JP2013195176A5 - - Google Patents

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Publication number
JP2013195176A5
JP2013195176A5 JP2012061391A JP2012061391A JP2013195176A5 JP 2013195176 A5 JP2013195176 A5 JP 2013195176A5 JP 2012061391 A JP2012061391 A JP 2012061391A JP 2012061391 A JP2012061391 A JP 2012061391A JP 2013195176 A5 JP2013195176 A5 JP 2013195176A5
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JP
Japan
Prior art keywords
electromagnetic wave
pulse
electromagnetic
wave pulse
elastic vibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2012061391A
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English (en)
Japanese (ja)
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JP2013195176A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2012061391A priority Critical patent/JP2013195176A/ja
Priority claimed from JP2012061391A external-priority patent/JP2013195176A/ja
Priority to PCT/JP2013/058175 priority patent/WO2013141326A1/en
Priority to US14/375,374 priority patent/US8981300B2/en
Priority to EP13714710.4A priority patent/EP2828650A1/en
Publication of JP2013195176A publication Critical patent/JP2013195176A/ja
Publication of JP2013195176A5 publication Critical patent/JP2013195176A5/ja
Pending legal-status Critical Current

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JP2012061391A 2012-03-19 2012-03-19 電磁波パルス測定装置及び方法、及びそれを用いた応用装置 Pending JP2013195176A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2012061391A JP2013195176A (ja) 2012-03-19 2012-03-19 電磁波パルス測定装置及び方法、及びそれを用いた応用装置
PCT/JP2013/058175 WO2013141326A1 (en) 2012-03-19 2013-03-13 Electromagnetic wave pulse measuring device and method, and application device using the same
US14/375,374 US8981300B2 (en) 2012-03-19 2013-03-13 Electromagnetic wave pulse measuring device and method, and application device using the same
EP13714710.4A EP2828650A1 (en) 2012-03-19 2013-03-13 Electromagnetic wave pulse measuring device and method, and application device using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012061391A JP2013195176A (ja) 2012-03-19 2012-03-19 電磁波パルス測定装置及び方法、及びそれを用いた応用装置

Publications (2)

Publication Number Publication Date
JP2013195176A JP2013195176A (ja) 2013-09-30
JP2013195176A5 true JP2013195176A5 (enExample) 2015-05-07

Family

ID=48050207

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012061391A Pending JP2013195176A (ja) 2012-03-19 2012-03-19 電磁波パルス測定装置及び方法、及びそれを用いた応用装置

Country Status (4)

Country Link
US (1) US8981300B2 (enExample)
EP (1) EP2828650A1 (enExample)
JP (1) JP2013195176A (enExample)
WO (1) WO2013141326A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104374462A (zh) * 2014-11-17 2015-02-25 北京智谷睿拓技术服务有限公司 振动信息获取方法、振动信息获取装置及用户设备
EP3441749B1 (en) * 2016-04-05 2023-11-22 Advanced Bio-Spectroscopy Co., Ltd. Method for observing dynamic physical property of biological tissue, and device for observing dynamic physical property of biological tissue
CN107095673B (zh) * 2017-05-24 2018-03-13 西北核技术研究所 一种反射式实时肿瘤成像方法及系统
US10795151B2 (en) * 2018-04-12 2020-10-06 Mitsubishi Electric Research Laboratories, Inc. Methods and systems for terahertz-based positioning
WO2023075694A2 (en) * 2021-10-28 2023-05-04 Agency For Science, Technology And Research A system and method of non-contact measurement of one or more mechanical properties of a material
JP7838584B2 (ja) * 2021-11-05 2026-04-01 横河電機株式会社 測定装置及び測定方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2360186B (en) 2000-03-03 2003-05-14 Toshiba Res Europ Ltd Apparatus and method for investigating a sample
GB0220755D0 (en) * 2002-09-06 2002-10-16 Univ Cambridge Tech Terahertz spectroscopy
WO2006020341A2 (en) 2004-07-23 2006-02-23 Massachusetts Institute Of Technology Characterization of materials with optically shaped acoustic waveforms
JP4939237B2 (ja) 2006-01-20 2012-05-23 オリンパスメディカルシステムズ株式会社 被検体情報分析装置、内視鏡装置及び被検体情報分析方法
JP2008168038A (ja) * 2007-01-15 2008-07-24 Olympus Medical Systems Corp 被検体情報分析装置、内視鏡装置及び被検体情報分析方法
JP5031330B2 (ja) * 2006-11-15 2012-09-19 キヤノン株式会社 検体分析装置、及び検体分析方法
US20090156932A1 (en) * 2007-12-13 2009-06-18 Board Of Trustees Of The University Of Arkansas Device and method for in vivo flow cytometry using the detection of photoacoustic waves
EP2399523A4 (en) 2009-02-23 2015-04-01 Olympus Medical Systems Corp APPARATUS FOR OBSERVING ORGANISMS AND METHOD FOR CREATING AN ORGANIZATIONAL MOMENTUM
JP2011127950A (ja) * 2009-12-16 2011-06-30 Hikari Physics Kenkyusho:Kk 液体薄膜化装置

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