KR101712028B1 - 기구 교환 어셈블리 및 방법 - Google Patents

기구 교환 어셈블리 및 방법 Download PDF

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Publication number
KR101712028B1
KR101712028B1 KR1020167005442A KR20167005442A KR101712028B1 KR 101712028 B1 KR101712028 B1 KR 101712028B1 KR 1020167005442 A KR1020167005442 A KR 1020167005442A KR 20167005442 A KR20167005442 A KR 20167005442A KR 101712028 B1 KR101712028 B1 KR 101712028B1
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KR
South Korea
Prior art keywords
probe
assembly
instrument
exchange tool
tool
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KR1020167005442A
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English (en)
Korean (ko)
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KR20160030335A (ko
Inventor
라지브 다마
스베틀라나 지겔만
Original Assignee
하이지트론, 인코포레이티드
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Publication of KR20160030335A publication Critical patent/KR20160030335A/ko
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23P—METAL-WORKING NOT OTHERWISE PROVIDED FOR; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS
    • B23P19/00—Machines for simply fitting together or separating metal parts or objects, or metal and non-metal parts, whether or not involving some deformation; Tools or devices therefor so far as not provided for in other classes
    • B23P19/04—Machines for simply fitting together or separating metal parts or objects, or metal and non-metal parts, whether or not involving some deformation; Tools or devices therefor so far as not provided for in other classes for assembling or disassembling parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/40—Investigating hardness or rebound hardness
    • G01N3/42—Investigating hardness or rebound hardness by performing impressions under a steady load by indentors, e.g. sphere, pyramid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/36—DC mode
    • G01Q60/366—Nanoindenters, i.e. wherein the indenting force is measured
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/02—Probe holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23P—METAL-WORKING NOT OTHERWISE PROVIDED FOR; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS
    • B23P19/00—Machines for simply fitting together or separating metal parts or objects, or metal and non-metal parts, whether or not involving some deformation; Tools or devices therefor so far as not provided for in other classes
    • B23P19/10—Aligning parts to be fitted together
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N19/00—Investigating materials by mechanical methods
    • G01N19/04—Measuring adhesive force between materials, e.g. of sealing tape, of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058—Kind of property studied
    • G01N2203/0076—Hardness, compressibility or resistance to crushing
    • G01N2203/0078—Hardness, compressibility or resistance to crushing using indentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/0202—Control of the test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/0202—Control of the test
    • G01N2203/0206—Means for supplying or positioning specimens or exchangeable parts of the machine such as indenters...
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02—Details not specific for a particular testing method
    • G01N2203/026—Specifications of the specimen
    • G01N2203/0286—Miniature specimen; Testing on microregions of a specimen

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nanotechnology (AREA)
  • Mechanical Engineering (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measuring Leads Or Probes (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
KR1020167005442A 2013-08-01 2014-08-01 기구 교환 어셈블리 및 방법 Active KR101712028B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361861306P 2013-08-01 2013-08-01
US61/861,306 2013-08-01
PCT/US2014/049379 WO2015017765A2 (en) 2013-08-01 2014-08-01 Instrument changing assembly and methods for the same

Publications (2)

Publication Number Publication Date
KR20160030335A KR20160030335A (ko) 2016-03-16
KR101712028B1 true KR101712028B1 (ko) 2017-03-03

Family

ID=52432589

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020167005442A Active KR101712028B1 (ko) 2013-08-01 2014-08-01 기구 교환 어셈블리 및 방법

Country Status (6)

Country Link
US (1) US9902027B2 (https=)
EP (1) EP3027365B1 (https=)
JP (1) JP6379197B2 (https=)
KR (1) KR101712028B1 (https=)
SG (1) SG11201600737TA (https=)
WO (1) WO2015017765A2 (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9902027B2 (en) 2013-08-01 2018-02-27 Hysitron, Inc. Instrument changing assembly and methods
KR20240070253A (ko) * 2022-11-14 2024-05-21 주식회사 노바 연료전지용 가스켓 접착력 검사모듈 및 이를 구비한 검사장치

