JP2016048212A5 - - Google Patents

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Publication number
JP2016048212A5
JP2016048212A5 JP2014173604A JP2014173604A JP2016048212A5 JP 2016048212 A5 JP2016048212 A5 JP 2016048212A5 JP 2014173604 A JP2014173604 A JP 2014173604A JP 2014173604 A JP2014173604 A JP 2014173604A JP 2016048212 A5 JP2016048212 A5 JP 2016048212A5
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JP
Japan
Prior art keywords
measurement
specific element
thickness
assist gas
laser light
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JP2014173604A
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English (en)
Japanese (ja)
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JP6317213B2 (ja
JP2016048212A (ja
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Priority to JP2014173604A priority Critical patent/JP6317213B2/ja
Priority claimed from JP2014173604A external-priority patent/JP6317213B2/ja
Publication of JP2016048212A publication Critical patent/JP2016048212A/ja
Publication of JP2016048212A5 publication Critical patent/JP2016048212A5/ja
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Publication of JP6317213B2 publication Critical patent/JP6317213B2/ja
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JP2014173604A 2014-08-28 2014-08-28 特定の元素の厚み計測装置及び特定の元素の厚み計測方法 Active JP6317213B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014173604A JP6317213B2 (ja) 2014-08-28 2014-08-28 特定の元素の厚み計測装置及び特定の元素の厚み計測方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014173604A JP6317213B2 (ja) 2014-08-28 2014-08-28 特定の元素の厚み計測装置及び特定の元素の厚み計測方法

Publications (3)

Publication Number Publication Date
JP2016048212A JP2016048212A (ja) 2016-04-07
JP2016048212A5 true JP2016048212A5 (https=) 2017-03-09
JP6317213B2 JP6317213B2 (ja) 2018-04-25

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ID=55649196

Family Applications (1)

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JP2014173604A Active JP6317213B2 (ja) 2014-08-28 2014-08-28 特定の元素の厚み計測装置及び特定の元素の厚み計測方法

Country Status (1)

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JP (1) JP6317213B2 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7104513B2 (ja) * 2017-12-21 2022-07-21 日立Ｇｅニュークリア・エナジー株式会社 原子力施設における作業可否評価方法及びその装置
CN119680713B (zh) * 2024-12-18 2026-02-17 北京理工大学 一种淹没环境中气体辅助的冰体损伤装置及方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07333147A (ja) * 1994-06-13 1995-12-22 Hitachi Ltd 材料検査・補修方法及びその装置
JP3119090B2 (ja) * 1994-10-05 2000-12-18 株式会社日立製作所 水中レーザ加工装置及びその装置を用いた水中施工方法
JP4113654B2 (ja) * 2000-05-10 2008-07-09 株式会社東芝 レーザ超音波検査装置
JP2005140529A (ja) * 2003-11-04 2005-06-02 Toshiba Corp 元素分析装置および元素分析方法
JP2006023092A (ja) * 2004-07-06 2006-01-26 Toshiba Corp 分析方法およびその装置
NL1029612C2 (nl) * 2005-07-26 2007-01-29 Corus Technology B V Werkwijze voor het analyseren van vloeibaar metaal en inrichting voor gebruik daarbij.
JP2008256585A (ja) * 2007-04-06 2008-10-23 Toshiba Corp 元素分析装置および元素分析方法
JP4634413B2 (ja) * 2007-04-23 2011-02-16 テクノシステム株式会社 測定装置
JP2010019626A (ja) * 2008-07-09 2010-01-28 Toshiba Corp 元素分析装置および元素分析方法
JP5042953B2 (ja) * 2008-09-19 2012-10-03 新日本製鐵株式会社 鋳片の偏析分析方法
JP2010160022A (ja) * 2009-01-07 2010-07-22 Olympus Corp 生体観察装置
JP5499732B2 (ja) * 2009-06-23 2014-05-21 ソニー株式会社 生体サンプル像取得装置、生体サンプル像取得方法及び生体サンプル像取得プログラム

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