SG11201903814UA - Contact terminal, inspection jig, and inspection device - Google Patents

Contact terminal, inspection jig, and inspection device

Info

Publication number
SG11201903814UA
SG11201903814UA SG11201903814UA SG11201903814UA SG11201903814UA SG 11201903814U A SG11201903814U A SG 11201903814UA SG 11201903814U A SG11201903814U A SG 11201903814UA SG 11201903814U A SG11201903814U A SG 11201903814UA SG 11201903814U A SG11201903814U A SG 11201903814UA
Authority
SG
Singapore
Prior art keywords
tubular body
portions
contact terminal
inspection
stick
Prior art date
Application number
SG11201903814UA
Inventor
Norihiro Ota
Original Assignee
Nidec Read Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidec Read Corp filed Critical Nidec Read Corp
Publication of SG11201903814UA publication Critical patent/SG11201903814UA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Abstract

CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS A contact terminal defined by a probe Pr includes a tubular body Pa which is made of an electrically conductive material and is tubular and central conductors Pb and Pc each of which is made of an electrically conductive material and is a shape of a stick. The central conductors Pb and Pc include stick-shaped bodies Pbl and Pc1 inserted into the tubular body Pa. The tubular body Pa includes spring portions Pel and Pe2 which are defined by helical bodies configured such that helical grooves Pgl and Pg2 are formed along a circumference thereof and clasping portions Pdl and Pd2 which are fitted onto proximal end portions of the stick-shaped bodies Pbl and Pc1 to fit the proximal end portions. The clasping portions Pdl and Pd2 are defined by a circumferential wall of the tubular body Pa by a slit Phi extending from end portions of the helical grooves Pgl and Pg2 which define the spring portions Pel and Pe2 in an axial direction of the tubular body Pa at which portions are separated in a circumferential direction of the tubular body Pa. FIG. 3
SG11201903814UA 2016-11-30 2017-11-28 Contact terminal, inspection jig, and inspection device SG11201903814UA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016232912 2016-11-30
PCT/JP2017/042508 WO2018101232A1 (en) 2016-11-30 2017-11-28 Contact terminal, inspection jig, and inspection device

Publications (1)

Publication Number Publication Date
SG11201903814UA true SG11201903814UA (en) 2019-05-30

Family

ID=62242824

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201903814UA SG11201903814UA (en) 2016-11-30 2017-11-28 Contact terminal, inspection jig, and inspection device

Country Status (9)

Country Link
US (1) US10656179B2 (en)
EP (1) EP3550310B1 (en)
JP (1) JP6432017B2 (en)
KR (1) KR101996789B1 (en)
CN (1) CN110036300B (en)
MY (1) MY177005A (en)
SG (1) SG11201903814UA (en)
TW (1) TWI693406B (en)
WO (1) WO2018101232A1 (en)

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JP7023276B2 (en) * 2017-03-29 2022-02-21 日本発條株式会社 A semiconductor inspection device including a probe, a probe unit, and a probe unit.
JP7017373B2 (en) * 2017-11-01 2022-02-08 株式会社日本マイクロニクス Probe and its manufacturing method
WO2020039969A1 (en) * 2018-08-23 2020-02-27 日本電産リード株式会社 Inspection jig, inspection device, and contact terminal
CN113287023A (en) * 2019-01-10 2021-08-20 日本电产理德股份有限公司 Contact terminal, inspection jig, and inspection device
TW202032137A (en) * 2019-02-22 2020-09-01 日商日本電產理德股份有限公司 Test jig
CN114930175A (en) * 2020-01-10 2022-08-19 日本电产理德股份有限公司 Contactor, inspection jig, inspection device, and method for manufacturing contactor
KR20230067769A (en) * 2021-11-08 2023-05-17 주식회사 에이엠에스티 Test socket
TWI819531B (en) * 2022-03-21 2023-10-21 皇亮科技股份有限公司 Probe

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Also Published As

Publication number Publication date
EP3550310A4 (en) 2020-08-19
WO2018101232A1 (en) 2018-06-07
JPWO2018101232A1 (en) 2018-11-29
TWI693406B (en) 2020-05-11
KR101996789B1 (en) 2019-07-04
EP3550310A1 (en) 2019-10-09
JP6432017B2 (en) 2018-12-05
US20190346485A1 (en) 2019-11-14
KR20190065460A (en) 2019-06-11
EP3550310B1 (en) 2021-10-20
CN110036300A (en) 2019-07-19
US10656179B2 (en) 2020-05-19
MY177005A (en) 2020-09-01
TW201821807A (en) 2018-06-16
CN110036300B (en) 2020-03-06

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