JP2013195176A - 電磁波パルス測定装置及び方法、及びそれを用いた応用装置 - Google Patents

電磁波パルス測定装置及び方法、及びそれを用いた応用装置 Download PDF

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Publication number
JP2013195176A
JP2013195176A JP2012061391A JP2012061391A JP2013195176A JP 2013195176 A JP2013195176 A JP 2013195176A JP 2012061391 A JP2012061391 A JP 2012061391A JP 2012061391 A JP2012061391 A JP 2012061391A JP 2013195176 A JP2013195176 A JP 2013195176A
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Prior art keywords
electromagnetic wave
pulse
wave pulse
elastic vibration
electromagnetic
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Pending
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JP2012061391A
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Japanese (ja)
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JP2013195176A5 (enExample
Inventor
Oichi Kubota
央一 窪田
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Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2012061391A priority Critical patent/JP2013195176A/ja
Priority to PCT/JP2013/058175 priority patent/WO2013141326A1/en
Priority to US14/375,374 priority patent/US8981300B2/en
Priority to EP13714710.4A priority patent/EP2828650A1/en
Publication of JP2013195176A publication Critical patent/JP2013195176A/ja
Publication of JP2013195176A5 publication Critical patent/JP2013195176A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0654—Imaging
    • G01N29/069—Defect imaging, localisation and sizing using, e.g. time of flight diffraction [TOFD], synthetic aperture focusing technique [SAFT], Amplituden-Laufzeit-Ortskurven [ALOK] technique
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/07—Analysing solids by measuring propagation velocity or propagation time of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/07—Analysing solids by measuring propagation velocity or propagation time of acoustic waves
    • G01N29/075—Analysing solids by measuring propagation velocity or propagation time of acoustic waves by measuring or comparing phase angle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
    • G01N29/341—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with time characteristics
    • G01N29/343—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with time characteristics pulse waves, e.g. particular sequence of pulses, bursts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/067—Electro-optic, magneto-optic, acousto-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0696—Pulsed
    • G01N2201/0697—Pulsed lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/011—Velocity or travel time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/10—Number of transducers

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Acoustics & Sound (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Toxicology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP2012061391A 2012-03-19 2012-03-19 電磁波パルス測定装置及び方法、及びそれを用いた応用装置 Pending JP2013195176A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2012061391A JP2013195176A (ja) 2012-03-19 2012-03-19 電磁波パルス測定装置及び方法、及びそれを用いた応用装置
PCT/JP2013/058175 WO2013141326A1 (en) 2012-03-19 2013-03-13 Electromagnetic wave pulse measuring device and method, and application device using the same
US14/375,374 US8981300B2 (en) 2012-03-19 2013-03-13 Electromagnetic wave pulse measuring device and method, and application device using the same
EP13714710.4A EP2828650A1 (en) 2012-03-19 2013-03-13 Electromagnetic wave pulse measuring device and method, and application device using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012061391A JP2013195176A (ja) 2012-03-19 2012-03-19 電磁波パルス測定装置及び方法、及びそれを用いた応用装置

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JP2013195176A true JP2013195176A (ja) 2013-09-30
JP2013195176A5 JP2013195176A5 (enExample) 2015-05-07

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JP2012061391A Pending JP2013195176A (ja) 2012-03-19 2012-03-19 電磁波パルス測定装置及び方法、及びそれを用いた応用装置

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US (1) US8981300B2 (enExample)
EP (1) EP2828650A1 (enExample)
JP (1) JP2013195176A (enExample)
WO (1) WO2013141326A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2017175773A1 (ja) * 2016-04-05 2019-05-16 株式会社分光計測 生体組織力学的物性量観測方法および生体組織力学的物性量観測装置

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104374462A (zh) * 2014-11-17 2015-02-25 北京智谷睿拓技术服务有限公司 振动信息获取方法、振动信息获取装置及用户设备
CN107095673B (zh) * 2017-05-24 2018-03-13 西北核技术研究所 一种反射式实时肿瘤成像方法及系统
US10795151B2 (en) * 2018-04-12 2020-10-06 Mitsubishi Electric Research Laboratories, Inc. Methods and systems for terahertz-based positioning
WO2023075694A2 (en) * 2021-10-28 2023-05-04 Agency For Science, Technology And Research A system and method of non-contact measurement of one or more mechanical properties of a material
JP7838584B2 (ja) * 2021-11-05 2026-04-01 横河電機株式会社 測定装置及び測定方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005537489A (ja) * 2002-09-06 2005-12-08 ケンブリッジ ユニバーシティ テクニカル サービシズ リミティド テラヘルツ分光法
JP2008122306A (ja) * 2006-11-15 2008-05-29 Canon Inc 検体分析装置、及び検体分析方法
JP2008168038A (ja) * 2007-01-15 2008-07-24 Olympus Medical Systems Corp 被検体情報分析装置、内視鏡装置及び被検体情報分析方法
JP2011127950A (ja) * 2009-12-16 2011-06-30 Hikari Physics Kenkyusho:Kk 液体薄膜化装置

Family Cites Families (5)

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Publication number Priority date Publication date Assignee Title
GB2360186B (en) 2000-03-03 2003-05-14 Toshiba Res Europ Ltd Apparatus and method for investigating a sample
WO2006020341A2 (en) 2004-07-23 2006-02-23 Massachusetts Institute Of Technology Characterization of materials with optically shaped acoustic waveforms
JP4939237B2 (ja) 2006-01-20 2012-05-23 オリンパスメディカルシステムズ株式会社 被検体情報分析装置、内視鏡装置及び被検体情報分析方法
US20090156932A1 (en) * 2007-12-13 2009-06-18 Board Of Trustees Of The University Of Arkansas Device and method for in vivo flow cytometry using the detection of photoacoustic waves
EP2399523A4 (en) 2009-02-23 2015-04-01 Olympus Medical Systems Corp APPARATUS FOR OBSERVING ORGANISMS AND METHOD FOR CREATING AN ORGANIZATIONAL MOMENTUM

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005537489A (ja) * 2002-09-06 2005-12-08 ケンブリッジ ユニバーシティ テクニカル サービシズ リミティド テラヘルツ分光法
JP2008122306A (ja) * 2006-11-15 2008-05-29 Canon Inc 検体分析装置、及び検体分析方法
JP2008168038A (ja) * 2007-01-15 2008-07-24 Olympus Medical Systems Corp 被検体情報分析装置、内視鏡装置及び被検体情報分析方法
JP2011127950A (ja) * 2009-12-16 2011-06-30 Hikari Physics Kenkyusho:Kk 液体薄膜化装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2017175773A1 (ja) * 2016-04-05 2019-05-16 株式会社分光計測 生体組織力学的物性量観測方法および生体組織力学的物性量観測装置

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US8981300B2 (en) 2015-03-17
EP2828650A1 (en) 2015-01-28
US20150008326A1 (en) 2015-01-08
WO2013141326A1 (en) 2013-09-26

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