JP5776107B2 - メモリコントローラ及び方法におけるデータ完全性 - Google Patents
メモリコントローラ及び方法におけるデータ完全性 Download PDFInfo
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- JP5776107B2 JP5776107B2 JP2011550132A JP2011550132A JP5776107B2 JP 5776107 B2 JP5776107 B2 JP 5776107B2 JP 2011550132 A JP2011550132 A JP 2011550132A JP 2011550132 A JP2011550132 A JP 2011550132A JP 5776107 B2 JP5776107 B2 JP 5776107B2
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- 230000015654 memory Effects 0.000 title claims description 210
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- 238000012937 correction Methods 0.000 claims description 15
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1004—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
- G06F13/16—Handling requests for interconnection or transfer for access to memory bus
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/14—Handling requests for interconnection or transfer
- G06F13/20—Handling requests for interconnection or transfer for access to input/output bus
- G06F13/28—Handling requests for interconnection or transfer for access to input/output bus using burst mode transfer, e.g. direct memory access DMA, cycle steal
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/60—Protecting data
- G06F21/64—Protecting data integrity, e.g. using checksums, certificates or signatures
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
- H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
- H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
- H03M13/09—Error detection only, e.g. using cyclic redundancy check [CRC] codes or single parity bit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
- H03M13/29—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes combining two or more codes or code structures, e.g. product codes, generalised product codes, concatenated codes, inner and outer codes
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0411—Online error correction
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
- H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
- H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
- H03M13/13—Linear codes
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- Engineering & Computer Science (AREA)
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- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Security & Cryptography (AREA)
- Quality & Reliability (AREA)
- Probability & Statistics with Applications (AREA)
- Health & Medical Sciences (AREA)
- Bioethics (AREA)
- General Health & Medical Sciences (AREA)
- Computer Hardware Design (AREA)
- Software Systems (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Detection And Correction Of Errors (AREA)
Description
(結論)
Claims (14)
- ホストインタフェースと、
前記ホストインタフェースに結合される第1のエラー検出回路と、
メモリインタフェースと、
前記メモリインタフェースに結合されるエラー訂正コード(ECC)エンジンと、
前記ECCエンジンに結合される第2のエラー検出回路と、
を備えるメモリコントローラであって、
前記第1のエラー検出回路が、
前記ホストインタフェースから受信されるデータに対して第1のエラー検出データを計算し、
前記ホストインタフェースに送信されるデータの完全性をチェックするように構成され、
前記ECCエンジンが、
前記メモリインタフェースに送信されるデータ及び前記第1のエラー検出データに対して、エラー訂正データを計算し、
前記メモリインタフェースから受信されるデータ及び前記第1のエラー検出データの完全性をチェックするように構成され、
前記第2のエラー検出回路は、
前記メモリインタフェースに送信されるためにデータに対して第2のエラー検出データを計算し、
