MX364467B - Sistemas de exploración por rayos de energía dual, metodos de exploración y sistemas de inspección. - Google Patents
Sistemas de exploración por rayos de energía dual, metodos de exploración y sistemas de inspección.Info
- Publication number
- MX364467B MX364467B MX2016010257A MX2016010257A MX364467B MX 364467 B MX364467 B MX 364467B MX 2016010257 A MX2016010257 A MX 2016010257A MX 2016010257 A MX2016010257 A MX 2016010257A MX 364467 B MX364467 B MX 364467B
- Authority
- MX
- Mexico
- Prior art keywords
- energy ray
- ray
- low energy
- filter
- dual
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/224—Multiple energy techniques using one type of radiation, e.g. X-rays of different energies
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
- H05G1/30—Controlling
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
- G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/313—Accessories, mechanical or electrical features filters, rotating filter disc
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/423—Imaging multispectral imaging-multiple energy imaging
Landscapes
- Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Health & Medical Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Abstract
La presente divulgación proporciona un sistema de exploración de rayo de energía dual, un método de exploración de rayo de energía dual, y un sistema de inspección de rayo de energía dual, y se refiere al campo de la detección de generación de imagen de exploración de radiación; el sistema de exploración de rayo de energía dual comprende una fuente de rayo y un filtro, en donde la fuente de rayo se utiliza para emitir un rayo de alta energía y un rayo de baja energía; el filtro comprende una porción de filtración de baja energía y una porción de paso de baja energía; cuando la fuente de rayo emite el rayo de alta energía, la porción de filtración de baja energía del filtro queda alineada con una dirección de salida de la fuente de rayo, de manera que una parte de baja energía del rayo de alta energía es filtrada, y una parte de alta energía del rayo de alta energía es penetrada; y cuando la fuente de rayo emite el rayo de baja energía, la porción de paso de baja energía del filtro queda alineada con la dirección de salida de la fuente de rayo, de manera que el rayo de baja energía es penetrado; por lo tanto, se puede mejorar una capacidad de transmisión del rayo de alta energía sin afectar una capacidad de resolución de cable espacial del rayo de baja energía, garantizando tanto un índice de capacidad de transmisión como un índice de capacidad de resolución de cable espacial, de manera que el rayo de energía dual puede utilizar de manera suficiente la diferencia de sus características de penetración para identificar un objeto inspeccionado para lograr los propósitos de la inspección de seguridad.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510627055.XA CN105181723B (zh) | 2015-09-28 | 2015-09-28 | 双能射线扫描系统、扫描方法以及检查系统 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| MX2016010257A MX2016010257A (es) | 2017-03-27 |
| MX364467B true MX364467B (es) | 2019-04-26 |
Family
ID=54903950
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MX2016010257A MX364467B (es) | 2015-09-28 | 2016-08-08 | Sistemas de exploración por rayos de energía dual, metodos de exploración y sistemas de inspección. |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10285252B2 (es) |
| EP (1) | EP3147652A1 (es) |
| CN (1) | CN105181723B (es) |
| MX (1) | MX364467B (es) |
| WO (1) | WO2017054669A1 (es) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105181723B (zh) | 2015-09-28 | 2019-02-12 | 同方威视技术股份有限公司 | 双能射线扫描系统、扫描方法以及检查系统 |
