JP2016002606A - Grinding device - Google Patents

Grinding device Download PDF

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JP2016002606A
JP2016002606A JP2014122691A JP2014122691A JP2016002606A JP 2016002606 A JP2016002606 A JP 2016002606A JP 2014122691 A JP2014122691 A JP 2014122691A JP 2014122691 A JP2014122691 A JP 2014122691A JP 2016002606 A JP2016002606 A JP 2016002606A
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workpieces
grinding
holding
workpiece
measuring
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JP6295146B2 (en
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拓也 三原
Takuya Mihara
拓也 三原
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Disco Corp
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Disco Abrasive Systems Ltd
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Priority to JP2014122691A priority Critical patent/JP6295146B2/en
Priority to TW104113542A priority patent/TWI651162B/en
Priority to KR1020150073849A priority patent/KR102151282B1/en
Priority to CN201510313499.6A priority patent/CN105290969B/en
Publication of JP2016002606A publication Critical patent/JP2016002606A/en
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/02Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent
    • B24B49/04Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation according to the instantaneous size and required size of the workpiece acted upon, the measuring or gauging being continuous or intermittent involving measurement of the workpiece at the place of grinding during grinding operation

Abstract

PROBLEM TO BE SOLVED: To provide a grinding device capable of measuring the thickness of workpieces with probes being in contact with top faces of the workpieces stably, even when multiple workpieces are simultaneously held and ground.SOLUTION: The grinding device includes: holding means having a holding surface for holding workpieces W; grinding means for grinding rear surfaces WR of the workpieces W held by the holding means; and a height measuring unit 40 for measuring the height of the rear surfaces WR of the workpieces W, ground by the grinding means. The height measuring unit 40 includes two probes 43 of which contact points to come in contact with the rear surfaces WR of the workpieces W are provided at the same height position. The two probes 43 are disposed side by side along a circumference C around a rotation axis A of the holding means as the center, and provided so as to be spaced apart from each other at an interval W1 longer than an interval W2 in a circumferential direction of the workpieces W adjacent to each other.

Description

本発明は、被加工物の上面高さを計測しながら被加工物の研削を行う研削装置に関する。   The present invention relates to a grinding apparatus for grinding a workpiece while measuring the upper surface height of the workpiece.

各種の被加工物を薄化研削して所望の厚さに仕上げる場合においては、被加工物の厚さを計測しながら研削を行い、所望の厚さになると研削を終了するようにしている。被加工物の厚さを計測する方法としては、厚さ計測器の接触子を被加工物の表面及び被加工物を保持する保持テーブルの表面に接触させ、その高さの差を求めて当該差の値から被加工物の厚さを求める接触式の計測方法が知られている(例えば、特許文献1参照)。   When various types of workpieces are thinned and finished to a desired thickness, grinding is performed while measuring the thickness of the workpiece, and the grinding is terminated when the desired thickness is reached. As a method of measuring the thickness of the workpiece, the contact of the thickness measuring instrument is brought into contact with the surface of the workpiece and the surface of the holding table that holds the workpiece, and the difference in height is obtained. A contact-type measuring method for obtaining the thickness of the workpiece from the difference value is known (for example, see Patent Document 1).

一方、サファイアや窒化ガリウム(GaN)などで形成された被加工物としてのウエーハには、通常のウエーハと比べて径が小さいものがある。このように径が小さいウエーハの研削については、1つの保持テーブルの同一保持面上において複数のウエーハを保持し、複数のウエーハを同時に研削することによって、研削にかかる時間を短縮する技術が提案されている(例えば、特許文献2参照)。   On the other hand, a wafer as a workpiece formed of sapphire, gallium nitride (GaN), or the like has a diameter smaller than that of a normal wafer. For grinding a wafer with such a small diameter, a technique has been proposed in which a plurality of wafers are held on the same holding surface of one holding table and the plurality of wafers are ground simultaneously, thereby shortening the time required for grinding. (For example, refer to Patent Document 2).

特開2000−006018号公報JP 2000-006018 A 特開2012−101293号公報JP 2012-101293 A

複数のウエーハを同時に研削する場合、上述のように厚さ計測器の接触子を被加工物の表面に接触させながら研削を行おうとすると、回転する小径の被加工物の間で接触子が引っかかり安定して被加工物の保持面からの高さを計測することが出来ないという問題がある。   When grinding multiple wafers at the same time, if you try to grind while contacting the contact of the thickness measuring instrument to the surface of the workpiece as described above, the contact will get caught between the rotating small-diameter workpiece. There is a problem that the height from the holding surface of the workpiece cannot be measured stably.

本発明の目的は、複数の被加工物を同時に保持し研削を行う場合においても、接触針を安定して被加工物の上面に接触させて被加工物の厚さを計測可能な研削装置を提供することである。   An object of the present invention is to provide a grinding apparatus capable of measuring the thickness of a workpiece by stably contacting a top surface of the workpiece even when holding and grinding a plurality of workpieces simultaneously. Is to provide.

