JP6339505B2 - 座標位置決め機械をチェックするためのゲージ人工物および方法 - Google Patents

座標位置決め機械をチェックするためのゲージ人工物および方法 Download PDF

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Publication number
JP6339505B2
JP6339505B2 JP2014548167A JP2014548167A JP6339505B2 JP 6339505 B2 JP6339505 B2 JP 6339505B2 JP 2014548167 A JP2014548167 A JP 2014548167A JP 2014548167 A JP2014548167 A JP 2014548167A JP 6339505 B2 JP6339505 B2 JP 6339505B2
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platform
base
artifact
gauge
coordinate positioning
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JP2014548167A
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Japanese (ja)
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JP2015506461A5 (enExample
JP2015506461A (ja
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クリストファー サマービル レオ
クリストファー サマービル レオ
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Renishaw PLC
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Renishaw PLC
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042—Calibration or calibration artifacts

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP2014548167A 2011-12-20 2012-12-19 座標位置決め機械をチェックするためのゲージ人工物および方法 Expired - Fee Related JP6339505B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201161577928P 2011-12-20 2011-12-20
US61/577,928 2011-12-20
GB1202557.3 2012-02-15
GBGB1202557.3A GB201202557D0 (en) 2012-02-15 2012-02-15 A gauge artefact and method for checking a coordinate positioning machine
PCT/GB2012/000915 WO2013093397A1 (en) 2011-12-20 2012-12-19 A gauge artefact and method for checking a coordinate positioning machine

Publications (3)

Publication Number Publication Date
JP2015506461A JP2015506461A (ja) 2015-03-02
JP2015506461A5 JP2015506461A5 (enExample) 2017-12-21
JP6339505B2 true JP6339505B2 (ja) 2018-06-06

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JP2014548167A Expired - Fee Related JP6339505B2 (ja) 2011-12-20 2012-12-19 座標位置決め機械をチェックするためのゲージ人工物および方法

Country Status (6)

Country Link
US (1) US9829300B2 (enExample)
EP (1) EP2795251B1 (enExample)
JP (1) JP6339505B2 (enExample)
CN (1) CN103998893A (enExample)
GB (1) GB201202557D0 (enExample)
WO (1) WO2013093397A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6126359B2 (ja) * 2012-11-15 2017-05-10 株式会社ミツトヨ 球体形状測定装置
EP3240995A1 (en) * 2014-12-30 2017-11-08 3M Innovative Properties Company Three-dimensional (3d) test standard
CN105606046B (zh) * 2015-11-04 2018-03-16 苏州天准科技股份有限公司 一种复合式坐标测量机融合标定器
FI127463B (en) * 2016-05-10 2018-06-29 Aabo Akademi Aabo Akademi Univ An artifact for determining resolution of imaging based on electromagnetic radiation and/or mechanical waves
US10845192B2 (en) * 2017-09-13 2020-11-24 Shawn Thomas Lause Machine tool test fixture
JP6598913B2 (ja) * 2018-03-27 2019-10-30 株式会社牧野フライス製作所 三次元ゲージおよび機械の三次元位置誤差測定方法
DE102018133671A1 (de) * 2018-12-28 2020-07-02 Carl Zeiss Industrielle Messtechnik Gmbh Normal zur Kalibrierung eines Koordinatenmessgeräts
JP7276807B2 (ja) * 2019-01-16 2023-05-18 株式会社浅沼技研 検査マスタ
JP6631984B1 (ja) * 2019-06-25 2020-01-15 株式会社浅沼技研 検査マスタ
GB202004192D0 (en) * 2020-03-23 2020-05-06 Renishaw Plc Calibration device and method
JP7576520B2 (ja) * 2021-07-08 2024-10-31 オークマ株式会社 工作機械の誤差同定方法、誤差同定プログラム、工作機械

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3719838A1 (de) 1987-06-13 1988-12-22 Daimler Benz Ag Formverkoerperung zur genauigkeitsueberpruefung von koordinatenmessgeraeten
GB8923947D0 (en) * 1989-10-24 1989-12-13 Lk Ltd Determination of spacial relationships
US5345690A (en) * 1990-02-23 1994-09-13 Renishaw Metrology Limited Contact probes
US5430948A (en) * 1993-07-12 1995-07-11 Vander Wal, Iii; H. James Coordinate measuring machine certification system
DE4424871C2 (de) * 1994-07-14 1998-04-09 Leitz Mestechnik Gmbh Verfahren zur Optimierung der Korrektur maschinenbedingter Meßfehler einer Koordinatenmeßmaschine
US5671541A (en) 1995-09-01 1997-09-30 Brown & Sharpe Manufacturing Company Accuracy verification devices for coordinate measuring machines
GB9605609D0 (en) * 1996-03-16 1996-05-15 Renishaw Plc Inspection system for coordinate positioning machine
JP3005681B1 (ja) * 1998-12-17 2000-01-31 工業技術院長 Ｃｍｍ校正ゲージ及びｃｍｍの校正方法
DE10018214A1 (de) * 2000-04-12 2001-10-25 Dreier Technology Ag Chur Verfahren und Vorrichtung zum Vermessen von Fertigungsmaschinen
JP2001330428A (ja) * 2000-05-23 2001-11-30 Natl Inst Of Advanced Industrial Science & Technology Meti ３次元測定機の測定誤差評価方法及び３次元測定機用ゲージ
DE10122080A1 (de) 2001-05-07 2002-11-14 Carl Zeiss 3D Metrology Servic Verfahren zum Bestimmen von Eigenschaften eines Koordinatenmeßgeräts sowie Testobjekt hierzu
GB0201362D0 (en) 2002-01-22 2002-03-13 Renishaw Plc Reversible sample holder
US20050068523A1 (en) 2003-08-11 2005-03-31 Multi-Dimension Technology, Llc Calibration block and method for 3D scanner
DE102004022750B4 (de) * 2004-05-07 2007-04-19 Bundesrepublik Deutschland, vertr. d. d. Bundesministerium für Wirtschaft und Technologie, dieses vertr. d. d. Präsidenten der Physikalisch-Technischen Bundesanstalt Verfahren zur Herstellung eines Mikro-Prüfkörpers
GB0712008D0 (en) * 2007-06-21 2007-08-01 Renishaw Plc Apparatus and method of calibration
DE102007030390B4 (de) 2007-06-29 2010-05-12 Vistec Semiconductor Systems Gmbh Koordinaten-Messmaschine und Verfahren zur Kalibrierung der Koordinaten-Messmaschine
JP5332009B2 (ja) * 2008-05-12 2013-11-06 株式会社ミツトヨ 形状測定装置、及び形状測定方法
GB201003363D0 (en) 2010-03-01 2010-04-14 Renishaw Plc Measurement method and apparatus
GB201003599D0 (en) 2010-03-04 2010-04-21 Renishaw Plc Measurement method and apparatus
CN202066495U (zh) * 2011-04-14 2011-12-07 兰州吉利汽车工业有限公司 校准标准球放置支架

Also Published As

Publication number Publication date
EP2795251B1 (en) 2020-08-26
WO2013093397A1 (en) 2013-06-27
CN103998893A (zh) 2014-08-20
GB201202557D0 (en) 2012-03-28
EP2795251A1 (en) 2014-10-29
US20140345359A1 (en) 2014-11-27
US9829300B2 (en) 2017-11-28
JP2015506461A (ja) 2015-03-02

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