JP2017509500A5 - - Google Patents
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- Publication number
- JP2017509500A5 JP2017509500A5 JP2016558346A JP2016558346A JP2017509500A5 JP 2017509500 A5 JP2017509500 A5 JP 2017509500A5 JP 2016558346 A JP2016558346 A JP 2016558346A JP 2016558346 A JP2016558346 A JP 2016558346A JP 2017509500 A5 JP2017509500 A5 JP 2017509500A5
- Authority
- JP
- Japan
- Prior art keywords
- protrusions
- cmp
- elongated
- front surface
- conditioning segment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003750 conditioning effect Effects 0.000 claims 9
- 239000000758 substrate Substances 0.000 claims 5
- 239000000463 material Substances 0.000 claims 2
- 239000000126 substance Substances 0.000 claims 2
- 239000011248 coating agent Substances 0.000 claims 1
- 238000000576 coating method Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201461968846P | 2014-03-21 | 2014-03-21 | |
| US61/968,846 | 2014-03-21 | ||
| PCT/US2015/021679 WO2015143278A1 (en) | 2014-03-21 | 2015-03-20 | Chemical mechanical planarization pad conditioner with elongated cutting edges |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017509500A JP2017509500A (ja) | 2017-04-06 |
| JP2017509500A5 true JP2017509500A5 (OSRAM) | 2018-05-10 |
| JP6542793B2 JP6542793B2 (ja) | 2019-07-10 |
Family
ID=54145367
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016558346A Active JP6542793B2 (ja) | 2014-03-21 | 2015-03-20 | 長尺状の切削エッジを有する化学機械平坦化パッド・コンディショナ |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10293463B2 (OSRAM) |
| JP (1) | JP6542793B2 (OSRAM) |
| KR (1) | KR102304574B1 (OSRAM) |
| CN (1) | CN106463379B (OSRAM) |
| TW (1) | TWI666091B (OSRAM) |
| WO (1) | WO2015143278A1 (OSRAM) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10105812B2 (en) * | 2014-07-17 | 2018-10-23 | Applied Materials, Inc. | Polishing pad configuration and polishing pad support |
| WO2017119339A1 (ja) * | 2016-01-08 | 2017-07-13 | バンドー化学株式会社 | 研磨材 |
| DE112017001938T5 (de) * | 2016-04-06 | 2019-01-17 | M Cubed Technologies, Inc. | Diamantverbundwerkstoff-Konditionierer für ein CMP-Tuch |
| US10471567B2 (en) * | 2016-09-15 | 2019-11-12 | Entegris, Inc. | CMP pad conditioning assembly |
| US20180085891A1 (en) * | 2016-09-29 | 2018-03-29 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Apparatus for shaping the surface of chemical mechanical polishing pads |
| TWI621503B (zh) * | 2017-05-12 | 2018-04-21 | Kinik Company Ltd. | 化學機械研磨拋光墊修整器及其製造方法 |
| US20190351527A1 (en) * | 2018-05-17 | 2019-11-21 | Entegris, Inc. | Conditioner for chemical-mechanical-planarization pad and related methods |
| US12208487B2 (en) | 2018-10-29 | 2025-01-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | Chemical mechanical polishing apparatus and method |
| US11331767B2 (en) * | 2019-02-01 | 2022-05-17 | Micron Technology, Inc. | Pads for chemical mechanical planarization tools, chemical mechanical planarization tools, and related methods |
| SG11202108831UA (en) | 2019-02-13 | 2021-09-29 | 3M Innovative Properties Co | Abrasive elements with precisely shaped features, abrasive articles fabricated therefrom and methods of making thereof |
| KR20210137580A (ko) * | 2019-04-09 | 2021-11-17 | 엔테그리스, 아이엔씨. | 디스크를 위한 세그먼트 설계 |
| US11524385B2 (en) * | 2019-06-07 | 2022-12-13 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | CMP polishing pad with lobed protruding structures |
| GB2590511B (en) * | 2019-11-20 | 2023-10-25 | Best Engineered Surface Tech Llc | Hybrid CMP conditioning head |
| US12370648B2 (en) * | 2020-01-30 | 2025-07-29 | Taiwan Semiconductor Manufacturing Co., Ltd. | Surface clean system and method |
| US11833638B2 (en) * | 2020-03-25 | 2023-12-05 | Rohm and Haas Electronic Materials Holding, Inc. | CMP polishing pad with polishing elements on supports |
| JP2024535447A (ja) * | 2021-09-29 | 2024-09-30 | インテグリス・インコーポレーテッド | 両面パッドコンディショナー |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5527424A (en) * | 1995-01-30 | 1996-06-18 | Motorola, Inc. | Preconditioner for a polishing pad and method for using the same |
