JP2017085089A5 - - Google Patents
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- Publication number
- JP2017085089A5 JP2017085089A5 JP2016195343A JP2016195343A JP2017085089A5 JP 2017085089 A5 JP2017085089 A5 JP 2017085089A5 JP 2016195343 A JP2016195343 A JP 2016195343A JP 2016195343 A JP2016195343 A JP 2016195343A JP 2017085089 A5 JP2017085089 A5 JP 2017085089A5
- Authority
- JP
- Japan
- Prior art keywords
- electrostatic chuck
- thermal
- base plate
- layer
- processing chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/875,473 | 2015-10-05 | ||
| US14/875,473 US9805963B2 (en) | 2015-10-05 | 2015-10-05 | Electrostatic chuck with thermal choke |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017085089A JP2017085089A (ja) | 2017-05-18 |
| JP2017085089A5 true JP2017085089A5 (enExample) | 2019-11-14 |
| JP6930826B2 JP6930826B2 (ja) | 2021-09-01 |
Family
ID=58448019
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016195343A Active JP6930826B2 (ja) | 2015-10-05 | 2016-10-03 | 熱閉塞体を備える静電チャック |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9805963B2 (enExample) |
| JP (1) | JP6930826B2 (enExample) |
| KR (1) | KR102648014B1 (enExample) |
| TW (1) | TWI717394B (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI635282B (zh) * | 2017-08-29 | 2018-09-11 | 創意電子股份有限公司 | 半導體元件之測試設備及其搬運裝置 |
| US11515130B2 (en) * | 2018-03-05 | 2022-11-29 | Applied Materials, Inc. | Fast response pedestal assembly for selective preclean |
| CN110911332B (zh) * | 2018-09-14 | 2022-11-25 | 北京北方华创微电子装备有限公司 | 静电卡盘 |
| JP7002014B2 (ja) * | 2018-10-30 | 2022-01-20 | Toto株式会社 | 静電チャック |
| JP7441404B2 (ja) * | 2019-03-05 | 2024-03-01 | Toto株式会社 | 静電チャック、および処理装置 |
| CN111668151B (zh) * | 2019-03-05 | 2024-06-25 | Toto株式会社 | 静电吸盘及处理装置 |
| WO2020185467A1 (en) * | 2019-03-08 | 2020-09-17 | Lam Research Corporation | Chuck for plasma processing chamber |
| KR102810211B1 (ko) * | 2019-06-07 | 2025-05-19 | 어플라이드 머티어리얼스, 인코포레이티드 | 심리스 전기 도관 |
| CN112768331B (zh) * | 2019-11-01 | 2023-09-29 | 中微半导体设备(上海)股份有限公司 | 一种等离子体处理装置及其下电极组件、静电卡盘 |
| JP7550551B2 (ja) * | 2020-06-30 | 2024-09-13 | 京セラ株式会社 | 静電チャック |
| US20220301914A1 (en) * | 2021-03-22 | 2022-09-22 | Tokyo Electron Limited | Electrostatic chuck for a plasma processing apparatus |
| JP7725614B2 (ja) * | 2021-05-14 | 2025-08-19 | アプライド マテリアルズ インコーポレイテッド | 高速排熱能力を備えた高温サセプタ |
| US20230069317A1 (en) * | 2021-08-25 | 2023-03-02 | Applied Materials, Inc. | Thermal choke plate |
| US11764094B2 (en) * | 2022-02-18 | 2023-09-19 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor processing tool and methods of operation |
| JP2023162983A (ja) * | 2022-04-27 | 2023-11-09 | 東京エレクトロン株式会社 | 基板処理方法及び基板処理装置 |
Family Cites Families (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07130826A (ja) * | 1993-11-01 | 1995-05-19 | Anelva Corp | 静電チャック |
| JPH07183277A (ja) * | 1993-12-21 | 1995-07-21 | Tokyo Electron Ltd | 処理装置 |
| JP3370489B2 (ja) * | 1995-08-31 | 2003-01-27 | 京セラ株式会社 | 静電チャック |
| US5835334A (en) * | 1996-09-30 | 1998-11-10 | Lam Research | Variable high temperature chuck for high density plasma chemical vapor deposition |
| US5983906A (en) | 1997-01-24 | 1999-11-16 | Applied Materials, Inc. | Methods and apparatus for a cleaning process in a high temperature, corrosive, plasma environment |
| KR19980071011A (ko) | 1997-01-24 | 1998-10-26 | 조셉 제이. 스위니 | 고온 및 고 흐름 속도의 화학적 기상 증착 장치 및 관련증착 방법 |
| US5841624A (en) | 1997-06-09 | 1998-11-24 | Applied Materials, Inc. | Cover layer for a substrate support chuck and method of fabricating same |
| US6081414A (en) | 1998-05-01 | 2000-06-27 | Applied Materials, Inc. | Apparatus for improved biasing and retaining of a workpiece in a workpiece processing system |
| US6219219B1 (en) | 1998-09-30 | 2001-04-17 | Applied Materials, Inc. | Cathode assembly containing an electrostatic chuck for retaining a wafer in a semiconductor wafer processing system |
