JP2013526770A - ワイドバスメモリ及びシリアルメモリをチップ・スケール・パッケージフットプリント内のプロセッサに取り付けるための方法 - Google Patents

ワイドバスメモリ及びシリアルメモリをチップ・スケール・パッケージフットプリント内のプロセッサに取り付けるための方法 Download PDF

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Publication number
JP2013526770A
JP2013526770A JP2013509319A JP2013509319A JP2013526770A JP 2013526770 A JP2013526770 A JP 2013526770A JP 2013509319 A JP2013509319 A JP 2013509319A JP 2013509319 A JP2013509319 A JP 2013509319A JP 2013526770 A JP2013526770 A JP 2013526770A
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JP
Japan
Prior art keywords
substrate
semiconductor die
die
semiconductor
electrically connected
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
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JP2013509319A
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English (en)
Japanese (ja)
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JP2013526770A5 (https=
Inventor
ワクトゥラ カート
ローズ シモンズ マシューズ マーガレット
Original Assignee
日本テキサス・インスツルメンツ株式会社
テキサス インスツルメンツ インコーポレイテッド
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Application filed by 日本テキサス・インスツルメンツ株式会社, テキサス インスツルメンツ インコーポレイテッド filed Critical 日本テキサス・インスツルメンツ株式会社
Publication of JP2013526770A publication Critical patent/JP2013526770A/ja
Publication of JP2013526770A5 publication Critical patent/JP2013526770A5/ja
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/851Dispositions of multiple connectors or interconnections
    • H10W72/874On different surfaces
    • H10W72/884Die-attach connectors and bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/20Configurations of stacked chips
    • H10W90/297Configurations of stacked chips characterised by the through-semiconductor vias [TSVs] in the stacked chips
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/722Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between stacked chips
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/724Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/731Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
    • H10W90/734Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/754Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Microcomputers (AREA)
  • Semiconductor Memories (AREA)
  • Dram (AREA)
JP2013509319A 2010-05-07 2011-05-09 ワイドバスメモリ及びシリアルメモリをチップ・スケール・パッケージフットプリント内のプロセッサに取り付けるための方法 Pending JP2013526770A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/776,302 US8288849B2 (en) 2010-05-07 2010-05-07 Method for attaching wide bus memory and serial memory to a processor within a chip scale package footprint
US12/776,302 2010-05-07
PCT/US2011/035753 WO2011140552A2 (en) 2010-05-07 2011-05-09 Method for attaching wide bus memory and serial memory to a processor within a chip scale package footprint

Publications (2)

Publication Number Publication Date
JP2013526770A true JP2013526770A (ja) 2013-06-24
JP2013526770A5 JP2013526770A5 (https=) 2014-05-29

Family

ID=44901410

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013509319A Pending JP2013526770A (ja) 2010-05-07 2011-05-09 ワイドバスメモリ及びシリアルメモリをチップ・スケール・パッケージフットプリント内のプロセッサに取り付けるための方法

Country Status (4)

Country Link
US (2) US8288849B2 (https=)
JP (1) JP2013526770A (https=)
CN (1) CN102859686B (https=)
WO (1) WO2011140552A2 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016526306A (ja) * 2014-07-11 2016-09-01 インテル コーポレイション スケーラブルパッケージアーキテクチャ並びに関連する技法及び構造

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* Cited by examiner, † Cited by third party
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US8227295B2 (en) * 2008-10-16 2012-07-24 Texas Instruments Incorporated IC die having TSV and wafer level underfill and stacked IC devices comprising a workpiece solder connected to the TSV
US8288849B2 (en) * 2010-05-07 2012-10-16 Texas Instruments Incorporated Method for attaching wide bus memory and serial memory to a processor within a chip scale package footprint
US8384430B2 (en) * 2010-08-16 2013-02-26 Taiwan Semiconductor Manufacturing Company, Ltd. RC delay detectors with high sensitivity for through substrate vias
KR101818507B1 (ko) * 2012-01-11 2018-01-15 삼성전자 주식회사 반도체 패키지
US9230932B2 (en) * 2012-02-09 2016-01-05 Taiwan Semiconductor Manufacturing Company, Ltd. Interconnect crack arrestor structure and methods
US9515036B2 (en) 2012-04-20 2016-12-06 Taiwan Semiconductor Manufacturing Company, Ltd. Methods and apparatus for solder connections
US9847284B2 (en) * 2013-01-29 2017-12-19 Apple Inc. Stacked wafer DDR package
US9721852B2 (en) * 2014-01-21 2017-08-01 International Business Machines Corporation Semiconductor TSV device package to which other semiconductor device package can be later attached
US10128205B2 (en) * 2014-03-06 2018-11-13 Intel Corporation Embedded die flip-chip package assembly
US10403669B2 (en) * 2015-06-15 2019-09-03 Sony Corporation Semiconductor device and electronic device having a chip size package (CSP) stack
US11152333B2 (en) * 2018-10-19 2021-10-19 Micron Technology, Inc. Semiconductor device packages with enhanced heat management and related systems

