JP2013170924A5 - - Google Patents

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Publication number
JP2013170924A5
JP2013170924A5 JP2012034792A JP2012034792A JP2013170924A5 JP 2013170924 A5 JP2013170924 A5 JP 2013170924A5 JP 2012034792 A JP2012034792 A JP 2012034792A JP 2012034792 A JP2012034792 A JP 2012034792A JP 2013170924 A5 JP2013170924 A5 JP 2013170924A5
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JP
Japan
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strip
patent document
foreign matter
shaped
detected
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JP2012034792A
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English (en)
Japanese (ja)
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JP2013170924A (ja
JP5875403B2 (ja
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Priority to JP2012034792A priority Critical patent/JP5875403B2/ja
Priority claimed from JP2012034792A external-priority patent/JP5875403B2/ja
Priority to KR1020130013755A priority patent/KR101874133B1/ko
Priority to US13/769,704 priority patent/US9001966B2/en
Priority to CN201310055104.8A priority patent/CN103499592B/zh
Publication of JP2013170924A publication Critical patent/JP2013170924A/ja
Publication of JP2013170924A5 publication Critical patent/JP2013170924A5/ja
Application granted granted Critical
Publication of JP5875403B2 publication Critical patent/JP5875403B2/ja
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JP2012034792A 2012-02-21 2012-02-21 透過ｘ線分析装置 Active JP5875403B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2012034792A JP5875403B2 (ja) 2012-02-21 2012-02-21 透過ｘ線分析装置
KR1020130013755A KR101874133B1 (ko) 2012-02-21 2013-02-07 투과 x선 분석 장치
US13/769,704 US9001966B2 (en) 2012-02-21 2013-02-18 Transmission X-ray analyzer
CN201310055104.8A CN103499592B (zh) 2012-02-21 2013-02-21 透射x射线分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012034792A JP5875403B2 (ja) 2012-02-21 2012-02-21 透過ｘ線分析装置

Publications (3)

Publication Number Publication Date
JP2013170924A JP2013170924A (ja) 2013-09-02
JP2013170924A5 true JP2013170924A5 (enExample) 2015-04-09
JP5875403B2 JP5875403B2 (ja) 2016-03-02

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ID=48982262

Family Applications (1)

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JP2012034792A Active JP5875403B2 (ja) 2012-02-21 2012-02-21 透過ｘ線分析装置

Country Status (4)

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US (1) US9001966B2 (enExample)
JP (1) JP5875403B2 (enExample)
KR (1) KR101874133B1 (enExample)
CN (1) CN103499592B (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6397690B2 (ja) * 2014-08-11 2018-09-26 株式会社日立ハイテクノロジーズ Ｘ線透過検査装置及び異物検出方法
JP6512980B2 (ja) * 2015-07-29 2019-05-15 株式会社日立ハイテクサイエンス Ｘ線透過検査装置及びｘ線透過検査方法
US20180284037A1 (en) * 2017-03-30 2018-10-04 Sumitomo Chemical Company, Limited Inspection device, inspection method, and method of producing film roll
WO2020115876A1 (ja) * 2018-12-06 2020-06-11 株式会社日立ハイテク 荷電粒子線装置
JP7201481B2 (ja) * 2019-03-04 2023-01-10 株式会社日立ハイテクサイエンス Ｘ線検査装置及びｘ線検査方法
CN110231345B (zh) * 2019-07-17 2023-11-14 佛山市清极能源科技有限公司 一种膜电极缺陷在线检测方法及设备
US20220276185A1 (en) * 2021-02-26 2022-09-01 Honeywell Limited BOEHMITE DETECTION AND WARNING SYSTEM, AND CONCENTRATION INDICATOR FOR LiB SEPARATOR SHEET MANUFACTURING
CN114088742B (zh) * 2021-11-18 2022-09-06 吉林大学 一种变矩器的铸造叶片塌陷位置检测装置
JP2023113027A (ja) * 2022-02-02 2023-08-15 株式会社イシダ Ｘ線検査装置
WO2024044968A1 (zh) * 2022-08-30 2024-03-07 宁德时代新能源科技股份有限公司 极片检测的方法和装置
JP2025072964A (ja) 2023-10-25 2025-05-12 株式会社日立ハイテクサイエンス Ｘ線分析装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2570288A (en) * 1949-05-03 1951-10-09 Howard Paper Mills Inc Photoelectric inspection of sheet materials
US3317736A (en) * 1963-11-12 1967-05-02 Gen Electric Apparatus for measuring the probability of the presence of optical blemishes
JPS60154181A (ja) * 1984-01-25 1985-08-13 Nippon Steel Corp 帯状金属板の介在物検出装置
JP2000298102A (ja) * 1999-02-08 2000-10-24 Nkk Corp 表面検査装置
US6324249B1 (en) * 2001-03-21 2001-11-27 Agilent Technologies, Inc. Electronic planar laminography system and method
JP3908048B2 (ja) * 2002-02-05 2007-04-25 株式会社イシダ Ｘ線検査装置
JP3971238B2 (ja) * 2002-05-16 2007-09-05 住友ゴム工業株式会社 Ｘ線検査装置
JP2004061479A (ja) 2002-07-27 2004-02-26 Elco:Kk Ｘ線異物検出装置
JP3678730B2 (ja) * 2003-02-26 2005-08-03 株式会社日鉄エレックス Ｘ線異物検査方法及び装置
JP2006267067A (ja) * 2005-03-25 2006-10-05 Nippon Petroleum Refining Co Ltd 異物検出装置及び検出方法、並びに異物除去装置及び除去方法
JP5126645B2 (ja) * 2006-08-23 2013-01-23 国際技術開発株式会社 検査装置
JP2009128090A (ja) * 2007-11-21 2009-06-11 Core Staff Inc テーピングｉｃ対応自動ｘ線検査装置
JP5443033B2 (ja) * 2009-03-27 2014-03-19 トヨタ自動車株式会社 欠陥検査装置および方法
JP4919115B2 (ja) 2009-09-24 2012-04-18 横河電機株式会社 放射線検査装置

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