JP2015031643A - Inspection chip - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an inspection chip capable of preventing an inspection liquid from flowing back to a previous process side when an inspection liquid is measured and performing a proper inspection.SOLUTION: The inspection chip includes: a quantification part for quantifying a liquid including an inspection liquid; a surplus part formed via the quantification part and a surplus flow passage and holding the inspection liquid defined as a surplus in the quantification part; a measurement part formed via a measurement flow passage in a downstream side of the quantification part and optically measuring a liquid including the inspection liquid; and a step wall surface or a recessed part formed in the measurement flow passage. The step wall surface or the recessed part is formed in a measurement flow passage in a first direction side toward a second connection part with the quantification part and the surplus flow passage from a first connection part with the quantification part and the measurement flow passage.

Description

  The present invention relates to a test chip for performing chemical, medical, and biological tests on a substance to be tested.

  In recent years, the importance of detecting, detecting or quantifying DNA (Deoxyribo Nucleic Acid) or biological substances such as enzymes, antigens, antibodies, proteins, viruses, cells, or chemical substances in the fields of medicine, health, food, drug discovery, etc. Is increasing. Test chips called microchips such as various biochips and microchemical chips that can easily measure such biological substances and chemical substances have been proposed.

  The microchip has a fluid circuit inside. The fluid circuit includes, for example, a liquid reagent holding unit that holds a liquid reagent, a sample such as blood to be tested or analyzed, a specific component in the sample, a measuring unit for measuring the liquid reagent, a sample in the sample or the sample Each unit includes a mixing unit that mixes a specific component and a liquid reagent, a detection unit that performs inspection or analysis on the mixed solution, and a fine path that appropriately connects these units.

  For example, in a microchip, various tests may be performed using plasma components in blood. In Patent Document 1, plasma components are separated and extracted from blood injected into a fluid path by centrifugation or the like, and measurement is performed. The weighed plasma and the liquid reagent move to the mixing unit and are mixed. A microchip in which a mixed specimen moves to a detection unit and optical measurement is performed is disclosed.

JP 2009-258013 A

  However, in the technique described in Patent Document 1 described above, the specimen is introduced into the detection unit by the centrifugal force applied to the microchip, and the detection unit is irradiated with light. Since the path from the mixing unit to the detection unit gets wet when the sample or reagent passes, the sample or reagent passes to the mixing unit while the detection unit is irradiated with light due to the affinity between the sample and the microchip. An example is the problem of backflow. If the sample flows out of the detection unit, the sample to be measured cannot be accurately analyzed.

  This disclosure has been made in order to solve the above-described problem, and provides a test chip capable of preventing the test liquid from flowing back to the previous process side and performing an appropriate test when measuring the test liquid. The purpose is to do.

  In order to solve the above-described problems and achieve the object, the inspection chip according to claim 1 is formed through a quantification unit for quantifying a liquid containing a test liquid, the quantification unit, and an excess channel, A surplus part for holding the surplus test liquid in the quantification part; a measurement part for optically measuring the liquid containing the test liquid formed downstream of the quantification part via a measurement channel; A step wall surface or a recess formed in the measurement channel, the step wall surface or the recess from the first connecting portion between the quantification unit and the measurement channel to the quantification unit and the excess channel It is formed in the said measurement flow path of the 1st direction side which goes to the 2nd connection part.

  The inspection object receiver according to claim 2 is the above-described disclosure, wherein the concave portion opened on the opposite side of the first direction is formed, and the wall surface of the measurement channel on the first direction side and the third connection portion The wall surface of the concave portion to be connected is extended to the first direction side with respect to a direction parallel to the wall surface on the opposite side to the first direction of the quantitative unit.

  The inspection object receptacle according to a third aspect of the present invention is characterized in that, in the above disclosure, the depth of the recess in the thickness direction of the test chip is shallower than the depth of the measurement channel in the thickness direction.

  The inspection object receptacle according to a fourth aspect of the present invention is characterized in that, in the above disclosure, the concave portion includes a region extending along an extending direction of the measurement flow channel.

  A test target receptacle according to a disclosure of claim 5 includes a reagent quantification unit for quantifying a reagent mixed with the liquid containing the test liquid in the above disclosure, and the measurement unit includes the volume of the quantification unit and the volume of the quantification unit The depth of the measurement part in the thickness direction of the test chip is smaller than the depth of the measurement flow channel in the thickness direction.

  The inspection object receiver according to claim 6 is the above-described disclosure, wherein the wall surface of the measurement unit on the first direction side is formed closer to the first direction side than the wall surface of the measurement channel on the first direction side. It is characterized by being.

  According to the disclosure of the first aspect, since the measurement flow path on the first direction side includes the stepped wall surface or the concave portion, the measurement liquid is measured when the measurement liquid is measured in the measurement unit. It is possible to reduce the reverse flow of the road. In particular, backflow is reduced even when measuring a test liquid having a high affinity with the test chip. Therefore, since an accurate measurement can be performed, an appropriate inspection can be performed.

