TW201131138A - Surface measure device, surface measure method thereof and correction method thereof - Google Patents
Surface measure device, surface measure method thereof and correction method thereof Download PDFInfo
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TW5966PA 六、發明說明: ^ 【發明所屬之技術領域】 本發明是有關於一種表面量測裝置及其之量測方法 及杈正方法,且特別是有關於一種可產生多點光源之表 面量測裝置及其之量測方法及校正方法。 【先前技術】 /請參照第1圖(習知技藝),其繪示傳統的光學檢測 系統的不⑦圖。光源3投射之光場經過分光透鏡^而聚 :在不同聚焦位置13a、13b以及13c。投射於待測面的 '線反射至分光鏡14後分綠濾波^件15,藉此量測待 測面上同一點的高度。 然而’由於光源8係點光源,故每次僅能量測待測 之一點的呵度,唯有入射至待測面的光線與待測面 廊,^:向產生相對位移才能量測到待測面的線輪 測到待測面的面輪廓’則入射至待測面的光 面之間須沿二不同方向產生相對位移。如此, 個待測面的表面形貌不但耗時而且降低製程 【發明内容】 及校#表面量測裝置及其之量測方 測待測㈣面輪/測裝置可產生多點光源,可快速^ 根據本發 力面^出一種表面量測裝置 201131138 1 » » »/ ✓ vyv/ 1/4' 表面量測裝置用以量測一待測面。表面量測裝置包括一 光源、一光纖管、一第一透鏡組、一第二透鏡組、一影 像感測單元、一分光鏡及一處理單元。光源用以發射一 光線。光纖管具有複數條光纖束,用以傳輸光線。第一 透鏡組用以聚焦並分光該光線。第二透鏡組用以聚焦光 線並使光線之焦點實質上位於待測面。影像感測單元用 以擷取光線之一量測影像。分光鏡用以將反射自待測面 之光線反射至影像感測單元。處理單元用以計算量測影 • 像之數個影像點之光強度比並將每個影像點之光強度比 與一深度-光強度比關係線進行比對以取得每個影像點 對應的深度。其中,光線依序通過光纖束、第一透鏡組、 分光鏡及第二透鏡組至待測面後,反射經第二透鏡組至 分光鏡後再反射至影像感測單元。 根據本發明之第二方面,提出一種表面量測裝置之 量測方法。表面量測方法包括以下步驟。一光源發射一 光線’光線依序通過數條光纖束、一第一透鏡組、一分 • 光鏡及一第二透鏡組至一待測面後,反射經第二透鏡組 至分光鏡後再反射至一影像感測單元。其中第一透鏡組 用以聚焦並分光光線;影像感測單元擷取反射自分光鏡 之光線之一量測影像;計算量測影像之數個影像點之光 強度比;以及,將每個影像點之光強度比與一深度-光強 度比關係線進行比對,以取得每個影像點對應的深度。 根據本發明之第三方面,提出一種表面量測裝置之 校正方法。表面量測的校正方法包括以下步驟。一光源 發射一光線’光線依序通過數條光纖束、一第一透鏡組、 5 201131138TW5966PA VI. Description of the Invention: ^ Technical Field of the Invention The present invention relates to a surface measuring device, a measuring method thereof, and a method for correcting the surface, and in particular to a surface measuring method capable of generating a multi-point light source The device and its measuring method and calibration method. [Prior Art] / Please refer to Fig. 1 (Conventional Art), which shows a diagram of a conventional optical inspection system. The light field projected by the light source 3 is concentrated by the beam splitting lens at different focus positions 13a, 13b and 13c. The line projected on the surface to be measured is reflected to the beam splitter 14 and then divided into green filter members 15, thereby measuring the height of the same point on the surface to be measured. However, since the light source 8 is a point source, each time only the energy is measured at a point of the point to be measured, only the light incident on the surface to be tested and the surface to be tested, ^: the relative displacement can be measured to be measured When the line wheel of the measuring surface measures the surface contour of the surface to be tested, the relative displacement between the light surfaces incident on the surface to be tested must be in two different directions. In this way, the surface topography of the surface to be tested is not only time-consuming but also reduces the process [invention] and the surface measuring device and the measuring method of the measuring device (four) face wheel/measuring device can generate multi-point light source, which can be fast ^ According to the power surface, a surface measuring device 201131138 1 » » »/ ✓ vyv/ 1/4' surface measuring device is used to measure a surface to be measured. The surface measuring device comprises a light source, a fiber tube, a first lens group, a second lens group, an image sensing unit, a beam splitter and a processing unit. The light source is used to emit a light. The fiber optic tube has a plurality of fiber bundles for transmitting light. The first lens group is used to focus and split the light. The second lens group is used to focus the light and to have the focus of the light substantially at the surface to be measured. The image sensing unit measures the image by one of the captured light. The beam splitter is used to reflect the light reflected from the surface to be measured to the image sensing unit. The processing unit is configured to calculate a light intensity ratio of the plurality of image points of the image and compare the light intensity ratio of each image point with a