| US6291777B1 (en) | 1999-02-17 | 2001-09-18 | Applied Materials, Inc. | Conductive feed-through for creating a surface electrode connection within a dielectric body and method of fabricating same |
| US6242360B1 (en) * | 1999-06-29 | 2001-06-05 | Lam Research Corporation | Plasma processing system apparatus, and method for delivering RF power to a plasma processing |
| KR20010111058A (ko) | 2000-06-09 | 2001-12-15 | 조셉 제이. 스위니 | 전체 영역 온도 제어 정전기 척 및 그 제조방법 |
| US6563686B2 (en) | 2001-03-19 | 2003-05-13 | Applied Materials, Inc. | Pedestal assembly with enhanced thermal conductivity |
| US7161121B1 (en) * | 2001-04-30 | 2007-01-09 | Lam Research Corporation | Electrostatic chuck having radial temperature control capability |
| US6669783B2 (en) | 2001-06-28 | 2003-12-30 | Lam Research Corporation | High temperature electrostatic chuck |
| US20030047283A1 (en) * | 2001-09-10 | 2003-03-13 | Applied Materials, Inc. | Apparatus for supporting a substrate and method of fabricating same |
| JP3881908B2 (ja) * | 2002-02-26 | 2007-02-14 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置 |
| US20040025791A1 (en) | 2002-08-09 | 2004-02-12 | Applied Materials, Inc. | Etch chamber with dual frequency biasing sources and a single frequency plasma generating source |
| US20040187787A1 (en) * | 2003-03-31 | 2004-09-30 | Dawson Keith E. | Substrate support having temperature controlled substrate support surface |
| US7697260B2 (en) | 2004-03-31 | 2010-04-13 | Applied Materials, Inc. | Detachable electrostatic chuck |
| US20060237138A1 (en) | 2005-04-26 | 2006-10-26 | Micron Technology, Inc. | Apparatuses and methods for supporting microelectronic devices during plasma-based fabrication processes |
| US8440049B2 (en) | 2006-05-03 | 2013-05-14 | Applied Materials, Inc. | Apparatus for etching high aspect ratio features |
| KR101312292B1 (ko) | 2006-12-11 | 2013-09-27 | 엘아이지에이디피 주식회사 | 플라즈마 처리장치의 기판 파손 방지장치 및 그 방법 |
| JP4944600B2 (ja) * | 2006-12-28 | 2012-06-06 | 新光電気工業株式会社 | 基板温調固定装置 |
| JP5203612B2 (ja) * | 2007-01-17 | 2013-06-05 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置 |
| US8149562B2 (en) * | 2007-03-09 | 2012-04-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | System for decharging a wafer or substrate after dechucking from an electrostatic chuck |
| EP2321846A4 (en) | 2008-08-12 | 2012-03-14 | Applied Materials Inc | ELECTROSTATIC FODDER ASSEMBLY |
| US20100116788A1 (en) * | 2008-11-12 | 2010-05-13 | Lam Research Corporation | Substrate temperature control by using liquid controlled multizone substrate support |
| JP5198226B2 (ja) * | 2008-11-20 | 2013-05-15 | 東京エレクトロン株式会社 | 基板載置台および基板処理装置 |
| JP5143184B2 (ja) | 2010-05-07 | 2013-02-13 | 日本碍子株式会社 | ウエハー載置装置の製造方法 |
| WO2012147931A1 (ja) * | 2011-04-27 | 2012-11-01 | 住友大阪セメント株式会社 | 静電チャック装置 |
| US9337067B2 (en) | 2011-05-13 | 2016-05-10 | Novellus Systems, Inc. | High temperature electrostatic chuck with radial thermal chokes |
| KR102068853B1 (ko) * | 2011-11-23 | 2020-01-22 | 램 리써치 코포레이션 | Rf 스트랩 입력을 갖는 대칭적 rf 리턴 및 주변 rf 피드 |
| US8941969B2 (en) | 2012-12-21 | 2015-01-27 | Applied Materials, Inc. | Single-body electrostatic chuck |
| JP6077301B2 (ja) * | 2012-12-28 | 2017-02-08 | 日本特殊陶業株式会社 | 静電チャック |
| TWI609991B (zh) * | 2013-06-05 | 2018-01-01 | 維克儀器公司 | 具有熱一致性改善特色的晶圓舟盒 |
| TW201518538A (zh) | 2013-11-11 | 2015-05-16 | Applied Materials Inc | 像素化冷卻溫度控制的基板支撐組件 |
-
2015
- 2015-10-05 US US14/875,473 patent/US9805963B2/en active Active
-
2016
- 2016-09-29 KR KR1020160125726A patent/KR102648014B1/ko active Active
- 2016-10-03 TW TW105131840A patent/TWI717394B/zh active
- 2016-10-03 JP JP2016195343A patent/JP6930826B2/ja active Active
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