의 조성이 조절된 박막 태양전지 광흡수층의 제조방법 및 상기 광흡수층을 함유한 박막 태양전지 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000058893A (ja) * | 1998-07-02 | 2000-02-25 | Internatl Solar Electric Technol Inc | 酸化物に基づき、化合物半導体膜を製造し、更に関連する電子デバイスを製造する方法 |
JP2009076842A (ja) * | 2007-09-18 | 2009-04-09 | Lg Electronics Inc | 太陽電池の薄膜組成用インクとその製造方法、これを利用したcigs薄膜型太陽電池、及びその製造方法 |
WO2013003439A1 (en) * | 2011-06-29 | 2013-01-03 | Nanosolar,Inc. | Multi-nary group ib and via based semiconductor |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8563348B2 (en) * | 2007-04-18 | 2013-10-22 | Nanoco Technologies Ltd. | Fabrication of electrically active films based on multiple layers |
WO2009068878A2 (en) * | 2007-11-30 | 2009-06-04 | Nanoco Technologies Limited | Preparation of nanoparticle material |
US8784701B2 (en) * | 2007-11-30 | 2014-07-22 | Nanoco Technologies Ltd. | Preparation of nanoparticle material |
US8802977B2 (en) * | 2008-05-09 | 2014-08-12 | International Business Machines Corporation | Techniques for enhancing performance of photovoltaic devices |
US7998789B1 (en) * | 2010-04-16 | 2011-08-16 | Jenn Feng New Energy Co., Ltd. | Method and system for forming copper indium gallium sulfur selenide absorption layer and cadmium sulfide buffer layer under non-vacuum condition |
WO2013033729A1 (en) * | 2011-09-02 | 2013-03-07 | Alliance For Sustainable Energy, Llc | Electrodepostion of gallium for photovoltaics |
US8551802B2 (en) * | 2011-09-12 | 2013-10-08 | Intermolecular, Inc. | Laser annealing for thin film solar cells |
US20130157407A1 (en) | 2011-12-20 | 2013-06-20 | Intermolecular, Inc. | APPARATUS FOR INLINE PROCESSING OF Cu(In,Ga)(Se,S)2 EMPLOYING A CHALCOGEN SOLUTION COATING MECHANISM |
US9018032B2 (en) * | 2012-04-13 | 2015-04-28 | Tsmc Solar Ltd. | CIGS solar cell structure and method for fabricating the same |
US9243340B2 (en) * | 2013-03-07 | 2016-01-26 | Nano And Advanced Materials Institute Limited | Non-vacuum method of manufacturing light-absorbing materials for solar cell application |
-
2015
- 2015-01-30 WO PCT/GB2015/050227 patent/WO2015114356A1/en active Application Filing
- 2015-01-30 TW TW104103328A patent/TWI560891B/zh not_active IP Right Cessation
- 2015-01-30 JP JP2016549235A patent/JP2017511782A/ja active Pending
- 2015-01-30 KR KR1020167020308A patent/KR101822147B1/ko active IP Right Grant
- 2015-01-30 CN CN201580006021.7A patent/CN105940500A/zh active Pending
- 2015-01-30 EP EP15702839.0A patent/EP3100306A1/en not_active Withdrawn
- 2015-01-30 US US14/610,895 patent/US9887304B2/en not_active Expired - Fee Related
-
2018
- 2018-07-31 JP JP2018143123A patent/JP6619484B2/ja not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000058893A (ja) * | 1998-07-02 | 2000-02-25 | Internatl Solar Electric Technol Inc | 酸化物に基づき、化合物半導体膜を製造し、更に関連する電子デバイスを製造する方法 |
JP2009076842A (ja) * | 2007-09-18 | 2009-04-09 | Lg Electronics Inc | 太陽電池の薄膜組成用インクとその製造方法、これを利用したcigs薄膜型太陽電池、及びその製造方法 |
WO2013003439A1 (en) * | 2011-06-29 | 2013-01-03 | Nanosolar,Inc. | Multi-nary group ib and via based semiconductor |
Also Published As
Publication number | Publication date |
---|---|
US9887304B2 (en) | 2018-02-06 |
CN105940500A (zh) | 2016-09-14 |
KR101822147B1 (ko) | 2018-01-25 |
KR20160103077A (ko) | 2016-08-31 |
US20150221795A1 (en) | 2015-08-06 |
TW201543694A (zh) | 2015-11-16 |
JP2018197188A (ja) | 2018-12-13 |
JP6619484B2 (ja) | 2019-12-11 |
TWI560891B (en) | 2016-12-01 |
WO2015114356A1 (en) | 2015-08-06 |
EP3100306A1 (en) | 2016-12-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US8410004B2 (en) | Chalcogenide absorber layers for photovoltaic applications and methods of manufacturing the same | |
JP6371764B2 (ja) | セレン化13族ナノ粒子 | |
US9466743B2 (en) | Copper-indium-gallium-chalcogenide nanoparticle precursors for thin-film solar cells | |
TWI609840B (zh) | 用於薄膜光伏打裝置之無機鹽-奈米粒子墨水及相關方法 | |
US20120122268A1 (en) | Selenization of precursor layer containing culns2 nanoparticles | |
JP5666836B2 (ja) | ジカルコゲナイドセレンインク、並びにその製造方法および使用方法 | |
WO2010138635A2 (en) | Thin films for photovoltaic cells | |
JP2011505449A (ja) | ナノ粒子材料の調製 | |
US20110076798A1 (en) | Dichalcogenide ink containing selenium and methods of making and using same | |
TWI644444B (zh) | 金屬摻雜之Cu(In,Ga)(S,Se)<sub>2</sub>奈米顆粒 | |
JP6302546B2 (ja) | 高いクラックフリー限界を有するcigsナノ粒子インキ調製物 | |
US20150024543A1 (en) | Preparation of Copper Selenide Nanoparticles | |
JP6619484B2 (ja) | ナノ粒子から作られた薄膜中のカーボンを低減するためのh2s反応性アニーリング | |
Carrete et al. | Spray‐deposited CuIn1− xGaxSe2 solar cell absorbers: Influence of spray deposition parameters and crystallization promoters | |
WO2015046876A2 (ko) | 3차원 p-n접합구조 태양전지 및 이의 제조방법 | |
KR101349852B1 (ko) | 나노입자 잉크를 이용한 태양전지용 박막의 제조 방법 및그 방법을 이용한 태양전지 | |
KR101541449B1 (ko) | 다공성 czts계 박막의 제조방법 | |
TWI675890B (zh) | 具有高無裂縫限度之cigs奈米粒子墨水調配物 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20170824 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20170905 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20171128 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20180205 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20180403 |