JP2015132599A - 光電センサ及び監視領域内の物体の検出方法 - Google Patents

光電センサ及び監視領域内の物体の検出方法 Download PDF

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Publication number
JP2015132599A
JP2015132599A JP2014253665A JP2014253665A JP2015132599A JP 2015132599 A JP2015132599 A JP 2015132599A JP 2014253665 A JP2014253665 A JP 2014253665A JP 2014253665 A JP2014253665 A JP 2014253665A JP 2015132599 A JP2015132599 A JP 2015132599A
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JP
Japan
Prior art keywords
unit
scanning
photoelectric sensor
light
deflection
Prior art date
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Pending
Application number
JP2014253665A
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English (en)
Japanese (ja)
Inventor
ウルリッヒ ニューブリング ラルフ
Ulrich Nubling Ralf
ウルリッヒ ニューブリング ラルフ
イェーゲル マティアス
Jaegel Matthias
イェーゲル マティアス
シュマルフス モリッツ
Schmalfuss Moritz
シュマルフス モリッツ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sick AG
Original Assignee
Sick AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sick AG filed Critical Sick AG
Publication of JP2015132599A publication Critical patent/JP2015132599A/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/101—Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • G01C3/06—Use of electric means to obtain final indication
    • G01C3/08—Use of electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/42—Simultaneous measurement of distance and other co-ordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4817—Constructional features, e.g. arrangements of optical elements relating to scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/497—Means for monitoring or calibrating
    • G01S7/4972—Alignment of sensor
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/18—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
    • G02B7/182—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors
    • G02B7/1821—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors for rotating or oscillating mirrors
JP2014253665A 2014-01-10 2014-12-16 光電センサ及び監視領域内の物体の検出方法 Pending JP2015132599A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102014100245.8 2014-01-10
DE102014100245.8A DE102014100245B3 (de) 2014-01-10 2014-01-10 Optoelektronischer Sensor und Verfahren zur Erfassung von Objekten in einem Überwachungsbereich

Publications (1)

Publication Number Publication Date
JP2015132599A true JP2015132599A (ja) 2015-07-23

Family

ID=51831617

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014253665A Pending JP2015132599A (ja) 2014-01-10 2014-12-16 光電センサ及び監視領域内の物体の検出方法

Country Status (3)

Country Link
EP (1) EP2894493B1 (de)
JP (1) JP2015132599A (de)
DE (1) DE102014100245B3 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014118149A1 (de) * 2014-12-08 2016-06-09 Sick Ag Optoelektronischer Sensor und Verfahren zum Erfassen von Objekten
DE102015104021B4 (de) 2015-03-18 2023-03-09 Sick Ag Polygonscanner und Verfahren zum Erfassen von Objekten
DE102017103791B4 (de) 2017-02-23 2021-09-30 Sick Ag Optoelektronischer Sensor und Verfahren zur Erfassung von Objekten
DE102017109056A1 (de) * 2017-04-27 2018-10-31 Rheinmetall Defence Electronics Gmbh Sensor-Vorrichtung zur dreidimensionalen Erfassung von Zielobjekten
DE102017111868A1 (de) * 2017-05-31 2018-12-06 Valeo Schalter Und Sensoren Gmbh Optische Sendeeinheit sowie Verfahren zum Betrieb einer optischen Sendeeinheit
DE202017107043U1 (de) 2017-11-21 2019-02-25 Sick Ag Polygonscanner zum Erfassen von Objekten in einem Überwachungsbereich
DE102017127420A1 (de) 2017-11-21 2019-05-23 Sick Ag Polygonscanner und Verfahren zum Erfassen von Objekten in einem Überwachungsbereich
DE102018102601A1 (de) 2018-02-06 2019-08-08 Sick Ag Optoelektronischer Sensor und Verfahren zur Erfassung von Objekten in einem Überwachungsbereich
DE102018113849B4 (de) 2018-06-11 2023-04-20 Sick Ag Optoelektronischer Sensor und Verfahren zu Erfassung von Objekten
DE202018103258U1 (de) 2018-06-11 2019-09-12 Sick Ag Optischer Sensor zur Erfassung von Objekten
DE102019125684B4 (de) 2019-09-24 2022-07-28 Sick Ag Optoelektronischer Sensor und Verfahren zur Erfassung von Objekten
EP3955022A1 (de) * 2020-08-12 2022-02-16 Leuze electronic GmbH + Co. KG Sensoranordnung und verfahren zu deren betrieb
EP4060374A1 (de) 2021-03-15 2022-09-21 Sick Ag Erfassung eines objekts in einem überwachungsbereich