  According to the disclosure of claim 2, the wall surface of the recess connected in the third connection portion extends to the first direction side with respect to a direction parallel to the wall surface in the direction opposite to the first direction of the fixed amount portion. Therefore, it is difficult for the liquid containing the inspection liquid that has flowed in through the measurement channel to flow backward through the wall surface of the recess. Therefore. It is possible to further reduce the backflow of the inspection liquid through the measurement channel.

  According to the disclosure of claim 3, the depth in the thickness direction of the test chip in the recess is shallower than the depth in the thickness direction of the measurement channel. Thereby, when the liquid containing a test | inspection liquid flows into a recessed part, a test | inspection liquid is hold | maintained at a recessed part with capillary force. As a result, it is possible to further reduce the backflow of the test liquid through the measurement channel.

  According to the disclosure of claim 4, the recess includes a region extending along the extending direction of the measurement flow channel. Due to this region, when a liquid containing the inspection liquid flows into the recess, an external force in the direction opposite to the extending direction is required for the liquid to flow backward from the recess, and it becomes difficult to flow backward. As a result, it is possible to further reduce the backflow of the test liquid through the measurement channel.

  According to the disclosure of claim 5, the depth in the thickness direction of the measurement part is shallower than the depth in the thickness direction of the measurement flow path. As a result, the capillary force easily acts on the measurement unit, and the outflow of the liquid containing the test liquid flowing into the measurement unit can be reduced. As a result, it is possible to further reduce the backflow of the test liquid through the measurement channel.

  According to the disclosure of claim 6, the wall surface of the measurement unit on the first direction side is formed closer to the first direction side than the wall surface of the measurement flow path on the first direction side. As a result, the liquid containing the test liquid that has flowed into the measurement unit becomes difficult to adhere from the wall surface of the measurement unit to the wall surface of the measurement flow channel, and the backflow of the test liquid through the measurement flow channel can be further reduced.

It is a figure showing an example of an inspection device of an embodiment of this indication. It is explanatory drawing which shows the test | inspection chip 2 of 1st Embodiment of this indication. It is explanatory drawing which shows an example of operation | movement of the test | inspection chip 2 of 1st Embodiment of this indication. It is explanatory drawing which shows an example of operation | movement of the test | inspection chip 2 of 1st Embodiment of this indication. It is explanatory drawing which shows an example of operation | movement of the test | inspection chip 2 of 1st Embodiment of this indication. It is explanatory drawing which shows the test | inspection chip 4 of 2nd Embodiment of this indication. It is an enlarged view which shows the measurement part vicinity of the test | inspection chip 4 of 2nd Embodiment of this indication. It is an enlarged view which shows the measurement part vicinity of the test | inspection chip 5 of a modification.

  Exemplary embodiments of an inspection chip according to the present disclosure will be described below in detail with reference to the accompanying drawings.

<1. Schematic structure of inspection system 3>
An embodiment of the present disclosure will be described. A schematic structure of the inspection system 3 will be described with reference to FIG. The inspection system 3 of the present embodiment includes an inspection chip 2 that can store a sample and a reagent that are liquids, and an inspection apparatus 1 that performs an inspection using the inspection chip 2. When the inspection device 1 rotates the inspection chip 2 around the vertical axis A <b> 1 separated from the inspection chip 2, centrifugal force acts on the inspection chip 2. When the inspection apparatus 1 rotates the inspection chip 2 around the horizontal axis A2, the centrifugal direction that is the direction of the centrifugal force acting on the inspection chip 2 is switched. That is, the inspection chip 2 is mounted on the inspection device 1 that can apply centrifugal force to the liquid contained therein. Since the inspection system 3 and the inspection apparatus 1 of the present embodiment have a known structure as described in JP 2012-78107 A, in the following description, an outline of the structure of the inspection apparatus 1 will be described.

<2. Structure of the inspection apparatus 1>
The structure of the inspection apparatus 1 will be described with reference to FIG. In the following description, the upper, lower, right, left, front side, and back side of FIG. 1 are defined as the front, rear, right, left, upper, and lower sides of the inspection apparatus 1, respectively. . In the present embodiment, the direction of the vertical axis A1 is the vertical direction of the inspection apparatus 1, and the direction of the horizontal axis A2 is the direction of the speed when the inspection chip 2 is rotated about the vertical axis A1. . FIG. 1 shows a state in which the top plate of the upper housing 30 of the inspection apparatus 1 has been removed.

  As shown in FIG. 1, the inspection apparatus 1 includes an upper housing 30, a lower housing 31, an upper plate 32, a turntable 33, an angle changing mechanism 34, and a control device 90. The turntable 33 is a disk rotatably provided on the upper side of an upper plate 32 described later. The two inspection chips 2 are held above the turntable 33. The angle changing mechanism 34 is a drive mechanism provided on the turntable 33. The angle changing mechanism 34 rotates the inspection chip 2 around the horizontal axis A2. The upper housing 30 is fixed to an upper plate 32 described later, and a measuring unit 7 that performs optical measurement on the inspection chip 2 is provided inside the upper housing 30. The control device 90 is a controller that controls various processes of the inspection device 1.