depth-light intensity ratio relationship line to obtain a depth corresponding to each image point. . The light is sequentially passed through the fiber bundle, the first lens group, the beam splitter and the second lens group to the surface to be tested, and then reflected through the second lens group to the beam splitter and then reflected to the image sensing unit. According to a second aspect of the invention, a method of measuring a surface measuring device is presented. The surface measurement method includes the following steps. A light source emits a ray of light passing through a plurality of fiber bundles, a first lens group, a minute lens, a second lens group and a second lens group to a surface to be measured, and then reflected through the second lens group to the beam splitter. Reflected to an image sensing unit. The first lens group is used for focusing and splitting the light; the image sensing unit takes one of the light reflected from the beam splitter to measure the image; and calculates the light intensity ratio of the plurality of image points of the measured image; and, each image is The point light intensity ratio is compared with a depth-light intensity ratio relationship line to obtain the depth corresponding to each image point. According to a third aspect of the invention, a method of correcting a surface measuring device is provided. The method of correcting the surface measurement includes the following steps. a light source emits a light ray sequentially passes through a plurality of fiber bundles, a first lens group, 5 201131138
TW5966PA 一分光鏡及一第二透鏡組至一樣本面後,反射經第二透 鏡組至分光鏡後再反射至一影像感測單元。其中第一透 鏡組用以聚焦並分光光線;影像感測單元擷取反射自分 光鏡之光線之一樣本影像,以及’計算樣本影像之數個 影像點之光強度比,以得到一深度-光強度比關係線。 為讓本發明之上述内容能更明顯易懂,下文特舉實 施例,並配合所附圖式,作詳細說明如下: 【實施方式】 以下係提出實施例作為本發明之說明,然而實施例 所提出的内容,僅為舉例說明之用,而繪製之圖式係為 配合說明,並非作為限縮本發明保護範圍之用。再者, 實施例之圖示亦省略不必要之元件,以利清楚顯示本發 明之技術特點。 請參照第2圖,其繪示依照本發明之一實施例之表 面量測裝置的示意圖。表面量測裝置100用以量測待測 面120,其中表面量測裝置100包括一光源102、一光纖 管104、一第一透鏡組106 ' —第二透鏡組108、一影像 感測單元110、一分光鏡112、一處理單元122。其中第 一透鏡組106包括一第三透鏡組116及平凸 (plano-convex)透鏡118。影像感測單元110及處理單 元122係設於控制器126内,影像感測單元110並電性 連接於處理單元122。 其中,光源102,用以發射光線L。光纖管104内具 有數條光纖束132,用以傳輸光線L。第一透鏡組106用 201131138 I wj^uurrt- 以聚焦並分光光線L。第二透鏡組1〇8用以聚焦光線L並 使光線L之焦點大致上位於待測面1,詳細來說,第二 透鏡組108中的第三透鏡組ι16用以聚焦光線L,平凸透 鏡118用以分光光線L。影像感測單元11〇用以擷取光線 L之!測影像114 (第2圖未纷示)。分光鏡112用以將 反射自待測面120之光線L反射至影像感測單元u〇e處 理單7L 122用以計算量測影像114之數個影像點之光強 度比並將每個影像點之光強度比與深度_光強度比關係 ♦線C1 (第2圖未緣示)進行比對以取得每個影像點對應 的深度。 進一步地說,光線L自光源丨〇2射出後依序通過光 纖管104内之該些光纖束132、第三透鏡組116、平凸透 鏡118刀光鏡112及第二透鏡組108至一待測面12〇後, 反ί回第二透鏡組⑽至分光鏡112後再反射至影像感 測單元110。其中,經過第二透鏡組1〇8之光線的焦點大 致上位於待測面12 〇。 # 、,參照第3圖至第4圖,第3圖繪示第2圖之影像 感測單元所擷取到之待測面的量測影像示意圖,第4圖 緣示本實施例之深度—光強度比關係線。當影像感測單元 110 #負取到自待測面J 2〇反射之光線的量測影像m (量 =影像114输示於第3圖)後,處理單元122計算量測 影像114之數個影像點之光強度比並將每個影像點的光 強度比與第4圖之深度-光強度比關係線C1進行比對以 取得每個影像點的深度,即待測面120於z方向的高度 值。以經過如第3圖中方向5_5,(即乂方向)的數個^ 201131138After the TW5966PA splitter mirror and a second lens group are on the same side, the reflection is reflected by the second lens group to the beam splitter and then reflected to an image sensing unit. The first lens group is used to focus and split the light; the image sensing unit captures a sample image of the light reflected from the beam splitter, and 'calculates the light intensity ratio of the image points of the sample image to obtain a depth-light Intensity ratio relationship line. In order to make the above description of the present invention more comprehensible, the following detailed description of the embodiments of the present invention will be described in detail as follows: [Embodiment] The following is a description of the embodiments of the present invention. The matters presented are for illustrative purposes only, and the drawings are for illustrative purposes and are not intended to limit the scope of the invention. Further, the illustration of the embodiments also omits unnecessary elements to clearly show the technical features of the present invention. Referring to Figure 2, there is shown a schematic diagram of a surface measuring device