JP2015203606A5 - - Google Patents

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Publication number
JP2015203606A5
JP2015203606A5 JP2014082310A JP2014082310A JP2015203606A5 JP 2015203606 A5 JP2015203606 A5 JP 2015203606A5 JP 2014082310 A JP2014082310 A JP 2014082310A JP 2014082310 A JP2014082310 A JP 2014082310A JP 2015203606 A5 JP2015203606 A5 JP 2015203606A5
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JP
Japan
Prior art keywords
substrate
sensor
scintillator layer
manufacturing
forming
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JP2014082310A
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English (en)
Japanese (ja)
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JP6333034B2 (ja
JP2015203606A (ja
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Priority to JP2014082310A priority Critical patent/JP6333034B2/ja
Priority claimed from JP2014082310A external-priority patent/JP6333034B2/ja
Publication of JP2015203606A publication Critical patent/JP2015203606A/ja
Publication of JP2015203606A5 publication Critical patent/JP2015203606A5/ja
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Publication of JP6333034B2 publication Critical patent/JP6333034B2/ja
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JP2014082310A 2014-04-11 2014-04-11 放射線撮像装置の製造方法 Active JP6333034B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014082310A JP6333034B2 (ja) 2014-04-11 2014-04-11 放射線撮像装置の製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014082310A JP6333034B2 (ja) 2014-04-11 2014-04-11 放射線撮像装置の製造方法

Publications (3)

Publication Number Publication Date
JP2015203606A JP2015203606A (ja) 2015-11-16
JP2015203606A5 true JP2015203606A5 (enExample) 2017-05-25
JP6333034B2 JP6333034B2 (ja) 2018-05-30

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ID=54597130

Family Applications (1)

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JP2014082310A Active JP6333034B2 (ja) 2014-04-11 2014-04-11 放射線撮像装置の製造方法

Country Status (1)

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JP (1) JP6333034B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3121513B2 (ja) 1994-12-14 2001-01-09 株式会社巴技術研究所 デュアルプレート逆止め弁
JP3121546B2 (ja) 1996-09-09 2001-01-09 株式会社巴技術研究所 デュアルプレート逆止弁
CN107398844B (zh) * 2017-06-26 2019-05-28 东软医疗系统股份有限公司 一种探测器制造夹具和闪烁体定位方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4447752B2 (ja) * 2000-08-03 2010-04-07 浜松ホトニクス株式会社 放射線検出器
US20050008291A1 (en) * 2003-07-08 2005-01-13 Baney Dougas M. Optical wave-guide microstructured environment absorption cell
JP5680943B2 (ja) * 2010-11-16 2015-03-04 キヤノン株式会社 シンチレータ、放射線検出装置および放射線撮影装置
JP6071283B2 (ja) * 2012-07-04 2017-02-01 キヤノン株式会社 放射線検出装置及びその製造方法
JP2014048061A (ja) * 2012-08-29 2014-03-17 Canon Inc 放射線撮像装置、その製造方法、及び放射線撮像システム

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