  A schematic structure of the lower housing 31 will be described. The lower housing 31 has a box-shaped frame structure in which frame members are combined. An upper plate 32 that is a rectangular plate material is provided on the upper surface of the lower housing 31. A drive mechanism for rotating the turntable 33 around the vertical axis A1 is provided in the lower housing 31 as follows.

  A spindle motor 35 that supplies a driving force for rotating the turntable 33 is installed on the left side in the lower housing 31. A shaft 36 of the main shaft motor 35 protrudes upward, and a pulley 37 is fixed to the shaft 36. A vertical main shaft 57 extending upward from the inside of the lower housing 31 is provided at the center of the lower housing 31. The main shaft 57 passes through the upper plate 32 and protrudes above the lower housing 31. The upper end portion of the main shaft 57 is connected to the center portion of the turntable 33.

  The main shaft 57 is rotatably held by a support member (not shown) provided immediately below the upper plate 32. A pulley 38 is fixed to the main shaft 57 below the support member. A belt 39 is stretched over the pulley 37 and the pulley 38. When the main shaft motor 35 rotates the shaft 36, the driving force is transmitted to the main shaft 57 via the pulley 37, the belt 39, and the pulley 38. At this time, the turntable 33 rotates around the main shaft 57 in conjunction with the rotation of the main shaft 57.

  A guide rail (not shown) extending in the vertical direction inside the lower housing 31 is provided on the right side in the lower housing 31. A T-shaped plate (not shown) is movable in the vertical direction in the lower housing 31 along the guide rail.

  The main shaft 57 is a cylindrical body having a hollow inside. An inner shaft (not shown) is a shaft that can move in the vertical direction inside the main shaft 57. The upper end portion of the inner shaft passes through the main shaft 57 and is connected to the rack gear 43. A bearing (not shown) is provided at the left end of the T-shaped plate. Inside the bearing, the lower end portion of the inner shaft is rotatably held.

  A horizontal motor 51 for moving the T-shaped plate up and down is fixed in front of the T-shaped plate. The shaft 58 of the horizontal motor 51 protrudes rearward, that is, downward in FIG. A disc-shaped cam plate (not shown) is fixed to the tip of the shaft 58. A cylindrical projection (not shown) is provided on the rear surface of the cam plate. The tip of the protrusion is inserted into a groove (not shown). The protrusion can slide in the groove. When the horizontal motor 51 rotates the shaft 58, the protrusion moves up and down in conjunction with the rotation of the cam plate. At this time, the T-shaped plate moves up and down along the guide rail in conjunction with the protrusion inserted in the groove. The spindle motor 35 and the horizontal motor 51 may be well-known motors such as a stepping motor, a servo motor, and a DC motor.

  The detailed structure of the angle changing mechanism 34 will be described. The angle changing mechanism 34 has a pair of L-shaped plates 60 fixed to the upper surface of the turntable 33. Each L-shaped plate 60 extends upward from a base portion fixed in the vicinity of the center of the turntable 33, and its upper end portion extends outward in the radial direction of the turntable 33. A rack gear 43 fixed to the inner shaft is provided between the pair of L-shaped plates 60. The rack gear 43 is a metal plate-like member that is long in the vertical direction, and gears are respectively carved on both end faces.

  On the front end side in the extending direction of each L-shaped plate 60, a horizontal support shaft 46 having a gear 45 is rotatably supported. The support shaft 46 fixes the holder 100. For this reason, in conjunction with the rotation of the gear 45, the inspection chip 2 held by the holder 100 also rotates around the support shaft 46. Between the gear 45 and the rack gear 43, a pinion gear 44 supported by an L-shaped plate 60 so as to be rotatable around an axial center in the front-rear direction is interposed. The pinion gear 44 meshes with the gear 45 and the rack gear 43, respectively. In conjunction with the vertical movement of the rack gear 43, the pinion gear 44 and the gear 45 are driven to rotate, and the inspection chip 2 rotates about the support shaft 46.

  In the present embodiment, as the main shaft motor 35 rotationally drives the turntable 33, the inspection chip 2 rotates around the main shaft 57 that is a vertical axis, and a centrifugal force acts on the inspection chip 2. The rotation around the vertical axis A1 of the inspection chip 2 is referred to as revolution. On the other hand, as the horizontal motor 51, which will be described later, moves the inner shaft up and down, the inspection chip 2 rotates around the support shaft 46, which is the horizontal axis, and the direction of the centrifugal force acting on the inspection chip 2 changes relatively. To do. The rotation around the horizontal axis A2 of the inspection chip 2 is referred to as rotation. As shown in FIG. 1, the inspection chip 2 of the present embodiment is arranged in parallel with the vertical axis A <b> 1 and revolved. The inspection chip 2 is not limited to this, and may be disposed at an arbitrary angle. For example, the inspection chip 2 may be disposed perpendicular to the vertical axis A1 and revolved.