in accordance with an embodiment of the present invention. The surface measuring device 100 is configured to measure the surface to be tested 120. The surface measuring device 100 includes a light source 102, a fiber tube 104, a first lens group 106', a second lens group 108, and an image sensing unit 110. A beam splitter 112 and a processing unit 122. The first lens group 106 includes a third lens group 116 and a plano-convex lens 118. The image sensing unit 110 and the processing unit 122 are disposed in the controller 126, and the image sensing unit 110 is electrically connected to the processing unit 122. The light source 102 is configured to emit light L. The fiber optic tube 104 has a plurality of fiber bundles 132 for transmitting light L. The first lens group 106 uses 201131138 I wj^uurrt- to focus and split the light L. The second lens group 1 〇 8 is used to focus the light L and the focus of the light L is substantially on the surface 1 to be tested. In detail, the third lens group ι 16 in the second lens group 108 is used to focus the light L, and the plano-convex lens 118 is used to split the light L. The image sensing unit 11 is used to capture light L! Measured image 114 (not shown in Figure 2). The beam splitter 112 is configured to reflect the light L reflected from the surface to be tested 120 to the image sensing unit u〇e processing unit 7L 122 for calculating the light intensity ratio of the plurality of image points of the measurement image 114 and each image point The light intensity ratio is compared with the depth_light intensity ratio ♦ line C1 (not shown in Fig. 2) to obtain the depth corresponding to each image point. Further, the light L is emitted from the light source 丨〇2 and sequentially passes through the fiber bundles 132, the third lens group 116, the plano-convex lens 118, the mirror 112 and the second lens group 108 in the fiber tube 104 to be tested. After the surface is 12 ,, the second lens group (10) is returned to the beam splitter 112 and then reflected to the image sensing unit 110. The focus of the light passing through the second lens group 1 〇 8 is substantially on the surface to be tested 12 〇. #,, refer to FIG. 3 to FIG. 4, and FIG. 3 is a schematic diagram showing the measurement image of the surface to be tested captured by the image sensing unit of FIG. 2, and FIG. 4 shows the depth of the embodiment— Light intensity ratio relationship line. When the image sensing unit 110 # takes the measurement image m of the light reflected from the surface to be tested J 2 ( (the quantity = the image 114 is shown in FIG. 3), the processing unit 122 calculates the number of the measurement images 114. The light intensity ratio of the image points is compared with the depth-light intensity ratio relationship line C1 of FIG. 4 to obtain the depth of each image point, that is, the surface 120 to be tested is in the z direction. Height value. By passing through the direction 5_5 in the third figure, (ie, the direction of the )) several ^ 201131138
TW5966PA 像點W為例說明,該些影像點M1對應至待測面i2〇的 1測點的深度係㈣於第5圖,歸示第3圖中經過方 向5-5’的影像點所對應之量測點的深度示意圖。 由於光纖管104内具有該些光纖束132,光線l經 過该些光纖束132後係產生出數個點光源,該些點光源 入射至待測面120後係涵蓋待測面12〇的表面範圍,因 此可一次獲得二維(2D)的量測影像114。也就是說,投 射至待測面120的光線與待測面12〇之間不需相對位移 即可量測出待測面12〇之表面㈣,可快速建立待測面 120的形貌,不但省時而且提高製程的生產效率。 光源102可產生波長涵蓋4〇〇奈米(nm)至7〇〇nm 的光線L,例如是白光。進一步地說,本實施例之光源 102係多波長的光源。在一實施態樣中,光源1〇2係可產 生,率大於120瓦(Wat〇的光線L,此處的光源1〇2例 如是鹵素光源。此外,光纖管1〇4係可撓曲的管路進 步地說,光源102與第一透鏡組106之間的光路係可 任意彎曲。 經過該些光纖束132的光線L入射至第三透鏡組116 的入射面積係實質上等於或小於第三透鏡組116之入光 面128的面積。進一步地說,經過該些光纖束132的光 線完全地入射至第三透鏡組丨丨6,如此可保留完整的光線 強度。在一實施例中,第三透鏡組116的倍率係4〇倍, 但不以此為限。 光線L經過第三透鏡組116後所聚焦之焦點F1係位 於第三透鏡組丨16與平凸透鏡118之間,且光線l經過 201131138 f » » ^ W1 i » 平凸透鏡118後所聚焦之焦點以係位於平凸透鏡U8愈 分光鏡112之間。 〜 特別-提的是’請參照第6圖,其繪示第2圖之光 線L經過平凸透鏡118後的分光示意圖。經過平凸透鏡 118的光線L係產生良好的分級果,以增加軸向上的色 差。也就是說,光線L經過平凸透鏡118後產生色散現 象’使紅光R之焦點FR、綠光G之焦點FG及藍光B之焦 點FB沿著光線行進方向D的間距拉大,如此可量測到待 • 測面120中z方向的範圍也較大。 請回到第2圖,光線L經過分光鏡112後入射至第 二透鏡組108的人射面積實f上#於或小於第二透鏡組 108之入光面130的面積。進一步地說,經過分光鏡u2 的光線完全地人射至第二透鏡組⑽,可㈣完整的光線 強度。