JP2015148561A5 - - Google Patents

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Publication number
JP2015148561A5
JP2015148561A5 JP2014022683A JP2014022683A JP2015148561A5 JP 2015148561 A5 JP2015148561 A5 JP 2015148561A5 JP 2014022683 A JP2014022683 A JP 2014022683A JP 2014022683 A JP2014022683 A JP 2014022683A JP 2015148561 A5 JP2015148561 A5 JP 2015148561A5
Authority
JP
Japan
Prior art keywords
contact
inspection apparatus
contact inspection
axial direction
terminals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2014022683A
Other languages
English (en)
Japanese (ja)
Other versions
JP6546719B2 (ja
JP2015148561A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2014022683A priority Critical patent/JP6546719B2/ja
Priority claimed from JP2014022683A external-priority patent/JP6546719B2/ja
Priority to TW103145004A priority patent/TWI561824B/zh
Publication of JP2015148561A publication Critical patent/JP2015148561A/ja
Publication of JP2015148561A5 publication Critical patent/JP2015148561A5/ja
Application granted granted Critical
Publication of JP6546719B2 publication Critical patent/JP6546719B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2014022683A 2014-02-07 2014-02-07 接触検査装置 Active JP6546719B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014022683A JP6546719B2 (ja) 2014-02-07 2014-02-07 接触検査装置
TW103145004A TWI561824B (en) 2014-02-07 2014-12-23 Contact inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014022683A JP6546719B2 (ja) 2014-02-07 2014-02-07 接触検査装置

Publications (3)

Publication Number Publication Date
JP2015148561A JP2015148561A (ja) 2015-08-20
JP2015148561A5 true JP2015148561A5 (enrdf_load_stackoverflow) 2017-02-16
JP6546719B2 JP6546719B2 (ja) 2019-07-17

Family

ID=53892010

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014022683A Active JP6546719B2 (ja) 2014-02-07 2014-02-07 接触検査装置

Country Status (2)

Country Link
JP (1) JP6546719B2 (enrdf_load_stackoverflow)
TW (1) TWI561824B (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6890921B2 (ja) 2015-10-21 2021-06-18 株式会社日本マイクロニクス プローブカード及び接触検査装置
JP6704733B2 (ja) * 2016-01-08 2020-06-03 株式会社日本マイクロニクス プローブ、プローブカード及び接触検査装置
SG11201903814UA (en) 2016-11-30 2019-05-30 Nidec Read Corp Contact terminal, inspection jig, and inspection device
JP6969930B2 (ja) * 2017-08-24 2021-11-24 株式会社日本マイクロニクス プローブ
CN108490242B (zh) * 2018-04-02 2020-03-27 国网江苏省电力有限公司徐州供电分公司 一种新型验电装置
DE102022119935A1 (de) * 2022-08-08 2024-02-08 Ingun Prüfmittelbau Gmbh Prüfstiftvorrichtung

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2030089U (zh) * 1988-05-24 1989-01-04 李牧 螺旋刃活检针
JPH0817500A (ja) * 1994-06-30 1996-01-19 Advantest Corp Ｂｇａｉｃ用ソケット及びこれに用いるスプリングピン
JP3851464B2 (ja) * 1999-03-04 2006-11-29 株式会社日立製作所 マニピュレータおよびそれを用いたプローブ装置、試料作製装置
TWM249021U (en) * 2002-10-15 2004-11-01 Autmwell Entpr Co Ltd Contact terminal structure of seat for IC testing
DE102005022482A1 (de) * 2005-05-11 2006-11-16 Dr. Johannes Heidenhain Gmbh Antaststift und damit ausgestattetes Tastsystem
US7601009B2 (en) * 2006-05-18 2009-10-13 Centipede Systems, Inc. Socket for an electronic device
TWM328566U (en) * 2006-07-04 2008-03-11 Yu-Shen Chen Conductive complex tips spring probe contact unit
US7491069B1 (en) * 2008-01-07 2009-02-17 Centipede Systems, Inc. Self-cleaning socket for microelectronic devices
JP5208619B2 (ja) * 2008-08-25 2013-06-12 日置電機株式会社 プローブおよびプローブユニット
JP5255459B2 (ja) * 2009-01-06 2013-08-07 日本電子材料株式会社 コンタクトプローブ
JP2010281583A (ja) * 2009-06-02 2010-12-16 Nidec-Read Corp 検査用治具
US20140111238A1 (en) * 2011-06-22 2014-04-24 Meiko Electronics Co., Ltd. Spiral probe and method of manufacturing the spiral probe
JP5821432B2 (ja) * 2011-09-05 2015-11-24 日本電産リード株式会社 接続端子及び接続治具

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