JP2013515950A5 - - Google Patents

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JP2013515950A5
JP2013515950A5 JP2012545298A JP2012545298A JP2013515950A5 JP 2013515950 A5 JP2013515950 A5 JP 2013515950A5 JP 2012545298 A JP2012545298 A JP 2012545298A JP 2012545298 A JP2012545298 A JP 2012545298A JP 2013515950 A5 JP2013515950 A5 JP 2013515950A5
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Japan
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laser
sample gas
frequency
measuring device
measurement
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JP2012545298A
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Japanese (ja)
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JP5797665B2 (ja
JP2013515950A (ja
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Priority claimed from DE102009055320A external-priority patent/DE102009055320B4/de
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JP2012545298A 2009-12-24 2010-12-21 赤外線吸収分光法により試料ガスを分析する測定装置およびその分析方法 Expired - Fee Related JP5797665B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102009055320A DE102009055320B4 (de) 2009-12-24 2009-12-24 Messvorrichtung und Verfahren zur Untersuchung eines Probegases mittels Infrarot-Absorptionsspektroskopie
DE102009055320.7 2009-12-24
PCT/EP2010/070407 WO2011076803A1 (de) 2009-12-24 2010-12-21 Messvorrichtung und verfahren zur untersuchung eines probegases mittels infrarot-absorptionsspektroskopie

Publications (3)

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JP2013515950A JP2013515950A (ja) 2013-05-09
JP2013515950A5 true JP2013515950A5 (https=) 2014-01-30
JP5797665B2 JP5797665B2 (ja) 2015-10-21

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JP2012545298A Expired - Fee Related JP5797665B2 (ja) 2009-12-24 2010-12-21 赤外線吸収分光法により試料ガスを分析する測定装置およびその分析方法

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US (1) US9541497B2 (https=)
EP (2) EP2626128B1 (https=)
JP (1) JP5797665B2 (https=)
CN (1) CN102711605B (https=)
AU (1) AU2010334907B2 (https=)
BR (1) BR112012015680A2 (https=)
CA (1) CA2785489C (https=)
DE (1) DE102009055320B4 (https=)
DK (1) DK2515756T3 (https=)
EA (1) EA022246B1 (https=)
ES (1) ES2531107T3 (https=)
PL (1) PL2515756T3 (https=)
PT (1) PT2515756E (https=)
WO (1) WO2011076803A1 (https=)

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