| US10809415B2 (en) * | 2016-08-25 | 2020-10-20 | Beijing Haulixing Technology Development Co., Ltd. | Imaging device for use in vehicle security check and method therefor |
| CN107797155A (zh) * | 2016-08-31 | 2018-03-13 | 合肥美亚光电技术股份有限公司 | 康普顿背散射检测装置 |
| WO2019014251A1 (en) * | 2017-07-11 | 2019-01-17 | The Regents Of The University Of California | EVALUATION OF THE CALCIUM SCORE BY PARALLEL TOMOSYNTHESIS |
| CN110448320A (zh) * | 2019-08-01 | 2019-11-15 | 新里程医用加速器(无锡)有限公司 | 用于cbct系统的球管组件及双能三维体积图像的重建方法 |
| CN111781652B (zh) * | 2020-06-30 | 2023-08-18 | 上海瑞示电子科技有限公司 | 一种射线遮挡装置及射线源、射线检查设备 |
| CN112826520B (zh) * | 2020-12-29 | 2025-01-24 | 北京朗视仪器股份有限公司 | 能谱成像系统及方法 |
| CN115791842A (zh) * | 2022-10-18 | 2023-03-14 | 清华大学 | 无损检测系统、双能射线源装置及其使用方法 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5044002A (en) * | 1986-07-14 | 1991-08-27 | Hologic, Inc. | Baggage inspection and the like |
| CA1250062A (en) * | 1988-01-29 | 1989-02-14 | Earl Mccutcheon | Radiation reduction filter for use in medical diagnosis |
| US5319547A (en) * | 1990-08-10 | 1994-06-07 | Vivid Technologies, Inc. | Device and method for inspection of baggage and other objects |
| US6069936A (en) * | 1997-08-18 | 2000-05-30 | Eg&G Astrophysics | Material discrimination using single-energy x-ray imaging system |
| US7330535B2 (en) * | 2005-11-10 | 2008-02-12 | General Electric Company | X-ray flux management device |
| CN1997256B (zh) * | 2005-12-31 | 2010-08-25 | 清华大学 | 一种高低能x射线输出装置 |
| CN1995993B (zh) * | 2005-12-31 | 2010-07-14 | 清华大学 | 一种利用多种能量辐射扫描物质的方法及其装置 |
| US8019044B2 (en) * | 2008-02-15 | 2011-09-13 | Shkumat Nick A | Image acquisition for dual energy imaging |
| MX2012009921A (es) * | 2010-02-25 | 2012-12-17 | Rapiscan Systems Inc | Un sistema de inspeccion basado en espectroscopia de rayos x de alta energia y metodos para determinar el numero atomico de materiales. |
| US8483361B2 (en) * | 2010-12-22 | 2013-07-09 | General Electric Company | Anode target for an x-ray tube and method for controlling the x-ray tube |
| US9435900B2 (en) * | 2011-06-08 | 2016-09-06 | The Board Of Trustees Of The Leland Stanford Junior University | X-ray system utilizing alternating spectrum x-ray source in conjuction with a fixed spectrum separation filter approval |
| CN103185734B (zh) * | 2011-12-30 | 2015-11-25 | 同方威视技术股份有限公司 | 测量物体的有效原子序数的方法和设备 |
| CN103431871B (zh) * | 2013-09-04 | 2016-03-30 | 马文 | 便携式x-射线外围骨密度检测方法及成像系统 |
| CN204315245U (zh) * | 2014-12-30 | 2015-05-06 | 同方威视技术股份有限公司 | 射线过滤装置和双能x射线检查系统 |
| CN104464871B (zh) * | 2014-12-30 | 2017-11-21 | 同方威视技术股份有限公司 | 射线过滤装置和双能x射线检查系统 |
| CN104535592A (zh) * | 2014-12-31 | 2015-04-22 | 同方威视技术股份有限公司 | 一种滤波装置和方法及一种物质探测装置和方法 |
| CN204989068U (zh) * | 2015-09-28 | 2016-01-20 | 同方威视技术股份有限公司 | 双能射线扫描系统以及检查系统 |
| CN105181723B (zh) * | 2015-09-28 | 2019-02-12 | 同方威视技术股份有限公司 | 双能射线扫描系统、扫描方法以及检查系统 |
-
2015
- 2015-09-28 CN CN201510627055.XA patent/CN105181723B/zh active Active
-
2016
- 2016-08-08 MX MX2016010257A patent/MX364467B/es active IP Right Grant
- 2016-09-22 WO PCT/CN2016/099685 patent/WO2017054669A1/zh not_active Ceased
- 2016-09-27 EP EP16190738.1A patent/EP3147652A1/en not_active Withdrawn
- 2016-09-28 US US15/278,043 patent/US10285252B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| MX2016010257A (es) | 2017-03-27 |
| CN105181723A (zh) | 2015-12-23 |
| CN105181723B (zh) | 2019-02-12 |
| US10285252B2 (en) | 2019-05-07 |
| WO2017054669A1 (zh) | 2017-04-06 |
| US20170094762A1 (en) | 2017-03-30 |
| EP3147652A1 (en) | 2017-03-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FG | Grant or registration |