JP2015510847A5 - - Google Patents

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Publication number
JP2015510847A5
JP2015510847A5 JP2015501730A JP2015501730A JP2015510847A5 JP 2015510847 A5 JP2015510847 A5 JP 2015510847A5 JP 2015501730 A JP2015501730 A JP 2015501730A JP 2015501730 A JP2015501730 A JP 2015501730A JP 2015510847 A5 JP2015510847 A5 JP 2015510847A5
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JP
Japan
Prior art keywords
insoluble polymer
polymer foam
particles
coated
polishing pad
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2015501730A
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English (en)
Japanese (ja)
Other versions
JP6078631B2 (ja
JP2015510847A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2013/030353 external-priority patent/WO2013142134A1/en
Publication of JP2015510847A publication Critical patent/JP2015510847A/ja
Publication of JP2015510847A5 publication Critical patent/JP2015510847A5/ja
Application granted granted Critical
Publication of JP6078631B2 publication Critical patent/JP6078631B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2015501730A 2012-03-20 2013-03-12 セルフコンディショニング研磨パッドおよびその作製方法 Expired - Fee Related JP6078631B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261613398P 2012-03-20 2012-03-20
US61/613,398 2012-03-20
PCT/US2013/030353 WO2013142134A1 (en) 2012-03-20 2013-03-12 A self-conditioning polishing pad and a method of making the same

Publications (3)

Publication Number Publication Date
JP2015510847A JP2015510847A (ja) 2015-04-13
JP2015510847A5 true JP2015510847A5 (https=) 2016-03-31
JP6078631B2 JP6078631B2 (ja) 2017-02-08

Family

ID=49212255

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015501730A Expired - Fee Related JP6078631B2 (ja) 2012-03-20 2013-03-12 セルフコンディショニング研磨パッドおよびその作製方法

Country Status (6)

Country Link
US (1) US9050697B2 (https=)
JP (1) JP6078631B2 (https=)
KR (1) KR101532896B1 (https=)
CN (1) CN104302446B (https=)
TW (1) TWI574782B (https=)
WO (1) WO2013142134A1 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6078631B2 (ja) 2012-03-20 2017-02-08 ジェイエイチ ローデス カンパニー, インコーポレイテッド セルフコンディショニング研磨パッドおよびその作製方法
US10813444B2 (en) 2018-05-16 2020-10-27 Jh Rhodes Company, Inc. Porous polymeric polishing bristles and methods for their manufacture
KR101783406B1 (ko) * 2016-12-07 2017-10-10 엠.씨.케이 (주) 연마 패드 및 이의 제조방법
US11551936B2 (en) * 2018-07-31 2023-01-10 Taiwan Semiconductor Manufacturing Co., Ltd. Self-healing polishing pad
CN112080209B (zh) * 2020-09-11 2022-04-12 宁波江丰电子材料股份有限公司 一种冷却水盘和冷却管的粘结方法
WO2023034573A1 (en) * 2021-09-02 2023-03-09 Cmc Materials, Inc. Textured cmp pad comprising polymer particles
CN118927171A (zh) * 2024-09-19 2024-11-12 郑州磨料磨具磨削研究所有限公司 一种研抛一体化复合磨具及其制备方法和应用

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3925041B2 (ja) * 2000-05-31 2007-06-06 Jsr株式会社 研磨パッド用組成物及びこれを用いた研磨パッド
US6913517B2 (en) 2002-05-23 2005-07-05 Cabot Microelectronics Corporation Microporous polishing pads
JP4155790B2 (ja) * 2002-10-18 2008-09-24 株式会社東芝 化学機械研磨方法及び素子微細化分離用研磨パッド
JP4039214B2 (ja) 2002-11-05 2008-01-30 Jsr株式会社 研磨パッド
US20040224622A1 (en) * 2003-04-15 2004-11-11 Jsr Corporation Polishing pad and production method thereof
US20050176251A1 (en) 2004-02-05 2005-08-11 Duong Chau H. Polishing pad with releasable slick particles
EP1739729B1 (en) 2004-04-23 2012-03-28 JSR Corporation Polishing pad for semiconductor wafer, polishing multilayered body for semiconductor wafer having same, and method for polishing semiconductor wafer
JP4897238B2 (ja) * 2005-05-17 2012-03-14 東洋ゴム工業株式会社 研磨パッド
US7169031B1 (en) * 2005-07-28 2007-01-30 3M Innovative Properties Company Self-contained conditioning abrasive article
JP4379462B2 (ja) * 2006-10-31 2009-12-09 Jsr株式会社 研磨パッド用組成物及びこれを用いた研磨パッド
US8491360B2 (en) * 2007-10-26 2013-07-23 Innopad, Inc. Three-dimensional network in CMP pad
KR100955032B1 (ko) 2008-05-20 2010-04-28 (주)피에스텍 연마용 폴리우레탄 흡착 패드 조성물, 연마용 폴리우레탄흡착 패드 및 그 제조방법
CN102271867B (zh) * 2009-01-05 2015-07-01 音诺帕德股份有限公司 多层的化学机械平面化垫体
WO2010138724A1 (en) * 2009-05-27 2010-12-02 Rogers Corporation Polishing pad, polyurethane layer therefor, and method of polishing a silicon wafer
WO2011087737A2 (en) * 2009-12-22 2011-07-21 3M Innovative Properties Company Polishing pad and method of making the same
WO2012138705A2 (en) 2011-04-05 2012-10-11 Universal Photonics, Inc. A self-conditioning polishing pad and a method of making the same
JP6078631B2 (ja) 2012-03-20 2017-02-08 ジェイエイチ ローデス カンパニー, インコーポレイテッド セルフコンディショニング研磨パッドおよびその作製方法

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