JP2017227512A - 偏光測定装置 - Google Patents

偏光測定装置 Download PDF

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Publication number
JP2017227512A
JP2017227512A JP2016122947A JP2016122947A JP2017227512A JP 2017227512 A JP2017227512 A JP 2017227512A JP 2016122947 A JP2016122947 A JP 2016122947A JP 2016122947 A JP2016122947 A JP 2016122947A JP 2017227512 A JP2017227512 A JP 2017227512A
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Japan
Prior art keywords
polarized light
semiconductor
polarization
light source
sample
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JP2016122947A
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Japanese (ja)
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JP2017227512A5 (enExample
Inventor
悠佑 長井
Yusuke Nagai
悠佑 長井
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2016122947A priority Critical patent/JP2017227512A/ja
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JP2016122947A 2016-06-21 2016-06-21 偏光測定装置 Pending JP2017227512A (ja)

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JP2016122947A JP2017227512A (ja) 2016-06-21 2016-06-21 偏光測定装置

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JP2016122947A JP2017227512A (ja) 2016-06-21 2016-06-21 偏光測定装置

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JP2017227512A true JP2017227512A (ja) 2017-12-28
JP2017227512A5 JP2017227512A5 (enExample) 2018-11-08

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JP2016122947A Pending JP2017227512A (ja) 2016-06-21 2016-06-21 偏光測定装置

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117309774A (zh) * 2022-06-24 2023-12-29 中国科学院大连化学物理研究所 基于外差相位调制法的圆二色性光谱测量系统

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04501007A (ja) * 1989-10-06 1992-02-20 シーメンス アクチエンゲゼルシヤフト 光学活性物質の定量的決定方法および装置
JPH05203566A (ja) * 1991-08-28 1993-08-10 Siemens Ag 光学活性物質の濃度の定量的決定方法および装置
JPH08189814A (ja) * 1995-01-10 1996-07-23 Mitsubishi Electric Corp 光学式厚み測定装置
CN1154472A (zh) * 1995-10-31 1997-07-16 京都第一科学株式会社 光学测量设备/方法
JP2000162134A (ja) * 1998-12-01 2000-06-16 Nidek Co Ltd 表面検査装置
JP2004069453A (ja) * 2002-08-06 2004-03-04 Citizen Watch Co Ltd 濃度測定装置
US20090116012A1 (en) * 2007-11-02 2009-05-07 Scarpaci Jacob W Apparatus and methods for concentration determination using polorized light

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04501007A (ja) * 1989-10-06 1992-02-20 シーメンス アクチエンゲゼルシヤフト 光学活性物質の定量的決定方法および装置
JPH05203566A (ja) * 1991-08-28 1993-08-10 Siemens Ag 光学活性物質の濃度の定量的決定方法および装置
JPH08189814A (ja) * 1995-01-10 1996-07-23 Mitsubishi Electric Corp 光学式厚み測定装置
CN1154472A (zh) * 1995-10-31 1997-07-16 京都第一科学株式会社 光学测量设备/方法
JP2000162134A (ja) * 1998-12-01 2000-06-16 Nidek Co Ltd 表面検査装置
JP2004069453A (ja) * 2002-08-06 2004-03-04 Citizen Watch Co Ltd 濃度測定装置
US20090116012A1 (en) * 2007-11-02 2009-05-07 Scarpaci Jacob W Apparatus and methods for concentration determination using polorized light

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117309774A (zh) * 2022-06-24 2023-12-29 中国科学院大连化学物理研究所 基于外差相位调制法的圆二色性光谱测量系统

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