上述した課題を解決し目的を達成するために、請求項1記載の本発明に係る研削装置は、被加工物を保持する保持面を有する保持手段と、該保持手段に保持された被加工物の上面を研削する研削手段と、該研削手段により研削された被加工物の該上面の高さを測定する高さ測定器と、を備えた研削装置であって、該保持手段は、複数の被加工物を保持し被加工物のサイズよりも大きいサイズに形成された保持面を有し、該保持面に直交するとともに該保持面の中心を通る回転軸を中心として回転可能であり、該保持面上において該回転軸を中心とした円周上で該複数の被加工物を周方向に保持し、該高さ測定器は、被加工物の上面に接触させる接触点が同一高さ位置に配設された2つの計測針を備え、該2つの計測針は該保持手段の回転軸を中心とした該円周上に沿って並列し且つ隣接する被加工物同士の周方向の間隔よりも大きい間隔離間して配設され、複数の被加工物を研削時においては、一方の該計測針が該複数の被加工物の間に位置する際にはもう一方の該計測針は複数の被加工物のいずれかの上面に接触して被加工物の高さ位置を常時計測することを特徴とする。なお、請求項1でいう隣接する被加工物同士の周方向の間隔とは、被加工物が周方向に等間隔で並んでいる場合には、隣接する被加工物同士の間隔をいい、被加工物が周方向に等間隔で並んでいない場合には、隣接する被加工物同士の間隔のうちの一番離間した被加工物同士の間隔をいう。   In order to solve the above-mentioned problems and achieve the object, a grinding apparatus according to the present invention comprises a holding means having a holding surface for holding a workpiece, and a workpiece held by the holding means. A grinding device comprising: grinding means for grinding an upper surface of the workpiece; and a height measuring device for measuring the height of the upper surface of the workpiece ground by the grinding means, wherein the holding means comprises a plurality of A holding surface that holds the workpiece and is larger than the size of the workpiece, and is rotatable about a rotation axis that is orthogonal to the holding surface and passes through the center of the holding surface; A plurality of workpieces are held in a circumferential direction on a circumference around the rotation axis on a holding surface, and the height measuring device has a contact point that contacts the upper surface of the workpiece at the same height position. Provided with two measuring needles, and the two measuring needles have a rotational axis of the holding means. When measuring a plurality of workpieces, the measurement is performed in parallel when the plurality of workpieces are arranged in parallel along the circumference of the center and spaced apart from each other by an interval larger than the circumferential interval between adjacent workpieces. When the needle is positioned between the plurality of workpieces, the other measuring needle contacts the upper surface of one of the plurality of workpieces to constantly measure the height position of the workpiece. Features. Note that the circumferential interval between adjacent workpieces in claim 1 refers to the interval between adjacent workpieces when the workpieces are arranged at equal intervals in the circumferential direction. When the workpieces are not arranged at equal intervals in the circumferential direction, it refers to the interval between the most distant workpieces among the intervals between adjacent workpieces.

本発明の研削装置によると、計測針を2つ備え、2つの計測針を保持手段の回転軸を中心とした円周に沿って並列し且つ隣接する被加工物同士の周方向の間隔よりも大きい間隔離間して配設している。そのため、研削時に一方の計測針が複数の被加工物の間に位置する時には、もう一方の計測針は必ず複数の被加工物の上面に接触して計測可能となる。したがって、複数の被加工物を同時に保持し研削を行う場合においても、被加工物の間に計測針が落下したり被加工物にひっかかることが無く、計測針を安定して被加工物の上面に接触させて被加工物の厚さを計測することができる。   According to the grinding apparatus of the present invention, two measuring needles are provided, and the two measuring needles are arranged in parallel along the circumference around the rotation axis of the holding means, and more than the circumferential interval between adjacent workpieces. They are spaced apart by a large distance. For this reason, when one measuring needle is positioned between a plurality of workpieces during grinding, the other measuring needle always comes into contact with the upper surfaces of the plurality of workpieces and can be measured. Therefore, even when holding and grinding a plurality of workpieces at the same time, the measuring needle does not fall or get caught between the workpieces, and the measuring needle can be stably held on the upper surface of the workpiece. The thickness of the workpiece can be measured by contacting the

図1は、実施形態に係る研削装置の構成を示す外観斜視図である。Drawing 1 is an appearance perspective view showing the composition of the grinding device concerning an embodiment. 図2は、実施形態に係る研削装置の保持手段と高さ測定器などの斜視図である。FIG. 2 is a perspective view of a holding unit and a height measuring device of the grinding apparatus according to the embodiment. 図3は、実施形態に係る研削装置の高さ測定器と複数の被加工物の斜視図である。FIG. 3 is a perspective view of a height measuring instrument and a plurality of workpieces of the grinding apparatus according to the embodiment. 図4は、実施形態に係る研削装置の高さ測定器などと複数の被加工物の平面図である。FIG. 4 is a plan view of a height measuring device and the like of the grinding apparatus according to the embodiment and a plurality of workpieces. 図5は、実施形態に係る研削装置の高さ測定器と複数の被加工物の側面図である。FIG. 5 is a side view of a height measuring instrument and a plurality of workpieces of the grinding apparatus according to the embodiment.

