JP2016524155A5 - - Google Patents

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Publication number
JP2016524155A5
JP2016524155A5 JP2016524217A JP2016524217A JP2016524155A5 JP 2016524155 A5 JP2016524155 A5 JP 2016524155A5 JP 2016524217 A JP2016524217 A JP 2016524217A JP 2016524217 A JP2016524217 A JP 2016524217A JP 2016524155 A5 JP2016524155 A5 JP 2016524155A5
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measurement
target structure
target
background
contrast
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JP2016524217A
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Japanese (ja)
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JP6602755B2 (ja
JP2016524155A (ja
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Priority claimed from PCT/US2014/044440 external-priority patent/WO2014210381A1/en
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JP2016524217A 2013-06-27 2014-06-26 計測標的の偏光測定及び対応する標的設計 Active JP6602755B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201361840339P 2013-06-27 2013-06-27
US61/840,339 2013-06-27
US201361916018P 2013-12-13 2013-12-13
US61/916,018 2013-12-13
PCT/US2014/044440 WO2014210381A1 (en) 2013-06-27 2014-06-26 Polarization measurements of metrology targets and corresponding target designs

Related Child Applications (1)

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JP2019186136A Division JP6875483B2 (ja) 2013-06-27 2019-10-09 計測標的の偏光測定及び対応する標的設計

Publications (3)

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JP2016524155A JP2016524155A (ja) 2016-08-12
JP2016524155A5 true JP2016524155A5 (enExample) 2017-08-03
JP6602755B2 JP6602755B2 (ja) 2019-11-06

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JP2016524217A Active JP6602755B2 (ja) 2013-06-27 2014-06-26 計測標的の偏光測定及び対応する標的設計
JP2019186136A Active JP6875483B2 (ja) 2013-06-27 2019-10-09 計測標的の偏光測定及び対応する標的設計

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US (2) US10458777B2 (enExample)
JP (2) JP6602755B2 (enExample)
KR (2) KR102252341B1 (enExample)
CN (2) CN105408721B (enExample)
TW (1) TWI675998B (enExample)
WO (1) WO2014210381A1 (enExample)

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KR102767520B1 (ko) * 2022-10-12 2025-02-14 (주)힉스컴퍼니 디지털 홀로그래픽 현미경을 제어하는 방법 및 장치
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