JP2015215178A - 電場増強素子、分析装置及び電子機器 - Google Patents

電場増強素子、分析装置及び電子機器 Download PDF

Info

Publication number
JP2015215178A
JP2015215178A JP2014096554A JP2014096554A JP2015215178A JP 2015215178 A JP2015215178 A JP 2015215178A JP 2014096554 A JP2014096554 A JP 2014096554A JP 2014096554 A JP2014096554 A JP 2014096554A JP 2015215178 A JP2015215178 A JP 2015215178A
Authority
JP
Japan
Prior art keywords
metal
electric field
pitch
dielectric layer
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2014096554A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015215178A5 (enExample
Inventor
守 杉本
Mamoru Sugimoto
守 杉本
めぐみ 江成
Megumi Enari
めぐみ 江成
哲雄 眞野
Tetsuo Mano
哲雄 眞野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2014096554A priority Critical patent/JP2015215178A/ja
Priority to US14/706,394 priority patent/US9658165B2/en
Publication of JP2015215178A publication Critical patent/JP2015215178A/ja
Publication of JP2015215178A5 publication Critical patent/JP2015215178A5/ja
Priority to US15/488,054 priority patent/US9880100B2/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G01N21/658—Raman scattering enhancement Raman, e.g. surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
    • G01N33/483—Physical analysis of biological material

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Biophysics (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Urology & Nephrology (AREA)
  • Molecular Biology (AREA)
  • Hematology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2014096554A 2014-05-08 2014-05-08 電場増強素子、分析装置及び電子機器 Pending JP2015215178A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2014096554A JP2015215178A (ja) 2014-05-08 2014-05-08 電場増強素子、分析装置及び電子機器
US14/706,394 US9658165B2 (en) 2014-05-08 2015-05-07 Electronic field enhancement element, analysis device, and electronic apparatus
US15/488,054 US9880100B2 (en) 2014-05-08 2017-04-14 Electronic field enhancement element, analysis device, and electronic apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014096554A JP2015215178A (ja) 2014-05-08 2014-05-08 電場増強素子、分析装置及び電子機器

Publications (2)

Publication Number Publication Date
JP2015215178A true JP2015215178A (ja) 2015-12-03
JP2015215178A5 JP2015215178A5 (enExample) 2017-03-30

Family

ID=54367614

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014096554A Pending JP2015215178A (ja) 2014-05-08 2014-05-08 電場増強素子、分析装置及び電子機器

Country Status (2)

Country Link
US (2) US9658165B2 (enExample)
JP (1) JP2015215178A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014169955A (ja) * 2013-03-05 2014-09-18 Seiko Epson Corp 分析装置、分析方法、これらに用いる光学素子および電子機器、並びに光学素子の設計方法
US10527494B2 (en) * 2014-09-26 2020-01-07 Korea Intitute of Machinery & Materials Substrate on which multiple nanogaps are formed, and manufacturing method therefor

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050105085A1 (en) * 2003-10-12 2005-05-19 Fuji Photo Film Co., Ltd. Microstructure for use in Raman spectrometry and production process for the microstructure
JP2007192806A (ja) * 2005-12-22 2007-08-02 Canon Inc 標的物質検出素子用基板、標的物質検出素子、それを用いた標的物質の検出装置及び検出方法、並びにそのためのキット
JP2008529006A (ja) * 2005-01-27 2008-07-31 プレシェント メディカル、インコーポレイテッド ハンドヘルド・ラマン体液分析器
JP2009503548A (ja) * 2005-08-02 2009-01-29 ユニバーシティ・オブ・ユタ・リサーチ・ファウンデイション 金属ナノキャビティを含むバイオセンサー
JP2012132804A (ja) * 2010-12-22 2012-07-12 Kyoto Univ 光増強素子
JP2012198060A (ja) * 2011-03-18 2012-10-18 Seiko Epson Corp 物質成分検出装置
JP2013221883A (ja) * 2012-04-18 2013-10-28 Seiko Epson Corp 試料分析素子および検出装置
JP2013246115A (ja) * 2012-05-29 2013-12-09 Seiko Epson Corp 光学デバイス及び検出装置

