JP2013133490A - Cylindrical sputtering target and method for producing the same - Google Patents

Cylindrical sputtering target and method for producing the same Download PDF

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JP2013133490A
JP2013133490A JP2011284237A JP2011284237A JP2013133490A JP 2013133490 A JP2013133490 A JP 2013133490A JP 2011284237 A JP2011284237 A JP 2011284237A JP 2011284237 A JP2011284237 A JP 2011284237A JP 2013133490 A JP2013133490 A JP 2013133490A
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ring
target
cylindrical
sputtering target
shaped
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Kazuya Munemiya
和也 宗宮
Masaki Kurita
昌樹 栗田
Yuji Yamaguchi
祐司 山口
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Tokuriki Honten Co Ltd
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Abstract

PROBLEM TO BE SOLVED: To solve such a problem that in a long cylindrical sputtering target constructed by mounting a plurality of ring-shaped targets on a cylindrical substrate, the targets have to be subjected to bonding to the cylindrical substrate one by one, and injection of a bonding material and formation of a gap have to be performed each time the target is mounted, thereby requiring numerous production processes.SOLUTION: The plurality of ring-shaped targets with a thickness of 10 mm or less are continuously mounted on the cylindrical substrate, and are integrated by fastening both ends using screws, thereby obtaining the cylindrical sputtering target.

Description

本発明は、薄膜形成に用いる長尺円筒形スパッタリングターゲットおよびその製造方法に関する。   The present invention relates to a long cylindrical sputtering target used for forming a thin film and a method for manufacturing the same.

近年、平板形スパッタリングターゲットに比べて高い使用効率と速い成膜速度を有する円筒形スパッタリングターゲットが注目されている。   2. Description of the Related Art In recent years, a cylindrical sputtering target having a high use efficiency and a high film formation rate as compared with a flat plate sputtering target has attracted attention.

その円筒形スパッタリングターゲットを製造する方法としては、複数のリング状のターゲットを円筒形基材に嵌めて接合材によって固定するという製造方法がとられている(例えば、特許文献1参照、特許文献2参照)。
特開2010−100930公報 特開平7−228967号公報
As a method of manufacturing the cylindrical sputtering target, a manufacturing method is adopted in which a plurality of ring-shaped targets are fitted to a cylindrical base material and fixed with a bonding material (for example, see Patent Document 1 and Patent Document 2). reference).
Japanese Patent Application Laid-Open No. 2010-100100 JP 7-228967 A

しかし、上記技術によると、円筒形基材に嵌めた複数のターゲットの隣り合うターゲットの間に外径の違いによる段差があると、その部分にスパッタが集中してターゲットを傷つける危険性があるため、専用の治具やInやIn合金等による接合材(ボンディング材やはんだ)を用いて外周面が一致するようにターゲットを円筒形基材に接合して固定する必要があり、製造工程が複雑であった。   However, according to the above technique, if there is a step due to the difference in the outer diameter between adjacent targets of a plurality of targets fitted on a cylindrical base material, there is a risk that spatter will concentrate on that part and damage the target. It is necessary to join and fix the target to the cylindrical base material so that the outer peripheral surfaces match using a dedicated jig or a bonding material such as In or In alloy (bonding material or solder), and the manufacturing process is complicated Met.

また、リング状のターゲットがスパッタリングによって熱膨張して割れるのを防ぐためにターゲット同士の間に隙間を設ける必要があり、そのためには、ターゲットを円筒形基材に1個ずつボンディングしなければならず、その都度ボンディング材の注入および隙間を形成しながらのターゲットのはめ込みを行うために多大な製造工程が要求されるという問題がある。   Further, it is necessary to provide a gap between the targets in order to prevent the ring-shaped targets from being thermally expanded and cracked by sputtering. For this purpose, the targets must be bonded to the cylindrical base material one by one. In each case, there is a problem that a large number of manufacturing steps are required to inject the bonding material and insert the target while forming a gap.