  In a state where the T-shaped plate is lowered to the lowermost end of the movable range, the rack gear 43 is also lowered to the lowermost end of the movable range. At this time, the inspection chip 2 is in a steady state where the rotation angle is 0 degree. Further, in the state where the T-shaped plate is raised to the uppermost end of the movable range, the rack gear 43 is also raised to the uppermost end of the movable range. At this time, the test | inspection chip 2 will be in the state rotated 90 degree | times centering on the horizontal axis A2 from the steady state. That is, in this embodiment, the angle width that the test chip 2 can rotate is the rotation angle of 0 degree to 90 degrees. A rotation angle of 0 degrees indicates the state of the inspection chip 2 shown in FIG. 2, and a rotation angle of 90 degrees indicates a state rotated 90 degrees counterclockwise from 0 degrees.

  The detailed structure of the upper housing 30 will be described. As shown in FIG. 1, the upper housing 30 has a box-like frame structure in which frame members are combined, and is installed on the upper left side of the upper plate 32. More specifically, the upper housing 30 is provided outside the range in which the inspection chip 2 is rotated as viewed from the main shaft 57 at the rotation center of the turntable 33.

  The measurement unit 7 provided inside the upper housing 30 includes a light source 71 that emits measurement light, and an optical sensor 72 that detects the measurement light emitted from the light source 71. The light source 71 and the optical sensor 72 are disposed on both the front and rear sides of the turntable 33 outside the rotation range of the inspection chip 2. In the present embodiment, the position on the left side of the main shaft 57 in the reciprocable range of the inspection chip 2 is a measurement position at which the inspection chip 2 is irradiated with measurement light. When the inspection chip 2 is at the measurement position, the measurement light connecting the light source 71 and the optical sensor 72 intersects the front surface and the rear surface of the inspection chip 2 substantially perpendicularly.

<3. Electrical configuration of control device 90>
The electrical configuration of the control device 90 will be described with reference to FIG. The control device 90 includes a CPU 91 that performs main control of the inspection device 1, a RAM 92 that temporarily stores various data, and a ROM 93 that stores a control program. Connected to the CPU 91 are an operation unit 94 for a user to input instructions to the control device 90, a hard disk device 95 for storing various data and programs, and a display 96 for displaying various information. As the control device 90, a personal computer may be used, or a dedicated control device may be used.

  A revolution controller 97, a rotation controller 98, and a measurement controller 99 are connected to the CPU 91. The revolution controller 97 controls the revolution of the inspection chip 2 by transmitting a control signal for rotating the spindle motor 35 to the spindle motor 35. The rotation controller 98 controls the rotation of the inspection chip 2 by transmitting a control signal for rotating the horizontal motor 51 to the horizontal motor 51. The measurement controller 99 performs the optical measurement of the inspection chip 2 by driving the measurement unit 7. Specifically, the measurement controller 99 transmits a control signal for executing light emission of the light source 71 and light detection of the optical sensor 72 to the light source 71 and the optical sensor 72. The CPU 91 controls the revolution controller 97, the rotation controller 98 and the measurement controller 99.

<4. Structure of inspection chip 2>
With reference to FIG. 2 and FIG. 3, the detailed structure of the test | inspection chip 2 of 1st Embodiment is demonstrated. In the following description, the upper side, lower side, right side, left side, front side of the paper surface, and rear side of the paper surface in FIG. 2 are the upper side, lower side, right side, left side, front side, and rear side of the inspection chip 2, respectively.

  As shown in FIG. 2, the inspection chip 2 has a square shape when viewed from the front as an example, and mainly includes a transparent synthetic resin plate material 20 having a predetermined thickness. A liquid channel 21 is formed in the plate member 20 with the front opening. That is, the liquid channel 21 is a recess formed at a predetermined depth and extends in a direction orthogonal to the front-rear direction, which is the thickness direction of the plate member 20. The liquid channel 21 is a channel through which the sample injected into the test chip 2 can flow. The front surface of the plate member 20 is sealed with a sheet (not shown) made of a transparent synthetic resin thin plate. The liquid channel 21 may be formed in the plate member 20 by opening the front surface and the rear surface, and may be formed by sealing the front surface and the rear surface of the liquid channel 21 with a sheet.

  The liquid channel 21 includes a sample inlet 221, a separation unit 222, a sample first surplus unit 223, a sample quantitative unit 224, a sample second surplus unit 225, and a mixing unit 226. The sample injection port 221 is an opening formed in the upper left of the test chip 2 and into which a capillary (not shown) is inserted. That is, the sample injection port 221 is a part where the sample is injected into the test chip 2. The specimen is a fluid containing components such as blood, bone marrow, urine, vaginal tissue, epithelial tissue, tumor, semen, saliva, and foodstuffs. A specimen is an example of the test liquid of the present invention.

  A separation unit 222 is formed downstream of the specimen injection port 221. A sample first surplus portion 223 is formed by being connected to the channel formed on the left side from the separation unit 222, and a sample quantifying unit 224 is formed by being connected to the channel formed on the right side. In the separation unit 222, components contained in the specimen are separated by the centrifugal force generated by the revolution of the test apparatus 1. During this separation, the sample overflowing from the separation unit 222 flows into the sample first surplus portion 223. By rotating the test chip 2, a sample containing components necessary for measurement flows into the sample determination unit 224.

