JP2013522779A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2013522779A5 JP2013522779A5 JP2013500288A JP2013500288A JP2013522779A5 JP 2013522779 A5 JP2013522779 A5 JP 2013522779A5 JP 2013500288 A JP2013500288 A JP 2013500288A JP 2013500288 A JP2013500288 A JP 2013500288A JP 2013522779 A5 JP2013522779 A5 JP 2013522779A5
- Authority
- JP
- Japan
- Prior art keywords
- memory device
- composite semiconductor
- semiconductor memory
- interface
- ecc engine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US31613810P | 2010-03-22 | 2010-03-22 | |
| US61/316,138 | 2010-03-22 | ||
| PCT/CA2011/000229 WO2011116454A1 (en) | 2010-03-22 | 2011-03-02 | Composite semiconductor memory device with error correction |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013522779A JP2013522779A (ja) | 2013-06-13 |
| JP2013522779A5 true JP2013522779A5 (enExample) | 2014-03-27 |
Family
ID=44648192
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013500288A Pending JP2013522779A (ja) | 2010-03-22 | 2011-03-02 | 誤り訂正を有する複合半導体メモリデバイス |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US9098430B2 (enExample) |
| EP (1) | EP2550661A4 (enExample) |
| JP (1) | JP2013522779A (enExample) |
| KR (1) | KR20120137416A (enExample) |
| CN (1) | CN102812519A (enExample) |
| CA (1) | CA2791931A1 (enExample) |
| TW (1) | TW201201008A (enExample) |
| WO (1) | WO2011116454A1 (enExample) |
Families Citing this family (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201201008A (en) * | 2010-03-22 | 2012-01-01 | Mosaid Technologies Inc | Composite semiconductor memory device with error correction |
| KR20130012737A (ko) * | 2011-07-26 | 2013-02-05 | 에스케이하이닉스 주식회사 | 반도체 메모리 장치 및 이를 포함하는 반도체 시스템 |
| US8922243B2 (en) | 2012-12-23 | 2014-12-30 | Advanced Micro Devices, Inc. | Die-stacked memory device with reconfigurable logic |
| US9697147B2 (en) | 2012-08-06 | 2017-07-04 | Advanced Micro Devices, Inc. | Stacked memory device with metadata management |
| US8972826B2 (en) | 2012-10-24 | 2015-03-03 | Western Digital Technologies, Inc. | Adaptive error correction codes for data storage systems |
| US9021339B2 (en) | 2012-11-29 | 2015-04-28 | Western Digital Technologies, Inc. | Data reliability schemes for data storage systems |
| US9059736B2 (en) | 2012-12-03 | 2015-06-16 | Western Digital Technologies, Inc. | Methods, solid state drive controllers and data storage devices having a runtime variable raid protection scheme |
| US9026888B2 (en) * | 2012-12-21 | 2015-05-05 | Intel Corporation | Method, system and apparatus for providing access to error correction information |
| US9214963B1 (en) | 2012-12-21 | 2015-12-15 | Western Digital Technologies, Inc. | Method and system for monitoring data channel to enable use of dynamically adjustable LDPC coding parameters in a data storage system |
| US9135185B2 (en) | 2012-12-23 | 2015-09-15 | Advanced Micro Devices, Inc. | Die-stacked memory device providing data translation |
| US9201777B2 (en) | 2012-12-23 | 2015-12-01 | Advanced Micro Devices, Inc. | Quality of service support using stacked memory device with logic die |
| US9065722B2 (en) | 2012-12-23 | 2015-06-23 | Advanced Micro Devices, Inc. | Die-stacked device with partitioned multi-hop network |
| US9170948B2 (en) | 2012-12-23 | 2015-10-27 | Advanced Micro Devices, Inc. | Cache coherency using die-stacked memory device with logic die |