本発明を実施するための形態(実施形態)につき、図面を参照しつつ詳細に説明する。以下の実施形態に記載した内容により本発明が限定されるものではない。また、以下に記載した構成要素には、当業者が容易に想定できるもの、実質的に同一のものが含まれる。さらに、以下に記載した構成は適宜組み合わせることが可能である。また、本発明の要旨を逸脱しない範囲で構成の種々の省略、置換又は変更を行うことができる。   DESCRIPTION OF EMBODIMENTS Embodiments (embodiments) for carrying out the present invention will be described in detail with reference to the drawings. The present invention is not limited by the contents described in the following embodiments. The constituent elements described below include those that can be easily assumed by those skilled in the art and those that are substantially the same. Furthermore, the structures described below can be combined as appropriate. Various omissions, substitutions, or changes in the configuration can be made without departing from the scope of the present invention.

本発明の実施形態に係る研削装置を、図1から図5に基づいて説明する。図1は、実施形態に係る研削装置の構成を示す外観斜視図であり、図2は、実施形態に係る研削装置の保持手段と高さ測定器などの斜視図であり、図3は、実施形態に係る研削装置の高さ測定器と複数の被加工物の斜視図であり、図4は、実施形態に係る研削装置の高さ測定器などと複数の被加工物の平面図であり、図5は、実施形態に係る研削装置の高さ測定器と複数の被加工物の側面図である。   A grinding apparatus according to an embodiment of the present invention will be described with reference to FIGS. FIG. 1 is an external perspective view showing a configuration of a grinding apparatus according to the embodiment, FIG. 2 is a perspective view of holding means and a height measuring device of the grinding apparatus according to the embodiment, and FIG. FIG. 4 is a perspective view of a height measuring instrument and a plurality of workpieces of the grinding apparatus according to the embodiment, and FIG. 4 is a plan view of the height measuring instrument and the like of the grinding apparatus according to the embodiment and a plurality of workpieces. FIG. 5 is a side view of a height measuring instrument and a plurality of workpieces of the grinding apparatus according to the embodiment.

本実施形態に係る研削装置1は、被加工物W(図3に示す)に研削(加工に相当する)を施す装置である。ここで、加工対象としての被加工物Wは、本実施形態では、シリコン、サファイア、窒化ガリウム(GaN)などを母材とする円板状の半導体ウエーハや光デバイスウエーハである。被加工物Wは、例えば、表面WSに格子状に形成されたストリートと呼ばれる分割予定ラインによって複数の領域が区画され、これらの区画された領域にデバイスが形成されている。被加工物Wは、図3に示すように、表面WSが保持部材Mに貼着されて、保持部材M上に複数保持された状態で、表面WSの裏側の裏面WR(図3及び図4に示す)に研削砥石26により研削が施される。なお、本実施形態では、保持部材Mを円板状に形成し、5つの被加工物Wを保持部材Mの外縁部に周方向に等間隔に配置している。   A grinding apparatus 1 according to the present embodiment is an apparatus that performs grinding (corresponding to processing) on a workpiece W (shown in FIG. 3). Here, in the present embodiment, the workpiece W to be processed is a disk-shaped semiconductor wafer or optical device wafer having a base material of silicon, sapphire, gallium nitride (GaN), or the like. The workpiece W is divided into a plurality of regions by, for example, scheduled dividing lines called streets formed in a lattice pattern on the surface WS, and devices are formed in these partitioned regions. As shown in FIG. 3, the workpiece W is adhered to the holding member M, and a plurality of the workpieces W are held on the holding member M, and the back surface WR on the back side of the surface WS (FIG. 3 and FIG. 4). Are ground by the grinding wheel 26. In the present embodiment, the holding member M is formed in a disk shape, and the five workpieces W are arranged on the outer edge of the holding member M at equal intervals in the circumferential direction.

研削装置1は、図1に示すように、保持手段10と、研削手段20と、加工送り手段30と、高さ測定器40(図2に示す)と、制御手段100などを備える。   As shown in FIG. 1, the grinding apparatus 1 includes a holding unit 10, a grinding unit 20, a processing feed unit 30, a height measuring device 40 (shown in FIG. 2), a control unit 100, and the like.

保持手段10は、保持部材Mを介して被加工物Wの表面WSが載置されて、載置された複数の被加工物Wを吸引保持する保持面10aを有するものである。保持手段10は、図2に示すように、保持面10aを構成する部分がポーラスセラミック等から形成された円盤形状であり、図示しない真空吸引経路を介して図示しない真空吸引源と接続され、保持面10aに載置された被加工物Wを保持部材Mを介して吸引することで保持する。   The holding means 10 has a holding surface 10a on which the surface WS of the workpiece W is placed via the holding member M and sucks and holds the plurality of workpieces W placed thereon. As shown in FIG. 2, the holding means 10 has a disk shape in which a portion constituting the holding surface 10a is made of porous ceramic or the like, and is connected to a vacuum suction source (not shown) via a vacuum suction path (not shown). The workpiece W placed on the surface 10a is held by being sucked through the holding member M.

