JP2014032677A - パラメータ測定のためのハンドヘルド装置、システム、および方法 - Google Patents

パラメータ測定のためのハンドヘルド装置、システム、および方法 Download PDF

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Publication number
JP2014032677A
JP2014032677A JP2013162775A JP2013162775A JP2014032677A JP 2014032677 A JP2014032677 A JP 2014032677A JP 2013162775 A JP2013162775 A JP 2013162775A JP 2013162775 A JP2013162775 A JP 2013162775A JP 2014032677 A JP2014032677 A JP 2014032677A
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JP
Japan
Prior art keywords
handheld
measurement
host
parameter
main
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2013162775A
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English (en)
Japanese (ja)
Other versions
JP2014032677A5 (enExample
Inventor
Paul Herman Heydron
ヘルマン ハイドロン ポール
Henricus Koppelmans
コッペルマンズ ヘンリス
Lawrence Epperson David
ローレンス エッパーソン デイビット
Luis Alberto Katz
アルベルト カッツ ルイス
Charles Hudson Jeffrey
チャールズ ハドソン ジェフリー
Howard Vetter Glen
ホワード ヴェッター グレン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
Fluke Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fluke Corp filed Critical Fluke Corp
Publication of JP2014032677A publication Critical patent/JP2014032677A/ja
Publication of JP2014032677A5 publication Critical patent/JP2014032677A5/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
    • G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q9/00—Arrangements in telecontrol or telemetry systems for selectively calling a substation from a main station, in which substation desired apparatus is selected for applying a control signal thereto or for obtaining measured values therefrom
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/025—General constructional details concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q2209/00—Arrangements in telecontrol or telemetry systems
    • H04Q2209/40—Arrangements in telecontrol or telemetry systems using a wireless architecture
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q2209/00—Arrangements in telecontrol or telemetry systems
    • H04Q2209/80—Arrangements in the sub-station, i.e. sensing device
    • H04Q2209/84—Measuring functions

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP2013162775A 2012-08-03 2013-08-05 パラメータ測定のためのハンドヘルド装置、システム、および方法 Pending JP2014032677A (ja)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US201261679652P 2012-08-03 2012-08-03
US61/679652 2012-08-03
US201261707804P 2012-09-28 2012-09-28
US61/707804 2012-09-28
US13/830,556 US20140035607A1 (en) 2012-08-03 2013-03-14 Handheld Devices, Systems, and Methods for Measuring Parameters
US13/830,556 2013-03-14

Publications (2)

Publication Number Publication Date
JP2014032677A true JP2014032677A (ja) 2014-02-20
JP2014032677A5 JP2014032677A5 (enExample) 2016-09-23

Family

ID=48948238

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013162775A Pending JP2014032677A (ja) 2012-08-03 2013-08-05 パラメータ測定のためのハンドヘルド装置、システム、および方法

Country Status (4)

Country Link
US (1) US20140035607A1 (enExample)
EP (1) EP2693222A1 (enExample)
JP (1) JP2014032677A (enExample)
CN (1) CN103575329A (enExample)

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US9377485B2 (en) * 2013-03-15 2016-06-28 Fluke Corporation Handheld measurement system with selectable options
CN105432064B (zh) 2013-03-15 2019-05-10 弗兰克公司 使用单独无线移动设备的红外图像的可见视听注释
US9766270B2 (en) 2013-12-30 2017-09-19 Fluke Corporation Wireless test measurement
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CN106501556A (zh) * 2015-09-06 2017-03-15 福禄克公司 测量装置及测量方法
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JP6202461B1 (ja) * 2017-03-06 2017-09-27 株式会社シーブイエンジニアリング 電流測定装置
US10120021B1 (en) 2017-06-16 2018-11-06 Fluke Corporation Thermal non-contact voltage and non-contact current devices
US10509063B2 (en) 2017-11-28 2019-12-17 Fluke Corporation Electrical signal measurement device using reference signal
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US10746767B2 (en) 2018-05-09 2020-08-18 Fluke Corporation Adjustable length Rogowski coil measurement device with non-contact voltage measurement
US10557875B2 (en) 2018-05-09 2020-02-11 Fluke Corporation Multi-sensor scanner configuration for non-contact voltage measurement devices
US10677876B2 (en) 2018-05-09 2020-06-09 Fluke Corporation Position dependent non-contact voltage and current measurement
US10775409B2 (en) * 2018-05-09 2020-09-15 Fluke Corporation Clamp probe for non-contact electrical parameter measurement
US10802072B2 (en) 2018-05-11 2020-10-13 Fluke Corporation Non-contact DC voltage measurement device with oscillating sensor
US10908188B2 (en) 2018-05-11 2021-02-02 Fluke Corporation Flexible jaw probe for non-contact electrical parameter measurement
EP3879291A1 (fr) * 2020-03-13 2021-09-15 Hervé Sallin Dispositif de contrôle d'installations électriques
CN112485476B (zh) * 2020-11-19 2023-10-20 国网四川省电力公司广元供电公司 一种多功能钳形表装置及系统
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Also Published As

Publication number Publication date
US20140035607A1 (en) 2014-02-06
EP2693222A1 (en) 2014-02-05
CN103575329A (zh) 2014-02-12

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