JP2016096139A5 - - Google Patents

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Publication number
JP2016096139A5
JP2016096139A5 JP2015220021A JP2015220021A JP2016096139A5 JP 2016096139 A5 JP2016096139 A5 JP 2016096139A5 JP 2015220021 A JP2015220021 A JP 2015220021A JP 2015220021 A JP2015220021 A JP 2015220021A JP 2016096139 A5 JP2016096139 A5 JP 2016096139A5
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JP
Japan
Prior art keywords
charged particle
particle beam
separation unit
detector
plane
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JP2015220021A
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English (en)
Japanese (ja)
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JP2016096139A (ja
JP6153988B2 (ja
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Priority claimed from US14/538,338 external-priority patent/US9330884B1/en
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Publication of JP2016096139A5 publication Critical patent/JP2016096139A5/ja
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JP2015220021A 2014-11-11 2015-11-10 荷電粒子ビーム装置を作動させる方法及び荷電粒子ビーム装置 Active JP6153988B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/538,338 2014-11-11
US14/538,338 US9330884B1 (en) 2014-11-11 2014-11-11 Dome detection for charged particle beam device

Publications (3)

Publication Number Publication Date
JP2016096139A JP2016096139A (ja) 2016-05-26
JP2016096139A5 true JP2016096139A5 (enExample) 2016-07-07
JP6153988B2 JP6153988B2 (ja) 2017-06-28

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JP2015220021A Active JP6153988B2 (ja) 2014-11-11 2015-11-10 荷電粒子ビーム装置を作動させる方法及び荷電粒子ビーム装置

Country Status (3)

Country Link
US (1) US9330884B1 (enExample)
JP (1) JP6153988B2 (enExample)
TW (1) TWI576887B (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018220809A1 (ja) * 2017-06-02 2018-12-06 株式会社日立ハイテクノロジーズ 荷電粒子線装置
US10345250B2 (en) * 2017-10-12 2019-07-09 Applied Materials, Inc. Method of inspecting a sample with a charged particle beam device, and charged particle beam device
US10504687B2 (en) * 2018-02-20 2019-12-10 Technische Universiteit Delft Signal separator for a multi-beam charged particle inspection apparatus
TWI821618B (zh) * 2019-12-19 2023-11-11 荷蘭商Ａｓｍｌ荷蘭公司 藉由多光束裝置執行以形成樣本之影像的方法及相關的多光束裝置
WO2022064628A1 (ja) * 2020-09-25 2022-03-31 株式会社日立ハイテク 電子顕微鏡

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6064071A (en) * 1997-04-23 2000-05-16 Nikon Corporation Charged-particle-beam optical systems
US6441384B1 (en) * 1998-04-08 2002-08-27 Nikon Corporation Charged particle beam exposure device exhibiting reduced image blur
JP2001124713A (ja) * 1999-10-27 2001-05-11 Hitachi Ltd 回路パターン検査装置、および回路パターン検査方法
JP2001307977A (ja) * 2000-02-18 2001-11-02 Nikon Corp 荷電粒子線露光装置の設計方法、荷電粒子線露光装置、及び半導体デバイスの製造方法
US6943351B2 (en) * 2000-02-19 2005-09-13 Multibeam Systems, Inc. Multi-column charged particle optics assembly
JP2001357808A (ja) * 2000-06-14 2001-12-26 Hitachi Ltd 回路パターン検査装置および方法
US7034297B2 (en) * 2003-03-05 2006-04-25 Applied Materials, Israel, Ltd. Method and system for use in the monitoring of samples with a charged particle beam
JP4092280B2 (ja) * 2003-10-23 2008-05-28 株式会社東芝 荷電ビーム装置および荷電粒子検出方法
DE602005010969D1 (de) * 2005-03-17 2008-12-24 Integrated Circuit Testing Teilchenstrahlgerät für hohe räumliche Auflösung und verschiedene für perspektivische Abbildungsmethoden
CN101361157B (zh) * 2005-12-02 2011-11-23 阿利斯公司 离子源、系统和方法
JP5271491B2 (ja) * 2006-10-26 2013-08-21 株式会社日立ハイテクノロジーズ 電子線応用装置および試料検査方法
JP4913854B2 (ja) * 2008-10-08 2012-04-11 アイシーティー インテグレーテッド サーキット テスティング ゲゼルシャフト フィーア ハルプライタープリーフテヒニック エム ベー ハー 荷電粒子検出装置及び検出方法
EP2385542B1 (en) * 2010-05-07 2013-01-02 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Electron beam device with dispersion compensation, and method of operating same
JP5948083B2 (ja) * 2012-02-28 2016-07-06 株式会社日立ハイテクノロジーズ 走査電子顕微鏡
JP5932428B2 (ja) * 2012-03-28 2016-06-08 株式会社日立ハイテクノロジーズ 走査電子顕微鏡
JP6002470B2 (ja) * 2012-06-28 2016-10-05 株式会社日立ハイテクノロジーズ 荷電粒子線装置
JP6295027B2 (ja) * 2013-04-03 2018-03-14 株式会社日立ハイテクノロジーズ 荷電粒子線装置およびそれを用いた計測方法

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