| KR102084553B1 (ko) * | 2013-01-03 | 2020-03-04 | 삼성전자주식회사 | 메모리 시스템 |
| EP2992435B1 (en) | 2013-04-30 | 2020-12-30 | Hewlett-Packard Enterprise Development LP | Memory node error correction |
| US20150012801A1 (en) * | 2013-07-03 | 2015-01-08 | Chih-Nan YEN | Method of detecting and correcting errors with bch and ldpc engines for flash storage systems |
| US9286948B2 (en) | 2013-07-15 | 2016-03-15 | Advanced Micro Devices, Inc. | Query operations for stacked-die memory device |
| CN104750569A (zh) | 2013-12-30 | 2015-07-01 | 深圳市中兴微电子技术有限公司 | 一种实现数据纠错的方法及装置 |
| JP6131207B2 (ja) | 2014-03-14 | 2017-05-17 | ウィンボンド エレクトロニクス コーポレーション | 半導体記憶装置 |
| KR102221752B1 (ko) * | 2014-03-20 | 2021-03-02 | 삼성전자주식회사 | 메모리 장치의 프로그램 방법 및 이를 포함하는 데이터 독출 방법 |
| US20150311920A1 (en) * | 2014-04-25 | 2015-10-29 | Agency For Science, Technology And Research | Decoder for a memory device, memory device and method of decoding a memory device |
| US10002043B2 (en) * | 2014-08-19 | 2018-06-19 | Samsung Electronics Co., Ltd. | Memory devices and modules |
| KR102214556B1 (ko) * | 2014-08-19 | 2021-02-09 | 삼성전자주식회사 | 메모리 장치 및 모듈 |
| US10002044B2 (en) | 2014-08-19 | 2018-06-19 | Samsung Electronics Co., Ltd. | Memory devices and modules |
| CN104217765B (zh) * | 2014-09-09 | 2017-11-24 | 武汉新芯集成电路制造有限公司 | 闪存芯片操作时间的测量方法 |
| KR102231441B1 (ko) * | 2014-12-17 | 2021-03-25 | 에스케이하이닉스 주식회사 | 메모리 시스템 및 메모리 시스템의 동작 방법 |
| US10209895B2 (en) | 2016-02-18 | 2019-02-19 | Toshiba Memory Corporation | Memory system |
| CN106598499A (zh) * | 2016-12-14 | 2017-04-26 | 深圳市中博睿存科技有限公司 | 一种基于fpga的分布式文件系统架构 |
| KR102688433B1 (ko) * | 2017-05-07 | 2024-07-26 | 에스케이하이닉스 주식회사 | 메모리 장치, 이를 포함하는 메모리 시스템 및 메모리 시스템의 동작 방법 |
| KR102688423B1 (ko) * | 2017-07-05 | 2024-07-26 | 에스케이하이닉스 주식회사 | 메모리 장치, 이를 포함하는 메모리 시스템 및 메모리 시스템의 동작 방법 |
| US10545860B2 (en) * | 2017-08-10 | 2020-01-28 | Samsung Electronics Co., Ltd. | Intelligent high bandwidth memory appliance |
| US10331345B2 (en) * | 2017-09-29 | 2019-06-25 | Intel Corporation | Method and apparatus for reducing silent data errors in non-volatile memory systems |
| US10719394B2 (en) * | 2017-10-25 | 2020-07-21 | Innogrit Technologies Co., Ltd. | Systems and methods for fast access of non-volatile storage devices |
| TWI680375B (zh) * | 2018-08-23 | 2019-12-21 | 慧榮科技股份有限公司 | 具有分散式信箱架構的多處理器系統及其處理器錯誤檢查方法 |
| KR102766573B1 (ko) * | 2018-09-21 | 2025-02-12 | 삼성전자주식회사 | 복수의 에러 정정 기능을 갖는 메모리 장치 및 메모리 시스템과 그 동작 방법 |
| US20200127685A1 (en) * | 2018-10-19 | 2020-04-23 | Nyquist Semiconductor Limited | Systems and methods for a hybrid non-volatile storage system |
| JP7184632B2 (ja) * | 2018-12-25 | 2022-12-06 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US11210167B2 (en) * | 2019-10-28 | 2021-12-28 | Intel Corporation | Memory wordline isolation for improvement in reliability, availability, and scalability (RAS) |
| US11537326B2 (en) | 2020-09-10 | 2022-12-27 | Western Digital Technologies, Inc. | Relocation flow using CbA technology |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7206891B2 (en) * | 2002-09-26 | 2007-04-17 | Lsi Logic Corporation | Multi-port memory controller having independent ECC encoders |
| JP3757204B2 (ja) * | 2002-12-06 | 2006-03-22 | ファナック株式会社 | エラー検出/訂正方式及び該方式を用いた制御装置 |
| US7904786B2 (en) * | 2003-03-06 | 2011-03-08 | Hewlett-Packard Development Company, L.P. | Assisted memory system |