  The sample determination unit 224 is formed downstream of the separation unit 222. A sample second surplus portion 225 is formed by connecting to the channel formed on the left side from the sample determination unit 224, and a mixing unit 226 is formed connected to the channel formed on the right side. The specimen quantification unit 224 quantifies the specimen containing the components necessary for the measurement in an amount necessary for the measurement by the centrifugal force caused by the revolution. During this quantification, the sample overflowing from the sample quantification unit 224 flows into the sample second surplus unit 225. By rotating the test chip 2, a quantified sample containing components necessary for measurement flows into the mixing unit 226.

  The liquid channel 21 includes a first reagent inlet 231, a first reagent quantitative unit 232, and a first reagent surplus unit 233. The first reagent inlet 231 is an opening formed on the right side of the specimen inlet 221 and into which a capillary (not shown) is inserted. That is, the first reagent injection port 231 is a part where the first reagent is injected into the test chip 2. The first reagent is a reagent for examining the specimen. The first reagent is an example of the test liquid of the present invention.

  The first reagent quantitative unit 232 is formed downstream of the first reagent inlet 231. The first reagent surplus portion 233 is formed by connecting to the flow channel formed on the left side from the first reagent quantification unit 232, and the flow channel formed on the right side is connected to the mixing unit 226. In the first reagent quantification unit 232, the amount of the first reagent necessary for measurement is quantified by centrifugal force due to revolution. At the time of this quantification, the sample overflowing from the first reagent quantification unit 232 flows into the first reagent surplus unit 233. As the test chip 2 rotates, the quantified first reagent flows into the mixing unit 226.

  The mixing unit 226 is formed downstream of the sample quantitative unit 224 and the first reagent quantitative unit 232. In the mixing unit 226, the separated and quantified specimen and the first reagent are mixed. The mixed liquid flows into the mixed liquid quantification unit 241 as the inspection chip 2 rotates.

  The mixed liquid determination unit 241 is formed downstream of the mixing unit 226. In the mixed solution quantification unit 241, the amount of the mixed solution necessary for measurement is quantified by the centrifugal force due to revolution. At the time of this quantification, the liquid mixture overflowing from the liquid mixture quantification part 241 flows into the liquid mixture surplus part 242 via the surplus flow path 241A. As the inspection chip 2 rotates, the quantified liquid mixture flows into the measurement unit 251 through the measurement flow path 241B. Details of the measurement unit 251 will be described later. The mixed liquid quantification unit 241 is an example of the quantification unit of the present invention. The liquid mixture surplus part 242 is an example of the surplus part of the present invention.

  The liquid channel 21 includes a second reagent inlet 261, a second reagent quantitative unit 262, and a second reagent surplus unit 263. The second reagent inlet 261 is an opening formed on the right side of the first reagent inlet 231 and into which a capillary (not shown) is inserted. That is, the second reagent injection port 261 is a part where the second reagent is injected into the test chip 2. The second reagent is a reagent for examining the specimen. The second reagent is an example of the test liquid of the present invention.

  The second reagent quantitative unit 262 is formed downstream of the second reagent inlet 261. The second reagent surplus portion 263 is formed by being connected to the channel formed on the left side from the second reagent quantification unit 262, and the channel formed on the right side is connected to the measuring unit 251. In the second reagent quantification unit 262, the amount of the second reagent necessary for measurement is quantified by the centrifugal force due to revolution. During this quantification, the second reagent overflowing from the second reagent quantification unit 262 flows into the second reagent surplus unit 263. By rotating the test chip 2, the quantified second reagent flows into the measurement unit 251.

<Near measuring part>
The measurement unit 251 will be described with reference to FIGS. In the test chip 2 of the first embodiment, the sample, the first reagent, and the second reagent, which are necessary for measurement, flow back from the measurement unit 251, and the sample, the first reagent, and the second reagent that have flowed into the measurement unit 251. It is possible to reduce a decrease in measurement accuracy due to a lack of the amount. Details will be described below.

  FIG. 3 is a diagram illustrating a state in which the mixed solution of the specimen and the first reagent flows into the mixed solution quantification unit 241 and the second reagent flows into the measurement unit 251. As shown in FIG. 3, when the mixed solution is quantified in the mixed solution quantification unit 241, the centrifugal force Fr <b> 1 by the inspection apparatus 1 is directed downward. The direction from the first connection portion 2412 between the mixed solution quantification unit 241 and the measurement channel 241B to the second connection unit 2411 between the mixture solution quantification unit 241 and the surplus channel 241A is the left direction. The direction from the first connection portion 2412 toward the second connection portion 2411 is the first direction of the present invention.