そこで本発明は、厚さ10mm以下としたリング状ターゲットを作製することによって精度を向上させ、そのリング状ターゲットを円筒形基材の外周に連続して複数嵌めた後、両側からねじによって連続するリング状ターゲットを押さえ付けて固定することにより接合固定した。   Therefore, the present invention improves accuracy by producing a ring-shaped target having a thickness of 10 mm or less, and after the plurality of the ring-shaped targets are continuously fitted on the outer periphery of the cylindrical base material, it is continued from both sides with screws. The ring-shaped target was bonded and fixed by pressing and fixing.

すなわち、複数のリング状ターゲットを隙間なく連続させ、かつ、接合材を使用することなくねじによって円筒形基材に固定した長尺円筒形スパッタリングターゲットである。   That is, it is a long cylindrical sputtering target in which a plurality of ring-shaped targets are continuous without gaps and are fixed to a cylindrical base material with screws without using a bonding material.

図1は本発明の長尺円筒形スパッタリングターゲットの構成例を示す断面図であり、図において、溶解法等によってリング状ターゲットを作製し、それらリング状ターゲットを少なくとも両側にねじ切りを施した円筒形基材に複数個連続してはめる。   FIG. 1 is a cross-sectional view showing a configuration example of a long cylindrical sputtering target of the present invention. In the figure, a ring-shaped target is manufactured by a melting method or the like, and the ring-shaped target is threaded on at least both sides. A plurality of pieces are continuously attached to the base material.

さらに、金属製のねじ3を円筒形基材の両側からねじ込んで連続しているリング状ターゲットを締め付けることにより全一体に連続固定した。   Further, the metal screw 3 was screwed in from both sides of the cylindrical base material, and the continuous ring-shaped target was tightened to be continuously and integrally fixed.

上記リング状ターゲットは、熱伝導率が悪い材料ではターゲットにワレが発生してしまうため、熱伝導率のよいAg、Ag合金、Au、Au合金といった材料を用いる。   Since the ring-shaped target is cracked by a material having poor thermal conductivity, materials such as Ag, Ag alloy, Au, and Au alloy having good thermal conductivity are used.

さらに、外径および内径の寸法にかかわらず、厚さを10mm以下とし、かつその外径、内径および厚さの誤差を0.05mm以下の精度とする。   Furthermore, regardless of the dimensions of the outer diameter and the inner diameter, the thickness is set to 10 mm or less, and the error of the outer diameter, the inner diameter and the thickness is set to an accuracy of 0.05 mm or less.

なお、上記において、厚さを10mm以下とした理由は、熱処理を行うことによる結晶粒の微細化が可能となるためにスパッタリングによる成膜が安定するためでる。また、誤差を0.05mm以下とした理由は、リング状ターゲットを組み付けて構成した円筒形スパッタリングターゲットでスパッタを集中させるような段差を形成させないためである。   Note that the reason why the thickness is 10 mm or less in the above is that the film formation by sputtering is stabilized because the crystal grains can be refined by heat treatment. The reason why the error is set to 0.05 mm or less is that a step that concentrates sputtering is not formed by a cylindrical sputtering target configured by assembling a ring-shaped target.

また、円筒形基材2と金属製のねじ3は、適当な熱伝導性、電気伝導性、強度を備えているものであればどのような金属でもよく、例えば、CuやTiの単体製、Cu、Ti、Al、Mo、Au、Ag、Mg等を含む非鉄合金製、ステンレススチール(SUS)製等である。   The cylindrical substrate 2 and the metal screw 3 may be any metal as long as it has appropriate thermal conductivity, electrical conductivity, and strength. It is made of a non-ferrous alloy containing Cu, Ti, Al, Mo, Au, Ag, Mg, or the like, or made of stainless steel (SUS).

以上の本発明によると、リング状ターゲットを円筒形基材に接合固定する製造工程が簡略化され、容易に製造することができることになる。   According to the present invention described above, the manufacturing process for joining and fixing the ring-shaped target to the cylindrical base material is simplified and can be easily manufactured.

さらに、個々のリング状ターゲットの精度がよいために、連続したリング状ターゲットの接続部外周面の段差が少なく、スパッタリングの集中を抑制した長尺円筒形スパッタリングターゲットとなる。   Furthermore, since the accuracy of each ring-shaped target is good, there are few steps on the outer peripheral surface of the connecting portion of the continuous ring-shaped target, and the long cylindrical sputtering target is suppressed in concentration of sputtering.