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003281686A (ja) * 2002-03-20 2003-10-03 Mitsubishi Heavy Ind Ltd 距離画像センサ及び車種判別装置
JP2004340856A (ja) * 2003-05-19 2004-12-02 Soatec Inc レーザ測定装置
US20050279914A1 (en) * 2004-03-16 2005-12-22 Jerry Dimsdale Contact-free slip ring for survey instrumentation
JP2008082782A (ja) * 2006-09-26 2008-04-10 Topcon Corp レーザスキャナ
JP2009098111A (ja) * 2007-02-28 2009-05-07 Denso Wave Inc レーザレーダ装置
JP2010122183A (ja) * 2008-11-21 2010-06-03 Sanyo Electric Co Ltd 物体検出装置および情報取得装置
JP2010231604A (ja) * 2009-03-27 2010-10-14 Ihi Corp 車両渋滞検出装置
DE102009035984A1 (de) * 2009-08-04 2011-02-10 Ingenieurbüro Spies GbR (vertretungsberechtigte Gesellschafter: Hans Spies, Martin Spies, 86558 Hohenwart) Multifunktionaler Laufzeitsensor

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19741730B4 (de) 1997-09-22 2006-02-02 Sick Ag Verfahren zur Ermittlung der Oberflächenkontur von Meßobjekten
DE10141294B4 (de) 2001-08-23 2016-12-08 Sick Ag Verfahren zur Bodenerkennung
DE102006013340A1 (de) * 2006-03-23 2007-09-27 Carl Zeiss Optronics Gmbh Vorrichtung und Verfahren zum Entdecken von optischen Systemen in einem Geländebereich
EP1965225A3 (de) * 2007-02-28 2009-07-15 Denso Wave Incorporated Laserradarvorrichtung zur dreidimensionalen Erkennung von Objekten
DE102008013906B4 (de) * 2008-03-13 2010-03-18 Spies, Hans, Dipl.-Ing. Optischer Laufzeitsensor mit Azimut und Elevationsabtastung
DE102009049809B4 (de) * 2008-04-18 2019-10-10 Ingenieurbüro Spies GbR (vertretungsberechtigte Gesellschafter: Hans Spies, Martin Spies, 86558 Hohenwart) Optischer Laufzeitsensor zur Raumabtastung
DE102008032216A1 (de) 2008-07-09 2010-01-14 Sick Ag Vorrichtung zur Erkennung der Anwesenheit eines Objekts im Raum
DE202009012114U1 (de) * 2009-09-05 2011-02-03 Sick Ag Optoelektronischer Scanner

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003281686A (ja) * 2002-03-20 2003-10-03 Mitsubishi Heavy Ind Ltd 距離画像センサ及び車種判別装置
JP2004340856A (ja) * 2003-05-19 2004-12-02 Soatec Inc レーザ測定装置
US20050279914A1 (en) * 2004-03-16 2005-12-22 Jerry Dimsdale Contact-free slip ring for survey instrumentation
JP2008082782A (ja) * 2006-09-26 2008-04-10 Topcon Corp レーザスキャナ
JP2009098111A (ja) * 2007-02-28 2009-05-07 Denso Wave Inc レーザレーダ装置
JP2010122183A (ja) * 2008-11-21 2010-06-03 Sanyo Electric Co Ltd 物体検出装置および情報取得装置
JP2010231604A (ja) * 2009-03-27 2010-10-14 Ihi Corp 車両渋滞検出装置
DE102009035984A1 (de) * 2009-08-04 2011-02-10 Ingenieurbüro Spies GbR (vertretungsberechtigte Gesellschafter: Hans Spies, Martin Spies, 86558 Hohenwart) Multifunktionaler Laufzeitsensor

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EP2894493B1 (de) 2016-09-14
EP2894493A1 (de) 2015-07-15
DE102014100245B3 (de) 2014-11-20

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