在一實施例中,第二透鏡組108的倍率係60倍, 但不以此為限。 以下係說明表面量測裝置1〇〇的量測方法及校正方 •法。於說明表面量測裝置1〇〇的量測方法之前,先說明 其校正方法’即取得如第4圖之深度_光強度比關係線的 方法。請參照第7圖,其緣示依照本發明之一實施例之 表面量測裝置的校正方法流程圖。 於步驟S102中,採用第2圖之表面量測裝置1〇〇量 測一樣本面(未繪示)中數個已知深度的樣本點。即, 光源102發射光線L’光線l依序通過光纖管1〇4之該些 光纖束132、第-透鏡組106、分光鏡112及第二透鏡組 108至該樣本面中該些樣本點後,反射經第二透鏡組ι〇8 201131138The TW5966PA image point W is taken as an example. The image points M1 correspond to the depth system of the 1 measuring point of the surface to be measured i2〇 (4) in Fig. 5, and the image points corresponding to the direction 5-5' in the third figure are corresponding. A schematic representation of the depth of the measured point. Since the fiber bundles 132 have the fiber bundles 132, the light rays 1 pass through the fiber bundles 132 to generate a plurality of point light sources, and the point light sources are incident on the surface to be tested 120 and cover the surface area of the surface to be tested 12〇. Therefore, a two-dimensional (2D) measurement image 114 can be obtained at one time. That is to say, the surface of the surface to be tested 12(4) can be measured without any relative displacement between the light projected onto the surface to be tested 120 and the surface to be tested 12, and the surface of the surface to be tested 120 can be quickly established. Save time and increase the productivity of the process. Light source 102 can produce light L having a wavelength ranging from 4 nanometers (nm) to 7 〇〇 nm, such as white light. Further, the light source 102 of the present embodiment is a multi-wavelength light source. In an embodiment, the light source 1 〇 2 can be generated at a rate greater than 120 watts (the light ray L of Watt, where the light source 1 〇 2 is, for example, a halogen light source. In addition, the fiber tube 1 〇 4 is flexible. According to the pipeline, the optical path between the light source 102 and the first lens group 106 can be bent arbitrarily. The incident area of the light L passing through the bundles 132 to the third lens group 116 is substantially equal to or less than the third. The area of the incident surface 128 of the lens group 116. Further, the light passing through the bundles 132 is completely incident on the third lens unit ,6, thus retaining the complete light intensity. In an embodiment, The magnification of the three lens group 116 is 4 times, but not limited thereto. The focus F1 of the light L after passing through the third lens group 116 is located between the third lens group 丨16 and the plano-convex lens 118, and the light ray l After 201131138 f » » ^ W1 i » The focus of the plano-convex lens 118 is located between the plano-convex lens U8 and the dichroic mirror 112. ~ Special - mention is 'Please refer to Figure 6, which shows Figure 2 A spectroscopic diagram of the light L passing through the plano-convex lens 118. The light L of the lens 118 produces a good graded fruit to increase the chromatic aberration in the axial direction. That is, the light L passes through the plano-convex lens 118 to cause a dispersion phenomenon 'the focus FR of the red light R, the focus FG of the green light G, and the blue light. The focal point FB of B is enlarged along the distance of the traveling direction D of the light, so that the range of the z direction in the to-be-measured surface 120 is also large. Returning to Fig. 2, the light L is incident on the spectroscope 112 and then incident. The area of the second lens group 108 is equal to or smaller than the area of the light incident surface 130 of the second lens group 108. Further, the light passing through the beam splitter u2 is completely incident on the second lens group (10), (4) The complete light intensity. In one embodiment, the magnification of the second lens group 108 is 60 times, but not limited thereto. The following describes the measurement method and the correction method of the surface measuring device 1〇〇 Before explaining the measurement method of the surface measuring device 1A, the method of correcting the method of