  The second reagent is held in the measurement unit 251 when the mixed solution is quantified in the mixed solution quantification unit 241. When the quantification of the mixed liquid is completed, the test chip 2 is rotated, and the direction Fr of the centrifugal force is controlled so that the quantified mixed liquid flows into the measuring unit 251. That is, as shown in FIG. 4, in the process in which the direction Fr of the centrifugal force is changed from the lower direction to the right direction, the direction Fr2 of the centrifugal force is relative to the direction in which the right wall surface 243 of the mixed liquid quantification unit 241 extends. When forming an orthogonal or acute angle, the mixed solution does not remain in the mixed solution quantification unit 241, but is held on the right wall surface of the measurement unit 251 and the measurement channel 241B. When the direction Fr2 of the centrifugal force is orthogonal or acute with respect to the direction in which the right wall surface 243 of the mixed liquid quantification unit 241 extends, the wall surface 244 connected to the right wall surface 243 is also in the centrifugal force direction Fr2. It is formed so as to form an orthogonal or acute angle. The right wall surface 243 is an example of the wall surface on the opposite side to the first direction of the quantification unit of the present invention.

  When the mixed liquid flows in toward the measurement unit 251, the mixed liquid flows in from the end point 245 of the wall surface 244 along the direction Fr2 of the centrifugal force. A wall surface 246 connected to the wall surface 244 via the end point 245 is formed to extend downward. As a result, in the process in which the direction Fr of the centrifugal force is changed from the lower direction to the right direction, the wall surface 246 has an acute angle or orthogonal to the direction Fr2 of the centrifugal force. Therefore, it is difficult for the liquid mixture to contact the wall surface 246. Further, the second reagent that has flowed into the measurement unit 251 is held on the right wall surface of the flow path connected to the measurement unit 251. As a result, the measurement liquid is mixed with the liquid mixture and mixed with the specimen, the first reagent, and the second reagent. Also in this measurement liquid, the mixed liquid is difficult to come into contact with the wall surface 246 in the process in which the direction Fr of the centrifugal force is changed from the downward direction to the right direction.

  As shown in FIG. 4, a measurement liquid holding part 254, which is a recess opened in the right direction, is formed on the left wall surface of the measurement flow path 241B. The upper wall surface 2541 of the measurement liquid holding unit 254 is connected to the wall surface 246 at the third connection unit 2461. The upper wall surface 2541 extends to the left side with respect to the direction parallel to the extending direction of the right wall surface 243.

  The direction of the centrifugal force is controlled, and as shown in FIG. 5, the direction of centrifugal force Fr3 is directed downward, and the measurement liquid is held in the measurement unit 251. When the measurement liquid is held in the measurement unit 251, the revolution is stopped and the measurement controller 99 performs optical measurement of the inspection chip 2. At this time, since the centrifugal force is not applied to the measurement liquid and is held only by gravity, the measurement liquid may resist gravity and flow out through the wall surface forming the measurement unit 251.

  A ridge line 252 is provided in the measurement unit 251. The lower part of the ridge line 252 is formed shallower in the front-rear direction than the upper part so that the measurement liquid does not flow out from the measurement unit 251. That is, since the cross-sectional area is smaller in the lower part than in the upper part of the ridge line 252, the measurement unit 251 holds the measurement liquid by capillary force. Since the flow path 21 is formed so that the sample, the first reagent, and the second reagent are quantified in the test chip 2, the total amount of the sample, the first reagent, and the second reagent flowing into the measurement unit 251 is Predetermined. Therefore, the ridge line 252 can be formed at the position where the liquid surface of the measurement liquid is located. As a result, the measurement liquid does not easily flow out of the measurement unit 251.

  The left wall surface 253 of the measurement unit 251 is formed on the left side of the wall surface 246. A length L1 between the left wall surface 253 and the wall surface 246 is, for example, about 0.8 mm. Since the left wall surface 253 is formed on the left side of the wall surface 246, the possibility that the measurement liquid contacts the left wall surface 253 can be reduced. As a result, a region where the measurement liquid is not in contact is generated on the left wall surface 253, and the measurement liquid is difficult to flow out of the measurement unit 251 during measurement.

  A measurement liquid holding part 254 is formed between the left wall surface 253 and the wall surface 246. When the measurement liquid flows backward through the left wall surface 253, the measurement liquid holding unit 254 holds the measurement liquid. As a result, it is possible to reduce the backflow of the measurement liquid through the measurement channel 241B. In particular, even when measuring a test liquid having a high affinity with the test chip 2, backflow is reduced. Therefore, since an accurate measurement can be performed, an appropriate inspection can be performed. Further, the measurement liquid holding part 254 on the left side of the ridge line 255 in the front-rear direction is formed shallower than the right side so that the flowing measurement liquid can be held by capillary force. The position of the ridge line 255 may be an arbitrary position as long as it is inside the measurement liquid holding unit.

  The wall surface 256 of the measurement liquid holding unit 254 connected to the left wall surface 253 is formed at a position higher than the ridgeline 252 by a length L2. In order to prevent the backflow of the measurement liquid from the measurement unit 251, the height L <b> 2 may be high, but is about 4 mm as an example.

