JP2014514554A5 - - Google Patents

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Publication number
JP2014514554A5
JP2014514554A5 JP2014503263A JP2014503263A JP2014514554A5 JP 2014514554 A5 JP2014514554 A5 JP 2014514554A5 JP 2014503263 A JP2014503263 A JP 2014503263A JP 2014503263 A JP2014503263 A JP 2014503263A JP 2014514554 A5 JP2014514554 A5 JP 2014514554A5
Authority
JP
Japan
Prior art keywords
array
scintillator
imaging detector
interposer
gap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2014503263A
Other languages
English (en)
Japanese (ja)
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JP2014514554A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/IB2012/051685 external-priority patent/WO2012137160A2/en
Publication of JP2014514554A publication Critical patent/JP2014514554A/ja
Publication of JP2014514554A5 publication Critical patent/JP2014514554A5/ja
Ceased legal-status Critical Current

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JP2014503263A 2011-04-06 2012-04-05 イメージング検出器 Ceased JP2014514554A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161472238P 2011-04-06 2011-04-06
US61/472,238 2011-04-06
PCT/IB2012/051685 WO2012137160A2 (en) 2011-04-06 2012-04-05 Imaging detector

Publications (2)

Publication Number Publication Date
JP2014514554A JP2014514554A (ja) 2014-06-19
JP2014514554A5 true JP2014514554A5 (OSRAM) 2015-05-21

Family

ID=46022511

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014503263A Ceased JP2014514554A (ja) 2011-04-06 2012-04-05 イメージング検出器

Country Status (5)

Country Link
US (1) US9121950B2 (OSRAM)
EP (1) EP2694999B1 (OSRAM)
JP (1) JP2014514554A (OSRAM)
CN (1) CN103620445B (OSRAM)
WO (1) WO2012137160A2 (OSRAM)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6079284B2 (ja) * 2013-02-08 2017-02-15 株式会社島津製作所 放射線検出器および放射線検出器の製造方法
WO2016015061A1 (en) * 2014-07-25 2016-01-28 The Regents Of The University Of California Multiple spatial resolution scintillation detectors
JP7065843B6 (ja) * 2016-10-26 2022-06-07 コーニンクレッカ フィリップス エヌ ヴェ 一体型スルーホール相互接続部を備える放射線検出器シンチレータ
JP6793553B2 (ja) * 2017-01-10 2020-12-02 キヤノンメディカルシステムズ株式会社 検出器パック、x線検出器、x線ct装置、検出器パックの製造方法
CN110582708A (zh) * 2017-05-01 2019-12-17 皇家飞利浦有限公司 多层辐射探测器
CN107398844B (zh) * 2017-06-26 2019-05-28 东软医疗系统股份有限公司 一种探测器制造夹具和闪烁体定位方法
KR20200083433A (ko) 2017-08-03 2020-07-08 더 리서치 파운데이션 포 더 스테이트 유니버시티 오브 뉴욕 비대칭 반사 스크린을 갖는 듀얼-스크린 디지털 라디오그래피
WO2019042797A1 (en) * 2017-08-31 2019-03-07 Koninklijke Philips N.V. MULTILAYER MONOLITHIC SCINTILLATOR DETECTOR

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3340793B2 (ja) * 1993-05-27 2002-11-05 株式会社日立メディコ 放射線検出器
JP3661196B2 (ja) * 1993-10-13 2005-06-15 住友電気工業株式会社 撮像装置の製造方法
US5430298A (en) * 1994-06-21 1995-07-04 General Electric Company CT array with improved photosensor linearity and reduced crosstalk
JPH0954162A (ja) * 1995-08-17 1997-02-25 Ge Yokogawa Medical Syst Ltd X線検出器およびその製造方法
JP2001074845A (ja) 1999-09-03 2001-03-23 Canon Inc 半導体装置及びそれを用いた放射線撮像システム
DE10063907A1 (de) * 2000-12-21 2002-07-04 Philips Corp Intellectual Pty Detektor zum Detektieren von elektromagnetischer Strahlung
JP4593806B2 (ja) * 2001-02-09 2010-12-08 キヤノン株式会社 放射線検出装置の製造方法、蛍光板の製造方法及び放射線検出装置の製造装置
JP3860758B2 (ja) * 2002-02-07 2006-12-20 浜松ホトニクス株式会社 放射線検出器
JP4220818B2 (ja) 2003-03-27 2009-02-04 浜松ホトニクス株式会社 ホトダイオードアレイおよびその製造方法並びに放射線検出器
US6933504B2 (en) 2003-03-12 2005-08-23 General Electric Company CT detector having a segmented optical coupler and method of manufacturing same
US7019297B2 (en) * 2003-05-20 2006-03-28 Cti Pet Systems, Inc. Detector array using internalized light sharing and air coupling
US6990176B2 (en) 2003-10-30 2006-01-24 General Electric Company Methods and apparatus for tileable sensor array
US20080258067A1 (en) 2004-08-20 2008-10-23 Koninklijke Philips Electronics N.V. Microelectronic System with a Passivation Layer
JP4534006B2 (ja) * 2005-09-28 2010-09-01 独立行政法人放射線医学総合研究所 放射線位置検出方法及び装置
JP2008224429A (ja) 2007-03-13 2008-09-25 Canon Inc 放射線検出装置
US7605374B2 (en) * 2007-03-27 2009-10-20 General Electric Company X-ray detector fabrication methods and apparatus therefrom
US8586933B2 (en) 2007-04-25 2013-11-19 Koninklijke Philips N.V. Radiation detector having a split laminate optical coupling
KR101034468B1 (ko) 2009-01-22 2011-05-17 (주)세현 엑스레이 검출기 및 이의 제조 방법

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