obtaining the depth-light intensity ratio relationship as shown in Fig. 4 will be described. Please refer to Fig. 7, which is based on this. Method for correcting surface measuring device of one embodiment of the invention In step S102, the surface measuring device 1 of FIG. 2 is used to measure sample points of a plurality of known depths in the same plane (not shown). That is, the light source 102 emits light L' rays. The fiber bundles 132, the first lens group 106, the beam splitter 112, and the second lens group 108 of the fiber tube 1 through 4 are sequentially passed to the sample points in the sample surface, and then reflected through the second lens group ι 8 201131138
TW5966PA Μ 11' 至分光鏡112後再反射至影像感測單元11〇。 接著,於步驟S104中,影像感測單元no擷取反射 自分光鏡112之光線的一樣本影像(未繪示)。 然後,於步驟S106中,處理單元122計算該樣本影 像之數個影像點之光強度比,配合上述已知深度的樣本 點,以得到第4圖之深度-光強度比關係線C1。 5羊細地5兒,請參照第8圖,其繪示本實施例之樣本 影像之數個影像點的深度-光強度曲線圖。由於該樣本影 像之该些影像點對應於該樣本面中該些已知深度的樣本 點,因此可得到第8圖所示之深度_光強度曲線圖。在一 實施例中,可正規化(N〇rmaiizati〇n)該樣本影像之各 忒些衫像點之光強度,也就是說,深度_光強度曲線圖中 的光強度曲線Bs、Gs及Bs係經過正規化而得之曲線。 然後,利用下式(1)及(2)計算出該樣本影像之每個影像 點的光強度比。The TW5966PA Μ 11' is reflected to the image sensing unit 11A after being split into the beam splitter 112. Next, in step S104, the image sensing unit no captures the same image (not shown) of the light reflected from the beam splitter 112. Then, in step S106, the processing unit 122 calculates the light intensity ratios of the plurality of image points of the sample image, and matches the sample points of the known depth to obtain the depth-light intensity ratio relationship line C1 of FIG. 5 sheep fine 5, please refer to Fig. 8, which shows the depth-light intensity curve of several image points of the sample image of the embodiment. Since the image points of the sample image correspond to the sample points of the known depth in the sample face, the depth_light intensity curve shown in Fig. 8 can be obtained. In one embodiment, the light intensity of each of the image points of the sample image can be normalized (that is, the light intensity curves Bs, Gs, and Bs in the depth_light intensity curve). It is a curve obtained by normalization. Then, the light intensity ratio of each image point of the sample image is calculated by the following equations (1) and (2).
Rs(A)/Gs(A)......................................(1)Rs(A)/Gs(A).....................................(1)
Gs(A)/Bs(A)...................................(2) 於上式(1)及(2)中,RS(A)係指影像點A的紅光強 度、Gs(A)係指影像點A的綠光強度、Bs(A)係指影像點A 的藍光強度,此處的光強度例如是灰階值。此外,對於 深度-光強度曲線中紅光強度曲線Rs與綠光強度曲線Gs 重疊之第一深度範圍0V1,係可採用式(1)計算出對應的 深度-光強度比關係線。對於深度_光強度曲線令綠光強 度曲線Gs與藍光強度曲線bs重疊的第二深度範圍〇V2, 201131138 ⑵計算出對應的妓—錢度 =:_)除以綠光強度心= '?/像”名A1的夫卜卜、w 將影像點A2所對;之:=點A2為例,可採用式⑵’ <所對應之綠光強度Gs(A2)除以藍光強度 < 2) ’以得到影像點A2的光強度比。依此計算出該樣 本〜像2所有影像點的光強度比。然後,制最小二乘Gs(A)/Bs(A)................................(2) in the above formula In (1) and (2), RS (A) refers to the red light intensity of image point A, Gs (A) refers to the green light intensity of image point A, and Bs (A) refers to the blue light intensity of image point A. The light intensity here is, for example, a gray scale value. In addition, for the first depth range 0V1 in which the red light intensity curve Rs and the green light intensity curve Gs overlap in the depth-light intensity curve, the corresponding depth-light intensity ratio relationship line can be calculated by using equation (1). For the depth _ light intensity curve, the green light intensity curve Gs overlaps with the blue light intensity curve bs, the second depth range 〇V2, 201131138 (2) calculates the corresponding 妓-money degree =: _) divided by the green light intensity heart = '? / For example, the name A1's Fu Bub, w pairs the image point A2; the:= point A2 is taken as an example, and the corresponding green light intensity Gs(A2) can be divided by the blue light intensity<2) 'To obtain the light intensity ratio of the image point A2. According to this, the light intensity ratio of all the image points of the sample ~ image 2 is calculated. Then, the least squares is made.