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3979184A (en) 1975-05-27 1976-09-07 General Electric Company Diagnostic device for visually detecting presence of biological particles
JPS6137581A (ja) 1984-07-31 1986-02-22 Nissan Motor Co Ltd 電動式動力舵取り装置
US20050068883A1 (en) * 2003-09-30 2005-03-31 Pioneer Corporation Optical recording medium and method for production of optical recording medium
FR2860872A1 (fr) 2003-10-09 2005-04-15 Commissariat Energie Atomique Micro-capteurs et nano-capteurs d'especes chimiques et biologiques a plasmons de surface
FR2864251B1 (fr) * 2003-12-17 2006-04-28 Essilor Int Article d'optique revetu d'un revetement anti-reflets multicouches absorbant dans le visible et procede de fabrication
NZ551786A (en) 2004-05-19 2011-03-31 Vp Holding Llc Optical sensor with layered plasmon structure for enhanced detection of chemical groups by surface enhanced raman scattering
US8441631B2 (en) * 2004-05-24 2013-05-14 OptoTrace (SuZhou) Technologies, Inc. Integrated device capable of performing chemical separation and light scattering
JP4156567B2 (ja) 2004-06-16 2008-09-24 日本電信電話株式会社 Ｓｐｒセンサーおよび屈折率測定方法
US7643156B2 (en) 2005-06-14 2010-01-05 Fujifilm Corporation Sensor, multichannel sensor, sensing apparatus, and sensing method
JP2007024870A (ja) 2005-06-14 2007-02-01 Fujifilm Holdings Corp センサ、センシング装置、及びセンシング方法
WO2007015556A1 (en) 2005-08-01 2007-02-08 Canon Kabushiki Kaisha Target substance detecting device, target substance detecting method using the same, and detecting apparatus and kit therefor
JP4878238B2 (ja) 2005-08-01 2012-02-15 キヤノン株式会社 標的物質検出用の素子及びそれを用いた標的物質の検出方法、並びにそのための検出装置及びキット
JP2008014933A (ja) 2006-06-08 2008-01-24 Fujifilm Corp ラマン分光用デバイス、及びラマン分光装置
US7639355B2 (en) 2007-06-26 2009-12-29 Hewlett-Packard Development Company, L.P. Electric-field-enhancement structure and detection apparatus using same
JP5294600B2 (ja) 2007-09-28 2013-09-18 キヤノン株式会社 標的物質検出装置、及び標的物質検出方法
JP5288772B2 (ja) 2007-11-02 2013-09-11 キヤノン株式会社 化学センサ素子、センシング装置およびセンシング方法
US20120081703A1 (en) * 2009-05-07 2012-04-05 Nant Holdings Ip, Llc Highly Efficient Plamonic Devices, Molecule Detection Systems, and Methods of Making the Same
EP2372348A1 (en) * 2010-03-22 2011-10-05 Imec Methods and systems for surface enhanced optical detection
WO2012011998A2 (en) 2010-04-28 2012-01-26 The Regents Of The University Of California Impedance matching ground plane for high efficiency coupling with optical antennas
JP5810667B2 (ja) 2011-06-23 2015-11-11 セイコーエプソン株式会社 光デバイス及び検出装置
JP5821511B2 (ja) 2011-10-17 2015-11-24 セイコーエプソン株式会社 光デバイス及び検出装置
JP2013142546A (ja) 2012-01-06 2013-07-22 Panasonic Corp 生体成分の濃度を測定する方法及び測定装置
JP5880064B2 (ja) 2012-01-18 2016-03-08 セイコーエプソン株式会社 試料分析素子および検出装置
JP5923992B2 (ja) 2012-01-18 2016-05-25 セイコーエプソン株式会社 試料分析素子および検出装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050105085A1 (en) * 2003-10-12 2005-05-19 Fuji Photo Film Co., Ltd. Microstructure for use in Raman spectrometry and production process for the microstructure
JP2005172569A (ja) * 2003-12-10 2005-06-30 Fuji Photo Film Co Ltd 微細構造体、微細構造体の作製方法、ラマン分光方法および装置
JP2008529006A (ja) * 2005-01-27 2008-07-31 プレシェント メディカル、インコーポレイテッド ハンドヘルド・ラマン体液分析器
JP2009503548A (ja) * 2005-08-02 2009-01-29 ユニバーシティ・オブ・ユタ・リサーチ・ファウンデイション 金属ナノキャビティを含むバイオセンサー
JP2007192806A (ja) * 2005-12-22 2007-08-02 Canon Inc 標的物質検出素子用基板、標的物質検出素子、それを用いた標的物質の検出装置及び検出方法、並びにそのためのキット
JP2012132804A (ja) * 2010-12-22 2012-07-12 Kyoto Univ 光増強素子
JP2012198060A (ja) * 2011-03-18 2012-10-18 Seiko Epson Corp 物質成分検出装置
JP2013221883A (ja) * 2012-04-18 2013-10-28 Seiko Epson Corp 試料分析素子および検出装置
JP2013246115A (ja) * 2012-05-29 2013-12-09 Seiko Epson Corp 光学デバイス及び検出装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
YIZHUO CHU: "Double resonance surface enhanced Raman scattering substrates: an intuitive coupled oscillator model", OPTICS EXPRESS, vol. 19, no. 16, JPN6016050153, 19 July 2011 (2011-07-19), pages 14919 - 14928, ISSN: 0003796575 *

