JP2013511041A - 減衰全反射に基づいた光センサシステムおよび感知方法 - Google Patents
減衰全反射に基づいた光センサシステムおよび感知方法 Download PDFInfo
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- JP2013511041A JP2013511041A JP2012538789A JP2012538789A JP2013511041A JP 2013511041 A JP2013511041 A JP 2013511041A JP 2012538789 A JP2012538789 A JP 2012538789A JP 2012538789 A JP2012538789 A JP 2012538789A JP 2013511041 A JP2013511041 A JP 2013511041A
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- 238000002198 surface plasmon resonance spectroscopy Methods 0.000 claims description 35
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
Landscapes
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/617,081 US8743368B2 (en) | 2009-11-12 | 2009-11-12 | Optical sensor system and method of sensing |
| US12/617,081 | 2009-11-12 | ||
| PCT/SE2010/051233 WO2011059383A1 (en) | 2009-11-12 | 2010-11-10 | Optical sensor system based on attenuated total reflection and method of sensing |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013511041A true JP2013511041A (ja) | 2013-03-28 |
| JP2013511041A5 JP2013511041A5 (enExample) | 2013-12-12 |
Family
ID=43973967
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012538789A Pending JP2013511041A (ja) | 2009-11-12 | 2010-11-10 | 減衰全反射に基づいた光センサシステムおよび感知方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8743368B2 (enExample) |
| EP (1) | EP2499480B1 (enExample) |
| JP (1) | JP2013511041A (enExample) |
| CN (1) | CN102597745B (enExample) |
| WO (1) | WO2011059383A1 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020163188A (ja) * | 2016-12-26 | 2020-10-08 | 三菱電機株式会社 | 生体物質測定装置 |
| WO2024122207A1 (ja) * | 2022-12-06 | 2024-06-13 | ソニーセミコンダクタソリューションズ株式会社 | 照明装置及び測距装置 |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8445217B2 (en) | 2007-09-20 | 2013-05-21 | Vanderbilt University | Free solution measurement of molecular interactions by backscattering interferometry |
| US8743368B2 (en) | 2009-11-12 | 2014-06-03 | General Electric Company | Optical sensor system and method of sensing |
| US9638632B2 (en) * | 2010-06-11 | 2017-05-02 | Vanderbilt University | Multiplexed interferometric detection system and method |
| US9562853B2 (en) | 2011-02-22 | 2017-02-07 | Vanderbilt University | Nonaqueous backscattering interferometric methods |
| US9008757B2 (en) | 2012-09-26 | 2015-04-14 | Stryker Corporation | Navigation system including optical and non-optical sensors |
| DE102014108424B3 (de) | 2014-06-16 | 2015-06-11 | Johann Wolfgang Goethe-Universität | Nicht-invasive Stoffanalyse |
| IL234766A (en) | 2014-09-21 | 2015-09-24 | Visionsense Ltd | Fluorescent Imaging System |
| US9557263B2 (en) | 2014-10-22 | 2017-01-31 | The Boeing Company | Terahertz material evaluation and characterization via material difference frequency generation |
| US9557267B2 (en) | 2014-10-22 | 2017-01-31 | The Boeing Company | Terahertz imaging via simultaneous surface and sub-surface evaluation via non-linear optical response |
| US9632020B2 (en) | 2014-10-22 | 2017-04-25 | The Boeing Company | Non-linear optical ellipsometry for surface monitoring and characterization |
| US9404854B2 (en) | 2014-10-22 | 2016-08-02 | The Boeing Company | Second and third order simultaneously non-linear optical processes and measurements for surface analysis |