法或其b數值^法計算該樣本影像之該些影像點之光強 度比的線性迴歸曲線,如第4圖所示之深度-光強度比關 係線C1。 雖然本實施例之第一深度範圍0V1及第二深度範圍 ο V 2係以第8圖所示為例作說明,然此非用以限制本實施 例,只要光強度值可對應至唯一的深度值即可,第一深 度範圍0V1及第二深度範圍0V2可以是其它任意範圍。 由於光線L經過第2圖之平凸透鏡118後,紅光R 之焦點FR、綠光G之焦點FG及藍光B之焦點FB沿著光 線行進方向D的間距拉大(如第6圖所繪示),如此使第 4圖所示之深度-光強度比關係線C1的z軸範圍較寬,可 量測到待測面120中z方向的範圍也較大◎也就是說, 即使待測面120的表面輪麻的波岭與波谷間的距離較 大,應用本實施例之表面量測裝置1 〇〇仍可得到精確且 具有完整的波峰/波谷的量測結果。 在得到深度-光強度比關係線C1之後,便可開始量 測待測面120的表面輪廓。以下係說明表面量測裝置1 〇〇 的量測方法。請參照第9圖,其繪示依照本發明之一實 »« I ' 201131138The method or its b value method calculates a linear regression curve of the light intensity ratios of the image points of the sample image, such as the depth-light intensity ratio line C1 shown in FIG. Although the first depth range 0V1 and the second depth range ο V 2 of the embodiment are illustrated by way of example in FIG. 8, this embodiment is not limited, as long as the light intensity value can correspond to a unique depth. The value may be, the first depth range 0V1 and the second depth range 0V2 may be any other range. Since the light L passes through the plano-convex lens 118 of FIG. 2, the focus FR of the red light R, the focus FG of the green light G, and the focus FB of the blue light B are enlarged along the distance D of the light traveling direction (as shown in FIG. 6). Therefore, the depth-light intensity ratio relationship line C1 shown in FIG. 4 has a wide z-axis range, and the range of the z-direction in the surface 120 to be measured can be measured to be large. That is, even the surface to be measured The distance between the wave and the trough of the surface of the 120 is large, and the surface measurement device 1 of the present embodiment can still obtain accurate and complete peak/valley measurement results. After the depth-light intensity ratio relationship line C1 is obtained, the surface profile of the surface to be tested 120 can be measured. The following describes the measurement method of the surface measuring device 1 。. Please refer to FIG. 9 , which illustrates one of the inventions according to the present invention. «« I ' 201131138
TW5966PA 施例之表面量測裝置的量測方法流程圖。 於步驟S202中,採用第2圖之表面量測裝置1 〇〇量 測待測面120。即,光源102發射光線L,光線L依序通 過該光纖管104之該些光纖束132、第一透鏡組1〇6、分 光鏡112及第二透鏡組108至待測面12〇後反射經第 二透鏡組108 1分光鏡112後再反射至影像感測單元 110 〇 接著,於步驟S204中,影像感測單元11〇擷取反射 自分光鏡112之光線的量測影像114,如第3圖所示。 再來,於步驟S206中,處理單元122計算量測影 114之數個影像點的光強度比。 然^後,於步驟S208中,處理單元122將量測影像 114之母個影像點的光強度比與上述之深度-光強度比關 係線C1進行比對,以取得每個影像點的深度。 詳細地說,處理單元122將量測影像114之影像點 的紅光強度Rs(A)除以綠光強度Gs(A)且將綠光強度Gs(a) 除以藍光強度Bs(A),上述計算所得之二個光強度比之其 中一者會與第4圖之深度-光強度比關係線C1在誤差範 圍内符合,因此而得到對應之深度。 二 由於本實施例之表面量測裝置100及其之量測方法 在-取得量測影像114之影像點的光強度比後,即可迅 速比對出對應之深度。快速量測出待測面的表面輪廓的 特徵係適用於生產線。例如,可於生產線的其中—環節 應用表面量測裝置100及其之量測方法,以快速且= 檢測每個產品的品質。 201131138 i w jy\j\jrr\ 此外 ㈣置测裝置刚可適用於動態量測。進一 步地也,只要知道生產線之機台所產生 面量測裝置⑽可在該機台每振動簡—基準 且$準地擷取到待測物(例如是產品)之_面 影像114。如此’使每個待測物之待測面的量測影像14 於疒振動基準下被比較,可客觀地檢測出每铜= 之待測面的表面狀況。 】物Flow chart of the measuring method of the surface measuring device of the TW5966PA example. In step S202, the surface to be measured 120 is measured using the surface measuring device 1 of Fig. 2. That is, the light source 102 emits light L, which sequentially passes through the fiber bundles 132 of the fiber tube 104, the first lens group 1〇6, the beam splitter 112, and the second lens group 108 to the surface to be tested 12 The second lens group 108 1 is then reflected by the beam splitter 112 to the image sensing unit 110. Then, in step S204, the image sensing unit 11 captures the measurement image 114 of the light reflected from the beam splitter 112, such as the third. The figure shows. Further, in step S206, the processing unit 122 calculates the light intensity ratio of the plurality of image points of the measurement shadow 114. Then, in step S208, the processing unit 122 compares the light intensity ratio of the mother image points of the measurement image 114 with the depth-light intensity ratio line C1 to obtain the depth of each image point. In detail, the processing unit 122 divides the red light intensity Rs (A) of the image point of the measurement image 114 by the green light intensity Gs (A) and the green light intensity Gs (a) by the blue light intensity Bs (A). One of the two light intensity ratios calculated above will coincide with the depth-light intensity ratio relationship line C1 of FIG. 4 within the error range, and thus the corresponding depth is obtained. 