即ち、保持手段10は、被加工物Wのサイズよりも大きなサイズに形成された保持面10aを有している。保持手段10は、図示しない保持手段移動手段により研削手段20の下方の加工位置と、研削手段20の下方から離間した着脱位置とに亘ってY軸方向に移動される。保持手段10は、図示しない回転駆動手段により吸引保持した被加工物Wを保持面10aに直交するとともに保持面10aの中心を通る回転軸A(図2及び図3に一点鎖線で示す)を中心として回転可能である。保持手段10は、保持面10a上に保持部材Mを介して複数の被加工物Wを保持することで、保持面10a上において回転軸Aを中心とした円周上で複数の被加工物Wを周方向に等間隔に保持する。   That is, the holding means 10 has a holding surface 10a formed in a size larger than the size of the workpiece W. The holding means 10 is moved in the Y-axis direction by a holding means moving means (not shown) over a processing position below the grinding means 20 and an attaching / detaching position spaced from the bottom of the grinding means 20. The holding means 10 is centered on a rotation axis A (indicated by a one-dot chain line in FIGS. 2 and 3) that is perpendicular to the holding surface 10a and that passes through the center of the holding surface 10a. As rotatable. The holding means 10 holds the plurality of workpieces W on the holding surface 10a via the holding member M, so that the plurality of workpieces W on the circumference around the rotation axis A on the holding surface 10a. Are held at equal intervals in the circumferential direction.

加工送り手段30は、研削手段20を保持面10aに対して近接離間する方向にZ軸と平行に移動させるものである。加工送り手段30は、加工送りモータ31などを備える。加工送りモータ31は、研削手段20が装着された移動基台21を案内レール33に沿って加工送りするためのものである。加工送りモータ31は、研削装置1の装置本体2から立設した柱部3に取り付けられ、出力軸にリードスクリュー34が取り付けられている。リードスクリュー34は、Z軸と平行に配置され、柱部3に軸心回りに回転自在に支持されている。リードスクリュー34は、移動基台21に取り付けられた図示しないナットに螺合している。案内レール33は、Z軸と平行に柱部3に取り付けられて、移動基台21をZ軸方向にスライド自在に支持している。   The processing feeding means 30 moves the grinding means 20 in parallel with the Z axis in a direction approaching and separating from the holding surface 10a. The machining feed means 30 includes a machining feed motor 31 and the like. The processing feed motor 31 is for processing and feeding the moving base 21 on which the grinding means 20 is mounted along the guide rail 33. The processing feed motor 31 is attached to the column portion 3 erected from the apparatus main body 2 of the grinding apparatus 1, and a lead screw 34 is attached to the output shaft. The lead screw 34 is disposed in parallel with the Z-axis and is supported by the column portion 3 so as to be rotatable around the axis. The lead screw 34 is screwed into a nut (not shown) attached to the moving base 21. The guide rail 33 is attached to the column portion 3 in parallel with the Z axis, and supports the movable base 21 so as to be slidable in the Z axis direction.

研削手段20は、保持手段10に保持された複数の被加工物Wの裏面WR(上面に相当)加工液としての研削液を供給しながら研削するものである。研削手段20は、図1に示すように、研削ホイール23を先端に装着するスピンドル24と、スピンドルモータ27などを備える。   The grinding means 20 performs grinding while supplying a grinding liquid as a back surface WR (corresponding to the upper surface) machining liquid of the plurality of workpieces W held by the holding means 10. As shown in FIG. 1, the grinding means 20 includes a spindle 24 on which a grinding wheel 23 is mounted at the tip, a spindle motor 27, and the like.

研削ホイール23は、円盤状の砥石基台25と、複数の研削砥石26とを具備している。砥石基台25は、スピンドル24の先端に設けられたフランジ部24aにボルトなどにより取り付けられる。研削砥石26は、砥石基台25の外縁部に円環上に設けられている。研削砥石26は、周知の砥粒と、砥粒を固めるボンド剤などで構成され、スピンドルモータ27によりスピンドル24が鉛直方向と平行なZ軸回りに回転されることで、被加工物Wの裏面WRを研削する。なお、図4に示すように、研削砥石26は、スピンドルモータ27の回転により、加工位置の保持手段10の回転軸A上を通過する。このために、研削中には、保持手段10に保持された被加工物Wの裏面WRの一部は、露出している。   The grinding wheel 23 includes a disk-shaped grinding wheel base 25 and a plurality of grinding wheels 26. The grindstone base 25 is attached to a flange portion 24a provided at the tip of the spindle 24 with a bolt or the like. The grinding wheel 26 is provided on the outer edge of the grinding wheel base 25 on a ring. The grinding wheel 26 is composed of well-known abrasive grains and a bonding agent that hardens the abrasive grains. The spindle 24 is rotated about the Z axis parallel to the vertical direction by a spindle motor 27, whereby the back surface of the workpiece W is obtained. Grind the WR. As shown in FIG. 4, the grinding wheel 26 passes on the rotation axis A of the processing position holding means 10 by the rotation of the spindle motor 27. For this reason, during grinding, a part of the back surface WR of the workpiece W held by the holding means 10 is exposed.