また、リング状ターゲットの組み付けにIn等による接合材を使用しないために、円筒形基材とリング状ターゲットを分離した際に、ターゲットにその接合材の付着がなくターゲット材の精製が容易となる。   In addition, since no bonding material such as In is used for assembling the ring-shaped target, when the cylindrical base material and the ring-shaped target are separated, the bonding material does not adhere to the target and the target material can be easily refined. .

さらに、一般的に金属ターゲットの結晶粒径が小さければスパッタリングによる成膜が安定するとされているが、本発明のリング状ターゲットの厚みを10mm以下としたために溶解後の鋳造組織が繊維組織に変わるのに十分な塑性加工を加えられ、さらに、熱処理を行うことによる結晶粒の微細化が可能となるためにスパッタリングによる成膜が安定する効果がある。   Furthermore, it is generally said that the film formation by sputtering is stable if the crystal grain size of the metal target is small, but since the thickness of the ring-shaped target of the present invention is 10 mm or less, the cast structure after melting is changed to a fiber structure. In addition, sufficient plastic working can be applied, and further, the crystal grains can be refined by heat treatment, so that the film formation by sputtering is stable.

本発明の構成を示す一部破断側面図The partially broken side view which shows the structure of this invention 第1、第2の実施例を示す一部破断側面図Partially broken side view showing the first and second embodiments 第1、第2の実施例を示す端面図End view showing the first and second embodiments 第3の実施例を示す一部破断側面図Partially broken side view showing the third embodiment 第4の実施例を示す一部破断側面図Partially broken side view showing the fourth embodiment

本発明の実施例を説明する。   Examples of the present invention will be described.

純度99.99質量%以上のAuを使用し、外径130mm、内径110mm、厚さ10mmでその外径、内径および厚さの誤差を0.05mm以下にしてリング状ターゲット1を溶解法によって20個作製した。   Using an Au having a purity of 99.99% by mass or more, an outer diameter of 130 mm, an inner diameter of 110 mm, a thickness of 10 mm, an error of the outer diameter, inner diameter and thickness being 0.05 mm or less, the ring-shaped target 1 is dissolved by a melting method. Individually produced.

また、外径110mm、内径100mm、高さ400mmのCu製の円筒形基材2を用意し、その両側にねじ切りを施した。   Moreover, the cylindrical base material 2 made of Cu having an outer diameter of 110 mm, an inner diameter of 100 mm, and a height of 400 mm was prepared, and threaded on both sides thereof.

得られたCu製の円筒形基材に上記リング状ターゲットを連続させて嵌め、個々のリング状ターゲットの外周面が一致するようにして連続したリング状ターゲット1の側端からCu製の外径120mmのねじ3で締め付け、図2、図3に示すAuの円筒形スパッタリングターゲットを作製した。   The ring-shaped target is continuously fitted to the obtained Cu-shaped cylindrical base material, and the outer diameter of Cu is formed from the side end of the continuous ring-shaped target 1 so that the outer peripheral surfaces of the individual ring-shaped targets coincide with each other. Tightened with a 120 mm screw 3, the Au cylindrical sputtering target shown in FIGS. 2 and 3 was produced.

図3に示されるAuの円筒形スパッタリングターゲットを高周波マグネトロン装置に挿入し、Ar分圧0.5Pa、出力10kWの条件でスパッタリングを行ったところ、Auの円筒形スパッタリングターゲットにワレは発生しなかった。   When the Au cylindrical sputtering target shown in FIG. 3 was inserted into a high-frequency magnetron apparatus and sputtering was performed under the conditions of Ar partial pressure of 0.5 Pa and output of 10 kW, no crack was generated in the Au cylindrical sputtering target. .

純度99.99質量%以上のAgを使用し、それ以外の条件を上記実施例1と同様にして図3に示すようなAgの円筒形スパッタリングターゲットを作製した。   Using Ag with a purity of 99.99% by mass or more and using the other conditions in the same manner as in Example 1, an Ag cylindrical sputtering target as shown in FIG. 3 was produced.

このAgの円筒形スパッタリングターゲットを実施例1と同じ条件で高周波マグネトロン装置を使用し、スパッタリングを行ったところ、Agの円筒形スパッタリングターゲットにワレは発生しなかった。   When this Ag cylindrical sputtering target was sputtered using the high-frequency magnetron device under the same conditions as in Example 1, no cracking occurred in the Ag cylindrical sputtering target.

