JP2013518396A5 - - Google Patents

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JP2013518396A5
JP2013518396A5 JP2012551316A JP2012551316A JP2013518396A5 JP 2013518396 A5 JP2013518396 A5 JP 2013518396A5 JP 2012551316 A JP2012551316 A JP 2012551316A JP 2012551316 A JP2012551316 A JP 2012551316A JP 2013518396 A5 JP2013518396 A5 JP 2013518396A5
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ions
pressure
dms
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JP2012551316A
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JP5985989B2 (ja
JP2013518396A (ja
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Priority claimed from PCT/US2011/022905 external-priority patent/WO2011094529A2/en
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JP2012551316A 2010-01-28 2011-01-28 低圧微分移動度分光計を備えた質量分析システム Expired - Fee Related JP5985989B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US29908610P 2010-01-28 2010-01-28
US61/299,086 2010-01-28
PCT/US2011/022905 WO2011094529A2 (en) 2010-01-28 2011-01-28 Mass analysis system with low pressure differential mobility spectrometer

Publications (3)

Publication Number Publication Date
JP2013518396A JP2013518396A (ja) 2013-05-20
JP2013518396A5 true JP2013518396A5 (https=) 2014-03-13
JP5985989B2 JP5985989B2 (ja) 2016-09-06

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JP2012551316A Expired - Fee Related JP5985989B2 (ja) 2010-01-28 2011-01-28 低圧微分移動度分光計を備えた質量分析システム

Country Status (5)

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US (2) US20110183431A1 (https=)
EP (1) EP2529387B1 (https=)
JP (1) JP5985989B2 (https=)
CA (1) CA2788455C (https=)
WO (1) WO2011094529A2 (https=)

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