JP2013145199A5 - - Google Patents

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Publication number
JP2013145199A5
JP2013145199A5 JP2012006179A JP2012006179A JP2013145199A5 JP 2013145199 A5 JP2013145199 A5 JP 2013145199A5 JP 2012006179 A JP2012006179 A JP 2012006179A JP 2012006179 A JP2012006179 A JP 2012006179A JP 2013145199 A5 JP2013145199 A5 JP 2013145199A5
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Japan
Prior art keywords
light
observation apparatus
illumination
optical interference
interference observation
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JP2012006179A
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English (en)
Japanese (ja)
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JP5970824B2 (ja
JP2013145199A (ja
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Publication of JP2013145199A5 publication Critical patent/JP2013145199A5/ja
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JP2012006179A 2012-01-16 2012-01-16 光干渉観察装置 Active JP5970824B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012006179A JP5970824B2 (ja) 2012-01-16 2012-01-16 光干渉観察装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012006179A JP5970824B2 (ja) 2012-01-16 2012-01-16 光干渉観察装置

Publications (3)

Publication Number Publication Date
JP2013145199A JP2013145199A (ja) 2013-07-25
JP2013145199A5 true JP2013145199A5 (enrdf_load_stackoverflow) 2015-05-07
JP5970824B2 JP5970824B2 (ja) 2016-08-17

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JP2012006179A Active JP5970824B2 (ja) 2012-01-16 2012-01-16 光干渉観察装置

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JP (1) JP5970824B2 (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103913127A (zh) * 2013-11-26 2014-07-09 北京航空航天大学 一种基于子孔径相位拼接的数字全息球面面型检测装置
WO2015105980A1 (en) * 2014-01-09 2015-07-16 Zygo Corporation Measuring topography of aspheric and other non-flat surfaces
CN112074724B (zh) 2018-05-02 2023-10-27 仪景通株式会社 数据取得装置
CN116538967B (zh) * 2023-06-13 2025-01-28 上海交通大学 一种兼顾动态范围和精度的干涉形貌测量方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3860300B2 (ja) * 1997-07-29 2006-12-20 オリンパス株式会社 形状測定方法及び形状測定器
WO2004073501A2 (en) * 2003-02-20 2004-09-02 Gutin Mikhail Optical coherence tomography with 3d coherence scanning
JP5130513B2 (ja) * 2006-03-10 2013-01-30 国立大学法人 和歌山大学 ３次元変位ひずみ計測方法及び装置
US7633631B2 (en) * 2007-04-04 2009-12-15 Nikon Corporation Three-dimensional microscope and method for obtaining three-dimensional image
JP5054457B2 (ja) * 2007-07-27 2012-10-24 学校法人北里研究所 広ダイナミックレンジ・オプティカル・コヒーレンス・トモグラフィー装置
JP2012515892A (ja) * 2009-01-20 2012-07-12 ヴァイツェル ティロ 光路長の判定装置及び判定方法
JP2011089887A (ja) * 2009-10-22 2011-05-06 Sun Tec Kk 光断層画像表示システム

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