前記メモリインタフェースに送信されるために前記データの完全性をチェックするために、前記第2のエラー検出データを、前記第1のエラー検出データと比較するように構成される、メモリコントローラ。 - 前記メモリコントローラが、前記ホストインタフェースから受信される前記データ及び前記エラー訂正データを、前記メモリインタフェース上で転送するように構成される、請求項1に記載のメモリコントローラ。
- 前記第1のエラー検出回路が、データの受信されたセクタごとにエラー検出データを計算するように構成される、請求項2に記載のメモリコントローラ。
- 前記ホストインタフェースから受信される前記データが、ある数のデータのセクタを含むデータペイロードを含み、
前記ホストインタフェースから受信される前記データがストリーミングデータを含む、請求項3に記載のメモリコントローラ。 - 前記第1のエラー検出回路が、リンク層及び/又はトランスポート層によって前記ホストインタフェースに結合されるサイクリックリダンダンシーチェック(CRC)エンジンを備える、
請求項1に記載のメモリコントローラ。 - 前記メモリコントローラが、
前記ホストインタフェース、並びに前記第1のエラー検出回路及び前記第2のエラー検出回路に結合されるデータ転送回路と、
前記データ転送回路に結合されるエラー検出メモリと、
を含み、
前記エラー検出メモリが、前記第1のエラー検出データを記憶するように構成される、
請求項1に記載のメモリコントローラ。 - 前記メモリコントローラが、
前記データ転送回路、及び前記第2のエラー検出回路に結合されるデータバッファを含み、
前記データバッファが、前記第2のエラー検出回路のためにデータをバッファリングするように構成される、
請求項6に記載のメモリコントローラ。 - 前記ECCエンジンが、前記メモリインタフェースから受信される前記データの1つ又は複数のエラーを訂正するように構成される、請求項1に記載のメモリコントローラ。
- 前記メモリコントローラが、
前記メモリインタフェース、並びに前記第1のエラー検出回路及び前記第2のエラー検出回路に結合されるデータ転送回路を含み、
前記データ転送回路が、前記第2のエラー検出回路に、前記データ及び前記第1のエラー検出データを転送するように構成される、
請求項1に記載のメモリコントローラ。 - 前記第2のエラー検出回路が、
前記データ転送回路から受信される前記データに対してエラー検出データを計算し、
前記データ転送回路から受信される前記データに対して前記計算されたエラー検出データを、前記データ転送回路から受信される対応するエラー検出データと比較するように構成される、
請求項9に記載のメモリコントローラ。 - 前記メモリコントローラが、
2つ以上のチャネルと、
前記データ転送回路に結合されるチャネルデータ転送回路と、
前記チャネルデータ転送回路及び前記第2のエラー検出回路に結合されるデータバッファと、
前記メモリインタフェースに結合されるエラー検出メモリと、
を含む、請求項9に記載のメモリコントローラ。 - 前記メモリコントローラが、
2つ以上のチャネルと、
チャネルプロセッサ及びチャネルメモリと、
を含む、請求項9に記載のメモリコントローラ。 - 前記メモリコントローラが、
前記ホストインタフェースに結合されるホストバッファと、
前記ホストバッファに結合される暗号化回路と、
を含み、
前記暗号化回路が、暗号化された出力を提供するために任意選択で前記データを処理するように構成される、
請求項1に記載のメモリコントローラ。 - 前記暗号化回路が、高度暗号化規格(AES)エンジンを備える、請求項13に記載のメモリコントローラ。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US12/388,305 | 2009-02-18 | ||
US12/388,305 US8468417B2 (en) | 2009-02-18 | 2009-02-18 | Data integrity in memory controllers and methods |
PCT/US2010/000412 WO2010096153A2 (en) | 2009-02-18 | 2010-02-12 | Data integrity in memory controllers and methods |
Publications (2)
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JP2012518224A JP2012518224A (ja) | 2012-08-09 |
JP5776107B2 true JP5776107B2 (ja) | 2015-09-09 |
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JP2011550132A Expired - Fee Related JP5776107B2 (ja) | 2009-02-18 | 2010-02-12 | メモリコントローラ及び方法におけるデータ完全性 |
Country Status (7)
Country | Link |
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US (3) | US8468417B2 (ja) |
EP (1) | EP2399194A4 (ja) |
JP (1) | JP5776107B2 (ja) |
KR (2) | KR101351754B1 (ja) |
CN (1) | CN102317919B (ja) |
TW (2) | TWI451434B (ja) |
WO (1) | WO2010096153A2 (ja) |
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KR101457518B1 (ko) | 2014-11-10 |
US20100211834A1 (en) | 2010-08-19 |
EP2399194A4 (en) | 2012-10-31 |
KR20130124989A (ko) | 2013-11-15 |
WO2010096153A2 (en) | 2010-08-26 |
US8468417B2 (en) | 2013-06-18 |
EP2399194A2 (en) | 2011-12-28 |
TWI451434B (zh) | 2014-09-01 |
CN102317919A (zh) | 2012-01-11 |
WO2010096153A3 (en) | 2010-11-25 |
JP2012518224A (ja) | 2012-08-09 |
CN102317919B (zh) | 2015-03-11 |
KR101351754B1 (ko) | 2014-01-14 |
US20150220386A1 (en) | 2015-08-06 |
KR20110118168A (ko) | 2011-10-28 |
US9015553B2 (en) | 2015-04-21 |
TW201434051A (zh) | 2014-09-01 |
TW201035987A (en) | 2010-10-01 |
US20130283124A1 (en) | 2013-10-24 |
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