  In the first embodiment, since the measurement liquid holding unit 254 is formed, the mixed liquid adheres to the wall surface 246 shown in FIG. 5, and the measurement unit 251 even if the mixed liquid hangs down in the centrifugal force direction Fr3 or the gravity direction. It does not adhere to the left side surface 253. Thereby, the affinity between the left wall surface 253 and the measurement liquid is weakened, and the backflow can be reduced. Not limited to this, even if the mixed solution adheres to the wall surface 246, the mixed solution does not adhere to the left side surface 253 because it is held by the measuring solution holding portion 253 that connects the upper wall surface of the measuring solution holding portion 253. Thereby, the affinity between the left wall surface 253 and the measurement liquid or the mixed liquid is weakened, and the backflow can be reduced.

  A second embodiment of the present disclosure will be described with reference to FIG. Unlike the first embodiment, the test chip 4 of the second embodiment has a sample injection port 441 formed at the upper right of the test chip, and the first reagent and the sample quantification unit 443 are provided between the measurement unit 451 and the sample determination unit 443. A reagent flow path 433 for allowing the second reagent to flow in is formed. Details will be described below.

  The liquid channel 400 includes a first reagent inlet 421, a first reagent quantitative unit 422, and a holding unit 423. The first reagent injection port 421 is an opening formed in the upper left of the test chip 2 and into which a capillary (not shown) is inserted. The first reagent quantitative unit 422 is formed downstream of the first reagent injection port 421. In the first reagent quantification unit 422, the amount of the first reagent necessary for measurement is quantified by the centrifugal force generated by the revolution of the inspection apparatus 1. As the test chip 2 rotates, the quantified first reagent flows into the holding unit 423.

  The liquid channel 400 includes a second reagent inlet 431 and a second reagent quantitative unit 432. The second reagent inlet 431 is an opening formed on the right side of the first reagent inlet 421 and into which a capillary (not shown) is inserted. The second reagent quantitative unit 432 is formed downstream of the second reagent inlet 431. In the first reagent quantification unit 432, the amount of the second reagent necessary for measurement is quantified by centrifugal force due to revolution. As the test chip 2 rotates, the quantified second reagent flows into the measurement unit 451 through the upper portion of the right wall surface 4231 of the holding unit 423 shown in FIG.

  The liquid channel 400 includes a sample injection port 441, a separation unit 442, and a sample quantification unit 443. The sample injection port 221 is an opening formed in the upper right of the test chip 2 and into which a capillary (not shown) is inserted. A separation unit 442 is formed downstream of the specimen injection port 441. A sample quantification unit 443 is formed by being connected to a flow path formed on the right side of the separation unit 442. The specimen quantification unit 443 quantifies the specimen containing the components necessary for the measurement in an amount necessary for the measurement by the centrifugal force due to the revolution. At the time of this quantification, the liquid mixture overflowing from the sample quantification unit 443 flows into the sample surplus unit 444 via the surplus channel 443A. As the inspection chip 2 rotates, the quantified liquid flows into the measurement unit 451 through the measurement channel 443B. The sample quantification unit 443 is an example of the quantification unit of the present invention. The specimen surplus portion 444 is an example of the surplus portion of the present invention.

<Near measuring part>
The measurement unit 451 will be described with reference to FIG. In the test chip 4 of the second embodiment, the sample, the first reagent, and the second reagent that have flowed into the measurement unit 451, flow back from the measurement unit 451, and are necessary for the measurement. It is possible to reduce a decrease in measurement accuracy due to a lack of the amount. Details will be described below.

  As in the first embodiment, the direction Fr of the centrifugal force is controlled, and the sample quantified by the sample quantification unit 443 flows into the measurement unit 451. Similarly, the first reagent and the second reagent also flow into the measurement unit in the order of the second reagent and the first reagent. When the first reagent and the second reagent flow into the measurement unit 451, the direction of the centrifugal force is changed from the downward direction to the right direction. In the process in which the direction of the centrifugal force is changed from the downward direction to the right direction, when the direction of the centrifugal force is orthogonal or acute with respect to the direction in which the right wall surface 4231 of the holding portion 423 extends, the holding portion 423 holds it. The first reagent and the second reagent thus made flow into the measurement channel 443B through the reagent channel 433. At this time, the first reagent and the second reagent do not flow into the measurement liquid holding part 452 which is a recess formed on the left side of the measurement channel 443B. This is because the third connection part 4232 on the upper side of the measurement liquid holding part 452 extends to the right side from a point P1 described later.

  As in the first embodiment, the measurement liquid holding unit 452 has a thinner area below the ridge line 455 than the thickness of the measurement channel 443B.

  FIG. 7 shows points P1 to P4 indicating the shape of the wall of the measurement unit 451, and shows a state in which the measurement liquid flows into the measurement unit 451. Further, the centrifugal force direction Fr4 is downward in FIG. 7 in a state where the measurement liquid flows into the measurement unit 451. The point P1 is the upper end of the measurement liquid holding unit 452. The point P2 is the upper end on the left side of the measurement part 451 formed in a concave shape. The point P3 is the lowermost end of the measurement part 451 formed in a concave shape. The point P4 is the upper end on the right side of the measurement part 451 formed in a concave shape.

