JP2015506461A5 - - Google Patents

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Publication number
JP2015506461A5
JP2015506461A5 JP2014548167A JP2014548167A JP2015506461A5 JP 2015506461 A5 JP2015506461 A5 JP 2015506461A5 JP 2014548167 A JP2014548167 A JP 2014548167A JP 2014548167 A JP2014548167 A JP 2014548167A JP 2015506461 A5 JP2015506461 A5 JP 2015506461A5
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JP
Japan
Prior art keywords
platform
base
artifact
gauge
coordinate positioning
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JP2014548167A
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English (en)
Japanese (ja)
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JP2015506461A (ja
JP6339505B2 (ja
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Priority claimed from GBGB1202557.3A external-priority patent/GB201202557D0/en
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Publication of JP2015506461A5 publication Critical patent/JP2015506461A5/ja
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Publication of JP6339505B2 publication Critical patent/JP6339505B2/ja
Expired - Fee Related legal-status Critical Current
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JP2014548167A 2011-12-20 2012-12-19 座標位置決め機械をチェックするためのゲージ人工物および方法 Expired - Fee Related JP6339505B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201161577928P 2011-12-20 2011-12-20
US61/577,928 2011-12-20
GB1202557.3 2012-02-15
GBGB1202557.3A GB201202557D0 (en) 2012-02-15 2012-02-15 A gauge artefact and method for checking a coordinate positioning machine
PCT/GB2012/000915 WO2013093397A1 (en) 2011-12-20 2012-12-19 A gauge artefact and method for checking a coordinate positioning machine

Publications (3)

Publication Number Publication Date
JP2015506461A JP2015506461A (ja) 2015-03-02
JP2015506461A5 true JP2015506461A5 (enExample) 2017-12-21
JP6339505B2 JP6339505B2 (ja) 2018-06-06

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JP2014548167A Expired - Fee Related JP6339505B2 (ja) 2011-12-20 2012-12-19 座標位置決め機械をチェックするためのゲージ人工物および方法

Country Status (6)

Country Link
US (1) US9829300B2 (enExample)
EP (1) EP2795251B1 (enExample)
JP (1) JP6339505B2 (enExample)
CN (1) CN103998893A (enExample)
GB (1) GB201202557D0 (enExample)
WO (1) WO2013093397A1 (enExample)

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* Cited by examiner, † Cited by third party
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JP6126359B2 (ja) * 2012-11-15 2017-05-10 株式会社ミツトヨ 球体形状測定装置
EP3240995A1 (en) * 2014-12-30 2017-11-08 3M Innovative Properties Company Three-dimensional (3d) test standard
CN105606046B (zh) * 2015-11-04 2018-03-16 苏州天准科技股份有限公司 一种复合式坐标测量机融合标定器
FI127463B (en) * 2016-05-10 2018-06-29 Aabo Akademi Aabo Akademi Univ An artifact for determining resolution of imaging based on electromagnetic radiation and/or mechanical waves
US10845192B2 (en) * 2017-09-13 2020-11-24 Shawn Thomas Lause Machine tool test fixture
JP6598913B2 (ja) * 2018-03-27 2019-10-30 株式会社牧野フライス製作所 三次元ゲージおよび機械の三次元位置誤差測定方法
DE102018133671A1 (de) * 2018-12-28 2020-07-02 Carl Zeiss Industrielle Messtechnik Gmbh Normal zur Kalibrierung eines Koordinatenmessgeräts
JP7276807B2 (ja) * 2019-01-16 2023-05-18 株式会社浅沼技研 検査マスタ
JP6631984B1 (ja) * 2019-06-25 2020-01-15 株式会社浅沼技研 検査マスタ
GB202004192D0 (en) * 2020-03-23 2020-05-06 Renishaw Plc Calibration device and method
JP7576520B2 (ja) * 2021-07-08 2024-10-31 オークマ株式会社 工作機械の誤差同定方法、誤差同定プログラム、工作機械

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DE3719838A1 (de) 1987-06-13 1988-12-22 Daimler Benz Ag Formverkoerperung zur genauigkeitsueberpruefung von koordinatenmessgeraeten
GB8923947D0 (en) * 1989-10-24 1989-12-13 Lk Ltd Determination of spacial relationships
US5345690A (en) * 1990-02-23 1994-09-13 Renishaw Metrology Limited Contact probes
US5430948A (en) * 1993-07-12 1995-07-11 Vander Wal, Iii; H. James Coordinate measuring machine certification system
DE4424871C2 (de) * 1994-07-14 1998-04-09 Leitz Mestechnik Gmbh Verfahren zur Optimierung der Korrektur maschinenbedingter Meßfehler einer Koordinatenmeßmaschine
US5671541A (en) 1995-09-01 1997-09-30 Brown & Sharpe Manufacturing Company Accuracy verification devices for coordinate measuring machines
GB9605609D0 (en) * 1996-03-16 1996-05-15 Renishaw Plc Inspection system for coordinate positioning machine
JP3005681B1 (ja) * 1998-12-17 2000-01-31 工業技術院長 Ｃｍｍ校正ゲージ及びｃｍｍの校正方法
DE10018214A1 (de) * 2000-04-12 2001-10-25 Dreier Technology Ag Chur Verfahren und Vorrichtung zum Vermessen von Fertigungsmaschinen
JP2001330428A (ja) * 2000-05-23 2001-11-30 Natl Inst Of Advanced Industrial Science & Technology Meti ３次元測定機の測定誤差評価方法及び３次元測定機用ゲージ
DE10122080A1 (de) 2001-05-07 2002-11-14 Carl Zeiss 3D Metrology Servic Verfahren zum Bestimmen von Eigenschaften eines Koordinatenmeßgeräts sowie Testobjekt hierzu
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DE102004022750B4 (de) * 2004-05-07 2007-04-19 Bundesrepublik Deutschland, vertr. d. d. Bundesministerium für Wirtschaft und Technologie, dieses vertr. d. d. Präsidenten der Physikalisch-Technischen Bundesanstalt Verfahren zur Herstellung eines Mikro-Prüfkörpers
GB0712008D0 (en) * 2007-06-21 2007-08-01 Renishaw Plc Apparatus and method of calibration
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JP5332009B2 (ja) * 2008-05-12 2013-11-06 株式会社ミツトヨ 形状測定装置、及び形状測定方法
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