| US8291295B2 (en) * | 2005-09-26 | 2012-10-16 | Sandisk Il Ltd. | NAND flash memory controller exporting a NAND interface |
| KR100681429B1 (ko) * | 2005-10-24 | 2007-02-15 | 삼성전자주식회사 | 반도체 메모리 장치 및 그것의 비트 에러 검출 방법 |
| CN101324867B (zh) | 2007-06-16 | 2011-07-20 | 深圳市硅格半导体有限公司 | 基于半导体存储介质的数据管理装置及管理方法 |
| TWI357733B (en) * | 2008-03-25 | 2012-02-01 | Ralink Technology Corp | Method for error-correcting code selection for mim |
| WO2010013437A1 (ja) * | 2008-07-30 | 2010-02-04 | パナソニック株式会社 | 誤り訂正機能付きコントローラ、誤り訂正機能付き記憶装置、及び誤り訂正機能付きシステム |
| US8134852B2 (en) * | 2008-10-14 | 2012-03-13 | Mosaid Technologies Incorporated | Bridge device architecture for connecting discrete memory devices to a system |
| CN101527171B (zh) | 2009-04-17 | 2012-05-23 | 成都市华为赛门铁克科技有限公司 | 一种多通道并行纠错的闪存控制方法和装置 |
| TW201201008A (en) * | 2010-03-22 | 2012-01-01 | Mosaid Technologies Inc | Composite semiconductor memory device with error correction |
-
2011
- 2011-03-02 TW TW100106888A patent/TW201201008A/zh unknown
- 2011-03-02 WO PCT/CA2011/000229 patent/WO2011116454A1/en not_active Ceased
- 2011-03-02 KR KR1020127027284A patent/KR20120137416A/ko not_active Withdrawn
- 2011-03-02 CA CA2791931A patent/CA2791931A1/en not_active Abandoned
- 2011-03-02 CN CN201180014974XA patent/CN102812519A/zh active Pending
- 2011-03-02 US US13/038,461 patent/US9098430B2/en active Active
- 2011-03-02 JP JP2013500288A patent/JP2013522779A/ja active Pending
- 2011-03-02 EP EP11758700.6A patent/EP2550661A4/en not_active Withdrawn
-
2015
- 2015-07-09 US US14/795,114 patent/US9411680B2/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2013522779A5 (enExample) | ||
| US9098430B2 (en) | Composite semiconductor memory device with error correction | |
| JP5776107B2 (ja) | メモリコントローラ及び方法におけるデータ完全性 | |
| US8726140B2 (en) | Dummy data padding and error code correcting memory controller, data processing method thereof, and memory system including the same | |
| US10528469B2 (en) | Memory system for writing data based on types of command and data and operating method of the same | |
| US9075531B2 (en) | Storage device | |
| US9021343B1 (en) | Parity scheme for a data storage device | |
| KR101405741B1 (ko) | 스트라이프-기반 비-휘발성 멀티레벨 메모리 동작 | |
| US9105333B1 (en) | On-chip copying of data between NAND flash memory and ReRAM of a memory die | |
| US9244767B1 (en) | Data storage device with in-memory parity circuitry | |
| US8612836B2 (en) | Non-volatile memory device with uncorrectable information region and operation method using the same | |
| CN110362270B (zh) | 存储器系统及其操作方法 | |
| CN109767806A (zh) | 自适应错误检查与校正的半导体存储器装置和存储器系统 | |
| US9652415B2 (en) | Atomic non-volatile memory data transfer | |
| CN107957849A (zh) | 存储器系统及其操作方法 | |
| US20190087126A1 (en) | Memory system and operating method of memory system | |
| KR102603243B1 (ko) | 반도체 메모리 장치 및 그것의 동작 방법 | |
| KR102743807B1 (ko) | 메모리 장치 및 그 동작 방법 | |
| US9454429B2 (en) | Protection against word line failure in memory devices | |
| CN106205728A (zh) | 奇偶校验电路及包括该奇偶校验电路的存储器装置 | |
| US20150143187A1 (en) | Implementing enhanced performance with read before write to phase change memory | |
| CN113268441A (zh) | 存储装置及其操作方法 | |
| KR102665270B1 (ko) | 반도체 메모리 장치 및 그것의 동작 방법 | |
| US12132501B2 (en) | Memory module, memory system, and operation method of memory controller | |
| CN110648698A (zh) | 储存装置、存储器件及操作该存储器件的方法 |