JP2013526770A - ワイドバスメモリ及びシリアルメモリをチップ・スケール・パッケージフットプリント内のプロセッサに取り付けるための方法 - Google Patents
ワイドバスメモリ及びシリアルメモリをチップ・スケール・パッケージフットプリント内のプロセッサに取り付けるための方法 Download PDFInfo
- Publication number
- JP2013526770A JP2013526770A JP2013509319A JP2013509319A JP2013526770A JP 2013526770 A JP2013526770 A JP 2013526770A JP 2013509319 A JP2013509319 A JP 2013509319A JP 2013509319 A JP2013509319 A JP 2013509319A JP 2013526770 A JP2013526770 A JP 2013526770A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- semiconductor die
- die
- semiconductor
- electrically connected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/297—Configurations of stacked chips characterised by the through-semiconductor vias [TSVs] in the stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/722—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Microcomputers (AREA)
- Semiconductor Memories (AREA)
- Dram (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/776,302 US8288849B2 (en) | 2010-05-07 | 2010-05-07 | Method for attaching wide bus memory and serial memory to a processor within a chip scale package footprint |
| US12/776,302 | 2010-05-07 | ||
| PCT/US2011/035753 WO2011140552A2 (en) | 2010-05-07 | 2011-05-09 | Method for attaching wide bus memory and serial memory to a processor within a chip scale package footprint |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013526770A true JP2013526770A (ja) | 2013-06-24 |
| JP2013526770A5 JP2013526770A5 (https=) | 2014-05-29 |
Family
ID=44901410
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013509319A Pending JP2013526770A (ja) | 2010-05-07 | 2011-05-09 | ワイドバスメモリ及びシリアルメモリをチップ・スケール・パッケージフットプリント内のプロセッサに取り付けるための方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US8288849B2 (https=) |
| JP (1) | JP2013526770A (https=) |
| CN (1) | CN102859686B (https=) |
| WO (1) | WO2011140552A2 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016526306A (ja) * | 2014-07-11 | 2016-09-01 | インテル コーポレイション | スケーラブルパッケージアーキテクチャ並びに関連する技法及び構造 |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8227295B2 (en) * | 2008-10-16 | 2012-07-24 | Texas Instruments Incorporated | IC die having TSV and wafer level underfill and stacked IC devices comprising a workpiece solder connected to the TSV |
| US8288849B2 (en) * | 2010-05-07 | 2012-10-16 | Texas Instruments Incorporated | Method for attaching wide bus memory and serial memory to a processor within a chip scale package footprint |
| US8384430B2 (en) * | 2010-08-16 | 2013-02-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | RC delay detectors with high sensitivity for through substrate vias |
| KR101818507B1 (ko) * | 2012-01-11 | 2018-01-15 | 삼성전자 주식회사 | 반도체 패키지 |
| US9230932B2 (en) * | 2012-02-09 | 2016-01-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Interconnect crack arrestor structure and methods |
| US9515036B2 (en) | 2012-04-20 | 2016-12-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Methods and apparatus for solder connections |
| US9847284B2 (en) * | 2013-01-29 | 2017-12-19 | Apple Inc. | Stacked wafer DDR package |
| US9721852B2 (en) * | 2014-01-21 | 2017-08-01 | International Business Machines Corporation | Semiconductor TSV device package to which other semiconductor device package can be later attached |
| US10128205B2 (en) * | 2014-03-06 | 2018-11-13 | Intel Corporation | Embedded die flip-chip package assembly |
| US10403669B2 (en) * | 2015-06-15 | 2019-09-03 | Sony Corporation | Semiconductor device and electronic device having a chip size package (CSP) stack |
| US11152333B2 (en) * | 2018-10-19 | 2021-10-19 | Micron Technology, Inc. | Semiconductor device packages with enhanced heat management and related systems |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090079067A1 (en) * | 2007-09-26 | 2009-03-26 | Texas Instruments Incorporated | Method for Stacking Semiconductor Chips |
| JP2009070965A (ja) * | 2007-09-12 | 2009-04-02 | Renesas Technology Corp | 半導体装置 |
| US20100052132A1 (en) * | 2008-08-29 | 2010-03-04 | Samsung Electronics Co., Ltd. | Semiconductor package |
| JP2010056139A (ja) * | 2008-08-26 | 2010-03-11 | Toshiba Corp | 積層型半導体装置 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7217994B2 (en) * | 2004-12-01 | 2007-05-15 | Kyocera Wireless Corp. | Stack package for high density integrated circuits |