Also Published As

Publication number Publication date
US20150323444A1 (en) 2015-11-12
US9880100B2 (en) 2018-01-30
US20170219493A1 (en) 2017-08-03
US9658165B2 (en) 2017-05-23

Similar Documents

Publication Publication Date Title
Kanipe et al. Large format surface-enhanced Raman spectroscopy substrate optimized for enhancement and uniformity
JP6365817B2 (ja) 分析装置、及び電子機器
JP2015055482A (ja) 分析装置、分析方法、これらに用いる光学素子及び電子機器
JP2014163869A (ja) 光学素子、分析装置、分析方法、および電子機器
JP2014173920A (ja) 分析装置、分析方法、これらに用いる光学素子および電子機器、並びに光学素子の設計方法
JP2014163868A (ja) 光学素子、分析装置、分析方法、および電子機器
US20160282266A1 (en) Analysis device, analysis method, optical element and electronic apparatus for analysis device and analysis method, and method of designing optical element
JP2015152492A (ja) 分析装置、及び電子機器
JP2015212626A (ja) 電場増強素子、ラマン分光法、ラマン分光装置、および電子機器
JP2015114219A (ja) 電場増強素子、分析装置、及び電子機器
JP6544504B2 (ja) 分析装置及び電子機器
US9880100B2 (en) Electronic field enhancement element, analysis device, and electronic apparatus
JP2016003946A (ja) 電場増強素子、分析装置、及び電子機器
EP3051277A2 (en) Electric-field enhancement element, analysis device, and eletronic apparatus
JP2015078904A (ja) 光学素子、分析装置、及び電子機器
JP6521215B2 (ja) 分析装置、及び電子機器
TW200837345A (en) Planar surface plasma resonance sensor
JP2015068663A (ja) 光学素子、分析装置、及び電子機器
JP2015096813A (ja) ラマン分光装置、及び電子機器
JP2015212625A (ja) 分析方法
JP2016197069A (ja) 電場増強素子、分析装置、及び電子機器

Legal Events

Date Code Title Description
RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20160617

RD03 Notification of appointment of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7423

Effective date: 20160628

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20170227

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20170227

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20180126

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20180206

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20180326

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20180522