2. Since the surface measuring device 100 of the present embodiment and the measuring method thereof obtain the light intensity ratio of the image point of the measurement image 114, the corresponding depth can be quickly compared. The feature of quickly measuring the surface profile of the surface to be tested is suitable for the production line. For example, the surface measuring device 100 and its measuring method can be applied to the production line to quickly and = detect the quality of each product. 201131138 i w jy\j\jrr\ In addition (4) The device is just suitable for dynamic measurement. Further, as long as the surface measuring device (10) of the machine of the production line is known, the oscillating image 114 of the object to be tested (for example, a product) can be captured every time the vibration is reduced and the reference is made. Thus, the measurement images 14 of the surface to be tested of each object to be tested are compared under the vibration reference, and the surface condition of the surface to be tested per copper = can be objectively detected.
本實施例之表面量測裝置⑽及其量測方法及校正 方法係非接觸式的光學量測機制,可量測到甚精密 面輪廓。如第5圖所示,表面量測裝置1〇〇及其量測; ;可量_波峰至波判之高度P約1 « (叩)及波 見度W約2μπι的表面粗輪度。 、本發明上述實施例所揭露之表面量測裝置及其之量 測方法及校正方法,表面量測裝置可產生多點光源,可 快速量測待測面的面輪廓,不但省時而且提高製程的生 產效率。此外,光線經過平凸透鏡後產生色散現象,使 紅光之焦點、綠光之焦點及藍光之焦點沿著光線行進方 向的間距拉大’如此可量測到待測面中深度方向的範 也較大。 綜上所述,雖然本發明已以實施例揭露如上,然其 並非用以限定本發明。本發明所屬技術領域中具有通常、 知識者,在不脫離本發明之精神和範圍内,當可作各種 之更動與潤飾。因此’本發明之保護範圍#視後附之申 請專利範圍所界定者為準。 【圖式簡單說明】 201131138The surface measuring device (10) of the present embodiment, and the measuring method and the correcting method thereof are non-contact optical measuring mechanisms, and the very precise surface profile can be measured. As shown in Fig. 5, the surface measuring device 1〇〇 and its measurement; ; the height _ peak to wave judgment height P about 1 « (叩) and the visibility W about 2μπι surface coarse roundness. The surface measuring device and the measuring method and the correcting method thereof disclosed in the above embodiments of the present invention, the surface measuring device can generate a multi-point light source, and can quickly measure the surface contour of the surface to be tested, which not only saves time but also improves the process. Production efficiency. In addition, the light passes through the plano-convex lens to produce a dispersion phenomenon, which causes the focus of the red light, the focus of the green light, and the focus of the blue light to be enlarged along the direction of the light traveling direction. Thus, the range of the depth direction in the surface to be tested is also measured. Big. In conclusion, the present invention has been disclosed above by way of example, and is not intended to limit the invention. It will be apparent to those skilled in the art that various changes and modifications can be made without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention is defined by the scope of the patent application appended hereto. [Simple description of the schema] 201131138