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US20090079067A1 (en) * 2007-09-26 2009-03-26 Texas Instruments Incorporated Method for Stacking Semiconductor Chips
JP2009070965A (ja) * 2007-09-12 2009-04-02 Renesas Technology Corp 半導体装置
US20100052132A1 (en) * 2008-08-29 2010-03-04 Samsung Electronics Co., Ltd. Semiconductor package
JP2010056139A (ja) * 2008-08-26 2010-03-11 Toshiba Corp 積層型半導体装置

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US7217994B2 (en) * 2004-12-01 2007-05-15 Kyocera Wireless Corp. Stack package for high density integrated circuits
US7390700B2 (en) 2006-04-07 2008-06-24 Texas Instruments Incorporated Packaged system of semiconductor chips having a semiconductor interposer
US7569918B2 (en) 2006-05-01 2009-08-04 Texas Instruments Incorporated Semiconductor package-on-package system including integrated passive components
US20080258285A1 (en) 2007-04-23 2008-10-23 Texas Instruments Incorporated Simplified Substrates for Semiconductor Devices in Package-on-Package Products
US20080258286A1 (en) 2007-04-23 2008-10-23 Texas Instruments Incorporated High Input/Output, Low Profile Package-On-Package Semiconductor System
US8049320B2 (en) 2008-02-19 2011-11-01 Texas Instruments Incorporated Integrated circuit stacked package precursors and stacked packaged devices and systems therefrom
US7851346B2 (en) * 2008-07-21 2010-12-14 Taiwan Semiconductor Manufacturing Company, Ltd. Bonding metallurgy for three-dimensional interconnect
US8227295B2 (en) 2008-10-16 2012-07-24 Texas Instruments Incorporated IC die having TSV and wafer level underfill and stacked IC devices comprising a workpiece solder connected to the TSV
US8183579B2 (en) * 2010-03-02 2012-05-22 Taiwan Semiconductor Manufacturing Company, Ltd. LED flip-chip package structure with dummy bumps
US8218334B2 (en) * 2010-03-09 2012-07-10 Oracle America, Inc. Multi-chip module with multi-level interposer
US8288849B2 (en) * 2010-05-07 2012-10-16 Texas Instruments Incorporated Method for attaching wide bus memory and serial memory to a processor within a chip scale package footprint

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009070965A (ja) * 2007-09-12 2009-04-02 Renesas Technology Corp 半導体装置
US20090079067A1 (en) * 2007-09-26 2009-03-26 Texas Instruments Incorporated Method for Stacking Semiconductor Chips
JP2010056139A (ja) * 2008-08-26 2010-03-11 Toshiba Corp 積層型半導体装置
US20100052132A1 (en) * 2008-08-29 2010-03-04 Samsung Electronics Co., Ltd. Semiconductor package

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016526306A (ja) * 2014-07-11 2016-09-01 インテル コーポレイション スケーラブルパッケージアーキテクチャ並びに関連する技法及び構造

Also Published As

Publication number Publication date
CN102859686B (zh) 2015-08-19
US8597978B2 (en) 2013-12-03
WO2011140552A3 (en) 2012-03-01
US8288849B2 (en) 2012-10-16
US20110272814A1 (en) 2011-11-10
WO2011140552A2 (en) 2011-11-10
US20120225523A1 (en) 2012-09-06
CN102859686A (zh) 2013-01-02

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