JP2014521967A5 - - Google Patents

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JP2014521967A5
JP2014521967A5 JP2014523403A JP2014523403A JP2014521967A5 JP 2014521967 A5 JP2014521967 A5 JP 2014521967A5 JP 2014523403 A JP2014523403 A JP 2014523403A JP 2014523403 A JP2014523403 A JP 2014523403A JP 2014521967 A5 JP2014521967 A5 JP 2014521967A5
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particles
sample
detection systems
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JP2014523403A
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JP2014521967A (ja
JP6030131B2 (ja
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Priority claimed from GB1113542.3A external-priority patent/GB2493391B/en
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JP2014523403A 2011-08-05 2012-08-06 粒子の光学的な検出および解析 Active JP6030131B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1113542.3 2011-08-05
GB1113542.3A GB2493391B (en) 2011-08-05 2011-08-05 Optical detection and analysis of particles
PCT/GB2012/051899 WO2013021185A1 (en) 2011-08-05 2012-08-06 Optical detection and analysis of particles

Publications (3)

Publication Number Publication Date
JP2014521967A JP2014521967A (ja) 2014-08-28
JP2014521967A5 true JP2014521967A5 (enExample) 2015-08-20
JP6030131B2 JP6030131B2 (ja) 2016-11-24

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JP2014523403A Active JP6030131B2 (ja) 2011-08-05 2012-08-06 粒子の光学的な検出および解析

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US (1) US9341559B2 (enExample)
EP (1) EP2739955B1 (enExample)
JP (1) JP6030131B2 (enExample)
CN (1) CN103890561B (enExample)
GB (1) GB2493391B (enExample)
WO (1) WO2013021185A1 (enExample)

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CN105043948B (zh) * 2015-08-26 2017-09-22 清华大学 单个纳米颗粒粒径的测量系统及测量方法
CN105115866B (zh) * 2015-08-26 2018-02-16 清华大学 单个纳米颗粒粒径的测量系统及测量方法
JP6486799B2 (ja) * 2015-09-04 2019-03-20 水ing株式会社 被処理水の膜閉塞性評価方法、その膜閉塞性評価方法に用いる膜ろ過装置、およびその膜閉塞性評価方法を用いて膜閉塞性評価指標値を決定した被処理水の膜ろ過方法
WO2017051149A1 (en) 2015-09-23 2017-03-30 Malvern Instruments Limited Particle characterisation
US11002655B2 (en) 2015-09-23 2021-05-11 Malvern Panalytical Limited Cuvette carrier
CN105241794B (zh) * 2015-09-30 2018-03-16 丹东百特仪器有限公司 一种结合图像法测量的激光粒度仪及其测量方法
WO2017069251A1 (ja) * 2015-10-23 2017-04-27 株式会社カワノラボ 磁化率測定装置、及び、磁化率測定方法
JP6559555B2 (ja) 2015-12-02 2019-08-14 株式会社日立エルジーデータストレージ 光計測方法および装置
CN108431579B (zh) 2015-12-02 2021-08-13 纳诺利兹公司 用于确定对象的流体动力学尺寸的方法
WO2017104662A1 (ja) * 2015-12-18 2017-06-22 株式会社堀場製作所 粒子分析装置及び粒子分析方法
CN105572020B (zh) * 2016-01-19 2018-05-22 西南交通大学 一种纳米粒子计数方法
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JP6872558B2 (ja) 2016-11-16 2021-05-19 株式会社堀場製作所 粒子径分布測定装置、粒子径分布測定方法、及び粒子径分布測定装置用プログラム
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EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
EP3724632B1 (en) 2017-12-11 2022-07-20 Malvern Panalytical Limited Determine particle size distribution by size exclusion chromatography
NL2020138B1 (en) 2017-12-20 2019-06-26 Inprocess Ip B V Method and apparatus for in-process particle size determination of colloidal suspensions under flow.
US10514331B1 (en) * 2019-03-23 2019-12-24 Horiba Instruments Incorporated Method for determining the size of nanoparticles in a colloid
SE543406C2 (en) 2019-05-15 2021-01-05 Nanosized Sweden Ab Water impurity measurements with dynamic light scattering
WO2021133515A1 (en) * 2019-12-23 2021-07-01 Horiba Instruments Incorporated Apparatus and method for observation of microscopic movements and counting of particles in colloids
US12400741B2 (en) * 2020-02-28 2025-08-26 Howard University Selective extraction of late exponentials
DE102020129179A1 (de) 2020-11-05 2022-05-05 Technische Universität Braunschweig Verfahren, computerprogramm und miniaturisierter optofluidischer chip zum untersuchen von partikeln in einer flüssigen probe
KR102667903B1 (ko) * 2021-04-02 2024-05-20 성균관대학교산학협력단 입자 추적 장치 및 방법
US12208400B2 (en) 2021-05-25 2025-01-28 Arizona Board Of Regents On Behalf Of Arizona State University Systems and methods for non-destructive isolation, concentration, and detection for unbiased characterization of nano- and bioparticles
CN114184527A (zh) * 2021-12-15 2022-03-15 中国日用化学研究院有限公司 纳米颗粒跟踪分析仪在表面活性剂聚集体表征中的应用
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CN102109454B (zh) * 2011-03-17 2013-04-03 上海理工大学 同时测量多颗粒的动态光散射纳米颗粒粒度的方法

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