JP2015536731A5 - - Google Patents

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Publication number
JP2015536731A5
JP2015536731A5 JP2015544571A JP2015544571A JP2015536731A5 JP 2015536731 A5 JP2015536731 A5 JP 2015536731A5 JP 2015544571 A JP2015544571 A JP 2015544571A JP 2015544571 A JP2015544571 A JP 2015544571A JP 2015536731 A5 JP2015536731 A5 JP 2015536731A5
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JP
Japan
Prior art keywords
beam shaper
moving means
imaging system
during
acquisition interval
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JP2015544571A
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English (en)
Japanese (ja)
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JP6391585B2 (ja
JP2015536731A (ja
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Priority claimed from PCT/IB2013/060219 external-priority patent/WO2014087283A1/en
Publication of JP2015536731A publication Critical patent/JP2015536731A/ja
Publication of JP2015536731A5 publication Critical patent/JP2015536731A5/ja
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Publication of JP6391585B2 publication Critical patent/JP6391585B2/ja
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JP2015544571A 2012-12-03 2013-11-18 Ｘ線ビーム透過プロファイル成形器の並進移動 Active JP6391585B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261732516P 2012-12-03 2012-12-03
US61/732,516 2012-12-03
PCT/IB2013/060219 WO2014087283A1 (en) 2012-12-03 2013-11-18 Translating x-ray beam transmission profile shaper

Publications (3)

Publication Number Publication Date
JP2015536731A JP2015536731A (ja) 2015-12-24
JP2015536731A5 true JP2015536731A5 (enExample) 2017-01-05
JP6391585B2 JP6391585B2 (ja) 2018-09-19

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ID=49759482

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JP2015544571A Active JP6391585B2 (ja) 2012-12-03 2013-11-18 Ｘ線ビーム透過プロファイル成形器の並進移動

Country Status (7)

Country Link
US (1) US10056164B2 (enExample)
EP (1) EP2925230B1 (enExample)
JP (1) JP6391585B2 (enExample)
CN (1) CN104837406B (enExample)
BR (1) BR112015012546A2 (enExample)
RU (1) RU2015126546A (enExample)
WO (1) WO2014087283A1 (enExample)

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JP6088503B2 (ja) * 2011-06-30 2017-03-01 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線ビーム透過プロファイル整形器
EP2925230B1 (en) 2012-12-03 2020-05-20 Koninklijke Philips N.V. Translating x-ray beam transmission profile shaper
CN107810538B (zh) * 2015-06-29 2021-11-02 皇家飞利浦有限公司 用于生成和准直x射线束的系统
EP3509492B1 (en) * 2016-09-08 2021-12-15 Koninklijke Philips N.V. Source grating for x-ray imaging
CN107479102A (zh) * 2017-09-19 2017-12-15 北京君和信达科技有限公司 辐射检查系统及方法
US10751549B2 (en) * 2018-07-18 2020-08-25 Kenneth Hogstrom Passive radiotherapy intensity modulator for electrons
US11604152B2 (en) * 2019-10-09 2023-03-14 Baker Hughes Oilfield Operations Llc Fast industrial computed tomography for large objects
CN110865089B (zh) * 2019-12-20 2020-12-25 北京航星机器制造有限公司 一种ct探测器及ct检测系统
US12125604B2 (en) * 2022-02-02 2024-10-22 GE Precision Healthcare LLC Pre-patient collimator having a built-in alignment mechanism

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JP6088503B2 (ja) 2011-06-30 2017-03-01 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線ビーム透過プロファイル整形器
JP6195852B2 (ja) * 2012-03-07 2017-09-13 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｘ線ビーム整形器
EP2925230B1 (en) 2012-12-03 2020-05-20 Koninklijke Philips N.V. Translating x-ray beam transmission profile shaper
CN104853679B (zh) 2012-12-05 2020-09-29 皇家飞利浦有限公司 辐射射束强度分布整形器

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