| EP3247988A4 (en) | 2015-01-23 | 2018-12-19 | Vanderbilt University | A robust interferometer and methods of using same |
| EP3298431B1 (en) * | 2015-05-18 | 2024-08-14 | Lasermotive, Inc. | Light curtain safety system |
| WO2017132483A1 (en) | 2016-01-29 | 2017-08-03 | Vanderbilt University | Free-solution response function interferometry |
| EP3208604B1 (en) * | 2016-02-22 | 2019-07-10 | F. Hoffmann-La Roche AG | Optics for analysis of microwells |
| CN106443890A (zh) * | 2016-12-12 | 2017-02-22 | 长春理工大学 | 一种基于非球面整形器的高效空间光至单模光纤耦合系统 |
| KR102459880B1 (ko) * | 2017-09-29 | 2022-10-27 | 에이에스엠엘 네델란즈 비.브이. | 웨이퍼 검사를 위한 고급 전하 컨트롤러에 대한 방법 및 장치 |
| CH714486A1 (de) * | 2017-12-21 | 2019-06-28 | Integra Biosciences Ag | Probenverteilsystem und Verfahren zum Verteilen von Proben. |
| CN111765853B (zh) * | 2020-07-29 | 2024-07-30 | 天津大学 | 一种高分辨力一维测角激光传感器 |
| CN114152569A (zh) * | 2021-11-17 | 2022-03-08 | 北京英柏生物科技有限公司 | 一种基于spr角谱的成像光学系统 |
| US20240167957A1 (en) * | 2022-11-23 | 2024-05-23 | Bionano Genomics, Inc. | Top Hat Illumination Biological Sample Imaging Devices, and Methods of Using the Same |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH032544A (ja) * | 1989-05-30 | 1991-01-08 | Sumitomo Heavy Ind Ltd | 雨滴計測装置 |
| JPH10153750A (ja) * | 1996-11-25 | 1998-06-09 | Sumitomo Electric Ind Ltd | レーザビーム整形光学部品 |
| JP2003185569A (ja) * | 2001-12-14 | 2003-07-03 | Mitsubishi Chemicals Corp | 表面プラズモン共鳴を利用した試料の分析装置及び表面プラズモン共鳴分析用センサチップ |
| JP2003185568A (ja) * | 2001-12-17 | 2003-07-03 | Fuji Photo Film Co Ltd | 全反射減衰を利用したセンサー |
| JP2006145676A (ja) * | 2004-11-17 | 2006-06-08 | Fujitsu Ltd | ホログラム記録装置 |
| JP2008070391A (ja) * | 2007-12-05 | 2008-03-27 | Fujifilm Corp | 全反射光を利用した測定装置 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE462408B (sv) * | 1988-11-10 | 1990-06-18 | Pharmacia Ab | Optiskt biosensorsystem utnyttjande ytplasmonresonans foer detektering av en specific biomolekyl, saett att kalibrera sensoranordningen samt saett att korrigera foer baslinjedrift i systemet |
| JPH0810188B2 (ja) * | 1990-08-03 | 1996-01-31 | 株式会社日立製作所 | 粒子状物質分析装置及び分析方法並びに超純水製造装置、半導体製造装置、高純度気体製造装置 |
| CN2284964Y (zh) * | 1995-12-24 | 1998-06-24 | 黄喜平 | 异形透镜 |
| US5986807A (en) * | 1997-01-13 | 1999-11-16 | Xerox Corporation | Single binary optical element beam homogenizer |
| JP2000162124A (ja) * | 1998-12-01 | 2000-06-16 | Nippon Laser Denshi Kk | 表面プラズモン共鳴角検出装置のセンサーチップ |
| US6466315B1 (en) * | 1999-09-03 | 2002-10-15 | Applied Materials, Inc. | Method and system for reticle inspection by photolithography simulation |
| US6654183B2 (en) * | 1999-12-15 | 2003-11-25 | International Business Machines Corporation | System for converting optical beams to collimated flat-top beams |
| EP1219952B1 (en) | 2000-12-25 | 2004-10-20 | Fuji Photo Film Co., Ltd. | Sensor utilizing attenuated total reflection |
| US6829052B2 (en) * | 2000-12-25 | 2004-12-07 | Fuji Photo Film Co., Ltd. | Sensor detecting attenuated total reflection angle by using semiconductor laser unit driven with driving current on which high frequency component is superimposed |
| JP2004219401A (ja) * | 2002-12-24 | 2004-08-05 | Aisin Seiki Co Ltd | 表面プラズモンセンサー及び、表面プラズモン共鳴測定装置、検知チップ |