TW5966PA 第1圖(習知技藝)繪示傳統的光學檢測系統的示 意圖。 第2圖繪示依照本發明之—實施例之表面量測 的示意EJ。 、 第3圖繪示第2圖之影像感測單元所擷取到之待測 面的量測影像示意圖。 第4圖繪示本實施例之深度—光強度比關係線。 第5圖繪示第3圖中經過方向5_5’的影像點所對 應之量測點的深度示意圖。 第6圖繪示第2圖之光線經過平凸透鏡後的分 意圖。 ’' 第7圖繪示依照本發明之一實施例之表面量測裝置 的校正方法流程圖。 第8圖繪示本實施例之樣本影像之數個影像點的深 度-光強度曲線圖。 第9圖繪示依照本發明之一實施例之表面量測裝置 的量測方法流程圖。 【主要元件符號說明】 :分光透鏡 13a、13b、13c :聚焦位置 14、112:分光鏡 15 :濾波元件 100 :表面量測裝置 102、S :光源 104 :光纖管 201131138TW5966PA Figure 1 (Prior Art) illustrates the schematic of a conventional optical inspection system. Figure 2 is a schematic representation of a surface measurement of a surface measurement in accordance with an embodiment of the present invention. FIG. 3 is a schematic diagram showing the measurement image of the to-be-measured surface captured by the image sensing unit of FIG. 2 . Figure 4 is a diagram showing the depth-light intensity ratio relationship line of this embodiment. Fig. 5 is a schematic view showing the depth of the measurement point corresponding to the image point passing through the direction 5_5' in Fig. 3. Fig. 6 is a view showing the intention of the light of Fig. 2 after passing through the plano-convex lens. Figure 7 is a flow chart showing a method of correcting the surface measuring device according to an embodiment of the present invention. Figure 8 is a graph showing the depth-light intensity of a plurality of image points of the sample image of the present embodiment. Figure 9 is a flow chart showing a method of measuring a surface measuring device according to an embodiment of the present invention. [Main component symbol description]: Spectroscopic lens 13a, 13b, 13c: Focus position 14, 112: Beam splitter 15: Filter element 100: Surface measuring device 102, S: Light source 104: Fiber tube 201131138
TW5966PA 106 :第一透鏡組 108 ··第二透鏡組 - 110:影像感測單元 114 :量測影像 116 :第三透鏡組 118 :平凸透鏡 120 :待測面 122 :處理單元 • 126 :控制器 128、130 :入光面 132 :光纖束 Al、A2、Ml :影像點 B :藍光TW5966PA 106: first lens group 108 · second lens group - 110: image sensing unit 114: measurement image 116: third lens group 118: plano-convex lens 120: surface to be tested 122: processing unit • 126: controller 128, 130: light-in plane 132: fiber bundles A1, A2, Ml: image point B: blue light
Bs、Gs、Rs :光強度曲線 C1 :深度-光強度比關係線 D:光線行進方向 • F卜 F2、FR、FG、FB :焦點 G :綠光 L :光線 OV1 :第一深度範圍 OV2 :第二深度範圍 P :高度 R :紅光 S102 —S106、S202 — S208 :步驟 W :寬度Bs, Gs, Rs: light intensity curve C1: depth-light intensity ratio relationship line D: light travel direction • F Bu F2, FR, FG, FB: focus G: green light L: light OV1: first depth range OV2: Second depth range P: height R: red light S102 - S106, S202 - S208: step W: width
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TWI481834B (en) * | 2012-10-31 | 2015-04-21 | Oto Photonics Inc | Optical sensing module, optical mechanics of spectrometer, and spectrometer |
US9625315B2 (en) | 2013-01-30 | 2017-04-18 | Oto Photonics Inc. | Optical sensing module, optical mechanism of spectrometer, and spectrometer |
CN112838018A (en) * | 2019-11-25 | 2021-05-25 | 致茂电子(苏州)有限公司 | Optical measurement method |
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JP5084558B2 (en) * | 2008-02-28 | 2012-11-28 | キヤノン株式会社 | Surface shape measuring apparatus, exposure apparatus, and device manufacturing method |
CN102089616B (en) * | 2008-06-03 | 2013-03-13 | 焕·J·郑 | Interferometric defect detection and classification |
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TWI468640B (en) * | 2012-09-25 | 2015-01-11 | Machvision Inc | Socket connector detection system and detection method |
TWI481834B (en) * | 2012-10-31 | 2015-04-21 | Oto Photonics Inc | Optical sensing module, optical mechanics of spectrometer, and spectrometer |
US9625315B2 (en) | 2013-01-30 | 2017-04-18 | Oto Photonics Inc. | Optical sensing module, optical mechanism of spectrometer, and spectrometer |
CN112838018A (en) * | 2019-11-25 | 2021-05-25 | 致茂电子(苏州)有限公司 | Optical measurement method |
CN112838018B (en) * | 2019-11-25 | 2023-09-15 | 致茂电子(苏州)有限公司 | Optical measuring method |
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