  The direction in which the wall extending from the point P1 to the point P2 extends is preferably the lower right direction. When the extending direction is the lower left direction, the second reagent extends in the upper left direction from the third connection part 4232 of the measurement liquid holding part 452 in order to prevent the second reagent from flowing into the measurement liquid holding part 452 when flowing into the measurement part 451. The wall 4233 needs to be long. When this wall 4233 is lengthened, the amount of liquid that may adhere to the wall 4233 increases, and the wetted area increases. Therefore, the affinity between the measurement liquid and the wall 4233 is increased, and the measurement liquid is likely to flow backward. On the other hand, when the extending direction of the wall from the point P1 to the point P2 is the lower right direction, the wetted area is reduced, and the backflow of the measurement liquid can be reduced. Further, the spread of the liquid level can be reduced as compared with the case where the extending direction of the wall from the point P1 to the point P2 is the lower left direction.

  The direction from point P3 to point P4 is preferably the upper right direction. Compared with the case where the direction from P3 to point P4 is the upper left direction, the distance between the wall surface from point P3 to point P4 and the third connection portion 4232 is increased. As a result, it is possible to reduce the back flow of the measurement liquid and the spread of the liquid level.

  In the second embodiment, even if the mixed solution adheres to the wall 4233 shown in FIG. 7 and the mixed solution hangs down in the direction of centrifugal force Fr4 or in the direction of gravity, the measurement solution holding part 452 is formed. Alternatively, the liquid mixture does not come into contact with the wall 4233 on the left side of the measurement liquid holding unit 452. Thereby, the left wall surface of the measurement liquid holding part 452 and the affinity between the wall 4233 and the measurement liquid are weakened, and the backflow can be reduced.

  In the first embodiment and the second embodiment, the measurement liquid holding units 254 and 452 are provided in the test chips 2 and 4, but the measurement liquid holding units 254 and 452 may not be provided. FIG. 8 shows an enlarged view of the vicinity of the measurement unit 501 of the test chip 5 according to the modification. In FIG. 8, the same components as those in the first embodiment will be described with the same reference numerals.

  The measurement unit 501 and the left wall surface 502 of the measurement channel 501B extend upward and are connected to a wall 503 extending from the lower end of the wall surface 246 to the lower left direction. That is, a wall 503 that is a stepped wall surface is formed in the measurement channel 501B. The distance between the left wall surface 502 and the wall surface 246, that is, the length of the wall 503 in the left-right direction is, for example, about 0.8 mm, as in the first embodiment. The wall 503 can reduce the backflow of the test liquid through the measurement flow path 501B when the measurement liquid is measured by the measurement unit 501. In particular, backflow is reduced even when measuring a test liquid having a high affinity with the test chip. Therefore, since an accurate measurement can be performed, an appropriate inspection can be performed.

DESCRIPTION OF SYMBOLS 1 Test | inspection apparatus 2, 4, 5 Test | inspection chip 20 Plate material 21 Liquid flow path 241 Mixed liquid fixed_quantity | quantitative_assay part 2411 2nd connection part 2412 1st connection part 241B Measurement flow path 242 Mixed liquid surplus part 251 Measurement part 443 Sample fixed_quantity | quantitative_assay part 444 Sample surplus Section 451 Measuring section 501 Measuring section 503 Step wall

Claims (6)

A quantification unit for quantifying a liquid containing a test liquid;
A surplus part for holding the test liquid formed in the quantification part and surplus in the quantification part;
A measurement unit for optically measuring a liquid containing the test liquid, which is formed downstream of the quantitative unit through a measurement channel;
A stepped wall or a recess formed in the measurement channel;
With
The stepped wall surface or the concave portion is provided on the measurement flow channel on the first direction side from the first connection portion between the quantification portion and the measurement flow channel to the second connection portion between the quantification portion and the excess flow channel. An inspection chip formed. The recess formed on the opposite side of the first direction is formed;
The wall surface of the concave portion connected to the wall surface of the measurement channel on the first direction side at the third connecting portion is parallel to the wall surface on the opposite side to the first direction of the quantifying portion. The test chip according to claim 1, wherein the test chip extends in a direction side. The depth of the said recessed part of the thickness direction of the said test chip is shallower than the depth of the said measurement flow path of the said thickness direction, The test | inspection chip of Claim 2 characterized by the above-mentioned. The inspection chip according to claim 2, wherein the recess includes a region extending along an extending direction of the measurement channel. A reagent quantification unit for quantifying a reagent mixed with the liquid containing the test liquid,
The measurement unit has a volume equal to or less than the sum of the volume of the quantification unit and the reagent quantification unit, and the depth of the measurement unit in the thickness direction of the test chip is the thickness direction of the measurement channel The inspection chip according to claim 1, wherein the inspection chip is shallower than the depth of the inspection chip. The wall surface of the measurement unit on the first direction side is formed closer to the first direction side than the wall surface of the measurement channel on the first direction side. Inspection chip.

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