純度99.99質量%以上のAgを使用し、溶解法によって幅200mm、厚さ1mm、長さ60000mmの帯材を作製し、プレス加工によって外径130mm、内径110mm、厚さ1mmでその外径、内径および厚さの誤差を0.05mm以下にしたリング状ターゲット1を100個作製した。   Using Ag with a purity of 99.99% by mass or more, a band material having a width of 200 mm, a thickness of 1 mm, and a length of 60000 mm is produced by a melting method, and the outer diameter is 130 mm, an inner diameter of 110 mm, and a thickness of 1 mm by pressing. 100 ring-shaped targets 1 having an inner diameter and thickness error of 0.05 mm or less were produced.

作製したリング状ターゲットを、外径110mm、内径100mm、高さ400mmのCu製の円筒形基材2に連続させて嵌め、個々のリング状ターゲットの外周面が一致するようにして連続したリング状ターゲット1の側端からCu製の外径120mmのねじ3で締め付け、図4に示すAgの円筒形スパッタリングターゲットを作製した。   The produced ring-shaped target is continuously fitted to a cylindrical cylindrical substrate 2 made of Cu having an outer diameter of 110 mm, an inner diameter of 100 mm, and a height of 400 mm, and the ring-shaped target is continuously ring-shaped so that the outer peripheral surfaces of the individual ring-shaped targets coincide. The Ag was sputtered from the side end of the target 1 with a screw 3 made of Cu having an outer diameter of 120 mm to produce an Ag cylindrical sputtering target shown in FIG.

図4に示されるAgの円筒形スパッタリングターゲットを高周波マグネトロン装置に挿入し、Ar分圧0.5Pa、出力10kWの条件でスパッタリングを行ったところ、Agの円筒形スパッタリングターゲットにワレは発生しなかった。   The Ag cylindrical sputtering target shown in FIG. 4 was inserted into a high-frequency magnetron apparatus, and sputtering was performed under the conditions of an Ar partial pressure of 0.5 Pa and an output of 10 kW. As a result, no crack was generated in the Ag cylindrical sputtering target. .

純度99.99質量%以上のAgを使用し、外径130mm、内径110mm、厚さ10mmでその外径、内径および厚さの誤差を0.05mm以下にしてリング状ターゲット1を溶解法によって20個作製した。   Using an Ag having a purity of 99.99% by mass or more, an outer diameter of 130 mm, an inner diameter of 110 mm, a thickness of 10 mm, and an error of the outer diameter, inner diameter and thickness of 0.05 mm or less, the ring-shaped target 1 is dissolved by a melting method. Individually produced.

また、外径110mm、内径100mm、高さ400mmのCu製の円筒形基材2を用意し、その両側にねじ切りを施した。   Moreover, the cylindrical base material 2 made of Cu having an outer diameter of 110 mm, an inner diameter of 100 mm, and a height of 400 mm was prepared, and threaded on both sides thereof.

得られたCu製の円筒形基材に上記リング状ターゲット1を連続させて嵌め、個々のリング状ターゲットの外周面が一致するようにして連続したリング状ターゲットの側端からSUS304製の外径120mmの皿ばね4を挿入し、側端からCu製の外径120mmのねじ3で締め付け、図5に示すAgの円筒形スパッタリングターゲットを作製した。   The ring-shaped target 1 is continuously fitted on the obtained Cu cylindrical base material, and the outer diameter of SUS304 is formed from the side end of the continuous ring-shaped target so that the outer peripheral surfaces of the individual ring-shaped targets coincide with each other. A 120 mm disc spring 4 was inserted and tightened from the side end with a screw 3 made of Cu having an outer diameter of 120 mm to produce an Ag cylindrical sputtering target shown in FIG.

図5に示されるAgの円筒形スパッタリングターゲットを高周波マグネトロン装置に挿入し、Ar分圧0.5Pa、出力10kWの条件でスパッタリングを行ったところ、Agの円筒形スパッタリングターゲットにワレは発生しなかった。   When the Ag cylindrical sputtering target shown in FIG. 5 was inserted into a high-frequency magnetron apparatus and sputtering was performed under the conditions of Ar partial pressure of 0.5 Pa and output of 10 kW, no crack was generated in the Ag cylindrical sputtering target. .