スピンドル24は、スピンドルハウジング28内にZ軸回りに回転自在に収容されている。スピンドルハウジング28は、移動基台21に取り付けられた支持部29に保持されている。スピンドルモータ27は、スピンドル24即ち研削ホイール23をZ軸回りに回転させる。   The spindle 24 is accommodated in the spindle housing 28 so as to be rotatable about the Z axis. The spindle housing 28 is held by a support portion 29 attached to the moving base 21. The spindle motor 27 rotates the spindle 24, that is, the grinding wheel 23 around the Z axis.

高さ測定器40は、研削手段20により研削された複数の被加工物Wの保持手段10の保持面10aからの裏面WRの高さを測定するためのものである。高さ測定器40は、図2に示すように、本体部41と、本体部41に上下方向に揺動自在に支持された計測アーム42と、計測アーム42の先端部42aに取り付けられた2つの計測針43とを備える。本体部41は、加工位置の保持手段10の近傍に配置される。本体部41は、先端部42aが上下動するように計測アーム42を揺動自在に支持している。本体部41には、エアー供給源44から加圧された気体が供給されると、計測アーム42の揺動中心Mよりも基端側を下方に押圧して計測アーム42の先端部42aを上昇させるエアシリンダ45が設けられている。また、本体部41には、計測アーム42の揺動中心M回りの回転位置を検出して、被加工物Wの裏面WRの高さを検出する検出手段(図示せず)が設けられている。検出手段は、検出結果を制御手段100に出力する。   The height measuring device 40 is for measuring the height of the back surface WR from the holding surface 10 a of the holding means 10 of the plurality of workpieces W ground by the grinding means 20. As shown in FIG. 2, the height measuring device 40 includes a main body portion 41, a measurement arm 42 supported by the main body portion 41 so as to be swingable in the vertical direction, and 2 attached to a distal end portion 42 a of the measurement arm 42. One measuring needle 43 is provided. The main body 41 is disposed in the vicinity of the processing position holding means 10. The main body 41 supports the measuring arm 42 so as to be swingable so that the tip 42a moves up and down. When pressurized gas is supplied from the air supply source 44 to the main body 41, the base end side is pressed downward from the swing center M of the measurement arm 42 to raise the distal end portion 42 a of the measurement arm 42. An air cylinder 45 is provided. The main body 41 is provided with detection means (not shown) for detecting the rotational position of the measuring arm 42 around the swing center M and detecting the height of the back surface WR of the workpiece W. . The detection unit outputs the detection result to the control unit 100.

計測アーム42は、円柱棒形状に形成され、基端部42bを中心として揺動自在に本体部41に支持されている。計測アーム42の先端部42aには、2つの計測針43が取り付けられた針支持部材46が設けられている。   The measuring arm 42 is formed in a cylindrical bar shape, and is supported by the main body 41 so as to be swingable about the base end portion 42b. A needle support member 46 to which two measurement needles 43 are attached is provided at the distal end portion 42 a of the measurement arm 42.

2つの計測針43は、円柱棒形状に形成され、かつ針支持部材46に取り付けられている。2つの計測針43は、計測アーム42と平行な平行部47と、平行部47の先端から保持手段10の保持面10aに向かって延びて被加工物Wの裏面WRと接触する接触部48とを備えている。接触部48の下端は、被加工物Wの裏面WRと接触する接触点48aをなしている。2つの計測針43は、研削中に露出する被加工物Wの裏面WRに接触させる接触点48aが同一高さ位置に配設されている。2つの計測針43は、図5に示すように、平行部47が互いに平行でかつ水平方向に間隔をあけて配置され、接触部48の長さLが等しく形成されている。2つの計測針43は、図3及び図4に示すように、保持手段10の回転軸Aを中心とした円周C(図4中に一点鎖線で示す)上に沿って並列し且つ隣接する被加工物W同士の周方向の間隔W2よりも大きい間隔W1離間して配設されている。   The two measuring needles 43 are formed in a cylindrical bar shape and are attached to the needle support member 46. The two measuring needles 43 include a parallel portion 47 parallel to the measuring arm 42, a contact portion 48 that extends from the tip of the parallel portion 47 toward the holding surface 10a of the holding means 10 and contacts the back surface WR of the workpiece W. It has. The lower end of the contact portion 48 forms a contact point 48a that comes into contact with the back surface WR of the workpiece W. In the two measuring needles 43, contact points 48a to be brought into contact with the back surface WR of the workpiece W exposed during grinding are arranged at the same height position. As shown in FIG. 5, the two measuring needles 43 are formed such that the parallel portions 47 are parallel to each other and spaced apart in the horizontal direction, and the lengths L of the contact portions 48 are equal. As shown in FIGS. 3 and 4, the two measuring needles 43 are parallel and adjacent to each other along a circumference C (indicated by a one-dot chain line in FIG. 4) around the rotation axis A of the holding means 10. The workpieces W are disposed with a spacing W1 that is larger than the circumferential spacing W2 between the workpieces W.

