CN102597745B - 基于衰减全反射的光传感器系统和感测方法 - Google Patents

基于衰减全反射的光传感器系统和感测方法 Download PDF

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Publication number
CN102597745B
CN102597745B CN201080051283.2A CN201080051283A CN102597745B CN 102597745 B CN102597745 B CN 102597745B CN 201080051283 A CN201080051283 A CN 201080051283A CN 102597745 B CN102597745 B CN 102597745B
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bundle
lens
intensity
light
electromagnetic radiation
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CN102597745A (zh
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B.伊瓦尔森
M.M.迈耶斯
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Cytiva Sweden AB
Global Life Sciences Solutions USA LLC
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General Electric Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence

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  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
CN201080051283.2A 2009-11-12 2010-11-10 基于衰减全反射的光传感器系统和感测方法 Active CN102597745B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US12/617,081 US8743368B2 (en) 2009-11-12 2009-11-12 Optical sensor system and method of sensing
US12/617,081 2009-11-12
US12/617081 2009-11-12
PCT/SE2010/051233 WO2011059383A1 (en) 2009-11-12 2010-11-10 Optical sensor system based on attenuated total reflection and method of sensing

Publications (2)

Publication Number Publication Date
CN102597745A CN102597745A (zh) 2012-07-18
CN102597745B true CN102597745B (zh) 2014-11-19

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Country Link
US (1) US8743368B2 (enExample)
EP (1) EP2499480B1 (enExample)
JP (1) JP2013511041A (enExample)
CN (1) CN102597745B (enExample)
WO (1) WO2011059383A1 (enExample)

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US9557267B2 (en) 2014-10-22 2017-01-31 The Boeing Company Terahertz imaging via simultaneous surface and sub-surface evaluation via non-linear optical response
US9632020B2 (en) 2014-10-22 2017-04-25 The Boeing Company Non-linear optical ellipsometry for surface monitoring and characterization
US9404854B2 (en) 2014-10-22 2016-08-02 The Boeing Company Second and third order simultaneously non-linear optical processes and measurements for surface analysis
EP3247988A4 (en) 2015-01-23 2018-12-19 Vanderbilt University A robust interferometer and methods of using same
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WO2017132483A1 (en) 2016-01-29 2017-08-03 Vanderbilt University Free-solution response function interferometry
EP3208604B1 (en) * 2016-02-22 2019-07-10 F. Hoffmann-La Roche AG Optics for analysis of microwells
CN106443890A (zh) * 2016-12-12 2017-02-22 长春理工大学 一种基于非球面整形器的高效空间光至单模光纤耦合系统
CN113662537B (zh) 2016-12-26 2024-06-18 三菱电机株式会社 生物体物质测量装置
KR102459880B1 (ko) * 2017-09-29 2022-10-27 에이에스엠엘 네델란즈 비.브이. 웨이퍼 검사를 위한 고급 전하 컨트롤러에 대한 방법 및 장치
CH714486A1 (de) * 2017-12-21 2019-06-28 Integra Biosciences Ag Probenverteilsystem und Verfahren zum Verteilen von Proben.
CN111765853B (zh) * 2020-07-29 2024-07-30 天津大学 一种高分辨力一维测角激光传感器
CN114152569A (zh) * 2021-11-17 2022-03-08 北京英柏生物科技有限公司 一种基于spr角谱的成像光学系统
US20240167957A1 (en) * 2022-11-23 2024-05-23 Bionano Genomics, Inc. Top Hat Illumination Biological Sample Imaging Devices, and Methods of Using the Same
JP2024081358A (ja) * 2022-12-06 2024-06-18 ソニーセミコンダクタソリューションズ株式会社 照明装置及び測距装置

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JP2000162124A (ja) * 1998-12-01 2000-06-16 Nippon Laser Denshi Kk 表面プラズモン共鳴角検出装置のセンサーチップ
JP2004219401A (ja) * 2002-12-24 2004-08-05 Aisin Seiki Co Ltd 表面プラズモンセンサー及び、表面プラズモン共鳴測定装置、検知チップ
US7271885B2 (en) * 2004-03-25 2007-09-18 Perkinelmer Las, Inc. Plasmon resonance measuring method and apparatus
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Also Published As

Publication number Publication date
CN102597745A (zh) 2012-07-18
EP2499480B1 (en) 2019-04-17
JP2013511041A (ja) 2013-03-28
US8743368B2 (en) 2014-06-03
EP2499480A4 (en) 2017-11-08
WO2011059383A1 (en) 2011-05-19
US20110109907A1 (en) 2011-05-12
EP2499480A1 (en) 2012-09-19

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