JP2017009576A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2017009576A5 JP2017009576A5 JP2016064912A JP2016064912A JP2017009576A5 JP 2017009576 A5 JP2017009576 A5 JP 2017009576A5 JP 2016064912 A JP2016064912 A JP 2016064912A JP 2016064912 A JP2016064912 A JP 2016064912A JP 2017009576 A5 JP2017009576 A5 JP 2017009576A5
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- shield
- detection electrode
- detection probe
- measurement target
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims description 59
- 238000005259 measurement Methods 0.000 claims description 25
- 239000000523 sample Substances 0.000 claims description 24
- 238000003780 insertion Methods 0.000 claims description 13
- 230000037431 insertion Effects 0.000 claims description 13
- 239000004020 conductor Substances 0.000 claims description 10
- 239000011248 coating agent Substances 0.000 claims description 6
- 238000000576 coating method Methods 0.000 claims description 6
- 230000002093 peripheral effect Effects 0.000 claims description 5
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 239000000463 material Substances 0.000 claims 5
- 230000008878 coupling Effects 0.000 claims 3
- 238000010168 coupling process Methods 0.000 claims 3
- 238000005859 coupling reaction Methods 0.000 claims 3
- 238000009413 insulation Methods 0.000 claims 1
- 239000007769 metal material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP16175342.1A EP3115792B1 (en) | 2015-06-24 | 2016-06-20 | Voltage detecting probe and measuring device |
| US15/188,064 US10267829B2 (en) | 2015-06-24 | 2016-06-21 | Voltage detecting probe and measuring device |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015126138 | 2015-06-24 | ||
| JP2015126138 | 2015-06-24 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017009576A JP2017009576A (ja) | 2017-01-12 |
| JP2017009576A5 true JP2017009576A5 (https=) | 2017-06-08 |
| JP6636372B2 JP6636372B2 (ja) | 2020-01-29 |
Family
ID=57761358
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016064912A Active JP6636372B2 (ja) | 2015-06-24 | 2016-03-29 | 電圧検出プローブおよび測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP6636372B2 (https=) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018132346A (ja) * | 2017-02-14 | 2018-08-23 | 日置電機株式会社 | 電圧検出装置 |
| JP2018204963A (ja) * | 2017-05-30 | 2018-12-27 | 日置電機株式会社 | センサおよび測定装置 |
| JP6995601B2 (ja) * | 2017-12-12 | 2022-01-14 | 日置電機株式会社 | センサ |
| JP6965149B2 (ja) | 2017-12-25 | 2021-11-10 | 日置電機株式会社 | センサおよび測定装置 |
| JP2021177148A (ja) * | 2020-05-08 | 2021-11-11 | 日置電機株式会社 | センサ |
| JP2021177149A (ja) * | 2020-05-08 | 2021-11-11 | 日置電機株式会社 | センサ |
| JP7471994B2 (ja) * | 2020-10-13 | 2024-04-22 | 日置電機株式会社 | センサ |
| DE102021211206A1 (de) | 2020-10-13 | 2022-04-14 | Hioki E.E. Corporation | Sensor |
| JP7682060B2 (ja) * | 2020-10-13 | 2025-05-23 | 日置電機株式会社 | センサ |
| CN116660712A (zh) * | 2023-06-08 | 2023-08-29 | 福州大学 | 采用探针结构对Micro-LED芯片进行无接触巨量检测的方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5274336A (en) * | 1992-01-14 | 1993-12-28 | Hewlett-Packard Company | Capacitively-coupled test probe |
| JPH09211046A (ja) * | 1996-02-02 | 1997-08-15 | Hitachi Ltd | 非接触電位検出方法とその装置 |
| US6545483B1 (en) * | 2001-08-29 | 2003-04-08 | Sensor Technologies, Inc. | Analyzer sensor |
| US6756799B1 (en) * | 2002-04-18 | 2004-06-29 | Richard Bryon Seltzer | Multi-meter test lead system |
| JP5340817B2 (ja) * | 2009-06-11 | 2013-11-13 | 日置電機株式会社 | 電圧検出装置 |
-
2016
- 2016-03-29 JP JP2016064912A patent/JP6636372B2/ja active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2017009576A5 (https=) | ||
| US10041977B2 (en) | Voltage detecting probe and measuring device | |
| JP6495103B2 (ja) | 電圧検出プローブおよび測定装置 | |
| JP6636372B2 (ja) | 電圧検出プローブおよび測定装置 | |
| JP2016223866A5 (https=) | ||
| US10267829B2 (en) | Voltage detecting probe and measuring device | |
| JP6665007B2 (ja) | 電圧検出プローブおよび測定装置 | |
| JP2018132346A (ja) | 電圧検出装置 | |
| JP6965149B2 (ja) | センサおよび測定装置 | |
| JP6486765B2 (ja) | クランプ式センサおよび測定装置 | |
| JP2018204963A (ja) | センサおよび測定装置 | |
| TW201830033A (zh) | 用於非接觸式電壓測量裝置的傳感器子系統 | |
| CN103454476B (zh) | 测量仪器，尤其是电压检测器 | |
| JP6679408B2 (ja) | 電圧検出プローブおよび測定装置 | |
| JP4800804B2 (ja) | プローブおよび測定装置 | |
| KR20220056408A (ko) | 알파 입자의 펄스 검출을 통한 라돈 측정기 | |
| JP6608251B2 (ja) | 検出プローブおよび測定装置 | |
| JP6441122B2 (ja) | 端子ユニットおよび抵抗装置 | |
| TW201303304A (zh) | 檢測夾具 | |
| JP7471994B2 (ja) | センサ | |
| CN208188188U (zh) | 一种精密测量高频微电流的装置 | |
| JP2019052863A (ja) | 電圧検出プローブ、測定装置および基板検査装置 | |
| JP2006308388A (ja) | 検電装置 | |
| JP2021110577A (ja) | 検電ユニット装置 | |
| JP2025013712A (ja) | 測定機器 |