なお、本発明でいう隣接する被加工物W同士の周方向の間隔W2とは、接触点48aが被加工物Wの裏面WR上を通る円周C上の間隔W2をいう。また、本実施形態では、2つの計測針43の間隔W1は、これらの計測針43の中心間の間隔W1をいう。また、2つの計測針43の間隔W1は、被加工物Wの裏面WRの外縁と前記円周Cとが交差する点P間の間隔W3よりも十分に小さく形成されている。   In the present invention, the circumferential interval W2 between adjacent workpieces W refers to the interval W2 on the circumference C where the contact point 48a passes on the back surface WR of the workpiece W. In the present embodiment, the interval W1 between the two measuring needles 43 refers to the interval W1 between the centers of the measuring needles 43. The interval W1 between the two measuring needles 43 is formed sufficiently smaller than the interval W3 between the points P where the outer edge of the back surface WR of the workpiece W intersects the circumference C.

このように、2つの計測針43は配設されることで、保持部材Mを介して複数の被加工物Wを保持手段10に保持する研削時においては、図5に点線で示すように、一方の計測針43が複数の被加工物Wの間に位置する際には、もう一方の計測針43は複数の被加工物Wのいずれかの裏面WRに接触して、被加工物Wの裏面WRの高さ位置を常時計測する。   In this way, by arranging the two measuring needles 43, during grinding for holding a plurality of workpieces W on the holding means 10 via the holding member M, as shown by dotted lines in FIG. When one measuring needle 43 is positioned between the plurality of workpieces W, the other measuring needle 43 contacts one of the back surfaces WR of the plurality of workpieces W, and the workpiece W The height position of the back surface WR is constantly measured.

制御手段100は、研削装置1を構成する上述した構成要素をそれぞれ制御して、被加工物Wに対する加工動作を研削装置1に行わせるものである。なお、制御手段100は、例えばCPU等で構成された演算処理装置やROM、RAM等を備える図示しないマイクロプロセッサを主体として構成されており、加工動作の状態を表示する図示しない表示手段や、オペレータが加工内容情報などを登録する際に用いる図示しない操作手段などと接続されている。   The control means 100 controls the above-described components constituting the grinding apparatus 1 to cause the grinding apparatus 1 to perform a machining operation on the workpiece W. The control means 100 is mainly composed of an arithmetic processing unit constituted by a CPU or the like, a microprocessor (not shown) provided with a ROM, a RAM, etc., and a display means (not shown) for displaying the state of the machining operation, an operator Are connected to an operating means (not shown) used when registering processing content information and the like.

次に、本実施形態に係る研削装置1の加工動作について説明する。まず、オペレータが加工内容情報を制御手段100に登録し、オペレータから加工動作の開始指示があった場合に、研削装置1が加工動作を開始する。加工動作において、研削手段20の下方から離間した着脱位置において保持手段10上に表面WSに保持部材Mに貼着された複数の被加工物Wが載置されると、制御手段100が、被加工物Wを保持手段10に吸引保持させる。また、制御手段100は、エアー供給源44から加圧された気体をエアシリンダ45に供給して、計測アーム42の先端部42a及び計測針43を図2中に二点鎖線で示すように、保持手段10の保持面10aよりも上昇させる。   Next, the processing operation of the grinding apparatus 1 according to this embodiment will be described. First, the operator registers the machining content information in the control means 100, and when the operator gives an instruction to start the machining operation, the grinding device 1 starts the machining operation. In the processing operation, when a plurality of workpieces W adhered to the holding member M on the surface WS are placed on the holding means 10 at the attachment / detachment position separated from the lower side of the grinding means 20, the control means 100 causes the workpiece 100 to move. The workpiece W is sucked and held by the holding means 10. Further, the control means 100 supplies the pressurized gas from the air supply source 44 to the air cylinder 45, and the tip end portion 42a of the measurement arm 42 and the measurement needle 43 are indicated by a two-dot chain line in FIG. It raises rather than the holding surface 10a of the holding means 10. FIG.