| US6302770B1 (en) * | 1998-07-28 | 2001-10-16 | Nikon Research Corporation Of America | In-situ pad conditioning for CMP polisher |
| JP2001157967A (ja) * | 1999-11-29 | 2001-06-12 | Mitsubishi Materials Corp | 単層砥石 |
| KR100387954B1 (ko) | 1999-10-12 | 2003-06-19 | (주) 휴네텍 | 연마패드용 컨디셔너와 이의 제조방법 |
| TW467802B (en) | 1999-10-12 | 2001-12-11 | Hunatech Co Ltd | Conditioner for polishing pad and method for manufacturing the same |
| US6390909B2 (en) * | 2000-04-03 | 2002-05-21 | Rodel Holdings, Inc. | Disk for conditioning polishing pads |
| JP2002337050A (ja) | 2001-03-13 | 2002-11-26 | Mitsubishi Materials Corp | Cmpコンディショナ |
| KR20050075280A (ko) | 2002-11-19 | 2005-07-20 | 가부시키가이샤 이시카와 세이사쿠쇼 | 화소제어 소자의 선택 전사 방법, 화소제어 소자의 선택전사 방법에 사용되는 화소제어 소자의 실장 장치,화소제어 소자 전사후의 배선 형성 방법, 및, 평면디스플레이 기판 |
| WO2004062851A1 (ja) * | 2003-01-15 | 2004-07-29 | Mitsubishi Materials Corporation | 軟質材加工用切削工具 |
| US7367872B2 (en) * | 2003-04-08 | 2008-05-06 | Applied Materials, Inc. | Conditioner disk for use in chemical mechanical polishing |
| CN1938128A (zh) | 2004-03-31 | 2007-03-28 | 三菱综合材料株式会社 | Cmp调节器 |
| US7799375B2 (en) | 2004-06-30 | 2010-09-21 | Poco Graphite, Inc. | Process for the manufacturing of dense silicon carbide |
| JP4145273B2 (ja) | 2004-07-14 | 2008-09-03 | 株式会社ノリタケスーパーアブレーシブ | Cmpパッドコンディショナー |
| US7066795B2 (en) * | 2004-10-12 | 2006-06-27 | Applied Materials, Inc. | Polishing pad conditioner with shaped abrasive patterns and channels |
| RU2430827C2 (ru) * | 2005-08-25 | 2011-10-10 | Хироси ИСИЗУКА | Инструмент с полирующей поверхностью из спеченного вещества и способ его изготовления |
| US7300338B2 (en) * | 2005-09-22 | 2007-11-27 | Abrasive Technology, Inc. | CMP diamond conditioning disk |
| TW200726582A (en) * | 2005-10-04 | 2007-07-16 | Mitsubishi Materials Corp | Rotary tool for processing flexible materials |
| JP4441552B2 (ja) | 2006-07-31 | 2010-03-31 | メゾテクダイヤ株式会社 | ダイヤモンドコンディショナ |
| US20170232576A1 (en) * | 2006-11-16 | 2017-08-17 | Chien-Min Sung | Cmp pad conditioners with mosaic abrasive segments and associated methods |
| US20080153398A1 (en) * | 2006-11-16 | 2008-06-26 | Chien-Min Sung | Cmp pad conditioners and associated methods |
| JP2008229820A (ja) * | 2007-03-23 | 2008-10-02 | Elpida Memory Inc | Cmp加工用のドレッサ及びcmp加工装置並びにcmp加工用の研磨パッドのドレッシング処理方法 |
| WO2009064677A2 (en) * | 2007-11-13 | 2009-05-22 | Chien-Min Sung | Cmp pad dressers |
| JP2009241200A (ja) * | 2008-03-31 | 2009-10-22 | Mitsubishi Materials Corp | Cmpコンディショナ |
| EP2474025A2 (en) * | 2009-09-01 | 2012-07-11 | Saint-Gobain Abrasives, Inc. | Chemical mechanical polishing conditioner |
| KR101091030B1 (ko) * | 2010-04-08 | 2011-12-09 | 이화다이아몬드공업 주식회사 | 감소된 마찰력을 갖는 패드 컨디셔너 제조방법 |
| SG184460A1 (en) | 2010-04-12 | 2012-11-29 | Ikonics Corp | Photoresist film and methods for abrasive etching and cutting |
| CN101972995B (zh) | 2010-06-08 | 2013-05-01 | 沈阳理工大学 | 一种仿生表面结构抛光垫及制造方法 |
| JP6133218B2 (ja) * | 2011-03-07 | 2017-05-24 | インテグリス・インコーポレーテッド | 化学機械平坦化パッドコンディショナー |
| KR101211138B1 (ko) | 2011-03-07 | 2012-12-11 | 이화다이아몬드공업 주식회사 | 연약패드용 컨디셔너 및 그 제조방법 |
| KR101144981B1 (ko) | 2011-05-17 | 2012-05-11 | 삼성전자주식회사 | Cmp 패드 컨디셔너 및 상기 cmp 패드 컨디셔너 제조방법 |
| CN110328616A (zh) | 2012-05-04 | 2019-10-15 | 恩特格里斯公司 | 具有超硬磨料增强的化学机械平坦化修整器衬垫 |
| TWI564116B (zh) * | 2013-08-12 | 2017-01-01 | Sapphire polishing pad dresser with multiple trimmed pellets |
-
2015
- 2015-03-20 WO PCT/US2015/021679 patent/WO2015143278A1/en not_active Ceased
- 2015-03-20 JP JP2016558346A patent/JP6542793B2/ja active Active
- 2015-03-20 KR KR1020167029446A patent/KR102304574B1/ko active Active
- 2015-03-20 CN CN201580026005.4A patent/CN106463379B/zh active Active
- 2015-03-20 US US15/128,021 patent/US10293463B2/en active Active
- 2015-03-23 TW TW104109176A patent/TWI666091B/zh active
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