1 リング状ターゲット
2 円筒形基材
3 ねじ
4 ばね

DESCRIPTION OF SYMBOLS 1 Ring-shaped target 2 Cylindrical base material 3 Screw 4 Spring

Claims (4)

円筒形基材に複数のリング状ターゲットを嵌めることによって構成される長尺の円筒形スパッタリングターゲットにおいて、
厚さ10mm以下にしたリング状ターゲットを円筒形基材に複数連続して嵌め、その両端をねじにより締め付けて全一体に組み付けたことを特徴とする円筒形スパッタリングターゲット。
In a long cylindrical sputtering target constructed by fitting a plurality of ring-shaped targets to a cylindrical substrate,
A cylindrical sputtering target characterized in that a plurality of ring-shaped targets having a thickness of 10 mm or less are continuously fitted to a cylindrical base material, and both ends thereof are tightened with screws to be assembled together.
請求項1において、リング状ターゲットの外径、内径および厚さの誤差を0.05mm以下としたことを特徴とする円筒形スパッタリングターゲット。   The cylindrical sputtering target according to claim 1, wherein an error in the outer diameter, inner diameter, and thickness of the ring-shaped target is 0.05 mm or less. 請求項1もしくは請求項2において、円筒形基材に連続して嵌めたリング状ターゲットの両端をばねを介してねじで締め付けたことを特徴とする円筒形スパッタリングターゲット。   3. The cylindrical sputtering target according to claim 1 or 2, wherein both ends of a ring-shaped target continuously fitted to the cylindrical base material are tightened with screws via a spring. 請求項1、請求項2もしくは請求項3のリング状ターゲットをプレス加工で作製することを特徴とする円筒形スパッタリングターゲットの製造方法。   A method for producing a cylindrical sputtering target, comprising producing the ring-shaped target according to claim 1, 2 or 3 by press working.
JP2011284237A 2011-12-26 2011-12-26 Cylindrical sputtering target and method for producing the same Ceased JP2013133490A (en)

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Cited By (1)

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WO2020066956A1 (en) * 2018-09-26 2020-04-02 Jx金属株式会社 Sputtering target and method for producing same

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JP2006104570A (en) * 2004-09-30 2006-04-20 Applied Films Corp Non-bonded rotatable target for sputtering
JP2009235491A (en) * 2008-03-27 2009-10-15 Sumitomo Chemical Co Ltd METHOD FOR HOMOGENIZING Al-Cu ALLOY
JP2010100930A (en) * 2008-09-25 2010-05-06 Tosoh Corp Cylindrical sputtering target, and method for manufacturing the same
JP2011106025A (en) * 2009-10-23 2011-06-02 Kobe Steel Ltd Al-BASED ALLOY SPUTTERING TARGET

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JPS63143568U (en) * 1987-03-11 1988-09-21
US20040074770A1 (en) * 2002-07-02 2004-04-22 George Wityak Rotary target
JP2004043868A (en) * 2002-07-10 2004-02-12 Hitachi Metals Ltd Sputtering target material for depositing thin film, and method for manufacturing the same
JP2004183040A (en) * 2002-12-03 2004-07-02 Toshiba Corp Nb SPUTTERING TARGET, ITS MANUFACTURING METHOD, OPTICAL THIN FILM USING IT, AND OPTICAL COMPONENT
JP2006104570A (en) * 2004-09-30 2006-04-20 Applied Films Corp Non-bonded rotatable target for sputtering
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JP2011106025A (en) * 2009-10-23 2011-06-02 Kobe Steel Ltd Al-BASED ALLOY SPUTTERING TARGET

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020066956A1 (en) * 2018-09-26 2020-04-02 Jx金属株式会社 Sputtering target and method for producing same
JPWO2020066956A1 (en) * 2018-09-26 2021-09-24 Jx金属株式会社 Sputtering target and its manufacturing method
JP7455750B2 (en) 2018-09-26 2024-03-26 Jx金属株式会社 Cylindrical sputtering target and its manufacturing method

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