制御手段100は、保持手段移動手段により保持手段10を移動して、保持手段10を加工位置に位置付け、エアー供給源44からエアシリンダ45への加圧された気体の供給を停止して、2つの計測針43の接触点48aを保持手段10に保持された被加工物Wの裏面WRに接触させる。制御手段100は、スピンドルモータ27により回転する研削ホイール23を、図4に示すように、回転する保持手段10の回転軸A上に位置付ける。そして、制御手段100は、加工送り手段30により研削ホイール23を徐々に下降していき、被加工物Wの裏面WRに研削送りする。被加工物Wの裏面WRを研削ホイール23の研削砥石26で研削する。研削中は、常に、高さ測定器40で裏面WRの高さを測定する。   The control means 100 moves the holding means 10 by the holding means moving means, positions the holding means 10 at the processing position, stops the supply of pressurized gas from the air supply source 44 to the air cylinder 45, and 2 The contact points 48a of the two measuring needles 43 are brought into contact with the back surface WR of the workpiece W held by the holding means 10. The control means 100 positions the grinding wheel 23 rotated by the spindle motor 27 on the rotation axis A of the rotating holding means 10 as shown in FIG. Then, the control unit 100 gradually lowers the grinding wheel 23 by the processing feeding unit 30 and feeds the grinding wheel 23 to the back surface WR of the workpiece W. The back surface WR of the workpiece W is ground with the grinding wheel 26 of the grinding wheel 23. During grinding, the height measuring device 40 always measures the height of the back surface WR.

制御手段100は、高さ測定器40の検出結果に基いて、被加工物Wの裏面WRの高さが所望の高さになると、加工送り手段30により研削手段20を被加工物Wから離間させる。さらに、制御手段100は、エアー供給源44から加圧された気体をエアシリンダ45に供給して、計測アーム42の先端部42a及び計測針43を保持手段10の保持面10aよりも上昇させる。   When the height of the back surface WR of the workpiece W reaches a desired height based on the detection result of the height measuring device 40, the control means 100 separates the grinding means 20 from the workpiece W by the work feeding means 30. Let Further, the control unit 100 supplies the pressurized gas from the air supply source 44 to the air cylinder 45, and raises the distal end portion 42 a of the measurement arm 42 and the measurement needle 43 from the holding surface 10 a of the holding unit 10.

制御手段100は、その後、保持手段移動手段により保持手段10を研削手段20の下方の加工位置から着脱位置に向かって移動させる。そして、保持手段10が着脱位置に位置すると、制御手段100が、保持手段移動手段による保持手段10の移動を停止し、保持手段10の被加工物Wの吸引保持を解除させる。研削後の被加工物Wと研削前の被加工物Wが交換されると、研削装置1は、前述した工程と同様に、被加工物Wに研削を施す。   Thereafter, the control means 100 moves the holding means 10 from the processing position below the grinding means 20 toward the attachment / detachment position by the holding means moving means. When the holding unit 10 is located at the attachment / detachment position, the control unit 100 stops the movement of the holding unit 10 by the holding unit moving unit and releases the suction and holding of the workpiece W by the holding unit 10. When the workpiece W after grinding and the workpiece W before grinding are exchanged, the grinding apparatus 1 performs grinding on the workpiece W in the same manner as the above-described steps.

以上のように、本実施形態に係る研削装置1は、計測針43を2つ備え、2つの計測針43を保持手段10の回転軸Aを中心とした円周に沿って並列し且つ隣接する被加工物W同士の周方向の間隔W2よりも大きい間隔W1離間して配設している。さらに、2つの計測針43間の間隔W1を被加工物Wの裏面WRの外縁と前記円周Cとが交差する点P間の間隔W3よりも十分に小さく形成している。そのため、研削時に一つの計測針43が複数の被加工物Wの間に位置する時には、もう一方の計測針43は必ず複数の被加工物Wの裏面WRに接触して計測可能となる。したがって、複数の被加工物Wを同時に保持し研削を行う場合においても、被加工物Wの間に計測針43が落下したり被加工物Wにひっかかることが無く、計測針43を安定して被加工物Wの裏面WRに接触させて被加工物Wの厚さを計測することができる。   As described above, the grinding apparatus 1 according to the present embodiment includes two measuring needles 43, and the two measuring needles 43 are juxtaposed along the circumference around the rotation axis A of the holding unit 10 and adjacent to each other. The workpieces W are spaced apart from each other by a gap W1 that is larger than the circumferential gap W2. Further, the interval W1 between the two measuring needles 43 is formed sufficiently smaller than the interval W3 between the points P where the outer edge of the back surface WR of the workpiece W intersects the circumference C. For this reason, when one measuring needle 43 is positioned between the plurality of workpieces W during grinding, the other measuring needle 43 always comes into contact with the back surface WR of the plurality of workpieces W and can be measured. Therefore, even when holding and grinding a plurality of workpieces W at the same time, the measuring needle 43 does not fall or get caught between the workpieces W, so that the measuring needle 43 can be stabilized. The thickness of the workpiece W can be measured by contacting the back surface WR of the workpiece W.

