JP2014142639A5 - - Google Patents

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Publication number
JP2014142639A5
JP2014142639A5 JP2014007377A JP2014007377A JP2014142639A5 JP 2014142639 A5 JP2014142639 A5 JP 2014142639A5 JP 2014007377 A JP2014007377 A JP 2014007377A JP 2014007377 A JP2014007377 A JP 2014007377A JP 2014142639 A5 JP2014142639 A5 JP 2014142639A5
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JP
Japan
Prior art keywords
sample
excitation light
carbon
absorbance
fluorescence
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JP2014007377A
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English (en)
Japanese (ja)
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JP6262543B2 (ja
JP2014142639A (ja
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Priority claimed from EP13152215.3A external-priority patent/EP2757402B1/en
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Publication of JP2014142639A publication Critical patent/JP2014142639A/ja
Publication of JP2014142639A5 publication Critical patent/JP2014142639A5/ja
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Publication of JP6262543B2 publication Critical patent/JP6262543B2/ja
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JP2014007377A 2013-01-22 2014-01-20 蛍光顕微鏡による試料の観察方法 Active JP6262543B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP13152215.3A EP2757402B1 (en) 2013-01-22 2013-01-22 Method of observing samples with a fluorescent microscope
EP13152215.3 2013-01-22

Publications (3)

Publication Number Publication Date
JP2014142639A JP2014142639A (ja) 2014-08-07
JP2014142639A5 true JP2014142639A5 (OSRAM) 2017-11-02
JP6262543B2 JP6262543B2 (ja) 2018-01-17

Family

ID=47715843

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014007377A Active JP6262543B2 (ja) 2013-01-22 2014-01-20 蛍光顕微鏡による試料の観察方法

Country Status (4)

Country Link
US (1) US20140203191A1 (OSRAM)
EP (1) EP2757402B1 (OSRAM)
JP (1) JP6262543B2 (OSRAM)
CN (1) CN103940791A (OSRAM)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2824445B1 (en) 2013-07-08 2016-03-02 Fei Company Charged-particle microscopy combined with raman spectroscopy
SE537103C2 (sv) 2013-12-16 2015-01-07 Per Fogelstrand System och metod för fluorescensmikroskopi med detektering av ljusemission från multipla fluorokromer
US11101104B2 (en) * 2019-08-30 2021-08-24 Fei Company Multi modal cryo compatible GUID grid
CN114667586B (zh) * 2019-10-04 2025-07-01 米特根有限公司 用于低温电子显微术的样品支架和样品冷却系统
CN111855567B (zh) * 2019-10-16 2021-07-20 中国科学院物理研究所 一种实现光学智能聚焦的透射电镜系统及方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0853238B1 (de) 1997-01-13 2002-09-18 Daniel Dr. Studer Probenhalter für wasserhaltige Proben sowie Verfahren zu deren Verwendung
DE69806496T2 (de) * 1997-10-29 2003-03-13 Macaulay, Calum E. Gerät und verfahren zur mikroskopie unter verwendung räumlich modulierten lichtes
NL1017669C2 (nl) 2001-03-22 2002-09-24 Univ Maastricht Inrichting voor het vervaardigen van preparaten voor een cryo-elektronenmicroscoop.
US6687035B2 (en) * 2001-06-07 2004-02-03 Leica Microsystems Heildelberg Gmbh Method and apparatus for ROI-scan with high temporal resolution
EP1983330B1 (en) * 2001-10-09 2011-12-28 Ruprecht-Karls-Universität Heidelberg Far field light microscopical method
NL1023717C2 (nl) 2003-06-20 2004-12-21 Fei Co Preparaatdrager voor het dragen van een met een elektronenbundel te doorstralen preparaat.
JP2005216645A (ja) * 2004-01-29 2005-08-11 Jeol Ltd 透過電子顕微鏡
JP4425098B2 (ja) 2004-09-06 2010-03-03 浜松ホトニクス株式会社 蛍光顕微鏡および蛍光相関分光解析装置
US7355696B2 (en) * 2005-02-01 2008-04-08 Arryx, Inc Method and apparatus for sorting cells
JP2006292421A (ja) * 2005-04-06 2006-10-26 Sharp Corp 蛍光検出装置
EP1863066A1 (en) 2006-05-29 2007-12-05 FEI Company Sample carrier and sample holder
EP1953791A1 (en) * 2007-02-05 2008-08-06 FEI Company Apparatus for observing a sample with a particle beam and an optical microscope
EP1998165A1 (en) * 2007-06-01 2008-12-03 The European Community, represented by the European Commission Method of fluorescence imaging

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