JP2016514332A5 - - Google Patents

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Publication number
JP2016514332A5
JP2016514332A5 JP2016501029A JP2016501029A JP2016514332A5 JP 2016514332 A5 JP2016514332 A5 JP 2016514332A5 JP 2016501029 A JP2016501029 A JP 2016501029A JP 2016501029 A JP2016501029 A JP 2016501029A JP 2016514332 A5 JP2016514332 A5 JP 2016514332A5
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JP
Japan
Prior art keywords
clock
delay line
detecting
monotonic
tampering
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2016501029A
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English (en)
Japanese (ja)
Other versions
JP2016514332A (ja
JP6169776B2 (ja
Filing date
Publication date
Priority claimed from US13/801,375 external-priority patent/US9607153B2/en
Application filed filed Critical
Publication of JP2016514332A publication Critical patent/JP2016514332A/ja
Publication of JP2016514332A5 publication Critical patent/JP2016514332A5/ja
Application granted granted Critical
Publication of JP6169776B2 publication Critical patent/JP6169776B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2016501029A 2013-03-13 2014-03-10 クロック改竄を検出するための装置および方法 Expired - Fee Related JP6169776B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/801,375 2013-03-13
US13/801,375 US9607153B2 (en) 2013-03-13 2013-03-13 Apparatus and method for detecting clock tampering
PCT/US2014/022655 WO2014164512A1 (en) 2013-03-13 2014-03-10 Apparatus and method for detecting clock tampering

Publications (3)

Publication Number Publication Date
JP2016514332A JP2016514332A (ja) 2016-05-19
JP2016514332A5 true JP2016514332A5 (enExample) 2017-06-29
JP6169776B2 JP6169776B2 (ja) 2017-07-26

Family

ID=50439495

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016501029A Expired - Fee Related JP6169776B2 (ja) 2013-03-13 2014-03-10 クロック改竄を検出するための装置および方法

Country Status (6)

Country Link
US (1) US9607153B2 (enExample)
EP (1) EP2973196A1 (enExample)
JP (1) JP6169776B2 (enExample)
KR (1) KR101811228B1 (enExample)
CN (1) CN105103160B (enExample)
WO (1) WO2014164512A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9306751B2 (en) * 2013-04-30 2016-04-05 Kathie Wilson Secure time and crypto system
US9223960B1 (en) * 2014-07-31 2015-12-29 Winbond Electronics Corporation State-machine clock tampering detection
US10148258B2 (en) * 2016-09-28 2018-12-04 Mellanox Technologies, Ltd. Power supply voltage monitoring and high-resolution adaptive clock stretching circuit
CN108073831B (zh) * 2016-11-15 2020-07-24 华为技术有限公司 一种检测安全芯片工作状态的方法及检测电路
US20190050570A1 (en) * 2017-08-14 2019-02-14 Qualcomm Incorporated Computer resource access control based on the state of a non-accessing component
EP3506548A1 (en) * 2017-12-27 2019-07-03 Secure-IC SAS Quantitative digital sensor
WO2020213334A1 (ja) * 2019-04-17 2020-10-22 ローム株式会社 同期リセット信号生成回路及びデジタル処理装置
CN114586034B (zh) 2019-11-19 2025-10-17 谷歌有限责任公司 时钟波动下的电压变化检测

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4686677A (en) 1985-08-02 1987-08-11 Unisys Corporation Apparatus and method for detecting time-related faults
JPS6379121A (ja) * 1986-09-24 1988-04-09 Nec Corp クロツク分配システム
US5521499A (en) 1992-12-23 1996-05-28 Comstream Corporation Signal controlled phase shifter
JPH0784667A (ja) * 1993-09-14 1995-03-31 Fujitsu Ltd クロックドライバの異常監視方法及び装置
ATE340391T1 (de) * 2000-06-12 2006-10-15 Supersensor Proprietary Ltd Leser für unterschiedliche seitenbänder in einem elektronisches identifizierungssystem
GB2397709B (en) * 2003-01-27 2005-12-28 Evangelos Arkas Period-to-digital converter
EP1514166B1 (en) 2003-04-15 2012-01-11 NDS Limited Secure clock
US7233182B1 (en) * 2004-12-10 2007-06-19 Marvell International Ltd. Circuitry for eliminating false lock in delay-locked loops
EP2002271B1 (en) 2006-03-27 2010-05-26 Freescale Semiconductor, Inc. Apparatus for detecting clock failure and method therefor
TWI329995B (en) * 2006-09-29 2010-09-01 Via Tech Inc Lock detecting circuit and method for phase lock loop systems
WO2010048720A1 (en) * 2008-10-31 2010-05-06 Certicom Corp. System for detecting a reset condition in an electronic circuit
US7971105B2 (en) 2009-01-16 2011-06-28 Freescale Semiconductor, Inc. Device and method for detecting and correcting timing errors
GB0911046D0 (en) 2009-06-25 2009-08-12 St Microelectronics Res & Dev Detection of bad clock conditions
US8624647B2 (en) 2010-01-19 2014-01-07 Altera Corporation Duty cycle correction circuit for memory interfaces in integrated circuits
US20110299678A1 (en) 2010-06-07 2011-12-08 Alexander Roger Deas Secure means for generating a specific key from unrelated parameters
JP2013187817A (ja) * 2012-03-09 2013-09-19 Advantest Corp 測定装置、測定方法およびプログラム
US9323957B2 (en) * 2013-03-01 2016-04-26 Marvell World Trade Ltd. Anti-tamper system based on dual random bits generators for integrated circuits
US9819933B2 (en) * 2013-10-18 2017-11-14 Alcatel Lucent Automated testing of media devices

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