JP2016152909A5 - - Google Patents

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JP2016152909A5
JP2016152909A5 JP2016016609A JP2016016609A JP2016152909A5 JP 2016152909 A5 JP2016152909 A5 JP 2016152909A5 JP 2016016609 A JP2016016609 A JP 2016016609A JP 2016016609 A JP2016016609 A JP 2016016609A JP 2016152909 A5 JP2016152909 A5 JP 2016152909A5
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Japan
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irradiation field
limited
limited irradiation
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density distribution
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JP2016016609A
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Japanese (ja)
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JP2016152909A (ja
JP6925779B2 (ja
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Priority claimed from US14/611,865 external-priority patent/US9936926B2/en
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JP2016016609A 2015-02-02 2016-01-29 小照射野x線撮影システム及び方法 Active JP6925779B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/611,865 2015-02-02
US14/611,865 US9936926B2 (en) 2015-02-02 2015-02-02 System and method of small field of view X-ray imaging

Publications (3)

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JP2016152909A JP2016152909A (ja) 2016-08-25
JP2016152909A5 true JP2016152909A5 (enExample) 2021-01-21
JP6925779B2 JP6925779B2 (ja) 2021-08-25

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JP2016016609A Active JP6925779B2 (ja) 2015-02-02 2016-01-29 小照射野x線撮影システム及び方法

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US (2) US9936926B2 (enExample)
EP (1) EP3053523B1 (enExample)
JP (1) JP6925779B2 (enExample)
KR (2) KR20160094880A (enExample)
CN (1) CN105832355B (enExample)
FI (1) FI3053523T3 (enExample)

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* Cited by examiner, † Cited by third party
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US9936926B2 (en) * 2015-02-02 2018-04-10 Palodex Group Oy System and method of small field of view X-ray imaging
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