また、本発明では、研削装置1は、保持手段10と研削手段20を複数備えても良い。本発明では、研削の事前に保持手段10の保持面10aの高さ位置を高さ測定器40で測定しておいて、制御手段100は、研削中に測定した高さ位置との差を算出し、差の値から被加工物Wの厚さを求めて、所望の厚さになるまで研削するように制御してもよい。   In the present invention, the grinding apparatus 1 may include a plurality of holding means 10 and grinding means 20. In the present invention, the height position of the holding surface 10a of the holding means 10 is measured with the height measuring device 40 in advance of grinding, and the control means 100 calculates the difference from the height position measured during grinding. Then, the thickness of the workpiece W may be obtained from the difference value, and control may be performed so that the workpiece W is ground until a desired thickness is obtained.

さらに、本発明では、保持手段10の保持面10aの外径が被加工物W又は保持部材Mの外径と略同等に形成されている場合に、保持面10aの外周の外周部10b(図2に示す)に接触する計測針を一つ有する高さ測定器(図示せず)を別途設ける。制御手段100は、研削中に別途設けた高さ測定器の計測針を外周部10bに接触させて、常時、保持手段10の高さ位置を測定して、測定した値などから被加工物Wの厚さを求めるようにしてもよい。   Furthermore, in the present invention, when the outer diameter of the holding surface 10a of the holding means 10 is formed substantially equal to the outer diameter of the workpiece W or the holding member M, the outer peripheral portion 10b (see FIG. (2) A height measuring device (not shown) having one measuring needle in contact with it is provided separately. The control means 100 contacts the outer peripheral portion 10b with a measuring needle of a height measuring device separately provided during grinding, constantly measures the height position of the holding means 10, and uses the measured value or the like to determine the workpiece W. You may make it require | calculate the thickness of.

なお、本発明は上記実施形態に限定されるものではない。即ち、本発明の骨子を逸脱しない範囲で種々変形して実施することができる。   The present invention is not limited to the above embodiment. That is, various modifications can be made without departing from the scope of the present invention.

1 研削装置
10 保持手段
10a 保持面
20 研削手段
40 高さ測定器
43 計測針
48a 接触点
A 回転軸
C 円周
W 被加工物
WR 裏面(上面)
W1 間隔
W2 間隔
DESCRIPTION OF SYMBOLS 1 Grinding device 10 Holding means 10a Holding surface 20 Grinding means 40 Height measuring instrument 43 Measuring needle 48a Contact point A Rotating shaft C Circumference W Workpiece WR Back surface (upper surface)
W1 interval W2 interval

Claims (1)

被加工物を保持する保持面を有する保持手段と、該保持手段に保持された被加工物の上面を研削する研削手段と、該研削手段により研削された被加工物の該上面の高さを測定する高さ測定器と、を備えた研削装置であって、
該保持手段は、複数の被加工物を保持し被加工物のサイズよりも大きいサイズに形成された保持面を有し、該保持面に直交するとともに該保持面の中心を通る回転軸を中心として回転可能であり、該保持面上において該回転軸を中心とした円周上で該複数の被加工物を周方向に保持し、
該高さ測定器は、被加工物の上面に接触させる接触点が同一高さ位置に配設された2つの計測針を備え、該2つの計測針は該保持手段の回転軸を中心とした該円周上に沿って並列し且つ隣接する被加工物同士の周方向の間隔よりも大きい間隔離間して配設され、
複数の被加工物を研削時においては、一方の該計測針が該複数の被加工物の間に位置する際にはもう一方の該計測針は複数の被加工物のいずれかの上面に接触して被加工物の高さ位置を常時計測すること、を特徴とする研削装置。
A holding means having a holding surface for holding the workpiece; a grinding means for grinding an upper surface of the workpiece held by the holding means; and a height of the upper surface of the workpiece ground by the grinding means. A grinding device comprising a height measuring device for measuring,
The holding means has a holding surface that holds a plurality of workpieces and has a size larger than the size of the workpiece, and is centered on a rotation axis that is orthogonal to the holding surface and passes through the center of the holding surface. The plurality of workpieces are held in a circumferential direction on a circumference around the rotation axis on the holding surface,
The height measuring instrument includes two measuring needles arranged at the same height with contact points to be brought into contact with the upper surface of the workpiece, and the two measuring needles are centered on the rotation axis of the holding means. Arranged along the circumference and spaced apart by a distance greater than the circumferential distance between adjacent workpieces,
When grinding a plurality of workpieces, when one of the measuring needles is positioned between the plurality of workpieces, the other measuring needle contacts one of the upper surfaces of the plurality of workpieces. And constantly measuring the height position of the workpiece.
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JP2010247311A (en) * 2009-04-20 2010-11-04 Disco Abrasive Syst Ltd Grinding method of workpiece
JP2012101293A (en) * 2010-11-08 2012-05-31 Disco Corp Machining method
US20140073223A1 (en) * 2012-09-07 2014-03-13 Axus Technology, Llc Method and apparatus for wafer backgrinding and edge trimming on one machine

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