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10883908B2 (en) * 2017-03-13 2021-01-05 King Fahd University Of Petroleum And Minerals Stage for high temperature indentation test
EP3680736A1 (en) * 2019-01-14 2020-07-15 JOT Automation Oy Apparatus and method for testing electronic device
US12270792B2 (en) * 2021-06-12 2025-04-08 University of the District of Columbia Scratch tester for adhesion testing of coatings on surfaces
KR102765238B1 (ko) 2024-03-11 2025-02-07 주식회사 바질바이오텍 과학수사를 위하여 gc-ms와 lc-ms를 이용한 기체 다성분 동시분석 기법

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005521066A (ja) 2002-03-22 2005-07-14 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド 試験プローブ整列装置
JP2005523453A (ja) 2002-04-16 2005-08-04 テラダイン・インコーポレーテッド 簡単に交換できるインターフェースユニットを備えた半導体試験システム
JP2014041141A (ja) 2011-02-10 2014-03-06 Hysitron Inc ナノメカニカルテストシステム
JP2016176923A (ja) 2015-01-23 2016-10-06 エロワ アーゲーＥｒｏｗａ Ａｇ ワークピースを測定するための測定機

Family Cites Families (10)

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US5595707A (en) * 1990-03-02 1997-01-21 Ventana Medical Systems, Inc. Automated biological reaction apparatus
US5327657A (en) * 1991-07-11 1994-07-12 Renishaw Metrology Ltd. Touch probe
JP3266457B2 (ja) * 1995-05-25 2002-03-18 住友金属工業株式会社 自動ロックウェル硬さ試験機
JP3547143B2 (ja) 1997-07-22 2004-07-28 株式会社日立製作所 試料作製方法
JP3425383B2 (ja) * 1998-12-03 2003-07-14 株式会社島津製作所 走査型プローブ顕微鏡及びプローブホルダ
JP2004085387A (ja) * 2002-08-27 2004-03-18 Mitsutoyo Corp 測定装置
KR101339078B1 (ko) 2006-03-13 2013-12-09 아실럼 리서치 코포레이션 나노압입자
EP2237052A1 (en) * 2009-03-31 2010-10-06 Capres A/S Automated multi-point probe manipulation
GB201005252D0 (https=) * 2010-03-29 2010-05-12 Infinitesima Ltd
JP6379197B2 (ja) 2013-08-01 2018-08-22 ハイジトロン, インク.Hysitron, Inc. アセンブリを変更する装置及びそのための方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005521066A (ja) 2002-03-22 2005-07-14 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド 試験プローブ整列装置
JP2005523453A (ja) 2002-04-16 2005-08-04 テラダイン・インコーポレーテッド 簡単に交換できるインターフェースユニットを備えた半導体試験システム
JP2014041141A (ja) 2011-02-10 2014-03-06 Hysitron Inc ナノメカニカルテストシステム
JP2016176923A (ja) 2015-01-23 2016-10-06 エロワ アーゲーＥｒｏｗａ Ａｇ ワークピースを測定するための測定機

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9902027B2 (en) 2013-08-01 2018-02-27 Hysitron, Inc. Instrument changing assembly and methods
KR20240070253A (ko) * 2022-11-14 2024-05-21 주식회사 노바 연료전지용 가스켓 접착력 검사모듈 및 이를 구비한 검사장치
KR102918090B1 (ko) * 2022-11-14 2026-01-26 주식회사 노바 연료전지용 가스켓 접착력 검사모듈 및 이를 구비한 검사장치

Also Published As

Publication number Publication date
JP2016527517A (ja) 2016-09-08
EP3027365A2 (en) 2016-06-08
KR20160030335A (ko) 2016-03-16
US20160169718A1 (en) 2016-06-16
US9902027B2 (en) 2018-02-27
WO2015017765A2 (en) 2015-02-05
SG11201600737TA (en) 2016-02-26
EP3027365A4 (en) 2017-02-15
EP3027365B1 (en) 2018-05-23
JP6379197B2 (ja) 2018-08-22
WO2015017765A3 (en) 2015-10-15

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