JP2016527517A5 - - Google Patents

Download PDF

Info

Publication number
JP2016527517A5
JP2016527517A5 JP2016531930A JP2016531930A JP2016527517A5 JP 2016527517 A5 JP2016527517 A5 JP 2016527517A5 JP 2016531930 A JP2016531930 A JP 2016531930A JP 2016531930 A JP2016531930 A JP 2016531930A JP 2016527517 A5 JP2016527517 A5 JP 2016527517A5
Authority
JP
Japan
Prior art keywords
probe
tool
assembly
socket
modification
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2016531930A
Other languages
English (en)
Japanese (ja)
Other versions
JP2016527517A (ja
JP6379197B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2014/049379 external-priority patent/WO2015017765A2/en
Publication of JP2016527517A publication Critical patent/JP2016527517A/ja
Publication of JP2016527517A5 publication Critical patent/JP2016527517A5/ja
Application granted granted Critical
Publication of JP6379197B2 publication Critical patent/JP6379197B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2016531930A 2013-08-01 2014-08-01 アセンブリを変更する装置及びそのための方法 Active JP6379197B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361861306P 2013-08-01 2013-08-01
US61/861,306 2013-08-01
PCT/US2014/049379 WO2015017765A2 (en) 2013-08-01 2014-08-01 Instrument changing assembly and methods for the same

Publications (3)

Publication Number Publication Date
JP2016527517A JP2016527517A (ja) 2016-09-08
JP2016527517A5 true JP2016527517A5 (https=) 2017-09-14
JP6379197B2 JP6379197B2 (ja) 2018-08-22

Family

ID=52432589

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016531930A Active JP6379197B2 (ja) 2013-08-01 2014-08-01 アセンブリを変更する装置及びそのための方法

Country Status (6)

Country Link
US (1) US9902027B2 (https=)
EP (1) EP3027365B1 (https=)
JP (1) JP6379197B2 (https=)
KR (1) KR101712028B1 (https=)
SG (1) SG11201600737TA (https=)
WO (1) WO2015017765A2 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6379197B2 (ja) 2013-08-01 2018-08-22 ハイジトロン, インク.Hysitron, Inc. アセンブリを変更する装置及びそのための方法
US10883908B2 (en) * 2017-03-13 2021-01-05 King Fahd University Of Petroleum And Minerals Stage for high temperature indentation test
EP3680736A1 (en) * 2019-01-14 2020-07-15 JOT Automation Oy Apparatus and method for testing electronic device
US12270792B2 (en) * 2021-06-12 2025-04-08 University of the District of Columbia Scratch tester for adhesion testing of coatings on surfaces
KR102918090B1 (ko) * 2022-11-14 2026-01-26 주식회사 노바 연료전지용 가스켓 접착력 검사모듈 및 이를 구비한 검사장치
KR102765238B1 (ko) 2024-03-11 2025-02-07 주식회사 바질바이오텍 과학수사를 위하여 gc-ms와 lc-ms를 이용한 기체 다성분 동시분석 기법

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5595707A (en) * 1990-03-02 1997-01-21 Ventana Medical Systems, Inc. Automated biological reaction apparatus
US5327657A (en) * 1991-07-11 1994-07-12 Renishaw Metrology Ltd. Touch probe
JP3266457B2 (ja) * 1995-05-25 2002-03-18 住友金属工業株式会社 自動ロックウェル硬さ試験機
JP3547143B2 (ja) 1997-07-22 2004-07-28 株式会社日立製作所 試料作製方法
JP3425383B2 (ja) * 1998-12-03 2003-07-14 株式会社島津製作所 走査型プローブ顕微鏡及びプローブホルダ
CA2476389A1 (en) 2002-03-22 2003-10-09 Electro Scientific Industries, Inc. Test probe alignment apparatus
US6756800B2 (en) 2002-04-16 2004-06-29 Teradyne, Inc. Semiconductor test system with easily changed interface unit
JP2004085387A (ja) * 2002-08-27 2004-03-18 Mitsutoyo Corp 測定装置
KR101339078B1 (ko) 2006-03-13 2013-12-09 아실럼 리서치 코포레이션 나노압입자
EP2237052A1 (en) * 2009-03-31 2010-10-06 Capres A/S Automated multi-point probe manipulation
GB201005252D0 (https=) * 2010-03-29 2010-05-12 Infinitesima Ltd
MY173918A (en) * 2011-02-10 2020-02-27 Hysitron Inc Nanomechanical testing system
JP6379197B2 (ja) 2013-08-01 2018-08-22 ハイジトロン, インク.Hysitron, Inc. アセンブリを変更する装置及びそのための方法
CH710648A1 (de) 2015-01-23 2016-07-29 Erowa Ag Messmaschine zum Vermessen von Werkstücken.

Similar Documents

Publication Publication Date Title
JP2016527517A5 (https=)
CN205023477U (zh) 一种物品移取与翻转的设备
JP2012515895A5 (https=)
CN204109297U (zh) 一种注塑机自动抓取机械手
EP2813855A3 (en) Automated multi-point probe manipulation, probe holder and probe cassette for multi-point probes
EP2799661A3 (en) Automatic drill rod handling
JP2016171107A5 (https=)
WO2014210083A3 (en) Probe-based data collection system with adaptive mode of probing controlled by local sample properties
CN104297078A (zh) 一种落球试验装置
KR101712028B1 (ko) 기구 교환 어셈블리 및 방법
CN104062141A (zh) 月壤钻探取心机构性能测试系统
CN102507231A (zh) 链式刀库及机械手可靠性试验装置及其方法
CN103075988A (zh) 一种磁瓦罩壳组件内径高度快速检测装置
CN204085489U (zh) 一种轮毂中心孔内径自动检测装置
CN107237621A (zh) 一种用于垂直管井勘探的地下空间无人测量装置
JP2016531767A5 (https=)
TWM472315U (zh) Ｌｅｄ晶片挑揀設備
CN204479521U (zh) 一种用于超声波法测量残余应力的配套装置
CN109298453B (zh) 一种深度探测非开挖深埋地下管线的方法及装置
CN203687985U (zh) 一种产品重量、尺寸半自动流水线式检测装置
CN110906832A (zh) 一种负压定位测量装置及其测量方法
CN209181828U (zh) 一种线轴检测系统
CN204179156U (zh) 一种蓄电池极群夹料入槽机构
CN112959316B (zh) 一种机器人机头效验治具及效验方法
CN204789727U (zh) 多功能电流测试用辅助设备