| US7271885B2 (en) * | 2004-03-25 | 2007-09-18 | Perkinelmer Las, Inc. | Plasmon resonance measuring method and apparatus |
| US7317519B2 (en) * | 2004-10-29 | 2008-01-08 | Agilent Technologies, Inc. | Swept-angle SPR measurement system |
| TWI259290B (en) * | 2004-12-02 | 2006-08-01 | Phalanx Biotech Group Inc | Common-path phase-shift interferometry surface plasmon resonance microscope |
| JP2006208294A (ja) * | 2005-01-31 | 2006-08-10 | Canon Inc | プラズモン共鳴および蛍光の同時イメージング装置及びイメージング方法 |
| JP2006242916A (ja) * | 2005-03-07 | 2006-09-14 | Fuji Photo Film Co Ltd | 全反射減衰を利用するセンサユニット及び測定方法 |
| US20070031154A1 (en) * | 2005-08-05 | 2007-02-08 | Vanwiggeren Gregory D | Measurement system having modulated laser source |
| JP3974157B2 (ja) | 2005-08-30 | 2007-09-12 | シャープ株式会社 | 表面プラズモンセンサー |
| DE202006000742U1 (de) * | 2006-01-18 | 2007-05-24 | Trw Automotive Electronics & Components Gmbh & Co. Kg | Optische Sensorvorrichtung |
| DE102006041338B3 (de) * | 2006-09-01 | 2007-11-22 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Plasmonenresonanzsensor |
| KR100876608B1 (ko) * | 2007-08-20 | 2008-12-31 | 한국생명공학연구원 | 회전거울을 이용한 표면 플라즈몬 공명 센서 |
| WO2009104123A1 (en) * | 2008-02-22 | 2009-08-27 | Koninklijke Philips Electronics N.V. | Light source for ftir biosensor |
| JP5344828B2 (ja) * | 2008-02-28 | 2013-11-20 | 富士フイルム株式会社 | センシング装置 |
| US8743368B2 (en) | 2009-11-12 | 2014-06-03 | General Electric Company | Optical sensor system and method of sensing |
-
2009
- 2009-11-12 US US12/617,081 patent/US8743368B2/en active Active
-
2010
- 2010-11-10 EP EP10830276.1A patent/EP2499480B1/en active Active
- 2010-11-10 JP JP2012538789A patent/JP2013511041A/ja active Pending
- 2010-11-10 CN CN201080051283.2A patent/CN102597745B/zh active Active
- 2010-11-10 WO PCT/SE2010/051233 patent/WO2011059383A1/en not_active Ceased
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH032544A (ja) * | 1989-05-30 | 1991-01-08 | Sumitomo Heavy Ind Ltd | 雨滴計測装置 |
| JPH10153750A (ja) * | 1996-11-25 | 1998-06-09 | Sumitomo Electric Ind Ltd | レーザビーム整形光学部品 |
| JP2003185569A (ja) * | 2001-12-14 | 2003-07-03 | Mitsubishi Chemicals Corp | 表面プラズモン共鳴を利用した試料の分析装置及び表面プラズモン共鳴分析用センサチップ |
| JP2003185568A (ja) * | 2001-12-17 | 2003-07-03 | Fuji Photo Film Co Ltd | 全反射減衰を利用したセンサー |
| JP2006145676A (ja) * | 2004-11-17 | 2006-06-08 | Fujitsu Ltd | ホログラム記録装置 |
| JP2008070391A (ja) * | 2007-12-05 | 2008-03-27 | Fujifilm Corp | 全反射光を利用した測定装置 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020163188A (ja) * | 2016-12-26 | 2020-10-08 | 三菱電機株式会社 | 生体物質測定装置 |
| JP7004770B2 (ja) | 2016-12-26 | 2022-01-21 | 三菱電機株式会社 | 生体物質測定装置 |
| US11234648B2 (en) | 2016-12-26 | 2022-02-01 | Mitsubishi Electric Corporation | Biological material measuring apparatus |
| WO2024122207A1 (ja) * | 2022-12-06 | 2024-06-13 | ソニーセミコンダクタソリューションズ株式会社 | 照明装置及び測距装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102597745A (zh) | 2012-07-18 |
| EP2499480B1 (en) | 2019-04-17 |
| CN102597745B (zh) | 2014-11-19 |
| US8743368B2 (en) | 2014-06-03 |
| EP2499480A4 (en) | 2017-11-08 |
| WO2011059383A1 (en) | 2011-05-19 |
| US20110109907A1 (en) | 2011-05-12 |
| EP2499480A1 (en) | 2012-09-19 |
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