| US7390700B2 (en) | 2006-04-07 | 2008-06-24 | Texas Instruments Incorporated | Packaged system of semiconductor chips having a semiconductor interposer |
| US7569918B2 (en) | 2006-05-01 | 2009-08-04 | Texas Instruments Incorporated | Semiconductor package-on-package system including integrated passive components |
| US20080258285A1 (en) | 2007-04-23 | 2008-10-23 | Texas Instruments Incorporated | Simplified Substrates for Semiconductor Devices in Package-on-Package Products |
| US20080258286A1 (en) | 2007-04-23 | 2008-10-23 | Texas Instruments Incorporated | High Input/Output, Low Profile Package-On-Package Semiconductor System |
| US8049320B2 (en) | 2008-02-19 | 2011-11-01 | Texas Instruments Incorporated | Integrated circuit stacked package precursors and stacked packaged devices and systems therefrom |
| US7851346B2 (en) * | 2008-07-21 | 2010-12-14 | Taiwan Semiconductor Manufacturing Company, Ltd. | Bonding metallurgy for three-dimensional interconnect |
| US8227295B2 (en) | 2008-10-16 | 2012-07-24 | Texas Instruments Incorporated | IC die having TSV and wafer level underfill and stacked IC devices comprising a workpiece solder connected to the TSV |
| US8183579B2 (en) * | 2010-03-02 | 2012-05-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | LED flip-chip package structure with dummy bumps |
| US8218334B2 (en) * | 2010-03-09 | 2012-07-10 | Oracle America, Inc. | Multi-chip module with multi-level interposer |
| US8288849B2 (en) * | 2010-05-07 | 2012-10-16 | Texas Instruments Incorporated | Method for attaching wide bus memory and serial memory to a processor within a chip scale package footprint |
-
2010
- 2010-05-07 US US12/776,302 patent/US8288849B2/en active Active
-
2011
- 2011-05-09 WO PCT/US2011/035753 patent/WO2011140552A2/en not_active Ceased
- 2011-05-09 CN CN201180021433.XA patent/CN102859686B/zh active Active
- 2011-05-09 JP JP2013509319A patent/JP2013526770A/ja active Pending
-
2012
- 2012-05-17 US US13/473,822 patent/US8597978B2/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009070965A (ja) * | 2007-09-12 | 2009-04-02 | Renesas Technology Corp | 半導体装置 |
| US20090079067A1 (en) * | 2007-09-26 | 2009-03-26 | Texas Instruments Incorporated | Method for Stacking Semiconductor Chips |
| JP2010056139A (ja) * | 2008-08-26 | 2010-03-11 | Toshiba Corp | 積層型半導体装置 |
| US20100052132A1 (en) * | 2008-08-29 | 2010-03-04 | Samsung Electronics Co., Ltd. | Semiconductor package |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016526306A (ja) * | 2014-07-11 | 2016-09-01 | インテル コーポレイション | スケーラブルパッケージアーキテクチャ並びに関連する技法及び構造 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102859686B (zh) | 2015-08-19 |
| US8597978B2 (en) | 2013-12-03 |
| WO2011140552A3 (en) | 2012-03-01 |
| US8288849B2 (en) | 2012-10-16 |
| US20110272814A1 (en) | 2011-11-10 |
| WO2011140552A2 (en) | 2011-11-10 |
| US20120225523A1 (en) | 2012-09-06 |
| CN102859686A (zh) | 2013-01-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102859686B (zh) | 用于在芯片级封装占用面积内将宽总线存储器及串行存储器附接到处理器的方法 | |
| US9449941B2 (en) | Connecting function chips to a package to form package-on-package | |
| CN104064551B (zh) | 一种芯片堆叠封装结构和电子设备 | |
| KR102708730B1 (ko) | 브리지 다이를 포함한 반도체 패키지 | |
| JP5763121B2 (ja) | シリコン貫通ビアのブリッジする相互接続 | |
| CN103258806B (zh) | 具桥接结构的半导体封装构造及其制造方法 | |
| CN107180826B (zh) | 半导体封装组件 | |
| US20240145346A1 (en) | Semiconductor device with through-mold via | |
| CN101459152B (zh) | 具金属接点导孔的堆栈式半导体封装结构 | |
| JP2007251145A (ja) | 積層パッケージ | |
| CN105097750A (zh) | 封装结构及其制法 | |
| CN100511672C (zh) | 芯片层叠型半导体装置 | |
| CN104685624B (zh) | 重组晶圆级微电子封装 | |
| US8546187B2 (en) | Electronic part and method of manufacturing the same | |
| US9059160B1 (en) | Semiconductor package assembly | |
| KR20120096754A (ko) | 인터포저를 이용한 웨이퍼 칩의 3차원 스택 구조 | |
| CN103337486A (zh) | 半导体封装构造及其制造方法 | |
| TWI613771B (zh) | 半導體封裝 | |
| US20210167038A1 (en) | Dual in-line memory module | |
| US20150115437A1 (en) | Universal encapsulation substrate, encapsulation structure and encapsulation method | |
| CN118248641A (zh) | 半导体封装件 | |
| CN102931166A (zh) | 半导体封装及形成半导体封装的方法 | |
| CN101521184B (zh) | 半导体器件 | |
| US20150179598A1 (en) | Flip-chip packaging structure |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20140411 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20140411 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20150901 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20160405 |